电容器 (Chinese Wikipedia)

Analysis of information sources in references of the Wikipedia article "电容器" in Chinese language version.

refsWebsite

Global rank Chinese rank

16web.archive.org

1^st place

11books.google.com

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8^th place

5doi.org

2^nd place

23^rd place

3harvard.edu

18^th place

57^th place

1archive.org

6^th place

4^th place

1researchgate.net

120^th place

337^th place

1nih.gov

4^th place

5^th place

1johansondielectrics.com

low place

1ga.com

low place

1donklipstein.com

low place

1zenodo.org

621^st place

1,608^th place

1analog.com

low place

5,018^th place

analog.com

Guinta, Steve. Ask The Applications Engineer – 21. Analog Devices. [2013-03-17]. （原始内容存档于2013-02-26）.

archive.org

Floyd, Thomas. Electronic Devices 7th. Upper Saddle River, NJ: Pearson Education. 1984–2005: 10. ISBN 0-13-127827-4.

books.google.com

Bird, John. Electrical and Electronic Principles and Technology. Routledge. 2010: 63–76 [2013-03-17]. ISBN 9780080890562. （原始内容存档于2022-04-28）.
Ulaby 1999，第170頁. Ulaby, Fawwaz Tayssir. Fundamentals of Applied Electromagnetics. Upper Saddle River, New Jersey: Prentice Hall. 1999. ISBN 9780130115546.
Pai, S. T.; Qi Zhang. Introduction to High Power Pulse Technology. Advanced Series in Electrical and Computer Engineering 10. World Scientific. 1995 [2013-03-17]. ISBN 9789810217143. （原始内容存档于2022-04-28）.
Dyer, Stephen A. Wiley Survey of Instrumentation and Measurement. John Wiley & Sons. 2004: 397 [2013-03-17]. ISBN 9780471221654. （原始内容存档于2022-04-28）.
Scherz, Paul. Practical Electronics for Inventors 2nd. McGraw Hill Professional. 2006: 100 [2013-03-17]. ISBN 9780071776448. （原始内容存档于2022-04-28）.
Bird, John. Electrical Circuit Theory and Technology. Routledge. 2007: 501 [2013-03-17]. ISBN 9780750681391. （原始内容存档于2022-04-28）.
Ulaby 1999，第169頁. Ulaby, Fawwaz Tayssir. Fundamentals of Applied Electromagnetics. Upper Saddle River, New Jersey: Prentice Hall. 1999. ISBN 9780130115546.
Kaiser, Cletus J. The Capacitor Handbook. Springer Science & Business Media. 6 December 2012 [2019-09-05]. ISBN 978-94-011-8090-0. （原始内容存档于2022-05-20）.
Prutchi, David. Exploring Quantum Physics through Hands-on Projects. John Wiley & Sons. 28 February 2012: 10 [2022-11-28]. ISBN 978-1-118-17070-0. （原始内容存档于2022-04-28）.
Dixit, J. B.; Yadav, Amit. Electrical Power Quality. Laxmi Publications, Ltd. 2010: 63 [2019-09-05]. ISBN 978-93-80386-74-4. （原始内容存档于2022-04-28）.
Winburn. Practical Laser Safety, Second Edition. CRC Press. 13 November 1989: 189 [2019-09-05]. ISBN 978-0-8247-8240-5. （原始内容存档于2022-04-28）.

doi.org

dx.doi.org

Inuishi, Y.; Powers, D.A. Electric breakdown and conduction through Mylar films. J. Appl. Phys. 1957, 28 (9): 1017–1022. Bibcode:1957JAP....28.1017I. doi:10.1063/1.1722899.
Reed, C.W.; Cichanowski, S.W. The fundamentals of aging in HV polymer-film capacitors. IEEE Transactions on Dielectrics and Electrical Insulation. 1994, 1 (5): 904–922. doi:10.1109/94.326658.
Klein, N.; Gafni, H. The maximum dielectric strength of thin silicon oxide films. IEEE Transactions on Electron Devices. 1966, 13 (2): 281–289. Bibcode:1966ITED...13..281K. doi:10.1109/T-ED.1966.15681.
Belkin, A.; et al. Recovery of alumina nanocapacitors after high voltage breakdown. Scientific Reports. 2017, 7 (1): 932. Bibcode:2017NatSR...7..932B. PMC 5430567 . PMID 28428625. doi:10.1038/s41598-017-01007-9.
Ho, Janet; Jow, T. Richard; Boggs, Steven. Historical Introduction to Capacitor Technology. IEEE Electrical Insulation Magazine. Jan 2010, 26 (1): 20–25 [2020-03-16]. doi:10.1109/mei.2010.5383924. （原始内容存档于2020-05-15）.

donklipstein.com

Xenon Strobe and Flash Safety Hints （页面存档备份，存于互联网档案馆）. donklipstein.com. May 29, 2006

ga.com

The Effect of Reversal on Capacitor Life (PDF). Engineering Bulletin 96-004. Sorrento Electronics. 2003-11 [2013-03-17]. （原始内容 (PDF)存档于2014-07-14）.

harvard.edu

ui.adsabs.harvard.edu

Inuishi, Y.; Powers, D.A. Electric breakdown and conduction through Mylar films. J. Appl. Phys. 1957, 28 (9): 1017–1022. Bibcode:1957JAP....28.1017I. doi:10.1063/1.1722899.
Klein, N.; Gafni, H. The maximum dielectric strength of thin silicon oxide films. IEEE Transactions on Electron Devices. 1966, 13 (2): 281–289. Bibcode:1966ITED...13..281K. doi:10.1109/T-ED.1966.15681.
Belkin, A.; et al. Recovery of alumina nanocapacitors after high voltage breakdown. Scientific Reports. 2017, 7 (1): 932. Bibcode:2017NatSR...7..932B. PMC 5430567 . PMID 28428625. doi:10.1038/s41598-017-01007-9.

johansondielectrics.com

Ceramic Capacitor Aging Made Simple. Johanson Dielectrics. 2012-05-21 [2013-03-17]. （原始内容存档于2012-12-26）.

nih.gov

ncbi.nlm.nih.gov

Belkin, A.; et al. Recovery of alumina nanocapacitors after high voltage breakdown. Scientific Reports. 2017, 7 (1): 932. Bibcode:2017NatSR...7..932B. PMC 5430567 . PMID 28428625. doi:10.1038/s41598-017-01007-9.

researchgate.net

Scaling in binary percolation networks. [2019-09-03]. （原始内容存档于2019-12-28）.

web.archive.org

Bird, John. Electrical and Electronic Principles and Technology. Routledge. 2010: 63–76 [2013-03-17]. ISBN 9780080890562. （原始内容存档于2022-04-28）.
https://web.archive.org/web/20060828235438/http://www.ttc-cmc.net/~fme/captance.html
Scaling in binary percolation networks. [2019-09-03]. （原始内容存档于2019-12-28）.
Pai, S. T.; Qi Zhang. Introduction to High Power Pulse Technology. Advanced Series in Electrical and Computer Engineering 10. World Scientific. 1995 [2013-03-17]. ISBN 9789810217143. （原始内容存档于2022-04-28）.
Dyer, Stephen A. Wiley Survey of Instrumentation and Measurement. John Wiley & Sons. 2004: 397 [2013-03-17]. ISBN 9780471221654. （原始内容存档于2022-04-28）.
Scherz, Paul. Practical Electronics for Inventors 2nd. McGraw Hill Professional. 2006: 100 [2013-03-17]. ISBN 9780071776448. （原始内容存档于2022-04-28）.
Bird, John. Electrical Circuit Theory and Technology. Routledge. 2007: 501 [2013-03-17]. ISBN 9780750681391. （原始内容存档于2022-04-28）.
Ceramic Capacitor Aging Made Simple. Johanson Dielectrics. 2012-05-21 [2013-03-17]. （原始内容存档于2012-12-26）.
The Effect of Reversal on Capacitor Life (PDF). Engineering Bulletin 96-004. Sorrento Electronics. 2003-11 [2013-03-17]. （原始内容 (PDF)存档于2014-07-14）.
Kaiser, Cletus J. The Capacitor Handbook. Springer Science & Business Media. 6 December 2012 [2019-09-05]. ISBN 978-94-011-8090-0. （原始内容存档于2022-05-20）.
Xenon Strobe and Flash Safety Hints （页面存档备份，存于互联网档案馆）. donklipstein.com. May 29, 2006
Prutchi, David. Exploring Quantum Physics through Hands-on Projects. John Wiley & Sons. 28 February 2012: 10 [2022-11-28]. ISBN 978-1-118-17070-0. （原始内容存档于2022-04-28）.
Dixit, J. B.; Yadav, Amit. Electrical Power Quality. Laxmi Publications, Ltd. 2010: 63 [2019-09-05]. ISBN 978-93-80386-74-4. （原始内容存档于2022-04-28）.
Winburn. Practical Laser Safety, Second Edition. CRC Press. 13 November 1989: 189 [2019-09-05]. ISBN 978-0-8247-8240-5. （原始内容存档于2022-04-28）.
Ho, Janet; Jow, T. Richard; Boggs, Steven. Historical Introduction to Capacitor Technology. IEEE Electrical Insulation Magazine. Jan 2010, 26 (1): 20–25 [2020-03-16]. doi:10.1109/mei.2010.5383924. （原始内容存档于2020-05-15）.
Guinta, Steve. Ask The Applications Engineer – 21. Analog Devices. [2013-03-17]. （原始内容存档于2013-02-26）.

zenodo.org

Ho, Janet; Jow, T. Richard; Boggs, Steven. Historical Introduction to Capacitor Technology. IEEE Electrical Insulation Magazine. Jan 2010, 26 (1): 20–25 [2020-03-16]. doi:10.1109/mei.2010.5383924. （原始内容存档于2020-05-15）.