Design for manufacturability (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Design for manufacturability" in English language version.

Last modified: 08:13:52, 11 September 2026 (UTC)

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doi.org (Global: 2^nd place; English: 2^nd place)

Owusu-Boahen, Kwame; Han, Carl; Hsueh, Ching; Kim, Chulwoo; Vijayakumar, Arun; Devender, Fnu; Moreau, David (2021). "E-Beam detection of over-etch in semiconductor processing and how over-etch level is related to defect detection parameters". In Adan, Ofer; Robinson, John C. (eds.). Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. p. 18. doi:10.1117/12.2584652. ISBN 978-1-5106-4055-9.
Stolt, Roland; Elgh, Fredrik; Andersson, Petter (2017). "Design for Inspection – Evaluating the Inspectability of Aerospace Components in the Early Stages of Design". Procedia Manufacturing. 11: 1193–1199. doi:10.1016/j.promfg.2017.07.244.
Chan, Ling-Yau; Wu, Shaomin (October 2009). "Optimal design for inspection and maintenance policy based on the CCC chart". Computers & Industrial Engineering. 57 (3): 667–676. doi:10.1016/j.cie.2008.12.009. hdl:1826/4041.

Chan, Ling-Yau; Wu, Shaomin (October 2009). "Optimal design for inspection and maintenance policy based on the CCC chart". Computers & Industrial Engineering. 57 (3): 667–676. doi:10.1016/j.cie.2008.12.009. hdl:1826/4041.