Burst noise (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Burst noise" in English language version.

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analog.com

"Op-Amp Noise can be Deafening Too" (PDF). Today, although burst noise can still occasionally occur during manufacturing, the phenomenon is sufficiently well understood that affected devices are detected and scrapped during test.

doi.org

Ranjan, A.; Raghavan, N.; Shubhakar, K.; Thamankar, R.; Molina, J.; O'Shea, S. J.; Bosman, M.; Pey, K. L. (2016-04-01). "CAFM based spectroscopy of stress-induced defects in HfO₂ with experimental evidence of the clustering model and metastable vacancy defect state". 2016 IEEE International Reliability Physics Symposium (IRPS). pp. 7A–4–1–7A–4–7. doi:10.1109/IRPS.2016.7574576. ISBN 978-1-4673-9137-5. S2CID 45278733.

intersil.com

"Operational Amplifier Noise Prediction" (PDF). Intersil Application Note. Archived from the original (PDF) on 2007-04-14. Retrieved 2006-10-12.

mit.edu

web.mit.edu

Lundberg, Kent H. "Noise Sources in Bulk CMOS" (PDF).

semanticscholar.org

api.semanticscholar.org

Ranjan, A.; Raghavan, N.; Shubhakar, K.; Thamankar, R.; Molina, J.; O'Shea, S. J.; Bosman, M.; Pey, K. L. (2016-04-01). "CAFM based spectroscopy of stress-induced defects in HfO₂ with experimental evidence of the clustering model and metastable vacancy defect state". 2016 IEEE International Reliability Physics Symposium (IRPS). pp. 7A–4–1–7A–4–7. doi:10.1109/IRPS.2016.7574576. ISBN 978-1-4673-9137-5. S2CID 45278733.

stanford.edu

Rajendran, Bipin. "Random Telegraph Signal (Review of Noise in Semiconductor Devices and Modeling of Noise in Surrounding Gate MOSFET)" (PDF). Archived from the original (PDF) on April 14, 2006.

ti.com

"Noise Analysis In Operational Amplifier Circuits" (PDF). Texas Instruments application report.

web.archive.org

Rajendran, Bipin. "Random Telegraph Signal (Review of Noise in Semiconductor Devices and Modeling of Noise in Surrounding Gate MOSFET)" (PDF). Archived from the original (PDF) on April 14, 2006.
"Operational Amplifier Noise Prediction" (PDF). Intersil Application Note. Archived from the original (PDF) on 2007-04-14. Retrieved 2006-10-12.