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"IoT Conference Report"(PDF). IoT Conference Report. The Royal Society. Archived from the original(PDF) on 23 October 2019. Retrieved 11 December 2018.
Gonciari, P.T.; Al-Hashimi, B.M.; Nicolici, N. (March 2002). "Improving compression ratio, area overhead, and test application time for system-on-a-chip test data compression/Decompression". Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition. pp. 604–611. doi:10.1109/DATE.2002.998363. ISBN978-0-7695-1471-0. S2CID195857239.
"IoT Conference Report"(PDF). IoT Conference Report. The Royal Society. Archived from the original(PDF) on 23 October 2019. Retrieved 11 December 2018.