Built-in self-test (Catalan Wikipedia)

Analysis of information sources in references of the Wikipedia article "Built-in self-test" in Catalan language version.

refsWebsite

Global rank Catalan rank

2com.+

low place

low place

1sciencedirect.com

149^th place

111^th place

1liverpool.ac.uk

low place

low place

1semiengineering.com

low place

low place

1electronicdesign.com

low place

low place

com.+ (Global: low place; Catalan: low place)

sciencedirect.com.+

«Built-in Self Test - an overview | ScienceDirect Topics» (en anglès). https://www.sciencedirect.com.+[Consulta: 22 novembre 2022].

semiengineering.com.+

«Built-in self-test (BiST)» (en anglès). https://semiengineering.com.+[Consulta: 22 novembre 2022].

electronicdesign.com (Global: low place; Catalan: low place)

«StackPath» (en anglès). https://www.electronicdesign.com/.+[Consulta: 22 novembre 2022].

liverpool.ac.uk (Global: low place; Catalan: low place)

livrepository.liverpool.ac.uk

Martínez LH, Khursheed S, Reddy SM. LFSR generation for high test coverage and low hardware overhead. IET Computers & Digital Techniques. 2019 Aug 21.UoL repository

sciencedirect.com (Global: 149^th place; Catalan: 111^th place)

«Built-in Self Test - an overview | ScienceDirect Topics» (en anglès). https://www.sciencedirect.com.+[Consulta: 22 novembre 2022].

semiengineering.com (Global: low place; Catalan: low place)

«Built-in self-test (BiST)» (en anglès). https://semiengineering.com.+[Consulta: 22 novembre 2022].