Mishra, Umesh and Singh, Jasprit, Chapter 1: Structural Properties of Semiconductors. In: Semiconductor Device Physics and Design, 2008, Pages 1-27, doi:10.1007/978-1-4020-6481-4, ISBN 978-1-4020-6481-4
Sune, Jordi and Wu, Ernest Y., Chapter 16: Defects Associated with Dielectric Breakdown in SiO2-Based Gate Dielectrics. In: Defects in Microelectronic Materials and Devices (Edited by Fleetwood, Daniel and Schrimpf, Ronald), 2008, Pages 465-496, doi:10.1201/9781420043778, ISBN 9781420043778