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Capacitance–voltage profiling (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Capacitance–voltage profiling" in English language version.

refsWebsite
Global rank English rank
4books.google.com
3rd place
3rd place

books.google.com (Global: 3rd place; English: 3rd place)

  • Alain C. Diebold, ed. (2001). Handbook of Silicon Semiconductor Metrology. CRC Press. pp. 59–60. ISBN 0-8247-0506-8.
  • E.H. Nicollian, J.R. Brews (2002). MOS (Metal Oxide Semiconductor) Physics and Technology. Wiley. ISBN 978-0-471-43079-7.
  • Andrzej Jakubowski, Henryk M. Przewłocki (1991). Diagnostic Measurements in LSI/VLSI Integrated Circuits Production. World Scientific. p. 159. ISBN 981-02-0282-2.
  • Sheng S. Li and Sorin Cristoloveanu (1995). Electrical Characterization of Silicon-On-Insulator Materials and Devices. Springer. Chapter 6, p. 163. ISBN 0-7923-9548-4.