Capacitance–voltage profiling (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Capacitance–voltage profiling" in English language version.

refsWebsite

Global rank English rank

4books.google.com

3^rd place

3^rd place

books.google.com

Alain C. Diebold, ed. (2001). Handbook of Silicon Semiconductor Metrology. CRC Press. pp. 59–60. ISBN 0-8247-0506-8.
E.H. Nicollian, J.R. Brews (2002). MOS (Metal Oxide Semiconductor) Physics and Technology. Wiley. ISBN 978-0-471-43079-7.
Andrzej Jakubowski, Henryk M. Przewłocki (1991). Diagnostic Measurements in LSI/VLSI Integrated Circuits Production. World Scientific. p. 159. ISBN 981-02-0282-2.
Sheng S. Li and Sorin Cristoloveanu (1995). Electrical Characterization of Silicon-On-Insulator Materials and Devices. Springer. Chapter 6, p. 163. ISBN 0-7923-9548-4.