Design for manufacturability (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Design for manufacturability" in English language version.

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Chan, Ling-Yau; Wu, Shaomin (October 1, 2009). "Optimal design for inspection and maintenance policy based on the CCC chart". Computers & Industrial Engineering. 57 (3): 667–676. doi:10.1016/j.cie.2008.12.009. hdl:1826/4041. ISSN 0360-8352. S2CID 206721473.

diva-portal.org

hj.diva-portal.org

Stolt, Roland; Elgh, Frederik; Andersson, Petter (2017). "Design for Inspection - Evaluating the Inspectability of Aerospace Components in the Early Stages of Design". Procedia Manufacturing. 11: 1193–1199. doi:10.1016/j.promfg.2017.07.244 – via Elsevier Science Direct.

doi.org

Owusu-Boahen, Kwame; Han, Chang (Carl); Hsueh, Ching; Kim, Chulwoo (Jake); Vijayakumar, Arun; Devender, Fnu; Moreau, David J. (2021-02-22). "E-Beam detection of over-etch in semiconductor processing and how over-etch level is related to defect detection parameters". In Adan, Ofer; Robinson, John C. (eds.). Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. Vol. 11611. SPIE. pp. 99–104. Bibcode:2021SPIE11611E..0NO. doi:10.1117/12.2584652. ISBN 978-1-5106-4055-9.
Stolt, Roland; Elgh, Frederik; Andersson, Petter (2017). "Design for Inspection - Evaluating the Inspectability of Aerospace Components in the Early Stages of Design". Procedia Manufacturing. 11: 1193–1199. doi:10.1016/j.promfg.2017.07.244 – via Elsevier Science Direct.
Chan, Ling-Yau; Wu, Shaomin (October 1, 2009). "Optimal design for inspection and maintenance policy based on the CCC chart". Computers & Industrial Engineering. 57 (3): 667–676. doi:10.1016/j.cie.2008.12.009. hdl:1826/4041. ISSN 0360-8352. S2CID 206721473.

efunda.com

"Milling: Design Rules".

handle.net

hdl.handle.net

Chan, Ling-Yau; Wu, Shaomin (October 1, 2009). "Optimal design for inspection and maintenance policy based on the CCC chart". Computers & Industrial Engineering. 57 (3): 667–676. doi:10.1016/j.cie.2008.12.009. hdl:1826/4041. ISSN 0360-8352. S2CID 206721473.

harvard.edu

ui.adsabs.harvard.edu

Owusu-Boahen, Kwame; Han, Chang (Carl); Hsueh, Ching; Kim, Chulwoo (Jake); Vijayakumar, Arun; Devender, Fnu; Moreau, David J. (2021-02-22). "E-Beam detection of over-etch in semiconductor processing and how over-etch level is related to defect detection parameters". In Adan, Ofer; Robinson, John C. (eds.). Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. Vol. 11611. SPIE. pp. 99–104. Bibcode:2021SPIE11611E..0NO. doi:10.1117/12.2584652. ISBN 978-1-5106-4055-9.

parametric-usa.com

"How to Design Cheap Machined Parts and Why? - Parametric Manufacturing". 3 September 2016.
"Guide to CNC Machining Prototype & Production - Parametric Manufacturing". August 2016.
"The #1 Killer to a Low Price CNC Machined Part - Parametric Manufacturing - CNC Machine Shop + Wire EDM". 17 July 2016.

procnc.com

"Design Guide" (PDF). Pro CNC. Retrieved January 30, 2017.

reliableplant.com

Dolcemascolo, Darren. "DFM helps manufacturers reduce cost while maintaining value". Reliable Plant.

semanticscholar.org

api.semanticscholar.org

Chan, Ling-Yau; Wu, Shaomin (October 1, 2009). "Optimal design for inspection and maintenance policy based on the CCC chart". Computers & Industrial Engineering. 57 (3): 667–676. doi:10.1016/j.cie.2008.12.009. hdl:1826/4041. ISSN 0360-8352. S2CID 206721473.

spiedigitallibrary.org

Owusu-Boahen, Kwame; Han, Chang (Carl); Hsueh, Ching; Kim, Chulwoo (Jake); Vijayakumar, Arun; Devender, Fnu; Moreau, David J. (2021-02-22). "E-Beam detection of over-etch in semiconductor processing and how over-etch level is related to defect detection parameters". In Adan, Ofer; Robinson, John C. (eds.). Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. Vol. 11611. SPIE. pp. 99–104. Bibcode:2021SPIE11611E..0NO. doi:10.1117/12.2584652. ISBN 978-1-5106-4055-9.

worldcat.org

search.worldcat.org

Chan, Ling-Yau; Wu, Shaomin (October 1, 2009). "Optimal design for inspection and maintenance policy based on the CCC chart". Computers & Industrial Engineering. 57 (3): 667–676. doi:10.1016/j.cie.2008.12.009. hdl:1826/4041. ISSN 0360-8352. S2CID 206721473.