Design for testing (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Design for testing" in English language version.

refsWebsite

Global rank English rank

2web.archive.org

1^st place

1^st place

4,464^th place

4,468^th place

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archive.today (Global: 14^th place; English: 14^th place)

"Design for debugging: the unspoken imperative in chip design" article by Ron Wilson, EDN, 6/21/2007

tau.ac.il (Global: 4,464^th place; English: 4,468^th place)

eng.tau.ac.il

Ben-Gal I., Herer Y. and Raz T. (2003). "Self-correcting inspection procedure under inspection errors" (PDF). IIE Transactions on Quality and Reliability, 34(6), pp. 529-540. Archived from the original (PDF) on 2013-10-13. Retrieved 2014-01-10.
[1] Archived 2013-10-13 at the Wayback Machine

web.archive.org (Global: 1^st place; English: 1^st place)

Ben-Gal I., Herer Y. and Raz T. (2003). "Self-correcting inspection procedure under inspection errors" (PDF). IIE Transactions on Quality and Reliability, 34(6), pp. 529-540. Archived from the original (PDF) on 2013-10-13. Retrieved 2014-01-10.
[1] Archived 2013-10-13 at the Wayback Machine