齊納效應 (Chinese Wikipedia)

Analysis of information sources in references of the Wikipedia article "齊納效應" in Chinese language version.

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1circuitstoday.com

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low place

1web.archive.org

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1semanticscholar.org

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circuitstoday.com

PN junction breakdown characteristics. Circuits Today. 2009-08-25 [2024-01-19] （英语）.

doi.org

Fair, R.B.; Wivell, H.W. Zener and avalanche breakdown in As-implanted low-voltage Si n-p junctions. IEEE Transactions on Electron Devices. May 1976, 23 (5): 512–518. ISSN 1557-9646. S2CID 12322965. doi:10.1109/T-ED.1976.18438 （英语）.

harvard.edu

people.seas.harvard.edu

Jones, R. Victor. Zener and Avalanche Breakdown/Diodes. School of Engineering and Applied Sciences, Harvard University. 2001-10-18. （原始内容存档于2017-06-10）（英语）.

ieee.org

ieeexplore.ieee.org

Fair, R.B.; Wivell, H.W. Zener and avalanche breakdown in As-implanted low-voltage Si n-p junctions. IEEE Transactions on Electron Devices. May 1976, 23 (5): 512–518. ISSN 1557-9646. S2CID 12322965. doi:10.1109/T-ED.1976.18438 （英语）.

semanticscholar.org

api.semanticscholar.org

Fair, R.B.; Wivell, H.W. Zener and avalanche breakdown in As-implanted low-voltage Si n-p junctions. IEEE Transactions on Electron Devices. May 1976, 23 (5): 512–518. ISSN 1557-9646. S2CID 12322965. doi:10.1109/T-ED.1976.18438 （英语）.

web.archive.org

Jones, R. Victor. Zener and Avalanche Breakdown/Diodes. School of Engineering and Applied Sciences, Harvard University. 2001-10-18. （原始内容存档于2017-06-10）（英语）.

worldcat.org

Fair, R.B.; Wivell, H.W. Zener and avalanche breakdown in As-implanted low-voltage Si n-p junctions. IEEE Transactions on Electron Devices. May 1976, 23 (5): 512–518. ISSN 1557-9646. S2CID 12322965. doi:10.1109/T-ED.1976.18438 （英语）.