Contact resistance (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Contact resistance" in English language version.

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9doi.org

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6harvard.edu

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1ieee.org

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1worldcat.org

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1semanticscholar.org

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1archives-ouvertes.fr

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archives-ouvertes.fr

hal.archives-ouvertes.fr

Zhai, Chongpu; Hanaor, Dorian; Proust, Gwénaëlle; Brassart, Laurence; Gan, Yixiang (December 2016). "Interfacial electro-mechanical behaviour at rough surfaces" (PDF). Extreme Mechanics Letters. 9 (3): 422–429. Bibcode:2016ExML....9..422Z. doi:10.1016/j.eml.2016.03.021. hdl:1959.4/unsworks_60452.

doi.org

Weis, Martin; Lin, Jack; Taguchi, Dai; Manaka, Takaaki; Iwamoto, Mitsumasa (2010). "Insight into the contact resistance problem by direct probing of the potential drop in organic field-effect transistors". Applied Physics Letters. 97 (26): 263304. Bibcode:2010ApPhL..97z3304W. doi:10.1063/1.3533020.
Pesavento, Paul V.; Chesterfield, Reid J.; Newman, Christopher R.; Frisbie, C. Daniel (2004). "Gated four-probe measurements on pentacene thin-film transistors: Contact resistance as a function of gate voltage and temperature". Journal of Applied Physics. 96 (12): 7312. Bibcode:2004JAP....96.7312P. doi:10.1063/1.1806533.
Weis, Martin; Lin, Jack; Taguchi, Dai; Manaka, Takaaki; Iwamoto, Mitsumasa (2009). "Analysis of Transient Currents in Organic Field Effect Transistor: The Time-of-Flight Method". Journal of Physical Chemistry C. 113 (43): 18459. doi:10.1021/jp908381b.
Bürgi, L.; Sirringhaus, H.; Friend, R. H. (2002). "Noncontact potentiometry of polymer field-effect transistors". Applied Physics Letters. 80 (16): 2913. Bibcode:2002ApPhL..80.2913B. doi:10.1063/1.1470702.
Nakao, Motoharu; Manaka, Takaaki; Weis, Martin; Lim, Eunju; Iwamoto, Mitsumasa (2009). "Probing carrier injection into pentacene field effect transistor by time-resolved microscopic optical second harmonic generation measurement". Journal of Applied Physics. 106 (1): 014511–014511–5. Bibcode:2009JAP...106a4511N. doi:10.1063/1.3168434.
Stavitski, Natalie; Klootwijk, Johan H.; van Zeijl, Henk W.; Kovalgin, Alexey Y.; Wolters, Rob A. M. (February 2009). "Cross-Bridge Kelvin Resistor Structures for Reliable Measurement of Low Contact Resistances and Contact Interface Characterization". IEEE Transactions on Semiconductor Manufacturing. 22 (1): 146–152. doi:10.1109/TSM.2008.2010746. ISSN 0894-6507. S2CID 111829.
Zhai, Chongpu; Hanaor, Dorian; Proust, Gwénaëlle; Brassart, Laurence; Gan, Yixiang (December 2016). "Interfacial electro-mechanical behaviour at rough surfaces" (PDF). Extreme Mechanics Letters. 9 (3): 422–429. Bibcode:2016ExML....9..422Z. doi:10.1016/j.eml.2016.03.021. hdl:1959.4/unsworks_60452.
Zhai, Chongpu; Hanaor, Dorian A. H.; Proust, Gwenaelle; Gan, Yixiang (2015). "Stress-Dependent Electrical Contact Resistance at Fractal Rough Surfaces". Journal of Engineering Mechanics. 143 (3): B4015001. doi:10.1061/(ASCE)EM.1943-7889.0000967.
Landauer, Rolf (August 1976). "Spatial carrier density modulation effects in metallic conductivity". Physical Review B. 14 (4): 1474–1479. Bibcode:1976PhRvB..14.1474L. doi:10.1103/PhysRevB.14.1474.

handle.net

hdl.handle.net

Zhai, Chongpu; Hanaor, Dorian; Proust, Gwénaëlle; Brassart, Laurence; Gan, Yixiang (December 2016). "Interfacial electro-mechanical behaviour at rough surfaces" (PDF). Extreme Mechanics Letters. 9 (3): 422–429. Bibcode:2016ExML....9..422Z. doi:10.1016/j.eml.2016.03.021. hdl:1959.4/unsworks_60452.

harvard.edu

ui.adsabs.harvard.edu

Weis, Martin; Lin, Jack; Taguchi, Dai; Manaka, Takaaki; Iwamoto, Mitsumasa (2010). "Insight into the contact resistance problem by direct probing of the potential drop in organic field-effect transistors". Applied Physics Letters. 97 (26): 263304. Bibcode:2010ApPhL..97z3304W. doi:10.1063/1.3533020.
Pesavento, Paul V.; Chesterfield, Reid J.; Newman, Christopher R.; Frisbie, C. Daniel (2004). "Gated four-probe measurements on pentacene thin-film transistors: Contact resistance as a function of gate voltage and temperature". Journal of Applied Physics. 96 (12): 7312. Bibcode:2004JAP....96.7312P. doi:10.1063/1.1806533.
Bürgi, L.; Sirringhaus, H.; Friend, R. H. (2002). "Noncontact potentiometry of polymer field-effect transistors". Applied Physics Letters. 80 (16): 2913. Bibcode:2002ApPhL..80.2913B. doi:10.1063/1.1470702.
Nakao, Motoharu; Manaka, Takaaki; Weis, Martin; Lim, Eunju; Iwamoto, Mitsumasa (2009). "Probing carrier injection into pentacene field effect transistor by time-resolved microscopic optical second harmonic generation measurement". Journal of Applied Physics. 106 (1): 014511–014511–5. Bibcode:2009JAP...106a4511N. doi:10.1063/1.3168434.
Zhai, Chongpu; Hanaor, Dorian; Proust, Gwénaëlle; Brassart, Laurence; Gan, Yixiang (December 2016). "Interfacial electro-mechanical behaviour at rough surfaces" (PDF). Extreme Mechanics Letters. 9 (3): 422–429. Bibcode:2016ExML....9..422Z. doi:10.1016/j.eml.2016.03.021. hdl:1959.4/unsworks_60452.
Landauer, Rolf (August 1976). "Spatial carrier density modulation effects in metallic conductivity". Physical Review B. 14 (4): 1474–1479. Bibcode:1976PhRvB..14.1474L. doi:10.1103/PhysRevB.14.1474.

ieee.org

ieeexplore.ieee.org

Stavitski, Natalie; Klootwijk, Johan H.; van Zeijl, Henk W.; Kovalgin, Alexey Y.; Wolters, Rob A. M. (February 2009). "Cross-Bridge Kelvin Resistor Structures for Reliable Measurement of Low Contact Resistances and Contact Interface Characterization". IEEE Transactions on Semiconductor Manufacturing. 22 (1): 146–152. doi:10.1109/TSM.2008.2010746. ISSN 0894-6507. S2CID 111829.

researchgate.net

Zhai, Chongpu; Hanaor, Dorian A. H.; Proust, Gwenaelle; Gan, Yixiang (2015). "Stress-Dependent Electrical Contact Resistance at Fractal Rough Surfaces". Journal of Engineering Mechanics. 143 (3): B4015001. doi:10.1061/(ASCE)EM.1943-7889.0000967.

semanticscholar.org

api.semanticscholar.org

Stavitski, Natalie; Klootwijk, Johan H.; van Zeijl, Henk W.; Kovalgin, Alexey Y.; Wolters, Rob A. M. (February 2009). "Cross-Bridge Kelvin Resistor Structures for Reliable Measurement of Low Contact Resistances and Contact Interface Characterization". IEEE Transactions on Semiconductor Manufacturing. 22 (1): 146–152. doi:10.1109/TSM.2008.2010746. ISSN 0894-6507. S2CID 111829.

worldcat.org

search.worldcat.org

Stavitski, Natalie; Klootwijk, Johan H.; van Zeijl, Henk W.; Kovalgin, Alexey Y.; Wolters, Rob A. M. (February 2009). "Cross-Bridge Kelvin Resistor Structures for Reliable Measurement of Low Contact Resistances and Contact Interface Characterization". IEEE Transactions on Semiconductor Manufacturing. 22 (1): 146–152. doi:10.1109/TSM.2008.2010746. ISSN 0894-6507. S2CID 111829.