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Sarua, A (7 July 2008). "Raman-IR micro-thermography tool for reliability and failure analysis of electronic devices". 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits. Proc. Physical and Failure Analysis of Integrated Circuits, 2008. pp. 1–5. doi:10.1109/IPFA.2008.4588160. ISBN978-1-4244-2039-1. S2CID2890666.
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"University of Bristol". Shanghai Ranking. Academic Ranking of World Universities. Archived from the original on 22 September 2014. Retrieved 16 September 2014.