Counter-scanning (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Counter-scanning" in English language version.

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aip.org

rsi.aip.org

archive.today

avspublications.org

doi.org

  • R. V. Lapshin (2007). "Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition" (PDF). Measurement Science and Technology. 18 (3). UK: IOP: 907–927. Bibcode:2007MeScT..18..907L. doi:10.1088/0957-0233/18/3/046. ISSN 0957-0233.
  • V. Y. Yurov, A. N. Klimov (1994). "Scanning tunneling microscope calibration and reconstruction of real image: Drift and slope elimination". Review of Scientific Instruments. 65 (5). USA: AIP: 1551–1557. Bibcode:1994RScI...65.1551Y. doi:10.1063/1.1144890. ISSN 0034-6748. Archived from the original (PDF) on 2012-07-13. Retrieved 2011-11-28.
  • J. T. Woodward, D. K. Schwartz (1998). "Removing drift from scanning probe microscope images of periodic samples". Journal of Vacuum Science and Technology B. 16 (1). USA: American Vacuum Society: 51–53. Bibcode:1998JVSTB..16...51W. doi:10.1116/1.589834. ISSN 0734-211X. Archived from the original (PDF) on 2012-07-10.

fast-page.org

lapshin.fast-page.org

  • R. V. Lapshin (2007). "Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition" (PDF). Measurement Science and Technology. 18 (3). UK: IOP: 907–927. Bibcode:2007MeScT..18..907L. doi:10.1088/0957-0233/18/3/046. ISSN 0957-0233.
  • R. V. Lapshin (2011). "Feature-oriented scanning probe microscopy". In H. S. Nalwa (ed.). Encyclopedia of Nanoscience and Nanotechnology (PDF). Vol. 14. USA: American Scientific Publishers. pp. 105–115. ISBN 1-58883-163-9.

harvard.edu

ui.adsabs.harvard.edu

  • R. V. Lapshin (2007). "Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition" (PDF). Measurement Science and Technology. 18 (3). UK: IOP: 907–927. Bibcode:2007MeScT..18..907L. doi:10.1088/0957-0233/18/3/046. ISSN 0957-0233.
  • V. Y. Yurov, A. N. Klimov (1994). "Scanning tunneling microscope calibration and reconstruction of real image: Drift and slope elimination". Review of Scientific Instruments. 65 (5). USA: AIP: 1551–1557. Bibcode:1994RScI...65.1551Y. doi:10.1063/1.1144890. ISSN 0034-6748. Archived from the original (PDF) on 2012-07-13. Retrieved 2011-11-28.
  • J. T. Woodward, D. K. Schwartz (1998). "Removing drift from scanning probe microscope images of periodic samples". Journal of Vacuum Science and Technology B. 16 (1). USA: American Vacuum Society: 51–53. Bibcode:1998JVSTB..16...51W. doi:10.1116/1.589834. ISSN 0734-211X. Archived from the original (PDF) on 2012-07-10.

worldcat.org

search.worldcat.org

  • R. V. Lapshin (2007). "Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition" (PDF). Measurement Science and Technology. 18 (3). UK: IOP: 907–927. Bibcode:2007MeScT..18..907L. doi:10.1088/0957-0233/18/3/046. ISSN 0957-0233.
  • V. Y. Yurov, A. N. Klimov (1994). "Scanning tunneling microscope calibration and reconstruction of real image: Drift and slope elimination". Review of Scientific Instruments. 65 (5). USA: AIP: 1551–1557. Bibcode:1994RScI...65.1551Y. doi:10.1063/1.1144890. ISSN 0034-6748. Archived from the original (PDF) on 2012-07-13. Retrieved 2011-11-28.
  • J. T. Woodward, D. K. Schwartz (1998). "Removing drift from scanning probe microscope images of periodic samples". Journal of Vacuum Science and Technology B. 16 (1). USA: American Vacuum Society: 51–53. Bibcode:1998JVSTB..16...51W. doi:10.1116/1.589834. ISSN 0734-211X. Archived from the original (PDF) on 2012-07-10.