Dynamic random-access memory (English Wikipedia)

Huang, Andrew (14 September 1996). "Bunnie's RAM FAQ". Archived from the original on 12 June 2017.
Cuppu, Vinodh; Jacob, Bruce; Davis, Brian; Mudge, Trevor (November 2001). "High-Performance DRAMs in Workstation Environments" (PDF). IEEE Transactions on Computers. 50 (11): 1133–1153. doi:10.1109/12.966491. hdl:1903/7456. Archived (PDF) from the original on 8 August 2017. Retrieved 2 November 2017.

cmu.edu

users.ece.cmu.edu

Yoongu Kim; Ross Daly; Jeremie Kim; Chris Fallin; Ji Hye Lee; Donghyuk Lee; Chris Wilkerson; Konrad Lai; Onur Mutlu (June 24, 2014). "Flipping Bits in Memory Without Accessing Them: DRAM Disturbance Errors" (PDF). ece.cmu.edu. Archived (PDF) from the original on 2015-03-26. Retrieved March 10, 2015.

ece.cmu.edu

"Understanding DRAM Operation (Application Note)" (PDF). IBM. December 1996. Archived from the original (PDF) on 29 August 2017.

cnn.com

edition.cnn.com

Kuriko Miyake (2001). "Japanese chip makers say they suspect dumping by Korean firms". CNN.
"Japanese chip makers suspect dumping by Korean firms". ITWorld. 2001.
"DRAM pricing investigation in Japan targets Hynix, Samsung". EETimes. 2001.
"Korean DRAM finds itself shut out of Japan". Phys.org. 2006.

computerhistory.org

"1966: Semiconductor RAMs Serve High-speed Storage Needs". Computer History Museum.
"1970: Semiconductors compete with magnetic cores". Computer History Museum.

archive.computerhistory.org

"Archived copy" (PDF). Archived from the original (PDF) on 2014-01-16. Retrieved 2014-01-15.{{cite web}}: CS1 maint: archived copy as title (link)

corsairmemory.com

"Corsair CMX1024-3200 (1 GByte, two bank unbuffered DDR SDRAM DIMM)" (PDF). December 2003. Archived from the original (PDF) on 11 September 2008.
"Corsair TWINX1024-3200XL dual-channel memory kit" (PDF). May 2004. Archived from the original (PDF) on 7 December 2006.

cypress.com

"psRAM(HyperRAM)". Cypress semiconductor.
"Hyperbus". Cypress semiconductor.

datasheetarchive.com

"KM48SL2000-7 Datasheet". Samsung. August 1992. Retrieved 19 June 2019.

doi.org

F. Morishita; et al. (21 September 2005). "A capacitorless twin-transistor random access memory (TTRAM) on SOI". Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005. Vol. Custom Integrated Circuits Conference 2005. pp. 428–431. doi:10.1109/CICC.2005.1568699. ISBN 978-0-7803-9023-2. S2CID 14952912.
Scheick, Leif Z.; Guertin, Steven M.; Swift, Gary M. (December 2000). "Analysis of radiation effects on individual DRAM cells". IEEE Transactions on Nuclear Science. 47 (6): 2534–2538. Bibcode:2000ITNS...47.2534S. doi:10.1109/23.903804. ISSN 0018-9499.
Cuppu, Vinodh; Jacob, Bruce; Davis, Brian; Mudge, Trevor (November 2001). "High-Performance DRAMs in Workstation Environments" (PDF). IEEE Transactions on Computers. 50 (11): 1133–1153. doi:10.1109/12.966491. hdl:1903/7456. Archived (PDF) from the original on 8 August 2017. Retrieved 2 November 2017.

edn.com

Mastipuram, Ritesh; Wee, Edwin C (30 September 2004). "Soft errors' impact on system reliability". EDN. Cypress Semiconductor. Archived from the original on 16 April 2007.

eetimes.com

EETimes; Hilson, Gary (2018-09-20). "DRAM Boom and Bust is Business as Usual". EETimes. Retrieved 2022-08-03.
Kuriko Miyake (2001). "Japanese chip makers say they suspect dumping by Korean firms". CNN.
"Japanese chip makers suspect dumping by Korean firms". ITWorld. 2001.
"DRAM pricing investigation in Japan targets Hynix, Samsung". EETimes. 2001.
"Korean DRAM finds itself shut out of Japan". Phys.org. 2006.
Mannion, Patrick (2008-07-12). "Under the Hood — Update: Apple iPhone 3G exposed". EETimes. Archived from the original on 2013-01-22.

handle.net

hdl.handle.net

Cuppu, Vinodh; Jacob, Bruce; Davis, Brian; Mudge, Trevor (November 2001). "High-Performance DRAMs in Workstation Environments" (PDF). IEEE Transactions on Computers. 50 (11): 1133–1153. doi:10.1109/12.966491. hdl:1903/7456. Archived (PDF) from the original on 8 August 2017. Retrieved 2 November 2017.

harvard.edu

ui.adsabs.harvard.edu

Scheick, Leif Z.; Guertin, Steven M.; Swift, Gary M. (December 2000). "Analysis of radiation effects on individual DRAM cells". IEEE Transactions on Nuclear Science. 47 (6): 2534–2538. Bibcode:2000ITNS...47.2534S. doi:10.1109/23.903804. ISSN 0018-9499.

ibm.com

"DRAM". IBM100. IBM. 9 August 2017. Retrieved 20 September 2019.
"IBM100 — DRAM". IBM. 9 August 2017.

icinsights.com

"Are the Major DRAM Suppliers Stunting DRAM Demand?". www.icinsights.com. Archived from the original on 2018-04-16. Retrieved 2018-04-16.

ieee.org

spectrum.ieee.org

"DRAM's Damning Defects—and How They Cripple Computers - IEEE Spectrum". Archived from the original on 2015-11-24. Retrieved 2015-11-24.

intelligentmemory.com

"ECC DRAM – Intelligent Memory". intelligentmemory.com. Archived from the original on 2014-12-23. Retrieved 2015-01-16.

itworld.com

Kuriko Miyake (2001). "Japanese chip makers say they suspect dumping by Korean firms". CNN.
"Japanese chip makers suspect dumping by Korean firms". ITWorld. 2001.
"DRAM pricing investigation in Japan targets Hynix, Samsung". EETimes. 2001.
"Korean DRAM finds itself shut out of Japan". Phys.org. 2006.

latimes.com

Sanger, David E. (3 August 1985). "Japan chip 'dumping' is found". New York Times.
Woutat., Donald (4 November 1985). "6 Japan Chip Makers Cited for Dumping". Los Angeles Times.
"More Japan Firms Accused: U.S. Contends 5 Companies Dumped Chips". Los Angeles Times. 1986.
Sanger, David E. (3 November 1987). "Japanese Chip Dumping Has Ended, U.S. Finds". New York Times.

legepfl.ch

Sallese, Jean-Michel (2002-06-20). "Principles of the 1T Dynamic Access Memory Concept on SOI" (PDF). MOS Modeling and Parameter Extraction Group Meeting. Wroclaw, Poland. Archived (PDF) from the original on 2007-11-29. Retrieved 2007-10-07.

micron.com

download.micron.com

"Micron 4 Meg x 4 EDO DRAM data sheet" (PDF). micron.com. Archived from the original (PDF) on 27 September 2007. Retrieved 8 May 2018.

microsoft.com

research.microsoft.com

"Cycles, cells and platters: an empirical analysis of hardware failures on a million consumer PCs. Proceedings of the sixth conference on Computer systems (EuroSys '11). pp 343-356" (PDF). 2011. Archived (PDF) from the original on 2012-11-14.

nextcomputers.org

"NeXTServiceManualPages1-160" (PDF). Retrieved 2022-03-09.

nytimes.com

Sanger, David E. (3 August 1985). "Japan chip 'dumping' is found". New York Times.
Woutat., Donald (4 November 1985). "6 Japan Chip Makers Cited for Dumping". Los Angeles Times.
"More Japan Firms Accused: U.S. Contends 5 Companies Dumped Chips". Los Angeles Times. 1986.
Sanger, David E. (3 November 1987). "Japanese Chip Dumping Has Ended, U.S. Finds". New York Times.

oldcalculatormuseum.com

"Spec Sheet for Toshiba "TOSCAL" BC-1411". www.oldcalculatormuseum.com. Archived from the original on 3 July 2017. Retrieved 8 May 2018.
Toshiba "Toscal" BC-1411 Desktop Calculator Archived 2007-05-20 at the Wayback Machine

patents.google.com

"Memory Circuit". Google Patents. Retrieved 18 June 2023.
US3387286A, Dennard, Robert H., "Field-effect transistor memory", issued 1968-06-04

pcguide.com

"Window RAM (WRAM)". Archived from the original on 2010-01-02.

phys.org

Kuriko Miyake (2001). "Japanese chip makers say they suspect dumping by Korean firms". CNN.
"Japanese chip makers suspect dumping by Korean firms". ITWorld. 2001.
"DRAM pricing investigation in Japan targets Hynix, Samsung". EETimes. 2001.
"Korean DRAM finds itself shut out of Japan". Phys.org. 2006.

princeton.edu

cs.princeton.edu

David August (2004-11-23). "Lecture 20: Memory Technology" (PDF). cs.princeton.edu. pp. 3–5. Archived from the original (PDF) on 2005-05-19. Retrieved 2015-03-10.

citp.princeton.edu

"Center for Information Technology Policy » Lest We Remember: Cold Boot Attacks on Encryption Keys". Archived from the original on July 22, 2011. 080222 citp.princeton.edu

radio-electronics.com

Ian Poole. "SDRAM Memory Basics & Tutorial". Archived from the original on 2018-02-27. Retrieved 26 Feb 2018.

reactivemicro.com

downloads.reactivemicro.com

Various Methods of DRAM Refresh Archived 2011-10-03 at the Wayback Machine Micron Technical Note TN-04-30

righto.com

Shirriff, Ken (November 2020). "Reverse-engineering the classic MK4116 16-kilobit DRAM chip".

rochester.edu

ece.rochester.edu

"A Memory Soft Error Measurement on Production Systems". www.ece.rochester.edu. Archived from the original on 14 February 2017. Retrieved 8 May 2018.

cs.rochester.edu

Li, Huang; Shen, Chu (2010). ""A Realistic Evaluation of Memory Hardware Errors and Software System Susceptibility". Usenix Annual Tech Conference 2010" (PDF). Archived (PDF) from the original on 2015-05-15.

samsung.com

"Samsung Electronics Develops First 128Mb SDRAM with DDR/SDR Manufacturing Option". Samsung Electronics. Samsung. 10 February 1999. Retrieved 23 June 2019.

sciencemuseum.org.uk

collection.sciencemuseum.org.uk

Toscal BC-1411 calculator Archived 2017-07-29 at the Wayback Machine, Science Museum, London

semanticscholar.org

api.semanticscholar.org

F. Morishita; et al. (21 September 2005). "A capacitorless twin-transistor random access memory (TTRAM) on SOI". Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005. Vol. Custom Integrated Circuits Conference 2005. pp. 428–431. doi:10.1109/CICC.2005.1568699. ISBN 978-0-7803-9023-2. S2CID 14952912.

shmj.or.jp

"Outbreak of Japan-US Semiconductor War" Archived 2020-02-29 at the Wayback Machine

simmtester.com

Lin, Albert (20 December 1999). "Memory Grades, the Most Confusing Subject". Simmtester.com. CST, Inc. Archived from the original on 7 November 2017. Retrieved 1 November 2017.

stackexchange.com

retrocomputing.stackexchange.com

"What is DRAM refresh and why is the weird Apple II video memory layout affected by it?".

tomshardware.com

Kent, Dean (24 October 1998). "Burst EDO (BEDO) - Ram Guide | Tom's Hardware". Tomshardware.com. Retrieved 2022-03-09.

toronto.edu

cs.toronto.edu

Schroeder, Bianca et al. (2009). "DRAM errors in the wild: a large-scale field study" Archived 2015-03-10 at the Wayback Machine. Proceedings of the Eleventh International Joint Conference on Measurement and Modeling of Computer Systems, pp. 193–204.

usenix.org

Lest We Remember: Cold Boot Attacks on Encryption Keys Archived 2015-01-05 at the Wayback Machine, Halderman et al, USENIX Security 2008.

utah.edu

eng.utah.edu

"Lecture 12: DRAM Basics" (PDF). utah.edu. 2011-02-17. Archived (PDF) from the original on 2015-06-16. Retrieved 2015-03-10.

utexas.edu

cs.utexas.edu

Proebsting, Robert (14 September 2005). "Oral History of Robert Proebsting" (PDF). Interviewed by Hendrie, Gardner. Computer History Museum. X3274.2006.

web.archive.org

"How to "open" microchip and what's inside? : ZeptoBars". 2012-11-15. Archived from the original on 2016-03-14. Retrieved 2016-04-02. Micron MT4C1024 — 1 mebibit (220 bit) dynamic ram. Widely used in 286 and 386-era computers, early 90s. Die size - 8662x3969μm.
"Are the Major DRAM Suppliers Stunting DRAM Demand?". www.icinsights.com. Archived from the original on 2018-04-16. Retrieved 2018-04-16.
"Spec Sheet for Toshiba "TOSCAL" BC-1411". www.oldcalculatormuseum.com. Archived from the original on 3 July 2017. Retrieved 8 May 2018.
Toscal BC-1411 calculator Archived 2017-07-29 at the Wayback Machine, Science Museum, London
Toshiba "Toscal" BC-1411 Desktop Calculator Archived 2007-05-20 at the Wayback Machine
"Archived copy" (PDF). Archived from the original (PDF) on 2014-01-16. Retrieved 2014-01-15.{{cite web}}: CS1 maint: archived copy as title (link)
"Outbreak of Japan-US Semiconductor War" Archived 2020-02-29 at the Wayback Machine
"Lecture 12: DRAM Basics" (PDF). utah.edu. 2011-02-17. Archived (PDF) from the original on 2015-06-16. Retrieved 2015-03-10.
David August (2004-11-23). "Lecture 20: Memory Technology" (PDF). cs.princeton.edu. pp. 3–5. Archived from the original (PDF) on 2005-05-19. Retrieved 2015-03-10.
Lest We Remember: Cold Boot Attacks on Encryption Keys Archived 2015-01-05 at the Wayback Machine, Halderman et al, USENIX Security 2008.
"Micron 4 Meg x 4 EDO DRAM data sheet" (PDF). micron.com. Archived from the original (PDF) on 27 September 2007. Retrieved 8 May 2018.
"Corsair CMX1024-3200 (1 GByte, two bank unbuffered DDR SDRAM DIMM)" (PDF). December 2003. Archived from the original (PDF) on 11 September 2008.
"Corsair TWINX1024-3200XL dual-channel memory kit" (PDF). May 2004. Archived from the original (PDF) on 7 December 2006.
Sallese, Jean-Michel (2002-06-20). "Principles of the 1T Dynamic Access Memory Concept on SOI" (PDF). MOS Modeling and Parameter Extraction Group Meeting. Wroclaw, Poland. Archived (PDF) from the original on 2007-11-29. Retrieved 2007-10-07.
"ECC DRAM – Intelligent Memory". intelligentmemory.com. Archived from the original on 2014-12-23. Retrieved 2015-01-16.
Mastipuram, Ritesh; Wee, Edwin C (30 September 2004). "Soft errors' impact on system reliability". EDN. Cypress Semiconductor. Archived from the original on 16 April 2007.
Schroeder, Bianca et al. (2009). "DRAM errors in the wild: a large-scale field study" Archived 2015-03-10 at the Wayback Machine. Proceedings of the Eleventh International Joint Conference on Measurement and Modeling of Computer Systems, pp. 193–204.
"A Memory Soft Error Measurement on Production Systems". www.ece.rochester.edu. Archived from the original on 14 February 2017. Retrieved 8 May 2018.
"DRAM's Damning Defects—and How They Cripple Computers - IEEE Spectrum". Archived from the original on 2015-11-24. Retrieved 2015-11-24.
Li, Huang; Shen, Chu (2010). ""A Realistic Evaluation of Memory Hardware Errors and Software System Susceptibility". Usenix Annual Tech Conference 2010" (PDF). Archived (PDF) from the original on 2015-05-15.
"Cycles, cells and platters: an empirical analysis of hardware failures on a million consumer PCs. Proceedings of the sixth conference on Computer systems (EuroSys '11). pp 343-356" (PDF). 2011. Archived (PDF) from the original on 2012-11-14.
"Center for Information Technology Policy » Lest We Remember: Cold Boot Attacks on Encryption Keys". Archived from the original on July 22, 2011. 080222 citp.princeton.edu
Yoongu Kim; Ross Daly; Jeremie Kim; Chris Fallin; Ji Hye Lee; Donghyuk Lee; Chris Wilkerson; Konrad Lai; Onur Mutlu (June 24, 2014). "Flipping Bits in Memory Without Accessing Them: DRAM Disturbance Errors" (PDF). ece.cmu.edu. Archived (PDF) from the original on 2015-03-26. Retrieved March 10, 2015.
Ian Poole. "SDRAM Memory Basics & Tutorial". Archived from the original on 2018-02-27. Retrieved 26 Feb 2018.
"Understanding DRAM Operation (Application Note)" (PDF). IBM. December 1996. Archived from the original (PDF) on 29 August 2017.
Various Methods of DRAM Refresh Archived 2011-10-03 at the Wayback Machine Micron Technical Note TN-04-30
Lin, Albert (20 December 1999). "Memory Grades, the Most Confusing Subject". Simmtester.com. CST, Inc. Archived from the original on 7 November 2017. Retrieved 1 November 2017.
Huang, Andrew (14 September 1996). "Bunnie's RAM FAQ". Archived from the original on 12 June 2017.
Cuppu, Vinodh; Jacob, Bruce; Davis, Brian; Mudge, Trevor (November 2001). "High-Performance DRAMs in Workstation Environments" (PDF). IEEE Transactions on Computers. 50 (11): 1133–1153. doi:10.1109/12.966491. hdl:1903/7456. Archived (PDF) from the original on 8 August 2017. Retrieved 2 November 2017.
"Window RAM (WRAM)". Archived from the original on 2010-01-02.

worldcat.org

search.worldcat.org

Scheick, Leif Z.; Guertin, Steven M.; Swift, Gary M. (December 2000). "Analysis of radiation effects on individual DRAM cells". IEEE Transactions on Nuclear Science. 47 (6): 2534–2538. Bibcode:2000ITNS...47.2534S. doi:10.1109/23.903804. ISSN 0018-9499.

zeptobars.com

"How to "open" microchip and what's inside? : ZeptoBars". 2012-11-15. Archived from the original on 2016-03-14. Retrieved 2016-04-02. Micron MT4C1024 — 1 mebibit (220 bit) dynamic ram. Widely used in 286 and 386-era computers, early 90s. Die size - 8662x3969μm.

zilog.com

Z80 CPU User Manual (PDF). p. 3.