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Salvi, Jérôme; Barchiesi, Dominique «Measurement of thicknesses and optical properties of thin films from Surface Plasmon Resonance (SPR)» (en anglès). Applied Physics A, 115, 1, 01-04-2014, pàg. 245–255. Bibcode: 2014ApPhA.115..245S. DOI: 10.1007/s00339-013-8038-z. ISSN: 1432-0630.
V. K. Valev «Characterization of Nanostructured Plasmonic Surfaces with Second Harmonic Generation». Langmuir, 28, 44, 2012, pàg. 15454–15471. DOI: 10.1021/la302485c. PMID: 22889193.
Taverne, S.; Caron, B.; Gétin, S.; Lartigue, O.; Lopez, C.; Meunier-Della-Gatta, S.; Gorge, V.; Reymermier, M.; Racine, B. «Multispectral surface plasmon resonance approach for ultra-thin silver layer characterization: Application to top-emitting OLED cathode». Journal of Applied Physics, 123, 2, 12-01-2018, pàg. 023108. Bibcode: 2018JAP...123b3108T. DOI: 10.1063/1.5003869. ISSN: 0021-8979.
Salvi, Jérôme; Barchiesi, Dominique «Measurement of thicknesses and optical properties of thin films from Surface Plasmon Resonance (SPR)» (en anglès). Applied Physics A, 115, 1, 01-04-2014, pàg. 245–255. Bibcode: 2014ApPhA.115..245S. DOI: 10.1007/s00339-013-8038-z. ISSN: 1432-0630.