SONOS (Catalan Wikipedia)

Analysis of information sources in references of the Wikipedia article "SONOS" in Catalan language version.

Last modified: 21:22:47, 26 August 2025 (UTC)

Ref.Un. Ref.Website

Global rank Catalan rank

14^th place

22^nd place

2^nd place

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4^th place

6^th place

516^th place

3^rd place

adsabs.harvard.edu (Global: 14^th place; Catalan: 22^nd place)

Chen, P. C. Y. IEEE Transactions on Electron Devices, 24, 5, 1977, p. 584–586. Bibcode: 1977ITED...24..584C. DOI: 10.1109/T-ED.1977.18783. ISSN: 0018-9383.
Chen, S. C.; Chang, T. C.; Liu, P. T.; Wu, Y. C.; Lin, P. S. IEEE Electron Device Letters, 28, 9, 2007, p. 809–811. Bibcode: 2007IEDL...28..809C. DOI: 10.1109/LED.2007.903885. ISSN: 0741-3106.
Lee, M. C.; Wong, H. Y. IEEE Transactions on Electron Devices, 60, 10, 2013, p. 3256–3264. Bibcode: 2013ITED...60.3256L. DOI: 10.1109/TED.2013.2279410. ISSN: 0018-9383.

Micheloni, Rino. Inside NAND Flash Memories (Google Books) (en anglès). Springer Science & Business Media, 2010. ISBN 9789048194315.
Prince, Betty. Emerging Memories: Technologies and Trends (en anglès). Springer Science & Business Media, 2007. ISBN 9780306475535.

Chen, P. C. Y. IEEE Transactions on Electron Devices, 24, 5, 1977, p. 584–586. Bibcode: 1977ITED...24..584C. DOI: 10.1109/T-ED.1977.18783. ISSN: 0018-9383.
Chen, S. C.; Chang, T. C.; Liu, P. T.; Wu, Y. C.; Lin, P. S. IEEE Electron Device Letters, 28, 9, 2007, p. 809–811. Bibcode: 2007IEDL...28..809C. DOI: 10.1109/LED.2007.903885. ISSN: 0741-3106.
Lee, M. C.; Wong, H. Y. IEEE Transactions on Electron Devices, 60, 10, 2013, p. 3256–3264. Bibcode: 2013ITED...60.3256L. DOI: 10.1109/TED.2013.2279410. ISSN: 0018-9383.

Chen, P. C. Y. IEEE Transactions on Electron Devices, 24, 5, 1977, p. 584–586. Bibcode: 1977ITED...24..584C. DOI: 10.1109/T-ED.1977.18783. ISSN: 0018-9383.
Chen, S. C.; Chang, T. C.; Liu, P. T.; Wu, Y. C.; Lin, P. S. IEEE Electron Device Letters, 28, 9, 2007, p. 809–811. Bibcode: 2007IEDL...28..809C. DOI: 10.1109/LED.2007.903885. ISSN: 0741-3106.
Lee, M. C.; Wong, H. Y. IEEE Transactions on Electron Devices, 60, 10, 2013, p. 3256–3264. Bibcode: 2013ITED...60.3256L. DOI: 10.1109/TED.2013.2279410. ISSN: 0018-9383.