Porta metàl·lica (Catalan Wikipedia)

Analysis of information sources in references of the Wikipedia article "Porta metàl·lica" in Catalan language version.

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1halbleiter.org

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1sciencedirect.com

149^th place

111^th place

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5^th place

1diva-portal.org

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1org.+

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diva-portal.org

«[https://www.diva-portal.org/smash/get/diva2:168797/FULLTEXT01.pdf Digital Comprehensive Summaries of Uppsala Dissertations from the Faculty of Science and Technology 213 Metal Gate Technology for Advanced CMOS Devices]» (en anglès). https://www.diva-portal.org.+[Consulta: 20 octubre 2022].

doi.org

dx.doi.org

Fujikawa, Shin-ichiro; Hirano, Ken-ichi; Fukushima, Yoshiaki Metallurgical Transactions A, 9, 12-1978, pàg. 1811-1815. DOI: 10.1007/BF02663412.
Robertson, John; Wallace, Robert M. «High-K materials and metal gates for CMOS applications» (en anglès). Materials Science and Engineering: R: Reports, 88, 01-02-2015, pàg. 1–41. DOI: 10.1016/j.mser.2014.11.001. ISSN: 0927-796X.

google.cat

books.google.cat

Yuhua Cheng, Chenming Hu. «§2.1 MOSFET classification and operation». A: MOSFET modeling & BSIM3 user's guide. Springer, 1999, p. 13. ISBN 0-7923-8575-6.
Voinigescu, Sorin. High-Frequency Integrated Circuits (en anglès). Cambridge University Press, 2013, p. 164. ISBN 9780521873024.

halbleiter.org

«Metallization: Aluminum Technology».

org.+

diva-portal.org.+

«[https://www.diva-portal.org/smash/get/diva2:168797/FULLTEXT01.pdf Digital Comprehensive Summaries of Uppsala Dissertations from the Faculty of Science and Technology 213 Metal Gate Technology for Advanced CMOS Devices]» (en anglès). https://www.diva-portal.org.+[Consulta: 20 octubre 2022].

sciencedirect.com

Robertson, John; Wallace, Robert M. «High-K materials and metal gates for CMOS applications» (en anglès). Materials Science and Engineering: R: Reports, 88, 01-02-2015, pàg. 1–41. DOI: 10.1016/j.mser.2014.11.001. ISSN: 0927-796X.

worldcat.org

Robertson, John; Wallace, Robert M. «High-K materials and metal gates for CMOS applications» (en anglès). Materials Science and Engineering: R: Reports, 88, 01-02-2015, pàg. 1–41. DOI: 10.1016/j.mser.2014.11.001. ISSN: 0927-796X.