Electron backscatter diffraction (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Electron backscatter diffraction" in English language version.

refsWebsite

Global rank English rank

154doi.org

2^nd place

84semanticscholar.org

11^th place

8^th place

49nih.gov

4^th place

48harvard.edu

18^th place

17^th place

21web.archive.org

1^st place

19arxiv.org

69^th place

59^th place

5handle.net

102^nd place

76^th place

4creativecommons.org

1,010^th place

612^th place

4osti.gov

2,036^th place

1,254^th place

4ox.ac.uk

613^th place

456^th place

3worldcat.org

5^th place

2azonano.com

low place

2unt.edu

1,336^th place

769^th place

2iucr.org

low place

9,593^rd place

2archives-ouvertes.fr

1,031^st place

879^th place

1bipm.org

641^st place

955^th place

1hal.science

low place

1tohoku.ac.jp

9,956^th place

low place

1mit.edu

415^th place

327^th place

1archive.org

6^th place

1ebsd.info

low place

1scientific.net

low place

1tue.nl

9,054^th place

6,363^rd place

1port.ac.uk

low place

7,554^th place

1strath.ac.uk

low place

7,329^th place

1desy.de

low place

1physicsworld.com

6,140^th place

4,691^st place

1azom.com

low place

1manchester.ac.uk

4,003^rd place

2,646^th place

archive.org

Electron backscatter diffraction in materials science (2nd ed.). Springer Science+Business Media. 2009. p. 1. ISBN 978-0-387-88135-5.

archives-ouvertes.fr

hal.archives-ouvertes.fr

Plancher, E.; Petit, J.; Maurice, C.; Favier, V.; Saintoyant, L.; Loisnard, D.; Rupin, N.; Marijon, J.-B.; Ulrich, O.; Bornert, M.; Micha, J.-S.; Robach, O.; Castelnau, O. (1 March 2016). "On the Accuracy of Elastic Strain Field Measurements by Laue Microdiffraction and High-Resolution EBSD: a Cross-Validation Experiment" (PDF). Experimental Mechanics. 56 (3): 483–492. doi:10.1007/s11340-015-0114-1. S2CID 255157494. Archived (PDF) from the original on 13 March 2020. Retrieved 20 March 2023.
Shi, Qiwei; Loisnard, Dominique; Dan, Chengyi; Zhang, Fengguo; Zhong, Hongru; Li, Han; Li, Yuda; Chen, Zhe; Wang, Haowei; Roux, Stéphane (2021). "Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation" (PDF). Materials Characterization. 178: 111206. doi:10.1016/j.matchar.2021.111206. S2CID 236241507. Archived (PDF) from the original on 25 March 2023. Retrieved 20 March 2023.

arxiv.org

Koko, Abdalrhaman; Tong, Vivian; Wilkinson, Angus J.; Marrow, T. James (2023). "An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)". Ultramicroscopy. 248: 113705. arXiv:2206.10242. doi:10.1016/j.ultramic.2023.113705. PMID 36871367. S2CID 249889699. This article incorporates text from this source, which is available under the CC BY 4.0 license.
Koko, Abdalrhaman; Becker, Thorsten H.; Elmukashfi, Elsiddig; Pugno, Nicola M.; Wilkinson, Angus J.; Marrow, T. James (2023). "HR-EBSD analysis of in situ stable crack growth at the micron scale". Journal of the Mechanics and Physics of Solids. 172: 105173. arXiv:2206.10243. Bibcode:2023JMPSo.17205173K. doi:10.1016/j.jmps.2022.105173. S2CID 249889649.
Britton, T. B.; Tong, V. S.; Hickey, J.; Foden, A.; Wilkinson, A. J. (2018). "AstroEBSD: exploring new space in pattern indexing with methods launched from an astronomical approach". Journal of Applied Crystallography. 51 (6): 1525–1534. arXiv:1804.02602. Bibcode:2018JApCr..51.1525B. doi:10.1107/S1600576718010373. S2CID 51687153.
Britton, Thomas Benjamin; Tong, Vivian S.; Hickey, Jim; Foden, Alex; Wilkinson, Angus J. (2018). "AstroEBSD : exploring new space in pattern indexing with methods launched from an astronomical approach". Journal of Applied Crystallography. 51 (6): 1525–1534. arXiv:1804.02602. Bibcode:2018JApCr..51.1525B. doi:10.1107/S1600576718010373. S2CID 51687153.
Pang, Edward L.; Larsen, Peter M.; Schuh, Christopher A. (2020). "Global optimization for accurate determination of EBSD pattern centers". Ultramicroscopy. 209: 112876. arXiv:1908.10692. doi:10.1016/j.ultramic.2019.112876. PMID 31707232. S2CID 201651309.
Tanaka, Tomohito; Wilkinson, Angus J. (1 July 2019). "Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination – accuracy and precision assessment". Ultramicroscopy. 202: 87–99. arXiv:1904.06891. doi:10.1016/j.ultramic.2019.04.006. PMID 31005023. S2CID 119294636.
Foden, A.; Collins, D.M.; Wilkinson, A.J.; Britton, T.B. (2019). "Indexing electron backscatter diffraction patterns with a refined template matching approach". Ultramicroscopy. 207: 112845. arXiv:1807.11313. doi:10.1016/j.ultramic.2019.112845. PMID 31586829. S2CID 203307560.
Hielscher, Ralf; Bartel, Felix; Britton, Thomas Benjamin (2019). "Gazing at crystal balls: Electron backscatter diffraction pattern analysis and cross-correlation on the sphere". Ultramicroscopy. 207: 112836. arXiv:1810.03211. doi:10.1016/j.ultramic.2019.112836. PMID 31539865. S2CID 202711517.
Wilkinson, Angus J.; Hirsch, Peter B. (1997). "Electron diffraction based techniques in scanning electron microscopy of bulk materials". Micron. 28 (4): 279–308. arXiv:1904.05550. doi:10.1016/S0968-4328(97)00032-2. S2CID 118944816.
Koko, Abdalrhaman; Marrow, James; Elmukashfi, Elsiddig (12 June 2022). "A Computational Method for the Determination of the Elastic Displacement Field using Measured Elastic Deformation Field". arXiv:2107.10330 [cond-mat.mtrl-sci]. This article incorporates text from this source, which is available under the CC BY 4.0 license.
Winkelmann, A; Nolze, G; Vos, M; Salvat-Pujol, F; Werner, W S M (2016). "Physics-based simulation models for EBSD: advances and challenges". IOP Conference Series: Materials Science and Engineering. 109 (1): 012018. arXiv:1505.07982. Bibcode:2016MS&E..109a2018W. doi:10.1088/1757-899x/109/1/012018. S2CID 38586851.
Vermeij, Tijmen; De Graef, Marc; Hoefnagels, Johan (15 March 2019). "Demonstrating the potential of accurate absolute cross-grain stress and orientation correlation using electron backscatter diffraction". Scripta Materialia. 162: 266–271. arXiv:1807.03908. doi:10.1016/j.scriptamat.2018.11.030. S2CID 54575778.
Tanaka, Tomohito; Wilkinson, Angus J. (1 July 2019). "Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination – accuracy and precision assessment". Ultramicroscopy. 202: 87–99. arXiv:1904.06891. doi:10.1016/j.ultramic.2019.04.006. PMID 31005023. S2CID 119294636.
Guo, Yi; Zong, Cui; Britton, T. B. (2021). "Development of local plasticity around voids during tensile deformation". Materials Science and Engineering: A. 814: 141227. arXiv:2007.11890. doi:10.1016/j.msea.2021.141227. S2CID 234850241.
Britton, T B; Hickey, J L R (2018). "Understanding deformation with high angular resolution electron backscatter diffraction (HR-EBSD)". IOP Conference Series: Materials Science and Engineering. 304 (1): 012003. arXiv:1710.00728. Bibcode:2018MS&E..304a2003B. doi:10.1088/1757-899x/304/1/012003. S2CID 54529072.
Kalácska, Szilvia; Dankházi, Zoltán; Zilahi, Gyula; Maeder, Xavier; Michler, Johann; Ispánovity, Péter Dusán; Groma, István (2020). "Investigation of geometrically necessary dislocation structures in compressed Cu micropillars by 3-dimensional HR-EBSD". Materials Science and Engineering: A. 770: 138499. arXiv:1906.06980. doi:10.1016/j.msea.2019.138499. S2CID 189928469. Archived from the original on 17 July 2020. Retrieved 20 March 2023.
Yu, Hongbing; Liu, Junliang; Karamched, Phani; Wilkinson, Angus J.; Hofmann, Felix (2019). "Mapping the full lattice strain tensor of a single dislocation by high angular resolution transmission Kikuchi diffraction (HR-TKD)". Scripta Materialia. 164: 36–41. arXiv:1808.10055. doi:10.1016/j.scriptamat.2018.12.039. S2CID 119075799.
Tong, Vivian S.; Knowles, Alexander J.; Dye, David; Britton, T. Ben (1 January 2019). "Rapid electron backscatter diffraction mapping: Painting by numbers". Materials Characterization. 147: 271–279. arXiv:1809.07283. doi:10.1016/j.matchar.2018.11.014. S2CID 119328762.
Charpagne, Marie-Agathe; Strub, Florian; Pollock, Tresa M. (2019). "Accurate reconstruction of EBSD datasets by a multimodal data approach using an evolutionary algorithm". Materials Characterization. 150: 184–198. arXiv:1903.02988. doi:10.1016/j.matchar.2019.01.033. S2CID 71144677.

azom.com

"Microscale Analysis of Lithium-Containing Compounds and Alloys". AZoM.com. 18 January 2023. Archived from the original on 17 February 2023.

azonano.com

"Sample Preparation Techniques for EBSD Analysis (Electron Backscatter Diffraction)". AZoNano.com. 15 November 2013. Archived from the original on 2 March 2023.
"Discriminating Phases with Similar Crystal Structures Using Electron Backscatter Diffraction (EBSD) and Energy Dispersive X-Ray Spectrometry (EDS)". AZoNano.com. 2015. Archived from the original on 2 March 2023.

bipm.org

Throughout this page, the terms ‘error’, and ‘precision’ are used as defined in the International Bureau of Weights and Measures (BIPM) guide to measurement uncertainty. In practice, ‘error’, ‘accuracy’ and ‘uncertainty’, as well as ‘true value’ and ‘best guess’, are synonymous. Precision is the variance (or standard deviation) between all estimated quantities. Bias is the difference between the average of measured values and an independently measured ‘best guess’. Accuracy is then the combination of bias and precision.^[1]

creativecommons.org

Koko, Abdalrhaman; Tong, Vivian; Wilkinson, Angus J.; Marrow, T. James (2023). "An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)". Ultramicroscopy. 248: 113705. arXiv:2206.10242. doi:10.1016/j.ultramic.2023.113705. PMID 36871367. S2CID 249889699. This article incorporates text from this source, which is available under the CC BY 4.0 license.
Koko, A. Mohamed (2022). In situ full-field characterisation of strain concentrations (deformation twins, slip bands and cracks) (PhD thesis). University of Oxford. Archived from the original on 1 February 2023. This article incorporates text from this source, which is available under the CC BY 4.0 license.
Koko, Abdalrhaman; Elmukashfi, Elsiddig; Becker, Thorsten H.; Karamched, Phani S.; Wilkinson, Angus J.; Marrow, T. James (2022). "In situ characterisation of the strain fields of intragranular slip bands in ferrite by high-resolution electron backscatter diffraction". Acta Materialia. 239: 118284. Bibcode:2022AcMat.23918284K. doi:10.1016/j.actamat.2022.118284. S2CID 251783802. This article incorporates text from this source, which is available under the CC BY 4.0 license.
Koko, Abdalrhaman; Marrow, James; Elmukashfi, Elsiddig (12 June 2022). "A Computational Method for the Determination of the Elastic Displacement Field using Measured Elastic Deformation Field". arXiv:2107.10330 [cond-mat.mtrl-sci]. This article incorporates text from this source, which is available under the CC BY 4.0 license.

desy.de

bib-pubdb1.desy.de

Kalácska, Szilvia; Dankházi, Zoltán; Zilahi, Gyula; Maeder, Xavier; Michler, Johann; Ispánovity, Péter Dusán; Groma, István (2020). "Investigation of geometrically necessary dislocation structures in compressed Cu micropillars by 3-dimensional HR-EBSD". Materials Science and Engineering: A. 770: 138499. arXiv:1906.06980. doi:10.1016/j.msea.2019.138499. S2CID 189928469. Archived from the original on 17 July 2020. Retrieved 20 March 2023.

doi.org

Koko, Abdalrhaman; Tong, Vivian; Wilkinson, Angus J.; Marrow, T. James (2023). "An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)". Ultramicroscopy. 248: 113705. arXiv:2206.10242. doi:10.1016/j.ultramic.2023.113705. PMID 36871367. S2CID 249889699. This article incorporates text from this source, which is available under the CC BY 4.0 license.
Vespucci, S.; Winkelmann, A.; Naresh-Kumar, G.; Mingard, K. P.; Maneuski, D.; Edwards, P. R.; Day, A. P.; O'Shea, V.; Trager-Cowan, C. (2015). "Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns". Physical Review B. 92 (20): 205301. Bibcode:2015PhRvB..92t5301V. doi:10.1103/PhysRevB.92.205301.
Randle, Valerie (September 2009). "Electron backscatter diffraction: Strategies for reliable data acquisition and processing". Materials Characterization. 60 (9): 913–922. doi:10.1016/j.matchar.2009.05.011.
Goldstein, Joseph I.; Newbury, Dale E.; Michael, Joseph R.; Ritchie, Nicholas W. M.; Scott, John Henry J.; Joy, David C. (2018), "Backscattered Electrons", Scanning Electron Microscopy and X-Ray Microanalysis, New York, New York: Springer New York, pp. 15–28, doi:10.1007/978-1-4939-6676-9_2, ISBN 978-1-4939-6674-5
Winkelmann, Aimo; Nolze, Gert (2010). "Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of silicon". Ultramicroscopy. 110 (3): 190–194. doi:10.1016/j.ultramic.2009.11.008. PMID 20005045.
Schwarzer, Robert A.; Field, David P.; Adams, Brent L.; Kumar, Mukul; Schwartz, Adam J. (2009), Schwartz, Adam J.; Kumar, Mukul; Adams, Brent L.; Field, David P. (eds.), "Present State of Electron Backscatter Diffraction and Prospective Developments", Electron Backscatter Diffraction in Materials Science, Boston, MA: Springer US, pp. 1–20, doi:10.1007/978-0-387-88136-2_1, ISBN 978-0-387-88136-2, OSTI 964094
Venables, J. A.; Harland, C. J. (1973). "Electron back-scattering patterns—A new technique for obtaining crystallographic information in the scanning electron microscope". The Philosophical Magazine. 27 (5): 1193–1200. Bibcode:1973PMag...27.1193V. doi:10.1080/14786437308225827.
Chen, Delphic; Kuo, Jui-Chao; Wu, Wen-Tuan (2011). "Effect of microscopic parameters on EBSD spatial resolution". Ultramicroscopy. 111 (9): 1488–1494. doi:10.1016/j.ultramic.2011.06.007. PMID 21930021.
Field, D. P. (2005). "Improving the Spatial Resolution of EBSD". Microscopy and Microanalysis. 11. doi:10.1017/s1431927605506445. S2CID 138097039.
Deal, Andrew; Tao, Xiaodong; Eades, Alwyn (2005). "EBSD geometry in the SEM: simulation and representation". Surface and Interface Analysis. 37 (11): 1017–1020. doi:10.1002/sia.2115. S2CID 122757345.
Randle, Valerie (2000), Schwartz, Adam J.; Kumar, Mukul; Adams, Brent L. (eds.), "Theoretical Framework for Electron Backscatter Diffraction", Electron Backscatter Diffraction in Materials Science, Boston, MA: Springer US, pp. 19–30, doi:10.1007/978-1-4757-3205-4_2, ISBN 978-1-4757-3205-4
Goulden, J.; Trimby, P.; Bewick, A. (1 August 2018). "The Benefits and Applications of a CMOS-based EBSD Detector". Microscopy and Microanalysis. 24 (S1): 1128–1129. Bibcode:2018MiMic..24S1128G. doi:10.1017/s1431927618006128. S2CID 139967518.
Eades, Alwyn; Deal, Andrew; Bhattacharyya, Abhishek; Hooghan, Tejpal (2009), Schwartz, Adam J.; Kumar, Mukul; Adams, Brent L.; Field, David P. (eds.), "Energy Filtering in EBSD", Electron Backscatter Diffraction in Materials Science, Boston, MA, pp. 53–63, doi:10.1007/978-0-387-88136-2_4, ISBN 978-0-387-88136-2
Wilkinson, Angus J.; Britton, T. Ben. (2012). "Strains, planes, and EBSD in materials science". Materials Today. 15 (9): 366–376. doi:10.1016/S1369-7021(12)70163-3.
Sawatzki, Simon; Woodcock, Thomas G.; Güth, Konrad; Müller, Karl-Hartmut; Gutfleisch, Oliver (2015). "Calculation of remanence and degree of texture from EBSD orientation histograms and XRD rocking curves in Nd–Fe–B sintered magnets". Journal of Magnetism and Magnetic Materials. 382: 219–224. Bibcode:2015JMMM..382..219S. doi:10.1016/j.jmmm.2015.01.046.
Nishikawa, S.; Kikuchi, S. (June 1928). "Diffraction of Cathode Rays by Mica". Nature. 121 (3061): 1019–1020. Bibcode:1928Natur.121.1019N. doi:10.1038/1211019a0. ISSN 0028-0836.
Tixier, R.; Waché, C. (1970). "Kossel patterns". Journal of Applied Crystallography. 3 (6): 466–485. Bibcode:1970JApCr...3..466T. doi:10.1107/S0021889870006726.
Maitland, Tim; Sitzman, Scott (2007), Zhou, Weilie; Wang, Zhong Lin (eds.), "Backscattering Detector and EBSD in Nanomaterials Characterization", Scanning Microscopy for Nanotechnology: Techniques and Applications, New York, New York: Springer, pp. 41–75, doi:10.1007/978-0-387-39620-0_2, ISBN 978-0-387-39620-0
Alam, M. N.; Blackman, M.; Pashley, D. W. (1954). "High-angle Kikuchi patterns". Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences. 221 (1145): 224–242. Bibcode:1954RSPSA.221..224A. doi:10.1098/rspa.1954.0017. S2CID 97131764.
Dingley, D J; Wright, S I; Nowell, M M (August 2005). "Dynamic Background Correction of Electron Backscatter Diffraction Patterns". Microscopy and Microanalysis. 11 (S02). doi:10.1017/S1431927605506676. S2CID 137658758.
Britton, T. B.; Jiang, J.; Guo, Y.; Vilalta-Clemente, A.; Wallis, D.; Hansen, L. N.; Winkelmann, A.; Wilkinson, A. J. (2016). "Tutorial: Crystal orientations and EBSD — Or which way is up?". Materials Characterization. 117: 113–126. doi:10.1016/j.matchar.2016.04.008. hdl:10044/1/31250. S2CID 138070296.
Nowell, Matthew M; Witt, Ronald A; True, Brian W (2005). "EBSD Sample Preparation: Techniques, Tips, and Tricks". Microscopy Today. 13 (4): 44–49. doi:10.1017/s1551929500053669. S2CID 139585885.
Koko, Abdalrhaman; Elmukashfi, Elsiddig; Becker, Thorsten H.; Karamched, Phani S.; Wilkinson, Angus J.; Marrow, T. James (2022). "In situ characterisation of the strain fields of intragranular slip bands in ferrite by high-resolution electron backscatter diffraction". Acta Materialia. 239: 118284. Bibcode:2022AcMat.23918284K. doi:10.1016/j.actamat.2022.118284. S2CID 251783802. This article incorporates text from this source, which is available under the CC BY 4.0 license.
Britton, T.B.; Jiang, J.; Clough, R.; Tarleton, E.; Kirkland, A.I.; Wilkinson, A.J. (2013). "Assessing the precision of strain measurements using electron backscatter diffraction – Part 2: Experimental demonstration". Ultramicroscopy. 135: 136–141. doi:10.1016/j.ultramic.2013.08.006. PMID 24034981.
Jiang, J.; Britton, T.B.; Wilkinson, A.J. (2013). "Evolution of dislocation density distributions in copper during tensile deformation". Acta Materialia. 61 (19): 7227–7239. Bibcode:2013AcMat..61.7227J. doi:10.1016/j.actamat.2013.08.027.
Abdolvand, Hamidreza; Wilkinson, Angus J. (2016). "On the effects of reorientation and shear transfer during twin formation: Comparison between high-resolution electron backscatter diffraction experiments and a crystal plasticity finite element model". International Journal of Plasticity. 84: 160–182. doi:10.1016/j.ijplas.2016.05.006. S2CID 139049848.
Koko, Abdalrhaman; Becker, Thorsten H.; Elmukashfi, Elsiddig; Pugno, Nicola M.; Wilkinson, Angus J.; Marrow, T. James (2023). "HR-EBSD analysis of in situ stable crack growth at the micron scale". Journal of the Mechanics and Physics of Solids. 172: 105173. arXiv:2206.10243. Bibcode:2023JMPSo.17205173K. doi:10.1016/j.jmps.2022.105173. S2CID 249889649.
Wilkinson, Angus J.; Randman, David (2010). "Determination of elastic strain fields and geometrically necessary dislocation distributions near nanoindents using electron back scatter diffraction" (PDF). Philosophical Magazine. 90 (9): 1159–1177. Bibcode:2010PMag...90.1159W. doi:10.1080/14786430903304145. S2CID 121903030. Archived (PDF) from the original on 3 March 2023. Retrieved 20 March 2023.
Griffiths, A J V; Walther, T (2010). "Quantification of carbon contamination under electron beam irradiation in a scanning transmission electron microscope and its suppression by plasma cleaning". Journal of Physics: Conference Series. 241 (1): 012017. Bibcode:2010JPhCS.241a2017G. doi:10.1088/1742-6596/241/1/012017. S2CID 250689401.
Koko, Abdalrhaman; Elmukashfi, Elsiddig; Dragnevski, Kalin; Wilkinson, Angus J.; Marrow, Thomas James (2021). "J-integral analysis of the elastic strain fields of ferrite deformation twins using electron backscatter diffraction". Acta Materialia. 218: 117203. Bibcode:2021AcMat.21817203K. doi:10.1016/j.actamat.2021.117203. Archived from the original on 5 July 2022. Retrieved 20 March 2023.
Bachmann, F.; Hielscher, Ralf; Schaeben, Helmut (2010). "Texture Analysis with MTEX – Free and Open Source Software Toolbox". Solid State Phenomena. 160: 63–68. doi:10.4028/www.scientific.net/SSP.160.63. S2CID 136017346.
Powell, C. J.; Jablonski, A. (2011). "Surface Sensitivity of Auger-Electron Spectroscopy and X-ray Photoelectron Spectroscopy". Journal of Surface Analysis. 17 (3): 170–176. doi:10.1384/jsa.17.170.
Piňos, J.; Mikmeková, Š.; Frank, L. (2017). "About the information depth of backscattered electron imaging". Journal of Microscopy. 266 (3): 335–342. doi:10.1111/jmi.12542. PMID 28248420. S2CID 35266526.
Zaefferer, S. (2007). "On the formation mechanisms, spatial resolution and intensity of backscatter Kikuchi patterns". Ultramicroscopy. 107 (2): 254–266. doi:10.1016/j.ultramic.2006.08.007. PMID 17055170.
Seah, M. P. (2001). "Summary of ISO/TC 201 Standard: VIII, ISO 18115:2001—Surface chemical analysis—Vocabulary". Surface and Interface Analysis. 31 (11): 1048–1049. doi:10.1002/sia.1139. S2CID 97982609.
Dingley, D. (2004). "Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy: EBSD AND OIM". Journal of Microscopy. 213 (3): 214–224. doi:10.1111/j.0022-2720.2004.01321.x. PMID 15009688. S2CID 41385346.
Isabell, Thomas C.; Dravid, Vinayak P. (1 June 1997). "Resolution and sensitivity of electron backscattered diffraction in a cold field emission gun SEM". Ultramicroscopy. Frontiers in Electron Microscopy in Materials Science. 67 (1): 59–68. doi:10.1016/S0304-3991(97)00003-X.
Humphreys, F. J (2004). "Characterisation of fine-scale microstructures by electron backscatter diffraction (EBSD)". Scripta Materialia. Viewpoint set no. 35. Metals and alloys with a structural scale from the micrometer to the atomic dimensions. 51 (8): 771–776. doi:10.1016/j.scriptamat.2004.05.016.
Goldstein, Joseph I.; Newbury, Dale E.; Michael, Joseph R.; Ritchie, Nicholas W. M.; Scott, John Henry J.; Joy, David C. (2018), Goldstein, Joseph I.; Newbury, Dale E.; Michael, Joseph R.; Ritchie, Nicholas W.M. (eds.), "The Visibility of Features in SEM Images", Scanning Electron Microscopy and X-Ray Microanalysis, New York, New York: Springer, pp. 123–131, doi:10.1007/978-1-4939-6676-9_8, ISBN 978-1-4939-6676-9
Zhu, Chaoyi; De Graef, Marc (2020). "EBSD pattern simulations for an interaction volume containing lattice defects". Ultramicroscopy. 218: 113088. doi:10.1016/j.ultramic.2020.113088. PMID 32784084. S2CID 221123906.
Ren, S. X.; Kenik, E. A.; Alexander, K. B. (1997). "Monte Carlo Simulation of Spatial Resolution for Electron Backscattered Diffraction (EBSD) with Application to Two-Phase Materials". Microscopy and Microanalysis. 3 (S2): 575–576. Bibcode:1997MiMic...3S.575R. doi:10.1017/S1431927600009764. S2CID 137029133. Archived from the original on 25 March 2023. Retrieved 20 March 2023.
Brodusch, Nicolas; Demers, Hendrix; Gauvin, Raynald (2018). "Imaging with a Commercial Electron Backscatter Diffraction (EBSD) Camera in a Scanning Electron Microscope: A Review". Journal of Imaging. 4 (7): 88. doi:10.3390/jimaging4070088.
Winkelmann, Aimo (2009), Schwartz, Adam J.; Kumar, Mukul; Adams, Brent L.; Field, David P. (eds.), "Dynamical Simulation of Electron Backscatter Diffraction Patterns", Electron Backscatter Diffraction in Materials Science, Boston, MA: Springer US, pp. 21–33, doi:10.1007/978-0-387-88136-2_2, ISBN 978-0-387-88136-2, S2CID 122806598
El-Dasher, Bassem; Deal, Andrew (2009), Schwartz, Adam J.; Kumar, Mukul; Adams, Brent L.; Field, David P. (eds.), "Application of Electron Backscatter Diffraction to Phase Identification", Electron Backscatter Diffraction in Materials Science, Boston, MA: Springer US, pp. 81–95, doi:10.1007/978-0-387-88136-2_6, ISBN 978-0-387-88136-2, archived from the original on 25 March 2023, retrieved 20 March 2023
Wright, Stuart I.; Zhao, Jun-Wu; Adams, Brent L. (1991). "Automated Determination of Lattice Orientation From Electron Backscattered Kikuchi Diffraction Patterns". Texture, Stress, and Microstructure. 13 (2–3): 123–131. doi:10.1155/TSM.13.123.
Wright, Stuart I.; Adams, Brent L.; Kunze, Karsten (1993). "Application of a new automatic lattice orientation measurement technique to polycrystalline aluminum". Materials Science and Engineering: A. 160 (2): 229–240. doi:10.1016/0921-5093(93)90452-K.
Lassen, Niels Chr. Krieger (1992). "Automatic crystal orientation determination from EBSPs". Micron and Microscopica Acta. 23 (1): 191–192. doi:10.1016/0739-6260(92)90133-X.
Krieger Lassen, N.C.; Juul Jensen, Dorte; Condradsen, K. (1994). "Automatic Recognition of Deformed and Recrystallized Regions in Partly Recrystallized Samples Using Electron Back Scattering Patterns". Materials Science Forum. 157–162: 149–158. doi:10.4028/www.scientific.net/msf.157-162.149. S2CID 137129038.
Wright, Stuart I.; Nowell, Matthew M.; Lindeman, Scott P.; Camus, Patrick P.; De Graef, Marc; Jackson, Michael A. (2015). "Introduction and comparison of new EBSD post-processing methodologies". Ultramicroscopy. 159: 81–94. doi:10.1016/j.ultramic.2015.08.001. PMID 26342553.
Randle, Valerie (2009). "Electron backscatter diffraction: Strategies for reliable data acquisition and processing". Materials Characterization. 60 (9): 913–922. doi:10.1016/j.matchar.2009.05.011.
Sitzman, Scott; Schmidt, Niels-Henrik; Palomares-Garcia, Alberto; Munoz-Moreno, Rocio; Goulden, Jenny (2015). "Addressing Pseudo-Symmetric Misindexing in EBSD Analysis of γ-TiAl with High Accuracy Band Detection". Microscopy and Microanalysis. 21 (S3): 2037–2038. Bibcode:2015MiMic..21S2037S. doi:10.1017/s143192761501096x. S2CID 51964340.
Lenthe, W.; Singh, S.; De Graef, M. (2019). "Prediction of potential pseudo-symmetry issues in the indexing of electron backscatter diffraction patterns". Journal of Applied Crystallography. 52 (5): 1157–1168. Bibcode:2019JApCr..52.1157L. doi:10.1107/S1600576719011233. OSTI 1575873. S2CID 204108200.
Dingley, David J.; Wright, S.I. (2009), Schwartz, Adam J.; Kumar, Mukul; Adams, Brent L.; Field, David P. (eds.), "Phase Identification Through Symmetry Determination in EBSD Patterns", Electron Backscatter Diffraction in Materials Science, Boston, MA: Springer US, pp. 97–107, doi:10.1007/978-0-387-88136-2_7, ISBN 978-0-387-88136-2
Winkelmann, Aimo; Trager-Cowan, Carol; Sweeney, Francis; Day, Austin P.; Parbrook, Peter (2007). "Many-beam dynamical simulation of electron backscatter diffraction patterns". Ultramicroscopy. 107 (4): 414–421. doi:10.1016/j.ultramic.2006.10.006. PMID 17126489.
Britton, T. B.; Tong, V. S.; Hickey, J.; Foden, A.; Wilkinson, A. J. (2018). "AstroEBSD: exploring new space in pattern indexing with methods launched from an astronomical approach". Journal of Applied Crystallography. 51 (6): 1525–1534. arXiv:1804.02602. Bibcode:2018JApCr..51.1525B. doi:10.1107/S1600576718010373. S2CID 51687153.
Britton, Thomas Benjamin; Tong, Vivian S.; Hickey, Jim; Foden, Alex; Wilkinson, Angus J. (2018). "AstroEBSD : exploring new space in pattern indexing with methods launched from an astronomical approach". Journal of Applied Crystallography. 51 (6): 1525–1534. arXiv:1804.02602. Bibcode:2018JApCr..51.1525B. doi:10.1107/S1600576718010373. S2CID 51687153.
Pang, Edward L.; Larsen, Peter M.; Schuh, Christopher A. (2020). "Global optimization for accurate determination of EBSD pattern centers". Ultramicroscopy. 209: 112876. arXiv:1908.10692. doi:10.1016/j.ultramic.2019.112876. PMID 31707232. S2CID 201651309.
Tanaka, Tomohito; Wilkinson, Angus J. (1 July 2019). "Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination – accuracy and precision assessment". Ultramicroscopy. 202: 87–99. arXiv:1904.06891. doi:10.1016/j.ultramic.2019.04.006. PMID 31005023. S2CID 119294636.
Foden, A.; Collins, D.M.; Wilkinson, A.J.; Britton, T.B. (2019). "Indexing electron backscatter diffraction patterns with a refined template matching approach". Ultramicroscopy. 207: 112845. arXiv:1807.11313. doi:10.1016/j.ultramic.2019.112845. PMID 31586829. S2CID 203307560.
Jackson, M. A.; Pascal, E.; De Graef, M. (2019). "Dictionary Indexing of Electron Back-Scatter Diffraction Patterns: a Hands-On Tutorial". Integrating Materials and Manufacturing Innovation. 8 (2): 226–246. doi:10.1007/s40192-019-00137-4. S2CID 182073071.
Dingley, D. J.; Randle, V. (1992). "Microtexture determination by electron back-scatter diffraction". Journal of Materials Science. 27 (17): 4545–4566. Bibcode:1992JMatS..27.4545D. doi:10.1007/BF01165988. S2CID 137281137.
Adams, Brent L. (1997). "Orientation imaging microscopy: Emerging and future applications". Ultramicroscopy. Frontiers in Electron Microscopy in Materials Science. 67 (1): 11–17. doi:10.1016/S0304-3991(96)00103-9.
Hielscher, Ralf; Bartel, Felix; Britton, Thomas Benjamin (2019). "Gazing at crystal balls: Electron backscatter diffraction pattern analysis and cross-correlation on the sphere". Ultramicroscopy. 207: 112836. arXiv:1810.03211. doi:10.1016/j.ultramic.2019.112836. PMID 31539865. S2CID 202711517.
Hielscher, R.; Silbermann, C. B.; Schmidl, E.; Ihlemann, Joern (2019). "Denoising of crystal orientation maps". Journal of Applied Crystallography. 52 (5): 984–996. Bibcode:2019JApCr..52..984H. doi:10.1107/s1600576719009075. S2CID 202068671.
Adams, Brent L.; Wright, Stuart I.; Kunze, Karsten (1993). "Orientation imaging: The emergence of a new microscopy". Metallurgical Transactions A. 24 (4): 819–831. Bibcode:1993MTA....24..819A. doi:10.1007/BF02656503. S2CID 137379846.
Prior (1999). "Problems in determining the misorientation axes, for small angular misorientations, using electron backscatter diffraction in the SEM". Journal of Microscopy. 195 (3): 217–225. doi:10.1046/j.1365-2818.1999.00572.x. PMID 10460687. S2CID 10144078.
Humphreys, F. J. (2001). "Review Grain and subgrain characterisation by electron backscatter diffraction". Journal of Materials Science. 36 (16): 3833–3854. doi:10.1023/A:1017973432592. S2CID 135659350.
Wilkinson, Angus J.; Hirsch, Peter B. (1997). "Electron diffraction based techniques in scanning electron microscopy of bulk materials". Micron. 28 (4): 279–308. arXiv:1904.05550. doi:10.1016/S0968-4328(97)00032-2. S2CID 118944816.
Shi, Qiwei; Roux, Stéphane; Latourte, Félix; Hild, François (2019). "Estimation of elastic strain by integrated image correlation on electron diffraction patterns". Ultramicroscopy. 199: 16–33. doi:10.1016/j.ultramic.2019.02.001. PMID 30738984. S2CID 73418370.
Lassen, N. C. Krieger; Jensen, Dorte Juul; Condradsen, K. (1994). "Automatic Recognition of Deformed and Recrystallized Regions in Partly Recrystallized Samples Using Electron Back Scattering Patterns". Materials Science Forum. 157–162: 149–158. doi:10.4028/www.scientific.net/MSF.157-162.149. S2CID 137129038. Archived from the original on 2 March 2023. Retrieved 2 March 2023.
Wilkinson, A. J. (1 January 1997). "Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns". Materials Science and Technology. 13 (1): 79–84. Bibcode:1997MatST..13...79W. doi:10.1179/mst.1997.13.1.79.
Troost, K. Z.; van der Sluis, P.; Gravesteijn, D. J. (1993). "Microscale elastic-strain determination by backscatter Kikuchi diffraction in the scanning electron microscope". Applied Physics Letters. 62 (10): 1110–1112. Bibcode:1993ApPhL..62.1110T. doi:10.1063/1.108758.
Wilkinson, A. J.; Dingley, D. J. (1991). "Quantitative deformation studies using electron back scatter patterns". Acta Metallurgica et Materialia. 39 (12): 3047–3055. doi:10.1016/0956-7151(91)90037-2.
Wilkinson, Angus J. (1996). "Measurement of elastic strains and small lattice rotations using electron back scatter diffraction". Ultramicroscopy. 62 (4): 237–247. doi:10.1016/0304-3991(95)00152-2. PMID 22666906.
Wilkinson, A. J.; Meaden, G.; Dingley, D. J. (1 November 2006). "High resolution mapping of strains and rotations using electron backscatter diffraction". Materials Science and Technology. 22 (11): 1271–1278. Bibcode:2006MatST..22.1271W. doi:10.1179/174328406X130966. S2CID 135875163. Archived from the original on 25 March 2023. Retrieved 20 March 2023.
Wilkinson, Angus J.; Meaden, Graham; Dingley, David J. (2006). "High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity". Ultramicroscopy. 106 (4): 307–313. doi:10.1016/j.ultramic.2005.10.001. PMID 16324788.
Barabash, Rozaliya; Ice, Gene (2013). Strain and Dislocation Gradients from Diffraction. doi:10.1142/p897. ISBN 978-1-908979-62-9.
Britton, T. B.; Wilkinson, A. J. (2012). "High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations". Ultramicroscopy. 114: 82–95. doi:10.1016/j.ultramic.2012.01.004. PMID 22366635.
Wilkinson, Angus J.; Dingley, David J.; Meaden, Graham (2009), Schwartz, Adam J.; Kumar, Mukul; Adams, Brent L.; Field, David P. (eds.), "Strain Mapping Using Electron Backscatter Diffraction", Electron Backscatter Diffraction in Materials Science, Boston, MA: Springer US, pp. 231–249, doi:10.1007/978-0-387-88136-2_17, ISBN 978-0-387-88136-2
Hardin, T.J.; Ruggles, T.J.; Koch, D.P.; Niezgoda, S.R.; Fullwood, D.T.; Homer, E.R. (2015). "Analysis of traction-free assumption in high-resolution EBSD measurements: HR-EBSD TRACTION-FREE ASSUMPTION". Journal of Microscopy. 260 (1): 73–85. doi:10.1111/jmi.12268. PMID 26138919. S2CID 25692536.
Pantleon, W. (1 June 2008). "Resolving the geometrically necessary dislocation content by conventional electron backscattering diffraction". Scripta Materialia. 58 (11): 994–997. doi:10.1016/j.scriptamat.2008.01.050.
Brewer, Luke N.; Field, David P.; Merriman, Colin C. (2009), Schwartz, Adam J.; Kumar, Mukul; Adams, Brent L.; Field, David P. (eds.), "Mapping and Assessing Plastic Deformation Using EBSD", Electron Backscatter Diffraction in Materials Science, Boston, MA: Springer US, pp. 251–262, doi:10.1007/978-0-387-88136-2_18, ISBN 978-0-387-88136-2
Plancher, E.; Petit, J.; Maurice, C.; Favier, V.; Saintoyant, L.; Loisnard, D.; Rupin, N.; Marijon, J.-B.; Ulrich, O.; Bornert, M.; Micha, J.-S.; Robach, O.; Castelnau, O. (1 March 2016). "On the Accuracy of Elastic Strain Field Measurements by Laue Microdiffraction and High-Resolution EBSD: a Cross-Validation Experiment" (PDF). Experimental Mechanics. 56 (3): 483–492. doi:10.1007/s11340-015-0114-1. S2CID 255157494. Archived (PDF) from the original on 13 March 2020. Retrieved 20 March 2023.
Maurice, Claire; Driver, Julian H.; Fortunier, Roland (2012). "On solving the orientation gradient dependency of high angular resolution EBSD". Ultramicroscopy. 113: 171–181. doi:10.1016/j.ultramic.2011.10.013.
Ruggles, T. J.; Bomarito, G. F.; Qiu, R. L.; Hochhalter, J. D. (1 December 2018). "New levels of high angular resolution EBSD performance via inverse compositional Gauss–Newton based digital image correlation". Ultramicroscopy. 195: 85–92. doi:10.1016/j.ultramic.2018.08.020. PMC 7780544. PMID 30216795.
Vermeij, T.; Hoefnagels, J. P. M. (2018). "A consistent full-field integrated DIC framework for HR-EBSD" (PDF). Ultramicroscopy. 191: 44–50. doi:10.1016/j.ultramic.2018.05.001. PMID 29772417. S2CID 21685690. Archived (PDF) from the original on 16 July 2021. Retrieved 20 March 2023.
Ernould, Clément; Beausir, Benoît; Fundenberger, Jean-Jacques; Taupin, Vincent; Bouzy, Emmanuel (2021). "Integrated correction of optical distortions for global HR-EBSD techniques". Ultramicroscopy. 221: 113158. doi:10.1016/j.ultramic.2020.113158. PMID 33338818. S2CID 228997006.
Shi, Qiwei; Loisnard, Dominique; Dan, Chengyi; Zhang, Fengguo; Zhong, Hongru; Li, Han; Li, Yuda; Chen, Zhe; Wang, Haowei; Roux, Stéphane (2021). "Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation" (PDF). Materials Characterization. 178: 111206. doi:10.1016/j.matchar.2021.111206. S2CID 236241507. Archived (PDF) from the original on 25 March 2023. Retrieved 20 March 2023.
Maurice, Claire; Fortunier, Roland; Driver, Julian; Day, Austin; Mingard, Ken; Meaden, Graham (2010). "Comments on the paper "Bragg's law diffraction simulations for electron backscatter diffraction analysis" by Josh Kacher, Colin Landon, Brent L. Adams & David Fullwood". Ultramicroscopy. 110 (7): 758–759. doi:10.1016/j.ultramic.2010.02.003. PMID 20223590.
Wright, Stuart I.; Nowell, Matthew M. (2006). "EBSD Image Quality Mapping". Microscopy and Microanalysis. 12 (1): 72–84. Bibcode:2006MiMic..12...72W. doi:10.1017/s1431927606060090. PMID 17481343. S2CID 35055001.
Jiang, Jun; Zhang, Tiantian; Dunne, Fionn P. E.; Britton, T. Ben (2016). "Deformation compatibility in a single crystalline Ni superalloy". Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences. 472 (2185): 20150690. Bibcode:2016RSPSA.47250690J. doi:10.1098/rspa.2015.0690. PMC 4786046. PMID 26997901.
Mikami, Yoshiki; Oda, Kazuo; Kamaya, Masayuki; Mochizuki, Masahito (2015). "Effect of reference point selection on microscopic stress measurement using EBSD". Materials Science and Engineering: A. 647: 256–264. doi:10.1016/j.msea.2015.09.004.
Koko, A.; Earp, P.; Wigger, T.; Tong, J.; Marrow, T. J. (2020). "J-integral analysis: An EDXD and DIC comparative study for a fatigue crack". International Journal of Fatigue. 134: 105474. doi:10.1016/j.ijfatigue.2020.105474. S2CID 214391445. Archived from the original on 27 January 2021. Retrieved 20 March 2023.
Kacher, Josh; Landon, Colin; Adams, Brent L.; Fullwood, David (1 August 2009). "Bragg's Law diffraction simulations for electron backscatter diffraction analysis". Ultramicroscopy. 109 (9): 1148–1156. doi:10.1016/j.ultramic.2009.04.007. PMID 19520512.
Winkelmann, A; Nolze, G; Vos, M; Salvat-Pujol, F; Werner, W S M (2016). "Physics-based simulation models for EBSD: advances and challenges". IOP Conference Series: Materials Science and Engineering. 109 (1): 012018. arXiv:1505.07982. Bibcode:2016MS&E..109a2018W. doi:10.1088/1757-899x/109/1/012018. S2CID 38586851.
Alkorta, Jon; Marteleur, Matthieu; Jacques, Pascal J. (2017). "Improved simulation based HR-EBSD procedure using image gradient based DIC techniques". Ultramicroscopy. 182: 17–27. doi:10.1016/j.ultramic.2017.06.015. PMID 28644960.
Winkelmann, Aimo; Nolze, Gert; Cios, Grzegorz; Tokarski, Tomasz; Bała, Piotr; Hourahine, Ben; Trager-Cowan, Carol (November 2021). "Kikuchi pattern simulations of backscattered and transmitted electrons" (PDF). Journal of Microscopy. 284 (2): 157–184. doi:10.1111/jmi.13051. PMID 34275156. S2CID 236091618. Archived (PDF) from the original on 25 March 2023. Retrieved 20 March 2023.
Winkelmann, A. (2010). "Principles of depth-resolved Kikuchi pattern simulation for electron backscatter diffraction: KIKUCHI PATTERN SIMULATION FOR EBSD". Journal of Microscopy. 239 (1): 32–45. doi:10.1111/j.1365-2818.2009.03353.x. PMID 20579267. S2CID 23590722.
Vermeij, Tijmen; De Graef, Marc; Hoefnagels, Johan (15 March 2019). "Demonstrating the potential of accurate absolute cross-grain stress and orientation correlation using electron backscatter diffraction". Scripta Materialia. 162: 266–271. arXiv:1807.03908. doi:10.1016/j.scriptamat.2018.11.030. S2CID 54575778.
Tanaka, Tomohito; Wilkinson, Angus J. (1 July 2019). "Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination – accuracy and precision assessment". Ultramicroscopy. 202: 87–99. arXiv:1904.06891. doi:10.1016/j.ultramic.2019.04.006. PMID 31005023. S2CID 119294636.
Kacher, Josh; Basinger, Jay; Adams, Brent L.; Fullwood, David T. (1 June 2010). "Reply to comment by Maurice et al. in response to "Bragg's Law Diffraction Simulations for Electron Backscatter Diffraction Analysis"". Ultramicroscopy. 110 (7): 760–762. doi:10.1016/j.ultramic.2010.02.004. PMID 20189305.
Britton, T. B.; Maurice, C.; Fortunier, R.; Driver, J. H.; Day, A. P.; Meaden, G.; Dingley, D. J.; Mingard, K.; Wilkinson, A. J. (2010). "Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns". Ultramicroscopy. 110 (12): 1443–1453. doi:10.1016/j.ultramic.2010.08.001. PMID 20888125.
Alkorta, Jon (1 August 2013). "Limits of simulation based high resolution EBSD". Ultramicroscopy. 131: 33–38. doi:10.1016/j.ultramic.2013.03.020. PMID 23676453.
Jackson, Brian E.; Christensen, Jordan J.; Singh, Saransh; De Graef, Marc; Fullwood, David T.; Homer, Eric R.; Wagoner, Robert H. (August 2016). "Performance of Dynamically Simulated Reference Patterns for Cross-Correlation Electron Backscatter Diffraction". Microscopy and Microanalysis. 22 (4): 789–802. Bibcode:2016MiMic..22..789J. doi:10.1017/S143192761601148X. PMID 27509538. S2CID 24482631.
Zhang, Tiantian; Collins, David M.; Dunne, Fionn P. E.; Shollock, Barbara A. (2014). "Crystal plasticity and high-resolution electron backscatter diffraction analysis of full-field polycrystal Ni superalloy strains and rotations under thermal loading". Acta Materialia. 80: 25–38. doi:10.1016/j.actamat.2014.07.036. hdl:10044/1/25979.
Guo, Yi; Zong, Cui; Britton, T. B. (2021). "Development of local plasticity around voids during tensile deformation". Materials Science and Engineering: A. 814: 141227. arXiv:2007.11890. doi:10.1016/j.msea.2021.141227. S2CID 234850241.
Jiang, J.; Britton, T. B.; Wilkinson, A. J. (1 November 2013). "Evolution of dislocation density distributions in copper during tensile deformation". Acta Materialia. 61 (19): 7227–7239. Bibcode:2013AcMat..61.7227J. doi:10.1016/j.actamat.2013.08.027.
Britton, T B; Hickey, J L R (2018). "Understanding deformation with high angular resolution electron backscatter diffraction (HR-EBSD)". IOP Conference Series: Materials Science and Engineering. 304 (1): 012003. arXiv:1710.00728. Bibcode:2018MS&E..304a2003B. doi:10.1088/1757-899x/304/1/012003. S2CID 54529072.
Kalácska, Szilvia; Dankházi, Zoltán; Zilahi, Gyula; Maeder, Xavier; Michler, Johann; Ispánovity, Péter Dusán; Groma, István (2020). "Investigation of geometrically necessary dislocation structures in compressed Cu micropillars by 3-dimensional HR-EBSD". Materials Science and Engineering: A. 770: 138499. arXiv:1906.06980. doi:10.1016/j.msea.2019.138499. S2CID 189928469. Archived from the original on 17 July 2020. Retrieved 20 March 2023.
Wallis, David; Hansen, Lars N.; Britton, T. Ben; Wilkinson, Angus J. (2017). "Dislocation Interactions in Olivine Revealed by HR-EBSD: Dislocation Interactions in Olivine". Journal of Geophysical Research: Solid Earth. 122 (10): 7659–7678. doi:10.1002/2017JB014513. hdl:10044/1/50615. S2CID 134570945.
Moussa, C; Bernacki, M; Besnard, R; Bozzolo, N (2015). "About quantitative EBSD analysis of deformation and recovery substructures in pure Tantalum". IOP Conference Series: Materials Science and Engineering. 89 (1): 012038. Bibcode:2015MS&E...89a2038M. doi:10.1088/1757-899x/89/1/012038. S2CID 53137730.
Wright, Stuart I.; Matthew, M. Nowell; David, P. Field. (2011). "A review of strain analysis using electron backscatter diffraction". Microscopy and Microanalysis. 17. 17 (3): 316–329. Bibcode:2011MiMic..17..316W. doi:10.1017/S1431927611000055. PMID 21418731. S2CID 26116915.
Tao, Xiaodong; Eades, Alwyn (2002). "Alternatives to Image Quality (IQ) Mapping in EBSD". Microscopy and Microanalysis. 8 (S02): 692–693. Bibcode:2002MiMic...8S.692T. doi:10.1017/s1431927602106465. S2CID 138999871.
McLean, Mark J.; Osborn, William A. (2018). "In-situ elastic strain mapping during micromechanical testing using EBSD". Ultramicroscopy. 185: 21–26. doi:10.1016/j.ultramic.2017.11.007. PMID 29161620.
Yu, Hongbing; Liu, Junliang; Karamched, Phani; Wilkinson, Angus J.; Hofmann, Felix (2019). "Mapping the full lattice strain tensor of a single dislocation by high angular resolution transmission Kikuchi diffraction (HR-TKD)". Scripta Materialia. 164: 36–41. arXiv:1808.10055. doi:10.1016/j.scriptamat.2018.12.039. S2CID 119075799.
Prior, David J.; Mariani, Elisabetta; Wheeler, John (2009), "EBSD in the Earth Sciences: Applications, Common Practice, and Challenges", Electron Backscatter Diffraction in Materials Science, Boston, MA: Springer US, pp. 345–360, doi:10.1007/978-0-387-88136-2_26, ISBN 978-0-387-88135-5
Choi, Seung; Han, Seokyoung; Lee, Yuong-Nam (2019). Rahman, Imran (ed.). "Electron backscatter diffraction (EBSD) analysis of maniraptoran eggshells with important implications for microstructural and taphonomic interpretations". Palaeontology. 62 (5): 777–803. Bibcode:2019Palgy..62..777C. doi:10.1111/pala.12427. S2CID 182770470.
Wolfe, Kennedy; Smith, Abigail M.; Trimby, Patrick; Byrne, Maria (1 August 2013). "Microstructure of the paper nautilus (Argonauta nodosa) shell and the novel application of electron backscatter diffraction (EBSD) to address effects of ocean acidification". Marine Biology. 160 (8): 2271–2278. Bibcode:2013MarBi.160.2271W. doi:10.1007/s00227-012-2032-4. S2CID 253745873.
Piazolo, S.; Jessell, M. W.; Prior, D. J.; Bons, P. D. (2004). "The integration of experimental in-situ EBSD observations and numerical simulations: a novel technique of microstructural process analysis". Journal of Microscopy. 213 (3): 273–284. doi:10.1111/j.0022-2720.2004.01304.x. PMID 15009695. S2CID 24037204.
Koblischka-Veneva, Anjela; Koblischka, Michael R.; Schmauch, Jörg; Hannig, Matthias (2018). "Human dental enamel: A natural nanotechnology masterpiece investigated by TEM and t-EBSD". Nano Research. 11 (7): 3911–3921. doi:10.1007/s12274-018-1968-1. S2CID 139757769.
Wright, Stuart I.; Nowell, Matthew M.; de Kloe, René; Camus, Patrick; Rampton, Travis (2015). "Electron imaging with an EBSD detector". Ultramicroscopy. 148: 132–145. doi:10.1016/j.ultramic.2014.10.002. PMID 25461590.
Schwarzer, Robert A; Hjelen, Jarle (9 January 2015). "Backscattered Electron Imaging with an EBSD Detector". Microscopy Today. 23 (1): 12–17. doi:10.1017/S1551929514001333. S2CID 138740715.
Tong, Vivian S.; Knowles, Alexander J.; Dye, David; Britton, T. Ben (1 January 2019). "Rapid electron backscatter diffraction mapping: Painting by numbers". Materials Characterization. 147: 271–279. arXiv:1809.07283. doi:10.1016/j.matchar.2018.11.014. S2CID 119328762.
Nolze, G.; Geist, V.; Neumann, R. Saliwan; Buchheim, M. (2005). "Investigation of orientation relationships by EBSD and EDS on the example of the Watson iron meteorite". Crystal Research and Technology. 40 (8): 791–804. Bibcode:2005CryRT..40..791N. doi:10.1002/crat.200410434. S2CID 96785527.
Kell, J.; Tyrer, J. R.; Higginson, R. L.; Thomson, R. C. (2005). "Microstructural characterization of autogenous laser welds on 316L stainless steel using EBSD and EDS". Journal of Microscopy. 217 (2): 167–173. doi:10.1111/j.1365-2818.2005.01447.x. PMID 15683414. S2CID 12285114.
West, G.D.; Thomson, R.C. (2009). "Combined EBSD/EDS tomography in a dual-beam FIB/FEG-SEM". Journal of Microscopy. 233 (3): 442–450. doi:10.1111/j.1365-2818.2009.03138.x. PMID 19250465. S2CID 42955621.
Moser, D. E.; Cupelli, C. L.; Barker, I. R.; Flowers, R. M.; Bowman, J. R.; Wooden, J.; Hart, J.R. (2011). Davis, William J. (ed.). "New zircon shock phenomena and their use for dating and reconstruction of large impact structures revealed by electron nanobeam (EBSD, CL, EDS) and isotopic U–Pb and (U–Th)/He analysis of the Vredefort domeThis article is one of a series of papers published in this Special Issue on the theme of Geochronology in honour of Tom Krogh". Canadian Journal of Earth Sciences. 48 (2): 117–139. Bibcode:2011CaJES..48..117D. doi:10.1139/E11-011.
Laigo, J.; Christien, F.; Le Gall, R.; Tancret, F.; Furtado, J. (2008). "SEM, EDS, EPMA-WDS and EBSD characterization of carbides in HP type heat resistant alloys". Materials Characterization. 59 (11): 1580–1586. doi:10.1016/j.matchar.2008.02.001.
Wisniewski, Wolfgang; Švančárek, Peter; Prnová, Anna; Parchovianský, Milan; Galusek, Dušan (2020). "Y₂O₃–Al₂O₃ microsphere crystallization analyzed by electron backscatter diffraction (EBSD)". Scientific Reports. 10 (1): 11122. Bibcode:2020NatSR..1011122W. doi:10.1038/s41598-020-67816-7. PMC 7338460. PMID 32632218.
Ohfuji, Hiroaki; Yamamoto, Masashi (2015). "EDS quantification of light elements using osmium surface coating". Journal of Mineralogical and Petrological Sciences. 110 (4): 189–195. Bibcode:2015JMPeS.110..189O. doi:10.2465/jmps.141126. S2CID 93672390.
Frahm, Ellery (2014), "Scanning Electron Microscopy (SEM): Applications in Archaeology", Encyclopedia of Global Archaeology, New York, New York: Springer New York, pp. 6487–6495, doi:10.1007/978-1-4419-0465-2_341, ISBN 978-1-4419-0426-3
Stinville, J. C.; Callahan, P. G.; Charpagne, M. A.; Echlin, M. P.; Valle, V.; Pollock, T. M. (2020). "Direct measurements of slip irreversibility in a nickel-based superalloy using high-resolution digital image correlation". Acta Materialia. 186: 172–189. Bibcode:2020AcMat.186..172S. doi:10.1016/j.actamat.2019.12.009. OSTI 1803462. S2CID 213631580.
Charpagne, Marie-Agathe; Strub, Florian; Pollock, Tresa M. (2019). "Accurate reconstruction of EBSD datasets by a multimodal data approach using an evolutionary algorithm". Materials Characterization. 150: 184–198. arXiv:1903.02988. doi:10.1016/j.matchar.2019.01.033. S2CID 71144677.
Zhao, Chong; Stewart, David; Jiang, Jun; Dunne, Fionn P. E. (2018). "A comparative assessment of iron and cobalt-based hard-facing alloy deformation using HR-EBSD and HR-DIC". Acta Materialia. 159: 173–186. Bibcode:2018AcMat.159..173Z. doi:10.1016/j.actamat.2018.08.021. hdl:10044/1/68967. S2CID 139436094.
Orozco-Caballero, Alberto; Jackson, Thomas; da Fonseca, João Quinta (2021). "High-resolution digital image correlation study of the strain localization during loading of a shot-peened RR1000 nickel-based superalloy" (PDF). Acta Materialia. 220: 117306. Bibcode:2021AcMat.22017306O. doi:10.1016/j.actamat.2021.117306. S2CID 240539022. Archived (PDF) from the original on 25 March 2023. Retrieved 20 March 2023.
Ye, Zhenhua; Li, Chuanwei; Zheng, Mengyao; Zhang, Xinyu; Yang, Xudong; Gu, Jianfeng (2022). "In situ EBSD/DIC-based investigation of deformation and fracture mechanism in FCC- and L12-structured FeCoNiV high-entropy alloys". International Journal of Plasticity. 152: 103247. doi:10.1016/j.ijplas.2022.103247. S2CID 246553822.
Hestroffer, Jonathan M.; Stinville, Jean-Charles; Charpagne, Marie-Agathe; Miller, Matthew P.; Pollock, Tresa M.; Beyerlein, Irene J. (2023). "Slip localization behavior at triple junctions in nickel-base superalloys". Acta Materialia. 249: 118801. Bibcode:2023AcMat.24918801H. doi:10.1016/j.actamat.2023.118801. OSTI 2420863. S2CID 257216017.
Sperry, Ryan; Han, Songyang; Chen, Zhe; Daly, Samantha H.; Crimp, Martin A.; Fullwood, David T. (2021). "Comparison of EBSD, DIC, AFM, and ECCI for active slip system identification in deformed Ti-7Al". Materials Characterization. 173: 110941. doi:10.1016/j.matchar.2021.110941. S2CID 233839426.
Gao, Wenjie; Lu, Junxia; Zhou, Jianli; Liu, Ling'en; Wang, Jin; Zhang, Yuefei; Zhang, Ze (2022). "Effect of grain size on deformation and fracture of Inconel718: An in-situ SEM-EBSD-DIC investigation". Materials Science and Engineering: A. 861: 144361. doi:10.1016/j.msea.2022.144361. S2CID 253797056.
Di Gioacchino, Fabio; Quinta da Fonseca, João (2015). "An experimental study of the polycrystalline plasticity of austenitic stainless steel". International Journal of Plasticity. 74: 92–109. doi:10.1016/j.ijplas.2015.05.012.
Mingard, K. P.; Roebuck, B.; Jones, H. G.; Stewart, M.; Cox, D.; Gee, M. G. (2018). "Visualisation and measurement of hardmetal microstructures in 3D". International Journal of Refractory Metals and Hard Materials. 71: 285–291. doi:10.1016/j.ijrmhm.2017.11.023.
Lin, F. X.; Godfrey, A.; Jensen, D. Juul; Winther, G. (2010). "3D EBSD characterization of deformation structures in commercial purity aluminum". Materials Characterization. 61 (11): 1203–1210. doi:10.1016/j.matchar.2010.07.013.
Khorashadizadeh, A.; Raabe, D.; Zaefferer, S.; Rohrer, G. S.; Rollett, A. D.; Winning, M. (2011). "Five-Parameter Grain Boundary Analysis by 3D EBSD of an Ultra Fine Grained CuZr Alloy Processed by Equal Channel Angular Pressing". Advanced Engineering Materials. 13 (4): 237–244. doi:10.1002/adem.201000259. S2CID 18389821.
Tsai, Shao-Pu; Konijnenberg, Peter J.; Gonzalez, Ivan; Hartke, Samuel; Griffiths, Thomas A.; Herbig, Michael; Kawano-Miyata, Kaori; Taniyama, Akira; Sano, Naoyuki; Zaefferer, Stefan (2022). "Development of a new, fully automated system for electron backscatter diffraction (EBSD)-based large volume three-dimensional microstructure mapping using serial sectioning by mechanical polishing, and its application to the analysis of special boundaries in 316L stainless steel". Review of Scientific Instruments. 93 (9): 093707. Bibcode:2022RScI...93i3707T. doi:10.1063/5.0087945. PMID 36182491. S2CID 252628156.
Zaafarani, N.; Raabe, D.; Singh, R. N.; Roters, F.; Zaefferer, S. (2006). "Three-dimensional investigation of the texture and microstructure below a nanoindent in a Cu single crystal using 3D EBSD and crystal plasticity finite element simulations". Acta Materialia. 54 (7): 1863–1876. Bibcode:2006AcMat..54.1863Z. doi:10.1016/j.actamat.2005.12.014. hdl:11858/00-001M-0000-0019-5A14-4.
Hashimoto, Teruo; Thompson, George E.; Zhou, Xiaorong; Withers, Philip J. (2016). "3D imaging by serial block face scanning electron microscopy for materials science using ultramicrotomy". Ultramicroscopy. 163: 6–18. doi:10.1016/j.ultramic.2016.01.005. PMID 26855205.
DeMott, Ryan; Haghdadi, Nima; Kong, Charlie; Gandomkar, Ziba; Kenney, Matthew; Collins, Peter; Primig, Sophie (2021). "3D electron backscatter diffraction characterization of fine α titanium microstructures: collection, reconstruction, and analysis methods". Ultramicroscopy. 230: 113394. doi:10.1016/j.ultramic.2021.113394. PMID 34614440. S2CID 238422160.
Konrad, J.; Zaefferer, S.; Raabe, D. (2006). "Investigation of orientation gradients around a hard Laves particle in a warm-rolled Fe₃Al-based alloy using a 3D EBSD-FIB technique". Acta Materialia. 54 (5): 1369–1380. Bibcode:2006AcMat..54.1369K. doi:10.1016/j.actamat.2005.11.015.
Calcagnotto, Marion; Ponge, Dirk; Demir, Eralp; Raabe, Dierk (2010). "Orientation gradients and geometrically necessary dislocations in ultrafine-grained dual-phase steels studied by 2D and 3D EBSD". Materials Science and Engineering: A. 527 (10): 2738–2746. doi:10.1016/j.msea.2010.01.004.
Gholinia, A.; Brough, I.; Humphreys, J.; McDonald, D.; Bate, P. (2010). "An investigation of dynamic recrystallisation on Cu–Sn bronze using 3D EBSD". Materials Science and Technology. 26 (6): 685–690. Bibcode:2010MatST..26..685G. doi:10.1179/026708309X12547309760966. S2CID 137530768.
Pirgazi, Hadi (2019). "On the alignment of 3D EBSD data collected by serial sectioning technique". Materials Characterization. 152: 223–229. doi:10.1016/j.matchar.2019.04.026. S2CID 149835216.
Winiarski, B.; Gholinia, A.; Mingard, K.; Gee, M.; Thompson, G.; Withers, P. J. (2021). "Correction of artefacts associated with large area EBSD". Ultramicroscopy. 226: 113315. doi:10.1016/j.ultramic.2021.113315. PMID 34049196. S2CID 235241941.
Konijnenberg, P. J.; Zaefferer, S.; Raabe, D. (2015). "Assessment of geometrically necessary dislocation levels derived by 3D EBSD". Acta Materialia. 99: 402–414. Bibcode:2015AcMat..99..402K. doi:10.1016/j.actamat.2015.06.051.

dx.doi.org

Nishikawa, S.; Kikuchi, S. (June 1928). "Diffraction of Cathode Rays by Mica". Nature. 121 (3061): 1019–1020. Bibcode:1928Natur.121.1019N. doi:10.1038/1211019a0. ISSN 0028-0836.

ebsd.info

Lassen, Niels Christian Krieger (1994). Automated Determination of Crystal Orientations from Electron Backscattering Patterns (PDF) (PhD thesis). The Technical University of Denmark. Archived (PDF) from the original on 8 March 2022.

hal.science

Wilkinson, Angus J.; Randman, David (2010). "Determination of elastic strain fields and geometrically necessary dislocation distributions near nanoindents using electron back scatter diffraction" (PDF). Philosophical Magazine. 90 (9): 1159–1177. Bibcode:2010PMag...90.1159W. doi:10.1080/14786430903304145. S2CID 121903030. Archived (PDF) from the original on 3 March 2023. Retrieved 20 March 2023.

handle.net

hdl.handle.net

Britton, T. B.; Jiang, J.; Guo, Y.; Vilalta-Clemente, A.; Wallis, D.; Hansen, L. N.; Winkelmann, A.; Wilkinson, A. J. (2016). "Tutorial: Crystal orientations and EBSD — Or which way is up?". Materials Characterization. 117: 113–126. doi:10.1016/j.matchar.2016.04.008. hdl:10044/1/31250. S2CID 138070296.
Zhang, Tiantian; Collins, David M.; Dunne, Fionn P. E.; Shollock, Barbara A. (2014). "Crystal plasticity and high-resolution electron backscatter diffraction analysis of full-field polycrystal Ni superalloy strains and rotations under thermal loading". Acta Materialia. 80: 25–38. doi:10.1016/j.actamat.2014.07.036. hdl:10044/1/25979.
Wallis, David; Hansen, Lars N.; Britton, T. Ben; Wilkinson, Angus J. (2017). "Dislocation Interactions in Olivine Revealed by HR-EBSD: Dislocation Interactions in Olivine". Journal of Geophysical Research: Solid Earth. 122 (10): 7659–7678. doi:10.1002/2017JB014513. hdl:10044/1/50615. S2CID 134570945.
Zhao, Chong; Stewart, David; Jiang, Jun; Dunne, Fionn P. E. (2018). "A comparative assessment of iron and cobalt-based hard-facing alloy deformation using HR-EBSD and HR-DIC". Acta Materialia. 159: 173–186. Bibcode:2018AcMat.159..173Z. doi:10.1016/j.actamat.2018.08.021. hdl:10044/1/68967. S2CID 139436094.
Zaafarani, N.; Raabe, D.; Singh, R. N.; Roters, F.; Zaefferer, S. (2006). "Three-dimensional investigation of the texture and microstructure below a nanoindent in a Cu single crystal using 3D EBSD and crystal plasticity finite element simulations". Acta Materialia. 54 (7): 1863–1876. Bibcode:2006AcMat..54.1863Z. doi:10.1016/j.actamat.2005.12.014. hdl:11858/00-001M-0000-0019-5A14-4.

harvard.edu

ui.adsabs.harvard.edu

Vespucci, S.; Winkelmann, A.; Naresh-Kumar, G.; Mingard, K. P.; Maneuski, D.; Edwards, P. R.; Day, A. P.; O'Shea, V.; Trager-Cowan, C. (2015). "Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns". Physical Review B. 92 (20): 205301. Bibcode:2015PhRvB..92t5301V. doi:10.1103/PhysRevB.92.205301.
Venables, J. A.; Harland, C. J. (1973). "Electron back-scattering patterns—A new technique for obtaining crystallographic information in the scanning electron microscope". The Philosophical Magazine. 27 (5): 1193–1200. Bibcode:1973PMag...27.1193V. doi:10.1080/14786437308225827.
Goulden, J.; Trimby, P.; Bewick, A. (1 August 2018). "The Benefits and Applications of a CMOS-based EBSD Detector". Microscopy and Microanalysis. 24 (S1): 1128–1129. Bibcode:2018MiMic..24S1128G. doi:10.1017/s1431927618006128. S2CID 139967518.
Sawatzki, Simon; Woodcock, Thomas G.; Güth, Konrad; Müller, Karl-Hartmut; Gutfleisch, Oliver (2015). "Calculation of remanence and degree of texture from EBSD orientation histograms and XRD rocking curves in Nd–Fe–B sintered magnets". Journal of Magnetism and Magnetic Materials. 382: 219–224. Bibcode:2015JMMM..382..219S. doi:10.1016/j.jmmm.2015.01.046.
Nishikawa, S.; Kikuchi, S. (June 1928). "Diffraction of Cathode Rays by Mica". Nature. 121 (3061): 1019–1020. Bibcode:1928Natur.121.1019N. doi:10.1038/1211019a0. ISSN 0028-0836.
Tixier, R.; Waché, C. (1970). "Kossel patterns". Journal of Applied Crystallography. 3 (6): 466–485. Bibcode:1970JApCr...3..466T. doi:10.1107/S0021889870006726.
Alam, M. N.; Blackman, M.; Pashley, D. W. (1954). "High-angle Kikuchi patterns". Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences. 221 (1145): 224–242. Bibcode:1954RSPSA.221..224A. doi:10.1098/rspa.1954.0017. S2CID 97131764.
Koko, Abdalrhaman; Elmukashfi, Elsiddig; Becker, Thorsten H.; Karamched, Phani S.; Wilkinson, Angus J.; Marrow, T. James (2022). "In situ characterisation of the strain fields of intragranular slip bands in ferrite by high-resolution electron backscatter diffraction". Acta Materialia. 239: 118284. Bibcode:2022AcMat.23918284K. doi:10.1016/j.actamat.2022.118284. S2CID 251783802. This article incorporates text from this source, which is available under the CC BY 4.0 license.
Jiang, J.; Britton, T.B.; Wilkinson, A.J. (2013). "Evolution of dislocation density distributions in copper during tensile deformation". Acta Materialia. 61 (19): 7227–7239. Bibcode:2013AcMat..61.7227J. doi:10.1016/j.actamat.2013.08.027.
Koko, Abdalrhaman; Becker, Thorsten H.; Elmukashfi, Elsiddig; Pugno, Nicola M.; Wilkinson, Angus J.; Marrow, T. James (2023). "HR-EBSD analysis of in situ stable crack growth at the micron scale". Journal of the Mechanics and Physics of Solids. 172: 105173. arXiv:2206.10243. Bibcode:2023JMPSo.17205173K. doi:10.1016/j.jmps.2022.105173. S2CID 249889649.
Wilkinson, Angus J.; Randman, David (2010). "Determination of elastic strain fields and geometrically necessary dislocation distributions near nanoindents using electron back scatter diffraction" (PDF). Philosophical Magazine. 90 (9): 1159–1177. Bibcode:2010PMag...90.1159W. doi:10.1080/14786430903304145. S2CID 121903030. Archived (PDF) from the original on 3 March 2023. Retrieved 20 March 2023.
Griffiths, A J V; Walther, T (2010). "Quantification of carbon contamination under electron beam irradiation in a scanning transmission electron microscope and its suppression by plasma cleaning". Journal of Physics: Conference Series. 241 (1): 012017. Bibcode:2010JPhCS.241a2017G. doi:10.1088/1742-6596/241/1/012017. S2CID 250689401.
Koko, Abdalrhaman; Elmukashfi, Elsiddig; Dragnevski, Kalin; Wilkinson, Angus J.; Marrow, Thomas James (2021). "J-integral analysis of the elastic strain fields of ferrite deformation twins using electron backscatter diffraction". Acta Materialia. 218: 117203. Bibcode:2021AcMat.21817203K. doi:10.1016/j.actamat.2021.117203. Archived from the original on 5 July 2022. Retrieved 20 March 2023.
Ren, S. X.; Kenik, E. A.; Alexander, K. B. (1997). "Monte Carlo Simulation of Spatial Resolution for Electron Backscattered Diffraction (EBSD) with Application to Two-Phase Materials". Microscopy and Microanalysis. 3 (S2): 575–576. Bibcode:1997MiMic...3S.575R. doi:10.1017/S1431927600009764. S2CID 137029133. Archived from the original on 25 March 2023. Retrieved 20 March 2023.
Sitzman, Scott; Schmidt, Niels-Henrik; Palomares-Garcia, Alberto; Munoz-Moreno, Rocio; Goulden, Jenny (2015). "Addressing Pseudo-Symmetric Misindexing in EBSD Analysis of γ-TiAl with High Accuracy Band Detection". Microscopy and Microanalysis. 21 (S3): 2037–2038. Bibcode:2015MiMic..21S2037S. doi:10.1017/s143192761501096x. S2CID 51964340.
Lenthe, W.; Singh, S.; De Graef, M. (2019). "Prediction of potential pseudo-symmetry issues in the indexing of electron backscatter diffraction patterns". Journal of Applied Crystallography. 52 (5): 1157–1168. Bibcode:2019JApCr..52.1157L. doi:10.1107/S1600576719011233. OSTI 1575873. S2CID 204108200.
Britton, T. B.; Tong, V. S.; Hickey, J.; Foden, A.; Wilkinson, A. J. (2018). "AstroEBSD: exploring new space in pattern indexing with methods launched from an astronomical approach". Journal of Applied Crystallography. 51 (6): 1525–1534. arXiv:1804.02602. Bibcode:2018JApCr..51.1525B. doi:10.1107/S1600576718010373. S2CID 51687153.
Britton, Thomas Benjamin; Tong, Vivian S.; Hickey, Jim; Foden, Alex; Wilkinson, Angus J. (2018). "AstroEBSD : exploring new space in pattern indexing with methods launched from an astronomical approach". Journal of Applied Crystallography. 51 (6): 1525–1534. arXiv:1804.02602. Bibcode:2018JApCr..51.1525B. doi:10.1107/S1600576718010373. S2CID 51687153.
Dingley, D. J.; Randle, V. (1992). "Microtexture determination by electron back-scatter diffraction". Journal of Materials Science. 27 (17): 4545–4566. Bibcode:1992JMatS..27.4545D. doi:10.1007/BF01165988. S2CID 137281137.
Hielscher, R.; Silbermann, C. B.; Schmidl, E.; Ihlemann, Joern (2019). "Denoising of crystal orientation maps". Journal of Applied Crystallography. 52 (5): 984–996. Bibcode:2019JApCr..52..984H. doi:10.1107/s1600576719009075. S2CID 202068671.
Adams, Brent L.; Wright, Stuart I.; Kunze, Karsten (1993). "Orientation imaging: The emergence of a new microscopy". Metallurgical Transactions A. 24 (4): 819–831. Bibcode:1993MTA....24..819A. doi:10.1007/BF02656503. S2CID 137379846.
Wilkinson, A. J. (1 January 1997). "Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns". Materials Science and Technology. 13 (1): 79–84. Bibcode:1997MatST..13...79W. doi:10.1179/mst.1997.13.1.79.
Troost, K. Z.; van der Sluis, P.; Gravesteijn, D. J. (1993). "Microscale elastic-strain determination by backscatter Kikuchi diffraction in the scanning electron microscope". Applied Physics Letters. 62 (10): 1110–1112. Bibcode:1993ApPhL..62.1110T. doi:10.1063/1.108758.
Wilkinson, A. J.; Meaden, G.; Dingley, D. J. (1 November 2006). "High resolution mapping of strains and rotations using electron backscatter diffraction". Materials Science and Technology. 22 (11): 1271–1278. Bibcode:2006MatST..22.1271W. doi:10.1179/174328406X130966. S2CID 135875163. Archived from the original on 25 March 2023. Retrieved 20 March 2023.
Wright, Stuart I.; Nowell, Matthew M. (2006). "EBSD Image Quality Mapping". Microscopy and Microanalysis. 12 (1): 72–84. Bibcode:2006MiMic..12...72W. doi:10.1017/s1431927606060090. PMID 17481343. S2CID 35055001.
Jiang, Jun; Zhang, Tiantian; Dunne, Fionn P. E.; Britton, T. Ben (2016). "Deformation compatibility in a single crystalline Ni superalloy". Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences. 472 (2185): 20150690. Bibcode:2016RSPSA.47250690J. doi:10.1098/rspa.2015.0690. PMC 4786046. PMID 26997901.
Winkelmann, A; Nolze, G; Vos, M; Salvat-Pujol, F; Werner, W S M (2016). "Physics-based simulation models for EBSD: advances and challenges". IOP Conference Series: Materials Science and Engineering. 109 (1): 012018. arXiv:1505.07982. Bibcode:2016MS&E..109a2018W. doi:10.1088/1757-899x/109/1/012018. S2CID 38586851.
Jackson, Brian E.; Christensen, Jordan J.; Singh, Saransh; De Graef, Marc; Fullwood, David T.; Homer, Eric R.; Wagoner, Robert H. (August 2016). "Performance of Dynamically Simulated Reference Patterns for Cross-Correlation Electron Backscatter Diffraction". Microscopy and Microanalysis. 22 (4): 789–802. Bibcode:2016MiMic..22..789J. doi:10.1017/S143192761601148X. PMID 27509538. S2CID 24482631.
Jiang, J.; Britton, T. B.; Wilkinson, A. J. (1 November 2013). "Evolution of dislocation density distributions in copper during tensile deformation". Acta Materialia. 61 (19): 7227–7239. Bibcode:2013AcMat..61.7227J. doi:10.1016/j.actamat.2013.08.027.
Britton, T B; Hickey, J L R (2018). "Understanding deformation with high angular resolution electron backscatter diffraction (HR-EBSD)". IOP Conference Series: Materials Science and Engineering. 304 (1): 012003. arXiv:1710.00728. Bibcode:2018MS&E..304a2003B. doi:10.1088/1757-899x/304/1/012003. S2CID 54529072.
Moussa, C; Bernacki, M; Besnard, R; Bozzolo, N (2015). "About quantitative EBSD analysis of deformation and recovery substructures in pure Tantalum". IOP Conference Series: Materials Science and Engineering. 89 (1): 012038. Bibcode:2015MS&E...89a2038M. doi:10.1088/1757-899x/89/1/012038. S2CID 53137730.
Wright, Stuart I.; Matthew, M. Nowell; David, P. Field. (2011). "A review of strain analysis using electron backscatter diffraction". Microscopy and Microanalysis. 17. 17 (3): 316–329. Bibcode:2011MiMic..17..316W. doi:10.1017/S1431927611000055. PMID 21418731. S2CID 26116915.
Tao, Xiaodong; Eades, Alwyn (2002). "Alternatives to Image Quality (IQ) Mapping in EBSD". Microscopy and Microanalysis. 8 (S02): 692–693. Bibcode:2002MiMic...8S.692T. doi:10.1017/s1431927602106465. S2CID 138999871.
Choi, Seung; Han, Seokyoung; Lee, Yuong-Nam (2019). Rahman, Imran (ed.). "Electron backscatter diffraction (EBSD) analysis of maniraptoran eggshells with important implications for microstructural and taphonomic interpretations". Palaeontology. 62 (5): 777–803. Bibcode:2019Palgy..62..777C. doi:10.1111/pala.12427. S2CID 182770470.
Wolfe, Kennedy; Smith, Abigail M.; Trimby, Patrick; Byrne, Maria (1 August 2013). "Microstructure of the paper nautilus (Argonauta nodosa) shell and the novel application of electron backscatter diffraction (EBSD) to address effects of ocean acidification". Marine Biology. 160 (8): 2271–2278. Bibcode:2013MarBi.160.2271W. doi:10.1007/s00227-012-2032-4. S2CID 253745873.
Nolze, G.; Geist, V.; Neumann, R. Saliwan; Buchheim, M. (2005). "Investigation of orientation relationships by EBSD and EDS on the example of the Watson iron meteorite". Crystal Research and Technology. 40 (8): 791–804. Bibcode:2005CryRT..40..791N. doi:10.1002/crat.200410434. S2CID 96785527.
Moser, D. E.; Cupelli, C. L.; Barker, I. R.; Flowers, R. M.; Bowman, J. R.; Wooden, J.; Hart, J.R. (2011). Davis, William J. (ed.). "New zircon shock phenomena and their use for dating and reconstruction of large impact structures revealed by electron nanobeam (EBSD, CL, EDS) and isotopic U–Pb and (U–Th)/He analysis of the Vredefort domeThis article is one of a series of papers published in this Special Issue on the theme of Geochronology in honour of Tom Krogh". Canadian Journal of Earth Sciences. 48 (2): 117–139. Bibcode:2011CaJES..48..117D. doi:10.1139/E11-011.
Wisniewski, Wolfgang; Švančárek, Peter; Prnová, Anna; Parchovianský, Milan; Galusek, Dušan (2020). "Y₂O₃–Al₂O₃ microsphere crystallization analyzed by electron backscatter diffraction (EBSD)". Scientific Reports. 10 (1): 11122. Bibcode:2020NatSR..1011122W. doi:10.1038/s41598-020-67816-7. PMC 7338460. PMID 32632218.
Ohfuji, Hiroaki; Yamamoto, Masashi (2015). "EDS quantification of light elements using osmium surface coating". Journal of Mineralogical and Petrological Sciences. 110 (4): 189–195. Bibcode:2015JMPeS.110..189O. doi:10.2465/jmps.141126. S2CID 93672390.
Stinville, J. C.; Callahan, P. G.; Charpagne, M. A.; Echlin, M. P.; Valle, V.; Pollock, T. M. (2020). "Direct measurements of slip irreversibility in a nickel-based superalloy using high-resolution digital image correlation". Acta Materialia. 186: 172–189. Bibcode:2020AcMat.186..172S. doi:10.1016/j.actamat.2019.12.009. OSTI 1803462. S2CID 213631580.
Zhao, Chong; Stewart, David; Jiang, Jun; Dunne, Fionn P. E. (2018). "A comparative assessment of iron and cobalt-based hard-facing alloy deformation using HR-EBSD and HR-DIC". Acta Materialia. 159: 173–186. Bibcode:2018AcMat.159..173Z. doi:10.1016/j.actamat.2018.08.021. hdl:10044/1/68967. S2CID 139436094.
Orozco-Caballero, Alberto; Jackson, Thomas; da Fonseca, João Quinta (2021). "High-resolution digital image correlation study of the strain localization during loading of a shot-peened RR1000 nickel-based superalloy" (PDF). Acta Materialia. 220: 117306. Bibcode:2021AcMat.22017306O. doi:10.1016/j.actamat.2021.117306. S2CID 240539022. Archived (PDF) from the original on 25 March 2023. Retrieved 20 March 2023.
Hestroffer, Jonathan M.; Stinville, Jean-Charles; Charpagne, Marie-Agathe; Miller, Matthew P.; Pollock, Tresa M.; Beyerlein, Irene J. (2023). "Slip localization behavior at triple junctions in nickel-base superalloys". Acta Materialia. 249: 118801. Bibcode:2023AcMat.24918801H. doi:10.1016/j.actamat.2023.118801. OSTI 2420863. S2CID 257216017.
Tsai, Shao-Pu; Konijnenberg, Peter J.; Gonzalez, Ivan; Hartke, Samuel; Griffiths, Thomas A.; Herbig, Michael; Kawano-Miyata, Kaori; Taniyama, Akira; Sano, Naoyuki; Zaefferer, Stefan (2022). "Development of a new, fully automated system for electron backscatter diffraction (EBSD)-based large volume three-dimensional microstructure mapping using serial sectioning by mechanical polishing, and its application to the analysis of special boundaries in 316L stainless steel". Review of Scientific Instruments. 93 (9): 093707. Bibcode:2022RScI...93i3707T. doi:10.1063/5.0087945. PMID 36182491. S2CID 252628156.
Zaafarani, N.; Raabe, D.; Singh, R. N.; Roters, F.; Zaefferer, S. (2006). "Three-dimensional investigation of the texture and microstructure below a nanoindent in a Cu single crystal using 3D EBSD and crystal plasticity finite element simulations". Acta Materialia. 54 (7): 1863–1876. Bibcode:2006AcMat..54.1863Z. doi:10.1016/j.actamat.2005.12.014. hdl:11858/00-001M-0000-0019-5A14-4.
Konrad, J.; Zaefferer, S.; Raabe, D. (2006). "Investigation of orientation gradients around a hard Laves particle in a warm-rolled Fe₃Al-based alloy using a 3D EBSD-FIB technique". Acta Materialia. 54 (5): 1369–1380. Bibcode:2006AcMat..54.1369K. doi:10.1016/j.actamat.2005.11.015.
Gholinia, A.; Brough, I.; Humphreys, J.; McDonald, D.; Bate, P. (2010). "An investigation of dynamic recrystallisation on Cu–Sn bronze using 3D EBSD". Materials Science and Technology. 26 (6): 685–690. Bibcode:2010MatST..26..685G. doi:10.1179/026708309X12547309760966. S2CID 137530768.
Konijnenberg, P. J.; Zaefferer, S.; Raabe, D. (2015). "Assessment of geometrically necessary dislocation levels derived by 3D EBSD". Acta Materialia. 99: 402–414. Bibcode:2015AcMat..99..402K. doi:10.1016/j.actamat.2015.06.051.

iucr.org

journals.iucr.org

Lenthe, W.; Singh, S.; De Graef, M. (2019). "Prediction of potential pseudo-symmetry issues in the indexing of electron backscatter diffraction patterns". Journal of Applied Crystallography. 52 (5): 1157–1168. Bibcode:2019JApCr..52.1157L. doi:10.1107/S1600576719011233. OSTI 1575873. S2CID 204108200.
Britton, T. B.; Tong, V. S.; Hickey, J.; Foden, A.; Wilkinson, A. J. (2018). "AstroEBSD: exploring new space in pattern indexing with methods launched from an astronomical approach". Journal of Applied Crystallography. 51 (6): 1525–1534. arXiv:1804.02602. Bibcode:2018JApCr..51.1525B. doi:10.1107/S1600576718010373. S2CID 51687153.

manchester.ac.uk

pure.manchester.ac.uk

Orozco-Caballero, Alberto; Jackson, Thomas; da Fonseca, João Quinta (2021). "High-resolution digital image correlation study of the strain localization during loading of a shot-peened RR1000 nickel-based superalloy" (PDF). Acta Materialia. 220: 117306. Bibcode:2021AcMat.22017306O. doi:10.1016/j.actamat.2021.117306. S2CID 240539022. Archived (PDF) from the original on 25 March 2023. Retrieved 20 March 2023.

mit.edu

news.mit.edu

"New technique provides detailed views of metals' crystal structure". MIT News | Massachusetts Institute of Technology. 6 July 2016. Archived from the original on 2 March 2023.

nih.gov

pubmed.ncbi.nlm.nih.gov

Koko, Abdalrhaman; Tong, Vivian; Wilkinson, Angus J.; Marrow, T. James (2023). "An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)". Ultramicroscopy. 248: 113705. arXiv:2206.10242. doi:10.1016/j.ultramic.2023.113705. PMID 36871367. S2CID 249889699. This article incorporates text from this source, which is available under the CC BY 4.0 license.
Winkelmann, Aimo; Nolze, Gert (2010). "Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of silicon". Ultramicroscopy. 110 (3): 190–194. doi:10.1016/j.ultramic.2009.11.008. PMID 20005045.
Chen, Delphic; Kuo, Jui-Chao; Wu, Wen-Tuan (2011). "Effect of microscopic parameters on EBSD spatial resolution". Ultramicroscopy. 111 (9): 1488–1494. doi:10.1016/j.ultramic.2011.06.007. PMID 21930021.
Britton, T.B.; Jiang, J.; Clough, R.; Tarleton, E.; Kirkland, A.I.; Wilkinson, A.J. (2013). "Assessing the precision of strain measurements using electron backscatter diffraction – Part 2: Experimental demonstration". Ultramicroscopy. 135: 136–141. doi:10.1016/j.ultramic.2013.08.006. PMID 24034981.
Piňos, J.; Mikmeková, Š.; Frank, L. (2017). "About the information depth of backscattered electron imaging". Journal of Microscopy. 266 (3): 335–342. doi:10.1111/jmi.12542. PMID 28248420. S2CID 35266526.
Zaefferer, S. (2007). "On the formation mechanisms, spatial resolution and intensity of backscatter Kikuchi patterns". Ultramicroscopy. 107 (2): 254–266. doi:10.1016/j.ultramic.2006.08.007. PMID 17055170.
Dingley, D. (2004). "Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy: EBSD AND OIM". Journal of Microscopy. 213 (3): 214–224. doi:10.1111/j.0022-2720.2004.01321.x. PMID 15009688. S2CID 41385346.
Zhu, Chaoyi; De Graef, Marc (2020). "EBSD pattern simulations for an interaction volume containing lattice defects". Ultramicroscopy. 218: 113088. doi:10.1016/j.ultramic.2020.113088. PMID 32784084. S2CID 221123906.
Wright, Stuart I.; Nowell, Matthew M.; Lindeman, Scott P.; Camus, Patrick P.; De Graef, Marc; Jackson, Michael A. (2015). "Introduction and comparison of new EBSD post-processing methodologies". Ultramicroscopy. 159: 81–94. doi:10.1016/j.ultramic.2015.08.001. PMID 26342553.
Winkelmann, Aimo; Trager-Cowan, Carol; Sweeney, Francis; Day, Austin P.; Parbrook, Peter (2007). "Many-beam dynamical simulation of electron backscatter diffraction patterns". Ultramicroscopy. 107 (4): 414–421. doi:10.1016/j.ultramic.2006.10.006. PMID 17126489.
Pang, Edward L.; Larsen, Peter M.; Schuh, Christopher A. (2020). "Global optimization for accurate determination of EBSD pattern centers". Ultramicroscopy. 209: 112876. arXiv:1908.10692. doi:10.1016/j.ultramic.2019.112876. PMID 31707232. S2CID 201651309.
Tanaka, Tomohito; Wilkinson, Angus J. (1 July 2019). "Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination – accuracy and precision assessment". Ultramicroscopy. 202: 87–99. arXiv:1904.06891. doi:10.1016/j.ultramic.2019.04.006. PMID 31005023. S2CID 119294636.
Foden, A.; Collins, D.M.; Wilkinson, A.J.; Britton, T.B. (2019). "Indexing electron backscatter diffraction patterns with a refined template matching approach". Ultramicroscopy. 207: 112845. arXiv:1807.11313. doi:10.1016/j.ultramic.2019.112845. PMID 31586829. S2CID 203307560.
Hielscher, Ralf; Bartel, Felix; Britton, Thomas Benjamin (2019). "Gazing at crystal balls: Electron backscatter diffraction pattern analysis and cross-correlation on the sphere". Ultramicroscopy. 207: 112836. arXiv:1810.03211. doi:10.1016/j.ultramic.2019.112836. PMID 31539865. S2CID 202711517.
Prior (1999). "Problems in determining the misorientation axes, for small angular misorientations, using electron backscatter diffraction in the SEM". Journal of Microscopy. 195 (3): 217–225. doi:10.1046/j.1365-2818.1999.00572.x. PMID 10460687. S2CID 10144078.
Shi, Qiwei; Roux, Stéphane; Latourte, Félix; Hild, François (2019). "Estimation of elastic strain by integrated image correlation on electron diffraction patterns". Ultramicroscopy. 199: 16–33. doi:10.1016/j.ultramic.2019.02.001. PMID 30738984. S2CID 73418370.
Wilkinson, Angus J. (1996). "Measurement of elastic strains and small lattice rotations using electron back scatter diffraction". Ultramicroscopy. 62 (4): 237–247. doi:10.1016/0304-3991(95)00152-2. PMID 22666906.
Wilkinson, Angus J.; Meaden, Graham; Dingley, David J. (2006). "High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity". Ultramicroscopy. 106 (4): 307–313. doi:10.1016/j.ultramic.2005.10.001. PMID 16324788.
Britton, T. B.; Wilkinson, A. J. (2012). "High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations". Ultramicroscopy. 114: 82–95. doi:10.1016/j.ultramic.2012.01.004. PMID 22366635.
Hardin, T.J.; Ruggles, T.J.; Koch, D.P.; Niezgoda, S.R.; Fullwood, D.T.; Homer, E.R. (2015). "Analysis of traction-free assumption in high-resolution EBSD measurements: HR-EBSD TRACTION-FREE ASSUMPTION". Journal of Microscopy. 260 (1): 73–85. doi:10.1111/jmi.12268. PMID 26138919. S2CID 25692536.
Ruggles, T. J.; Bomarito, G. F.; Qiu, R. L.; Hochhalter, J. D. (1 December 2018). "New levels of high angular resolution EBSD performance via inverse compositional Gauss–Newton based digital image correlation". Ultramicroscopy. 195: 85–92. doi:10.1016/j.ultramic.2018.08.020. PMC 7780544. PMID 30216795.
Vermeij, T.; Hoefnagels, J. P. M. (2018). "A consistent full-field integrated DIC framework for HR-EBSD" (PDF). Ultramicroscopy. 191: 44–50. doi:10.1016/j.ultramic.2018.05.001. PMID 29772417. S2CID 21685690. Archived (PDF) from the original on 16 July 2021. Retrieved 20 March 2023.
Ernould, Clément; Beausir, Benoît; Fundenberger, Jean-Jacques; Taupin, Vincent; Bouzy, Emmanuel (2021). "Integrated correction of optical distortions for global HR-EBSD techniques". Ultramicroscopy. 221: 113158. doi:10.1016/j.ultramic.2020.113158. PMID 33338818. S2CID 228997006.
Maurice, Claire; Fortunier, Roland; Driver, Julian; Day, Austin; Mingard, Ken; Meaden, Graham (2010). "Comments on the paper "Bragg's law diffraction simulations for electron backscatter diffraction analysis" by Josh Kacher, Colin Landon, Brent L. Adams & David Fullwood". Ultramicroscopy. 110 (7): 758–759. doi:10.1016/j.ultramic.2010.02.003. PMID 20223590.
Wright, Stuart I.; Nowell, Matthew M. (2006). "EBSD Image Quality Mapping". Microscopy and Microanalysis. 12 (1): 72–84. Bibcode:2006MiMic..12...72W. doi:10.1017/s1431927606060090. PMID 17481343. S2CID 35055001.
Jiang, Jun; Zhang, Tiantian; Dunne, Fionn P. E.; Britton, T. Ben (2016). "Deformation compatibility in a single crystalline Ni superalloy". Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences. 472 (2185): 20150690. Bibcode:2016RSPSA.47250690J. doi:10.1098/rspa.2015.0690. PMC 4786046. PMID 26997901.
Kacher, Josh; Landon, Colin; Adams, Brent L.; Fullwood, David (1 August 2009). "Bragg's Law diffraction simulations for electron backscatter diffraction analysis". Ultramicroscopy. 109 (9): 1148–1156. doi:10.1016/j.ultramic.2009.04.007. PMID 19520512.
Alkorta, Jon; Marteleur, Matthieu; Jacques, Pascal J. (2017). "Improved simulation based HR-EBSD procedure using image gradient based DIC techniques". Ultramicroscopy. 182: 17–27. doi:10.1016/j.ultramic.2017.06.015. PMID 28644960.
Winkelmann, Aimo; Nolze, Gert; Cios, Grzegorz; Tokarski, Tomasz; Bała, Piotr; Hourahine, Ben; Trager-Cowan, Carol (November 2021). "Kikuchi pattern simulations of backscattered and transmitted electrons" (PDF). Journal of Microscopy. 284 (2): 157–184. doi:10.1111/jmi.13051. PMID 34275156. S2CID 236091618. Archived (PDF) from the original on 25 March 2023. Retrieved 20 March 2023.
Winkelmann, A. (2010). "Principles of depth-resolved Kikuchi pattern simulation for electron backscatter diffraction: KIKUCHI PATTERN SIMULATION FOR EBSD". Journal of Microscopy. 239 (1): 32–45. doi:10.1111/j.1365-2818.2009.03353.x. PMID 20579267. S2CID 23590722.
Tanaka, Tomohito; Wilkinson, Angus J. (1 July 2019). "Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination – accuracy and precision assessment". Ultramicroscopy. 202: 87–99. arXiv:1904.06891. doi:10.1016/j.ultramic.2019.04.006. PMID 31005023. S2CID 119294636.
Kacher, Josh; Basinger, Jay; Adams, Brent L.; Fullwood, David T. (1 June 2010). "Reply to comment by Maurice et al. in response to "Bragg's Law Diffraction Simulations for Electron Backscatter Diffraction Analysis"". Ultramicroscopy. 110 (7): 760–762. doi:10.1016/j.ultramic.2010.02.004. PMID 20189305.
Britton, T. B.; Maurice, C.; Fortunier, R.; Driver, J. H.; Day, A. P.; Meaden, G.; Dingley, D. J.; Mingard, K.; Wilkinson, A. J. (2010). "Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns". Ultramicroscopy. 110 (12): 1443–1453. doi:10.1016/j.ultramic.2010.08.001. PMID 20888125.
Alkorta, Jon (1 August 2013). "Limits of simulation based high resolution EBSD". Ultramicroscopy. 131: 33–38. doi:10.1016/j.ultramic.2013.03.020. PMID 23676453.
Jackson, Brian E.; Christensen, Jordan J.; Singh, Saransh; De Graef, Marc; Fullwood, David T.; Homer, Eric R.; Wagoner, Robert H. (August 2016). "Performance of Dynamically Simulated Reference Patterns for Cross-Correlation Electron Backscatter Diffraction". Microscopy and Microanalysis. 22 (4): 789–802. Bibcode:2016MiMic..22..789J. doi:10.1017/S143192761601148X. PMID 27509538. S2CID 24482631.
Wright, Stuart I.; Matthew, M. Nowell; David, P. Field. (2011). "A review of strain analysis using electron backscatter diffraction". Microscopy and Microanalysis. 17. 17 (3): 316–329. Bibcode:2011MiMic..17..316W. doi:10.1017/S1431927611000055. PMID 21418731. S2CID 26116915.
McLean, Mark J.; Osborn, William A. (2018). "In-situ elastic strain mapping during micromechanical testing using EBSD". Ultramicroscopy. 185: 21–26. doi:10.1016/j.ultramic.2017.11.007. PMID 29161620.
Piazolo, S.; Jessell, M. W.; Prior, D. J.; Bons, P. D. (2004). "The integration of experimental in-situ EBSD observations and numerical simulations: a novel technique of microstructural process analysis". Journal of Microscopy. 213 (3): 273–284. doi:10.1111/j.0022-2720.2004.01304.x. PMID 15009695. S2CID 24037204.
Wright, Stuart I.; Nowell, Matthew M.; de Kloe, René; Camus, Patrick; Rampton, Travis (2015). "Electron imaging with an EBSD detector". Ultramicroscopy. 148: 132–145. doi:10.1016/j.ultramic.2014.10.002. PMID 25461590.
Kell, J.; Tyrer, J. R.; Higginson, R. L.; Thomson, R. C. (2005). "Microstructural characterization of autogenous laser welds on 316L stainless steel using EBSD and EDS". Journal of Microscopy. 217 (2): 167–173. doi:10.1111/j.1365-2818.2005.01447.x. PMID 15683414. S2CID 12285114.
West, G.D.; Thomson, R.C. (2009). "Combined EBSD/EDS tomography in a dual-beam FIB/FEG-SEM". Journal of Microscopy. 233 (3): 442–450. doi:10.1111/j.1365-2818.2009.03138.x. PMID 19250465. S2CID 42955621.
Wisniewski, Wolfgang; Švančárek, Peter; Prnová, Anna; Parchovianský, Milan; Galusek, Dušan (2020). "Y₂O₃–Al₂O₃ microsphere crystallization analyzed by electron backscatter diffraction (EBSD)". Scientific Reports. 10 (1): 11122. Bibcode:2020NatSR..1011122W. doi:10.1038/s41598-020-67816-7. PMC 7338460. PMID 32632218.
Tsai, Shao-Pu; Konijnenberg, Peter J.; Gonzalez, Ivan; Hartke, Samuel; Griffiths, Thomas A.; Herbig, Michael; Kawano-Miyata, Kaori; Taniyama, Akira; Sano, Naoyuki; Zaefferer, Stefan (2022). "Development of a new, fully automated system for electron backscatter diffraction (EBSD)-based large volume three-dimensional microstructure mapping using serial sectioning by mechanical polishing, and its application to the analysis of special boundaries in 316L stainless steel". Review of Scientific Instruments. 93 (9): 093707. Bibcode:2022RScI...93i3707T. doi:10.1063/5.0087945. PMID 36182491. S2CID 252628156.
Hashimoto, Teruo; Thompson, George E.; Zhou, Xiaorong; Withers, Philip J. (2016). "3D imaging by serial block face scanning electron microscopy for materials science using ultramicrotomy". Ultramicroscopy. 163: 6–18. doi:10.1016/j.ultramic.2016.01.005. PMID 26855205.
DeMott, Ryan; Haghdadi, Nima; Kong, Charlie; Gandomkar, Ziba; Kenney, Matthew; Collins, Peter; Primig, Sophie (2021). "3D electron backscatter diffraction characterization of fine α titanium microstructures: collection, reconstruction, and analysis methods". Ultramicroscopy. 230: 113394. doi:10.1016/j.ultramic.2021.113394. PMID 34614440. S2CID 238422160.
Winiarski, B.; Gholinia, A.; Mingard, K.; Gee, M.; Thompson, G.; Withers, P. J. (2021). "Correction of artefacts associated with large area EBSD". Ultramicroscopy. 226: 113315. doi:10.1016/j.ultramic.2021.113315. PMID 34049196. S2CID 235241941.

ncbi.nlm.nih.gov

Ruggles, T. J.; Bomarito, G. F.; Qiu, R. L.; Hochhalter, J. D. (1 December 2018). "New levels of high angular resolution EBSD performance via inverse compositional Gauss–Newton based digital image correlation". Ultramicroscopy. 195: 85–92. doi:10.1016/j.ultramic.2018.08.020. PMC 7780544. PMID 30216795.
Jiang, Jun; Zhang, Tiantian; Dunne, Fionn P. E.; Britton, T. Ben (2016). "Deformation compatibility in a single crystalline Ni superalloy". Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences. 472 (2185): 20150690. Bibcode:2016RSPSA.47250690J. doi:10.1098/rspa.2015.0690. PMC 4786046. PMID 26997901.
Wisniewski, Wolfgang; Švančárek, Peter; Prnová, Anna; Parchovianský, Milan; Galusek, Dušan (2020). "Y₂O₃–Al₂O₃ microsphere crystallization analyzed by electron backscatter diffraction (EBSD)". Scientific Reports. 10 (1): 11122. Bibcode:2020NatSR..1011122W. doi:10.1038/s41598-020-67816-7. PMC 7338460. PMID 32632218.

osti.gov

Schwarzer, Robert A.; Field, David P.; Adams, Brent L.; Kumar, Mukul; Schwartz, Adam J. (2009), Schwartz, Adam J.; Kumar, Mukul; Adams, Brent L.; Field, David P. (eds.), "Present State of Electron Backscatter Diffraction and Prospective Developments", Electron Backscatter Diffraction in Materials Science, Boston, MA: Springer US, pp. 1–20, doi:10.1007/978-0-387-88136-2_1, ISBN 978-0-387-88136-2, OSTI 964094
Lenthe, W.; Singh, S.; De Graef, M. (2019). "Prediction of potential pseudo-symmetry issues in the indexing of electron backscatter diffraction patterns". Journal of Applied Crystallography. 52 (5): 1157–1168. Bibcode:2019JApCr..52.1157L. doi:10.1107/S1600576719011233. OSTI 1575873. S2CID 204108200.
Stinville, J. C.; Callahan, P. G.; Charpagne, M. A.; Echlin, M. P.; Valle, V.; Pollock, T. M. (2020). "Direct measurements of slip irreversibility in a nickel-based superalloy using high-resolution digital image correlation". Acta Materialia. 186: 172–189. Bibcode:2020AcMat.186..172S. doi:10.1016/j.actamat.2019.12.009. OSTI 1803462. S2CID 213631580.
Hestroffer, Jonathan M.; Stinville, Jean-Charles; Charpagne, Marie-Agathe; Miller, Matthew P.; Pollock, Tresa M.; Beyerlein, Irene J. (2023). "Slip localization behavior at triple junctions in nickel-base superalloys". Acta Materialia. 249: 118801. Bibcode:2023AcMat.24918801H. doi:10.1016/j.actamat.2023.118801. OSTI 2420863. S2CID 257216017.

ox.ac.uk

ora.ox.ac.uk

Koko, A. Mohamed (2022). In situ full-field characterisation of strain concentrations (deformation twins, slip bands and cracks) (PhD thesis). University of Oxford. Archived from the original on 1 February 2023. This article incorporates text from this source, which is available under the CC BY 4.0 license.
Koko, Abdalrhaman; Elmukashfi, Elsiddig; Dragnevski, Kalin; Wilkinson, Angus J.; Marrow, Thomas James (2021). "J-integral analysis of the elastic strain fields of ferrite deformation twins using electron backscatter diffraction". Acta Materialia. 218: 117203. Bibcode:2021AcMat.21817203K. doi:10.1016/j.actamat.2021.117203. Archived from the original on 5 July 2022. Retrieved 20 March 2023.
Wilkinson, A. J.; Meaden, G.; Dingley, D. J. (1 November 2006). "High resolution mapping of strains and rotations using electron backscatter diffraction". Materials Science and Technology. 22 (11): 1271–1278. Bibcode:2006MatST..22.1271W. doi:10.1179/174328406X130966. S2CID 135875163. Archived from the original on 25 March 2023. Retrieved 20 March 2023.
Wallis, David; Hansen, Lars N.; Britton, T. Ben; Wilkinson, Angus J. (2017). "Dislocation Interactions in Olivine Revealed by HR-EBSD: Dislocation Interactions in Olivine". Journal of Geophysical Research: Solid Earth. 122 (10): 7659–7678. doi:10.1002/2017JB014513. hdl:10044/1/50615. S2CID 134570945.

physicsworld.com

"Uncovering the tiny defects that make materials fail". Physics World. 29 November 2022. Archived from the original on 3 March 2023.

port.ac.uk

researchportal.port.ac.uk

Koko, A.; Earp, P.; Wigger, T.; Tong, J.; Marrow, T. J. (2020). "J-integral analysis: An EDXD and DIC comparative study for a fatigue crack". International Journal of Fatigue. 134: 105474. doi:10.1016/j.ijfatigue.2020.105474. S2CID 214391445. Archived from the original on 27 January 2021. Retrieved 20 March 2023.

scientific.net

Lassen, N. C. Krieger; Jensen, Dorte Juul; Condradsen, K. (1994). "Automatic Recognition of Deformed and Recrystallized Regions in Partly Recrystallized Samples Using Electron Back Scattering Patterns". Materials Science Forum. 157–162: 149–158. doi:10.4028/www.scientific.net/MSF.157-162.149. S2CID 137129038. Archived from the original on 2 March 2023. Retrieved 2 March 2023.

semanticscholar.org

api.semanticscholar.org

Koko, Abdalrhaman; Tong, Vivian; Wilkinson, Angus J.; Marrow, T. James (2023). "An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)". Ultramicroscopy. 248: 113705. arXiv:2206.10242. doi:10.1016/j.ultramic.2023.113705. PMID 36871367. S2CID 249889699. This article incorporates text from this source, which is available under the CC BY 4.0 license.
Field, D. P. (2005). "Improving the Spatial Resolution of EBSD". Microscopy and Microanalysis. 11. doi:10.1017/s1431927605506445. S2CID 138097039.
Deal, Andrew; Tao, Xiaodong; Eades, Alwyn (2005). "EBSD geometry in the SEM: simulation and representation". Surface and Interface Analysis. 37 (11): 1017–1020. doi:10.1002/sia.2115. S2CID 122757345.
Goulden, J.; Trimby, P.; Bewick, A. (1 August 2018). "The Benefits and Applications of a CMOS-based EBSD Detector". Microscopy and Microanalysis. 24 (S1): 1128–1129. Bibcode:2018MiMic..24S1128G. doi:10.1017/s1431927618006128. S2CID 139967518.
Alam, M. N.; Blackman, M.; Pashley, D. W. (1954). "High-angle Kikuchi patterns". Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences. 221 (1145): 224–242. Bibcode:1954RSPSA.221..224A. doi:10.1098/rspa.1954.0017. S2CID 97131764.
Dingley, D J; Wright, S I; Nowell, M M (August 2005). "Dynamic Background Correction of Electron Backscatter Diffraction Patterns". Microscopy and Microanalysis. 11 (S02). doi:10.1017/S1431927605506676. S2CID 137658758.
Britton, T. B.; Jiang, J.; Guo, Y.; Vilalta-Clemente, A.; Wallis, D.; Hansen, L. N.; Winkelmann, A.; Wilkinson, A. J. (2016). "Tutorial: Crystal orientations and EBSD — Or which way is up?". Materials Characterization. 117: 113–126. doi:10.1016/j.matchar.2016.04.008. hdl:10044/1/31250. S2CID 138070296.
Nowell, Matthew M; Witt, Ronald A; True, Brian W (2005). "EBSD Sample Preparation: Techniques, Tips, and Tricks". Microscopy Today. 13 (4): 44–49. doi:10.1017/s1551929500053669. S2CID 139585885.
Koko, Abdalrhaman; Elmukashfi, Elsiddig; Becker, Thorsten H.; Karamched, Phani S.; Wilkinson, Angus J.; Marrow, T. James (2022). "In situ characterisation of the strain fields of intragranular slip bands in ferrite by high-resolution electron backscatter diffraction". Acta Materialia. 239: 118284. Bibcode:2022AcMat.23918284K. doi:10.1016/j.actamat.2022.118284. S2CID 251783802. This article incorporates text from this source, which is available under the CC BY 4.0 license.
Abdolvand, Hamidreza; Wilkinson, Angus J. (2016). "On the effects of reorientation and shear transfer during twin formation: Comparison between high-resolution electron backscatter diffraction experiments and a crystal plasticity finite element model". International Journal of Plasticity. 84: 160–182. doi:10.1016/j.ijplas.2016.05.006. S2CID 139049848.
Koko, Abdalrhaman; Becker, Thorsten H.; Elmukashfi, Elsiddig; Pugno, Nicola M.; Wilkinson, Angus J.; Marrow, T. James (2023). "HR-EBSD analysis of in situ stable crack growth at the micron scale". Journal of the Mechanics and Physics of Solids. 172: 105173. arXiv:2206.10243. Bibcode:2023JMPSo.17205173K. doi:10.1016/j.jmps.2022.105173. S2CID 249889649.
Wilkinson, Angus J.; Randman, David (2010). "Determination of elastic strain fields and geometrically necessary dislocation distributions near nanoindents using electron back scatter diffraction" (PDF). Philosophical Magazine. 90 (9): 1159–1177. Bibcode:2010PMag...90.1159W. doi:10.1080/14786430903304145. S2CID 121903030. Archived (PDF) from the original on 3 March 2023. Retrieved 20 March 2023.
Griffiths, A J V; Walther, T (2010). "Quantification of carbon contamination under electron beam irradiation in a scanning transmission electron microscope and its suppression by plasma cleaning". Journal of Physics: Conference Series. 241 (1): 012017. Bibcode:2010JPhCS.241a2017G. doi:10.1088/1742-6596/241/1/012017. S2CID 250689401.
Bachmann, F.; Hielscher, Ralf; Schaeben, Helmut (2010). "Texture Analysis with MTEX – Free and Open Source Software Toolbox". Solid State Phenomena. 160: 63–68. doi:10.4028/www.scientific.net/SSP.160.63. S2CID 136017346.
Piňos, J.; Mikmeková, Š.; Frank, L. (2017). "About the information depth of backscattered electron imaging". Journal of Microscopy. 266 (3): 335–342. doi:10.1111/jmi.12542. PMID 28248420. S2CID 35266526.
Seah, M. P. (2001). "Summary of ISO/TC 201 Standard: VIII, ISO 18115:2001—Surface chemical analysis—Vocabulary". Surface and Interface Analysis. 31 (11): 1048–1049. doi:10.1002/sia.1139. S2CID 97982609.
Dingley, D. (2004). "Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy: EBSD AND OIM". Journal of Microscopy. 213 (3): 214–224. doi:10.1111/j.0022-2720.2004.01321.x. PMID 15009688. S2CID 41385346.
Zhu, Chaoyi; De Graef, Marc (2020). "EBSD pattern simulations for an interaction volume containing lattice defects". Ultramicroscopy. 218: 113088. doi:10.1016/j.ultramic.2020.113088. PMID 32784084. S2CID 221123906.
Ren, S. X.; Kenik, E. A.; Alexander, K. B. (1997). "Monte Carlo Simulation of Spatial Resolution for Electron Backscattered Diffraction (EBSD) with Application to Two-Phase Materials". Microscopy and Microanalysis. 3 (S2): 575–576. Bibcode:1997MiMic...3S.575R. doi:10.1017/S1431927600009764. S2CID 137029133. Archived from the original on 25 March 2023. Retrieved 20 March 2023.
Winkelmann, Aimo (2009), Schwartz, Adam J.; Kumar, Mukul; Adams, Brent L.; Field, David P. (eds.), "Dynamical Simulation of Electron Backscatter Diffraction Patterns", Electron Backscatter Diffraction in Materials Science, Boston, MA: Springer US, pp. 21–33, doi:10.1007/978-0-387-88136-2_2, ISBN 978-0-387-88136-2, S2CID 122806598
Krieger Lassen, N.C.; Juul Jensen, Dorte; Condradsen, K. (1994). "Automatic Recognition of Deformed and Recrystallized Regions in Partly Recrystallized Samples Using Electron Back Scattering Patterns". Materials Science Forum. 157–162: 149–158. doi:10.4028/www.scientific.net/msf.157-162.149. S2CID 137129038.
Sitzman, Scott; Schmidt, Niels-Henrik; Palomares-Garcia, Alberto; Munoz-Moreno, Rocio; Goulden, Jenny (2015). "Addressing Pseudo-Symmetric Misindexing in EBSD Analysis of γ-TiAl with High Accuracy Band Detection". Microscopy and Microanalysis. 21 (S3): 2037–2038. Bibcode:2015MiMic..21S2037S. doi:10.1017/s143192761501096x. S2CID 51964340.
Lenthe, W.; Singh, S.; De Graef, M. (2019). "Prediction of potential pseudo-symmetry issues in the indexing of electron backscatter diffraction patterns". Journal of Applied Crystallography. 52 (5): 1157–1168. Bibcode:2019JApCr..52.1157L. doi:10.1107/S1600576719011233. OSTI 1575873. S2CID 204108200.
Britton, T. B.; Tong, V. S.; Hickey, J.; Foden, A.; Wilkinson, A. J. (2018). "AstroEBSD: exploring new space in pattern indexing with methods launched from an astronomical approach". Journal of Applied Crystallography. 51 (6): 1525–1534. arXiv:1804.02602. Bibcode:2018JApCr..51.1525B. doi:10.1107/S1600576718010373. S2CID 51687153.
Britton, Thomas Benjamin; Tong, Vivian S.; Hickey, Jim; Foden, Alex; Wilkinson, Angus J. (2018). "AstroEBSD : exploring new space in pattern indexing with methods launched from an astronomical approach". Journal of Applied Crystallography. 51 (6): 1525–1534. arXiv:1804.02602. Bibcode:2018JApCr..51.1525B. doi:10.1107/S1600576718010373. S2CID 51687153.
Pang, Edward L.; Larsen, Peter M.; Schuh, Christopher A. (2020). "Global optimization for accurate determination of EBSD pattern centers". Ultramicroscopy. 209: 112876. arXiv:1908.10692. doi:10.1016/j.ultramic.2019.112876. PMID 31707232. S2CID 201651309.
Tanaka, Tomohito; Wilkinson, Angus J. (1 July 2019). "Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination – accuracy and precision assessment". Ultramicroscopy. 202: 87–99. arXiv:1904.06891. doi:10.1016/j.ultramic.2019.04.006. PMID 31005023. S2CID 119294636.
Foden, A.; Collins, D.M.; Wilkinson, A.J.; Britton, T.B. (2019). "Indexing electron backscatter diffraction patterns with a refined template matching approach". Ultramicroscopy. 207: 112845. arXiv:1807.11313. doi:10.1016/j.ultramic.2019.112845. PMID 31586829. S2CID 203307560.
Jackson, M. A.; Pascal, E.; De Graef, M. (2019). "Dictionary Indexing of Electron Back-Scatter Diffraction Patterns: a Hands-On Tutorial". Integrating Materials and Manufacturing Innovation. 8 (2): 226–246. doi:10.1007/s40192-019-00137-4. S2CID 182073071.
Dingley, D. J.; Randle, V. (1992). "Microtexture determination by electron back-scatter diffraction". Journal of Materials Science. 27 (17): 4545–4566. Bibcode:1992JMatS..27.4545D. doi:10.1007/BF01165988. S2CID 137281137.
Hielscher, Ralf; Bartel, Felix; Britton, Thomas Benjamin (2019). "Gazing at crystal balls: Electron backscatter diffraction pattern analysis and cross-correlation on the sphere". Ultramicroscopy. 207: 112836. arXiv:1810.03211. doi:10.1016/j.ultramic.2019.112836. PMID 31539865. S2CID 202711517.
Hielscher, R.; Silbermann, C. B.; Schmidl, E.; Ihlemann, Joern (2019). "Denoising of crystal orientation maps". Journal of Applied Crystallography. 52 (5): 984–996. Bibcode:2019JApCr..52..984H. doi:10.1107/s1600576719009075. S2CID 202068671.
Adams, Brent L.; Wright, Stuart I.; Kunze, Karsten (1993). "Orientation imaging: The emergence of a new microscopy". Metallurgical Transactions A. 24 (4): 819–831. Bibcode:1993MTA....24..819A. doi:10.1007/BF02656503. S2CID 137379846.
Prior (1999). "Problems in determining the misorientation axes, for small angular misorientations, using electron backscatter diffraction in the SEM". Journal of Microscopy. 195 (3): 217–225. doi:10.1046/j.1365-2818.1999.00572.x. PMID 10460687. S2CID 10144078.
Humphreys, F. J. (2001). "Review Grain and subgrain characterisation by electron backscatter diffraction". Journal of Materials Science. 36 (16): 3833–3854. doi:10.1023/A:1017973432592. S2CID 135659350.
Wilkinson, Angus J.; Hirsch, Peter B. (1997). "Electron diffraction based techniques in scanning electron microscopy of bulk materials". Micron. 28 (4): 279–308. arXiv:1904.05550. doi:10.1016/S0968-4328(97)00032-2. S2CID 118944816.
Shi, Qiwei; Roux, Stéphane; Latourte, Félix; Hild, François (2019). "Estimation of elastic strain by integrated image correlation on electron diffraction patterns". Ultramicroscopy. 199: 16–33. doi:10.1016/j.ultramic.2019.02.001. PMID 30738984. S2CID 73418370.
Lassen, N. C. Krieger; Jensen, Dorte Juul; Condradsen, K. (1994). "Automatic Recognition of Deformed and Recrystallized Regions in Partly Recrystallized Samples Using Electron Back Scattering Patterns". Materials Science Forum. 157–162: 149–158. doi:10.4028/www.scientific.net/MSF.157-162.149. S2CID 137129038. Archived from the original on 2 March 2023. Retrieved 2 March 2023.
Wilkinson, A. J.; Meaden, G.; Dingley, D. J. (1 November 2006). "High resolution mapping of strains and rotations using electron backscatter diffraction". Materials Science and Technology. 22 (11): 1271–1278. Bibcode:2006MatST..22.1271W. doi:10.1179/174328406X130966. S2CID 135875163. Archived from the original on 25 March 2023. Retrieved 20 March 2023.
Hardin, T.J.; Ruggles, T.J.; Koch, D.P.; Niezgoda, S.R.; Fullwood, D.T.; Homer, E.R. (2015). "Analysis of traction-free assumption in high-resolution EBSD measurements: HR-EBSD TRACTION-FREE ASSUMPTION". Journal of Microscopy. 260 (1): 73–85. doi:10.1111/jmi.12268. PMID 26138919. S2CID 25692536.
Plancher, E.; Petit, J.; Maurice, C.; Favier, V.; Saintoyant, L.; Loisnard, D.; Rupin, N.; Marijon, J.-B.; Ulrich, O.; Bornert, M.; Micha, J.-S.; Robach, O.; Castelnau, O. (1 March 2016). "On the Accuracy of Elastic Strain Field Measurements by Laue Microdiffraction and High-Resolution EBSD: a Cross-Validation Experiment" (PDF). Experimental Mechanics. 56 (3): 483–492. doi:10.1007/s11340-015-0114-1. S2CID 255157494. Archived (PDF) from the original on 13 March 2020. Retrieved 20 March 2023.
Vermeij, T.; Hoefnagels, J. P. M. (2018). "A consistent full-field integrated DIC framework for HR-EBSD" (PDF). Ultramicroscopy. 191: 44–50. doi:10.1016/j.ultramic.2018.05.001. PMID 29772417. S2CID 21685690. Archived (PDF) from the original on 16 July 2021. Retrieved 20 March 2023.
Ernould, Clément; Beausir, Benoît; Fundenberger, Jean-Jacques; Taupin, Vincent; Bouzy, Emmanuel (2021). "Integrated correction of optical distortions for global HR-EBSD techniques". Ultramicroscopy. 221: 113158. doi:10.1016/j.ultramic.2020.113158. PMID 33338818. S2CID 228997006.
Shi, Qiwei; Loisnard, Dominique; Dan, Chengyi; Zhang, Fengguo; Zhong, Hongru; Li, Han; Li, Yuda; Chen, Zhe; Wang, Haowei; Roux, Stéphane (2021). "Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation" (PDF). Materials Characterization. 178: 111206. doi:10.1016/j.matchar.2021.111206. S2CID 236241507. Archived (PDF) from the original on 25 March 2023. Retrieved 20 March 2023.
Wright, Stuart I.; Nowell, Matthew M. (2006). "EBSD Image Quality Mapping". Microscopy and Microanalysis. 12 (1): 72–84. Bibcode:2006MiMic..12...72W. doi:10.1017/s1431927606060090. PMID 17481343. S2CID 35055001.
Koko, A.; Earp, P.; Wigger, T.; Tong, J.; Marrow, T. J. (2020). "J-integral analysis: An EDXD and DIC comparative study for a fatigue crack". International Journal of Fatigue. 134: 105474. doi:10.1016/j.ijfatigue.2020.105474. S2CID 214391445. Archived from the original on 27 January 2021. Retrieved 20 March 2023.
Winkelmann, A; Nolze, G; Vos, M; Salvat-Pujol, F; Werner, W S M (2016). "Physics-based simulation models for EBSD: advances and challenges". IOP Conference Series: Materials Science and Engineering. 109 (1): 012018. arXiv:1505.07982. Bibcode:2016MS&E..109a2018W. doi:10.1088/1757-899x/109/1/012018. S2CID 38586851.
Winkelmann, Aimo; Nolze, Gert; Cios, Grzegorz; Tokarski, Tomasz; Bała, Piotr; Hourahine, Ben; Trager-Cowan, Carol (November 2021). "Kikuchi pattern simulations of backscattered and transmitted electrons" (PDF). Journal of Microscopy. 284 (2): 157–184. doi:10.1111/jmi.13051. PMID 34275156. S2CID 236091618. Archived (PDF) from the original on 25 March 2023. Retrieved 20 March 2023.
Winkelmann, A. (2010). "Principles of depth-resolved Kikuchi pattern simulation for electron backscatter diffraction: KIKUCHI PATTERN SIMULATION FOR EBSD". Journal of Microscopy. 239 (1): 32–45. doi:10.1111/j.1365-2818.2009.03353.x. PMID 20579267. S2CID 23590722.
Vermeij, Tijmen; De Graef, Marc; Hoefnagels, Johan (15 March 2019). "Demonstrating the potential of accurate absolute cross-grain stress and orientation correlation using electron backscatter diffraction". Scripta Materialia. 162: 266–271. arXiv:1807.03908. doi:10.1016/j.scriptamat.2018.11.030. S2CID 54575778.
Tanaka, Tomohito; Wilkinson, Angus J. (1 July 2019). "Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination – accuracy and precision assessment". Ultramicroscopy. 202: 87–99. arXiv:1904.06891. doi:10.1016/j.ultramic.2019.04.006. PMID 31005023. S2CID 119294636.
Jackson, Brian E.; Christensen, Jordan J.; Singh, Saransh; De Graef, Marc; Fullwood, David T.; Homer, Eric R.; Wagoner, Robert H. (August 2016). "Performance of Dynamically Simulated Reference Patterns for Cross-Correlation Electron Backscatter Diffraction". Microscopy and Microanalysis. 22 (4): 789–802. Bibcode:2016MiMic..22..789J. doi:10.1017/S143192761601148X. PMID 27509538. S2CID 24482631.
Guo, Yi; Zong, Cui; Britton, T. B. (2021). "Development of local plasticity around voids during tensile deformation". Materials Science and Engineering: A. 814: 141227. arXiv:2007.11890. doi:10.1016/j.msea.2021.141227. S2CID 234850241.
Britton, T B; Hickey, J L R (2018). "Understanding deformation with high angular resolution electron backscatter diffraction (HR-EBSD)". IOP Conference Series: Materials Science and Engineering. 304 (1): 012003. arXiv:1710.00728. Bibcode:2018MS&E..304a2003B. doi:10.1088/1757-899x/304/1/012003. S2CID 54529072.
Kalácska, Szilvia; Dankházi, Zoltán; Zilahi, Gyula; Maeder, Xavier; Michler, Johann; Ispánovity, Péter Dusán; Groma, István (2020). "Investigation of geometrically necessary dislocation structures in compressed Cu micropillars by 3-dimensional HR-EBSD". Materials Science and Engineering: A. 770: 138499. arXiv:1906.06980. doi:10.1016/j.msea.2019.138499. S2CID 189928469. Archived from the original on 17 July 2020. Retrieved 20 March 2023.
Wallis, David; Hansen, Lars N.; Britton, T. Ben; Wilkinson, Angus J. (2017). "Dislocation Interactions in Olivine Revealed by HR-EBSD: Dislocation Interactions in Olivine". Journal of Geophysical Research: Solid Earth. 122 (10): 7659–7678. doi:10.1002/2017JB014513. hdl:10044/1/50615. S2CID 134570945.
Moussa, C; Bernacki, M; Besnard, R; Bozzolo, N (2015). "About quantitative EBSD analysis of deformation and recovery substructures in pure Tantalum". IOP Conference Series: Materials Science and Engineering. 89 (1): 012038. Bibcode:2015MS&E...89a2038M. doi:10.1088/1757-899x/89/1/012038. S2CID 53137730.
Wright, Stuart I.; Matthew, M. Nowell; David, P. Field. (2011). "A review of strain analysis using electron backscatter diffraction". Microscopy and Microanalysis. 17. 17 (3): 316–329. Bibcode:2011MiMic..17..316W. doi:10.1017/S1431927611000055. PMID 21418731. S2CID 26116915.
Tao, Xiaodong; Eades, Alwyn (2002). "Alternatives to Image Quality (IQ) Mapping in EBSD". Microscopy and Microanalysis. 8 (S02): 692–693. Bibcode:2002MiMic...8S.692T. doi:10.1017/s1431927602106465. S2CID 138999871.
Yu, Hongbing; Liu, Junliang; Karamched, Phani; Wilkinson, Angus J.; Hofmann, Felix (2019). "Mapping the full lattice strain tensor of a single dislocation by high angular resolution transmission Kikuchi diffraction (HR-TKD)". Scripta Materialia. 164: 36–41. arXiv:1808.10055. doi:10.1016/j.scriptamat.2018.12.039. S2CID 119075799.
Choi, Seung; Han, Seokyoung; Lee, Yuong-Nam (2019). Rahman, Imran (ed.). "Electron backscatter diffraction (EBSD) analysis of maniraptoran eggshells with important implications for microstructural and taphonomic interpretations". Palaeontology. 62 (5): 777–803. Bibcode:2019Palgy..62..777C. doi:10.1111/pala.12427. S2CID 182770470.
Wolfe, Kennedy; Smith, Abigail M.; Trimby, Patrick; Byrne, Maria (1 August 2013). "Microstructure of the paper nautilus (Argonauta nodosa) shell and the novel application of electron backscatter diffraction (EBSD) to address effects of ocean acidification". Marine Biology. 160 (8): 2271–2278. Bibcode:2013MarBi.160.2271W. doi:10.1007/s00227-012-2032-4. S2CID 253745873.
Piazolo, S.; Jessell, M. W.; Prior, D. J.; Bons, P. D. (2004). "The integration of experimental in-situ EBSD observations and numerical simulations: a novel technique of microstructural process analysis". Journal of Microscopy. 213 (3): 273–284. doi:10.1111/j.0022-2720.2004.01304.x. PMID 15009695. S2CID 24037204.
Koblischka-Veneva, Anjela; Koblischka, Michael R.; Schmauch, Jörg; Hannig, Matthias (2018). "Human dental enamel: A natural nanotechnology masterpiece investigated by TEM and t-EBSD". Nano Research. 11 (7): 3911–3921. doi:10.1007/s12274-018-1968-1. S2CID 139757769.
Schwarzer, Robert A; Hjelen, Jarle (9 January 2015). "Backscattered Electron Imaging with an EBSD Detector". Microscopy Today. 23 (1): 12–17. doi:10.1017/S1551929514001333. S2CID 138740715.
Tong, Vivian S.; Knowles, Alexander J.; Dye, David; Britton, T. Ben (1 January 2019). "Rapid electron backscatter diffraction mapping: Painting by numbers". Materials Characterization. 147: 271–279. arXiv:1809.07283. doi:10.1016/j.matchar.2018.11.014. S2CID 119328762.
Nolze, G.; Geist, V.; Neumann, R. Saliwan; Buchheim, M. (2005). "Investigation of orientation relationships by EBSD and EDS on the example of the Watson iron meteorite". Crystal Research and Technology. 40 (8): 791–804. Bibcode:2005CryRT..40..791N. doi:10.1002/crat.200410434. S2CID 96785527.
Kell, J.; Tyrer, J. R.; Higginson, R. L.; Thomson, R. C. (2005). "Microstructural characterization of autogenous laser welds on 316L stainless steel using EBSD and EDS". Journal of Microscopy. 217 (2): 167–173. doi:10.1111/j.1365-2818.2005.01447.x. PMID 15683414. S2CID 12285114.
West, G.D.; Thomson, R.C. (2009). "Combined EBSD/EDS tomography in a dual-beam FIB/FEG-SEM". Journal of Microscopy. 233 (3): 442–450. doi:10.1111/j.1365-2818.2009.03138.x. PMID 19250465. S2CID 42955621.
Ohfuji, Hiroaki; Yamamoto, Masashi (2015). "EDS quantification of light elements using osmium surface coating". Journal of Mineralogical and Petrological Sciences. 110 (4): 189–195. Bibcode:2015JMPeS.110..189O. doi:10.2465/jmps.141126. S2CID 93672390.
Stinville, J. C.; Callahan, P. G.; Charpagne, M. A.; Echlin, M. P.; Valle, V.; Pollock, T. M. (2020). "Direct measurements of slip irreversibility in a nickel-based superalloy using high-resolution digital image correlation". Acta Materialia. 186: 172–189. Bibcode:2020AcMat.186..172S. doi:10.1016/j.actamat.2019.12.009. OSTI 1803462. S2CID 213631580.
Charpagne, Marie-Agathe; Strub, Florian; Pollock, Tresa M. (2019). "Accurate reconstruction of EBSD datasets by a multimodal data approach using an evolutionary algorithm". Materials Characterization. 150: 184–198. arXiv:1903.02988. doi:10.1016/j.matchar.2019.01.033. S2CID 71144677.
Zhao, Chong; Stewart, David; Jiang, Jun; Dunne, Fionn P. E. (2018). "A comparative assessment of iron and cobalt-based hard-facing alloy deformation using HR-EBSD and HR-DIC". Acta Materialia. 159: 173–186. Bibcode:2018AcMat.159..173Z. doi:10.1016/j.actamat.2018.08.021. hdl:10044/1/68967. S2CID 139436094.
Orozco-Caballero, Alberto; Jackson, Thomas; da Fonseca, João Quinta (2021). "High-resolution digital image correlation study of the strain localization during loading of a shot-peened RR1000 nickel-based superalloy" (PDF). Acta Materialia. 220: 117306. Bibcode:2021AcMat.22017306O. doi:10.1016/j.actamat.2021.117306. S2CID 240539022. Archived (PDF) from the original on 25 March 2023. Retrieved 20 March 2023.
Ye, Zhenhua; Li, Chuanwei; Zheng, Mengyao; Zhang, Xinyu; Yang, Xudong; Gu, Jianfeng (2022). "In situ EBSD/DIC-based investigation of deformation and fracture mechanism in FCC- and L12-structured FeCoNiV high-entropy alloys". International Journal of Plasticity. 152: 103247. doi:10.1016/j.ijplas.2022.103247. S2CID 246553822.
Hestroffer, Jonathan M.; Stinville, Jean-Charles; Charpagne, Marie-Agathe; Miller, Matthew P.; Pollock, Tresa M.; Beyerlein, Irene J. (2023). "Slip localization behavior at triple junctions in nickel-base superalloys". Acta Materialia. 249: 118801. Bibcode:2023AcMat.24918801H. doi:10.1016/j.actamat.2023.118801. OSTI 2420863. S2CID 257216017.
Sperry, Ryan; Han, Songyang; Chen, Zhe; Daly, Samantha H.; Crimp, Martin A.; Fullwood, David T. (2021). "Comparison of EBSD, DIC, AFM, and ECCI for active slip system identification in deformed Ti-7Al". Materials Characterization. 173: 110941. doi:10.1016/j.matchar.2021.110941. S2CID 233839426.
Gao, Wenjie; Lu, Junxia; Zhou, Jianli; Liu, Ling'en; Wang, Jin; Zhang, Yuefei; Zhang, Ze (2022). "Effect of grain size on deformation and fracture of Inconel718: An in-situ SEM-EBSD-DIC investigation". Materials Science and Engineering: A. 861: 144361. doi:10.1016/j.msea.2022.144361. S2CID 253797056.
Khorashadizadeh, A.; Raabe, D.; Zaefferer, S.; Rohrer, G. S.; Rollett, A. D.; Winning, M. (2011). "Five-Parameter Grain Boundary Analysis by 3D EBSD of an Ultra Fine Grained CuZr Alloy Processed by Equal Channel Angular Pressing". Advanced Engineering Materials. 13 (4): 237–244. doi:10.1002/adem.201000259. S2CID 18389821.
Tsai, Shao-Pu; Konijnenberg, Peter J.; Gonzalez, Ivan; Hartke, Samuel; Griffiths, Thomas A.; Herbig, Michael; Kawano-Miyata, Kaori; Taniyama, Akira; Sano, Naoyuki; Zaefferer, Stefan (2022). "Development of a new, fully automated system for electron backscatter diffraction (EBSD)-based large volume three-dimensional microstructure mapping using serial sectioning by mechanical polishing, and its application to the analysis of special boundaries in 316L stainless steel". Review of Scientific Instruments. 93 (9): 093707. Bibcode:2022RScI...93i3707T. doi:10.1063/5.0087945. PMID 36182491. S2CID 252628156.
DeMott, Ryan; Haghdadi, Nima; Kong, Charlie; Gandomkar, Ziba; Kenney, Matthew; Collins, Peter; Primig, Sophie (2021). "3D electron backscatter diffraction characterization of fine α titanium microstructures: collection, reconstruction, and analysis methods". Ultramicroscopy. 230: 113394. doi:10.1016/j.ultramic.2021.113394. PMID 34614440. S2CID 238422160.
Gholinia, A.; Brough, I.; Humphreys, J.; McDonald, D.; Bate, P. (2010). "An investigation of dynamic recrystallisation on Cu–Sn bronze using 3D EBSD". Materials Science and Technology. 26 (6): 685–690. Bibcode:2010MatST..26..685G. doi:10.1179/026708309X12547309760966. S2CID 137530768.
Pirgazi, Hadi (2019). "On the alignment of 3D EBSD data collected by serial sectioning technique". Materials Characterization. 152: 223–229. doi:10.1016/j.matchar.2019.04.026. S2CID 149835216.
Winiarski, B.; Gholinia, A.; Mingard, K.; Gee, M.; Thompson, G.; Withers, P. J. (2021). "Correction of artefacts associated with large area EBSD". Ultramicroscopy. 226: 113315. doi:10.1016/j.ultramic.2021.113315. PMID 34049196. S2CID 235241941.

strath.ac.uk

strathprints.strath.ac.uk

Winkelmann, Aimo; Nolze, Gert; Cios, Grzegorz; Tokarski, Tomasz; Bała, Piotr; Hourahine, Ben; Trager-Cowan, Carol (November 2021). "Kikuchi pattern simulations of backscattered and transmitted electrons" (PDF). Journal of Microscopy. 284 (2): 157–184. doi:10.1111/jmi.13051. PMID 34275156. S2CID 236091618. Archived (PDF) from the original on 25 March 2023. Retrieved 20 March 2023.

tohoku.ac.jp

www2.tagen.tohoku.ac.jp

Michiyoshi, Tanaka (1988). Convergent beam electron diffraction (PDF). Jeol. OCLC 312738225. Archived (PDF) from the original on 20 March 2023. Retrieved 20 March 2023.

tue.nl

pure.tue.nl

Vermeij, T.; Hoefnagels, J. P. M. (2018). "A consistent full-field integrated DIC framework for HR-EBSD" (PDF). Ultramicroscopy. 191: 44–50. doi:10.1016/j.ultramic.2018.05.001. PMID 29772417. S2CID 21685690. Archived (PDF) from the original on 16 July 2021. Retrieved 20 March 2023.

unt.edu

digital.library.unt.edu

Ren, S. X.; Kenik, E. A.; Alexander, K. B. (1997). "Monte Carlo Simulation of Spatial Resolution for Electron Backscattered Diffraction (EBSD) with Application to Two-Phase Materials". Microscopy and Microanalysis. 3 (S2): 575–576. Bibcode:1997MiMic...3S.575R. doi:10.1017/S1431927600009764. S2CID 137029133. Archived from the original on 25 March 2023. Retrieved 20 March 2023.
El-Dasher, Bassem; Deal, Andrew (2009), Schwartz, Adam J.; Kumar, Mukul; Adams, Brent L.; Field, David P. (eds.), "Application of Electron Backscatter Diffraction to Phase Identification", Electron Backscatter Diffraction in Materials Science, Boston, MA: Springer US, pp. 81–95, doi:10.1007/978-0-387-88136-2_6, ISBN 978-0-387-88136-2, archived from the original on 25 March 2023, retrieved 20 March 2023

web.archive.org

Koko, A. Mohamed (2022). In situ full-field characterisation of strain concentrations (deformation twins, slip bands and cracks) (PhD thesis). University of Oxford. Archived from the original on 1 February 2023. This article incorporates text from this source, which is available under the CC BY 4.0 license.
"Sample Preparation Techniques for EBSD Analysis (Electron Backscatter Diffraction)". AZoNano.com. 15 November 2013. Archived from the original on 2 March 2023.
Wilkinson, Angus J.; Randman, David (2010). "Determination of elastic strain fields and geometrically necessary dislocation distributions near nanoindents using electron back scatter diffraction" (PDF). Philosophical Magazine. 90 (9): 1159–1177. Bibcode:2010PMag...90.1159W. doi:10.1080/14786430903304145. S2CID 121903030. Archived (PDF) from the original on 3 March 2023. Retrieved 20 March 2023.
Koko, Abdalrhaman; Elmukashfi, Elsiddig; Dragnevski, Kalin; Wilkinson, Angus J.; Marrow, Thomas James (2021). "J-integral analysis of the elastic strain fields of ferrite deformation twins using electron backscatter diffraction". Acta Materialia. 218: 117203. Bibcode:2021AcMat.21817203K. doi:10.1016/j.actamat.2021.117203. Archived from the original on 5 July 2022. Retrieved 20 March 2023.
Ren, S. X.; Kenik, E. A.; Alexander, K. B. (1997). "Monte Carlo Simulation of Spatial Resolution for Electron Backscattered Diffraction (EBSD) with Application to Two-Phase Materials". Microscopy and Microanalysis. 3 (S2): 575–576. Bibcode:1997MiMic...3S.575R. doi:10.1017/S1431927600009764. S2CID 137029133. Archived from the original on 25 March 2023. Retrieved 20 March 2023.
Michiyoshi, Tanaka (1988). Convergent beam electron diffraction (PDF). Jeol. OCLC 312738225. Archived (PDF) from the original on 20 March 2023. Retrieved 20 March 2023.
El-Dasher, Bassem; Deal, Andrew (2009), Schwartz, Adam J.; Kumar, Mukul; Adams, Brent L.; Field, David P. (eds.), "Application of Electron Backscatter Diffraction to Phase Identification", Electron Backscatter Diffraction in Materials Science, Boston, MA: Springer US, pp. 81–95, doi:10.1007/978-0-387-88136-2_6, ISBN 978-0-387-88136-2, archived from the original on 25 March 2023, retrieved 20 March 2023
"New technique provides detailed views of metals' crystal structure". MIT News | Massachusetts Institute of Technology. 6 July 2016. Archived from the original on 2 March 2023.
Lassen, Niels Christian Krieger (1994). Automated Determination of Crystal Orientations from Electron Backscattering Patterns (PDF) (PhD thesis). The Technical University of Denmark. Archived (PDF) from the original on 8 March 2022.
Lassen, N. C. Krieger; Jensen, Dorte Juul; Condradsen, K. (1994). "Automatic Recognition of Deformed and Recrystallized Regions in Partly Recrystallized Samples Using Electron Back Scattering Patterns". Materials Science Forum. 157–162: 149–158. doi:10.4028/www.scientific.net/MSF.157-162.149. S2CID 137129038. Archived from the original on 2 March 2023. Retrieved 2 March 2023.
Wilkinson, A. J.; Meaden, G.; Dingley, D. J. (1 November 2006). "High resolution mapping of strains and rotations using electron backscatter diffraction". Materials Science and Technology. 22 (11): 1271–1278. Bibcode:2006MatST..22.1271W. doi:10.1179/174328406X130966. S2CID 135875163. Archived from the original on 25 March 2023. Retrieved 20 March 2023.
Plancher, E.; Petit, J.; Maurice, C.; Favier, V.; Saintoyant, L.; Loisnard, D.; Rupin, N.; Marijon, J.-B.; Ulrich, O.; Bornert, M.; Micha, J.-S.; Robach, O.; Castelnau, O. (1 March 2016). "On the Accuracy of Elastic Strain Field Measurements by Laue Microdiffraction and High-Resolution EBSD: a Cross-Validation Experiment" (PDF). Experimental Mechanics. 56 (3): 483–492. doi:10.1007/s11340-015-0114-1. S2CID 255157494. Archived (PDF) from the original on 13 March 2020. Retrieved 20 March 2023.
Vermeij, T.; Hoefnagels, J. P. M. (2018). "A consistent full-field integrated DIC framework for HR-EBSD" (PDF). Ultramicroscopy. 191: 44–50. doi:10.1016/j.ultramic.2018.05.001. PMID 29772417. S2CID 21685690. Archived (PDF) from the original on 16 July 2021. Retrieved 20 March 2023.
Shi, Qiwei; Loisnard, Dominique; Dan, Chengyi; Zhang, Fengguo; Zhong, Hongru; Li, Han; Li, Yuda; Chen, Zhe; Wang, Haowei; Roux, Stéphane (2021). "Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation" (PDF). Materials Characterization. 178: 111206. doi:10.1016/j.matchar.2021.111206. S2CID 236241507. Archived (PDF) from the original on 25 March 2023. Retrieved 20 March 2023.
Koko, A.; Earp, P.; Wigger, T.; Tong, J.; Marrow, T. J. (2020). "J-integral analysis: An EDXD and DIC comparative study for a fatigue crack". International Journal of Fatigue. 134: 105474. doi:10.1016/j.ijfatigue.2020.105474. S2CID 214391445. Archived from the original on 27 January 2021. Retrieved 20 March 2023.
Winkelmann, Aimo; Nolze, Gert; Cios, Grzegorz; Tokarski, Tomasz; Bała, Piotr; Hourahine, Ben; Trager-Cowan, Carol (November 2021). "Kikuchi pattern simulations of backscattered and transmitted electrons" (PDF). Journal of Microscopy. 284 (2): 157–184. doi:10.1111/jmi.13051. PMID 34275156. S2CID 236091618. Archived (PDF) from the original on 25 March 2023. Retrieved 20 March 2023.
Kalácska, Szilvia; Dankházi, Zoltán; Zilahi, Gyula; Maeder, Xavier; Michler, Johann; Ispánovity, Péter Dusán; Groma, István (2020). "Investigation of geometrically necessary dislocation structures in compressed Cu micropillars by 3-dimensional HR-EBSD". Materials Science and Engineering: A. 770: 138499. arXiv:1906.06980. doi:10.1016/j.msea.2019.138499. S2CID 189928469. Archived from the original on 17 July 2020. Retrieved 20 March 2023.
"Discriminating Phases with Similar Crystal Structures Using Electron Backscatter Diffraction (EBSD) and Energy Dispersive X-Ray Spectrometry (EDS)". AZoNano.com. 2015. Archived from the original on 2 March 2023.
"Uncovering the tiny defects that make materials fail". Physics World. 29 November 2022. Archived from the original on 3 March 2023.
"Microscale Analysis of Lithium-Containing Compounds and Alloys". AZoM.com. 18 January 2023. Archived from the original on 17 February 2023.
Orozco-Caballero, Alberto; Jackson, Thomas; da Fonseca, João Quinta (2021). "High-resolution digital image correlation study of the strain localization during loading of a shot-peened RR1000 nickel-based superalloy" (PDF). Acta Materialia. 220: 117306. Bibcode:2021AcMat.22017306O. doi:10.1016/j.actamat.2021.117306. S2CID 240539022. Archived (PDF) from the original on 25 March 2023. Retrieved 20 March 2023.

worldcat.org

search.worldcat.org

Nishikawa, S.; Kikuchi, S. (June 1928). "Diffraction of Cathode Rays by Mica". Nature. 121 (3061): 1019–1020. Bibcode:1928Natur.121.1019N. doi:10.1038/1211019a0. ISSN 0028-0836.
Williams, B. David (2009). Transmission electron microscopy: a textbook for materials science. Plenum Press. p. 11. ISBN 978-0-387-76501-3. OCLC 633626308.
Michiyoshi, Tanaka (1988). Convergent beam electron diffraction (PDF). Jeol. OCLC 312738225. Archived (PDF) from the original on 20 March 2023. Retrieved 20 March 2023.