Time-dependent gate oxide breakdown (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Time-dependent gate oxide breakdown" in English language version.

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doi.org

Elhami Khorasani, Arash; Griswold, Mark; Alford, T. L. (2014). "A Fast $I{-}V$ Screening Measurement for TDDB Assessment of Ultra-Thick Inter-Metal Dielectrics". IEEE Electron Device Letters. 35 (1): 117–119. doi:10.1109/LED.2013.2290538. ISSN 0741-3106.

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Elhami Khorasani, Arash; Griswold, Mark; Alford, T. L. (2014). "A Fast $I{-}V$ Screening Measurement for TDDB Assessment of Ultra-Thick Inter-Metal Dielectrics". IEEE Electron Device Letters. 35 (1): 117–119. doi:10.1109/LED.2013.2290538. ISSN 0741-3106.