Dynamic random-access memory (English Wikipedia)

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Cuppu, Vinodh; Jacob, Bruce; Davis, Brian; Mudge, Trevor (November 2001). "High-Performance DRAMs in Workstation Environments" (PDF). IEEE Transactions on Computers. 50 (11): 1133–1153. Bibcode:2001ITCmp..50.1133C. doi:10.1109/12.966491. hdl:1903/7456. Archived (PDF) from the original on 8 August 2017. Retrieved 2 November 2017.

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Cuppu, Vinodh; Jacob, Bruce; Davis, Brian; Mudge, Trevor (November 2001). "High-Performance DRAMs in Workstation Environments" (PDF). IEEE Transactions on Computers. 50 (11): 1133–1153. Bibcode:2001ITCmp..50.1133C. doi:10.1109/12.966491. hdl:1903/7456. Archived (PDF) from the original on 8 August 2017. Retrieved 2 November 2017.

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"ECC DRAM – Intelligent Memory". intelligentmemory.com. Archived from the original on 2014-12-23. Retrieved 2015-01-16.
Mastipuram, Ritesh; Wee, Edwin C (30 September 2004). "Soft errors' impact on system reliability". EDN. Cypress Semiconductor. Archived from the original on 16 April 2007.
Schroeder, Bianca et al. (2009). "DRAM errors in the wild: a large-scale field study" Archived 2015-03-10 at the Wayback Machine. Proceedings of the Eleventh International Joint Conference on Measurement and Modeling of Computer Systems, pp. 193–204.
"A Memory Soft Error Measurement on Production Systems". www.ece.rochester.edu. Archived from the original on 14 February 2017. Retrieved 8 May 2018.
"DRAM's Damning Defects—and How They Cripple Computers - IEEE Spectrum". Archived from the original on 2015-11-24. Retrieved 2015-11-24.
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"Cycles, cells and platters: an empirical analysis of hardware failures on a million consumer PCs. Proceedings of the sixth conference on Computer systems (EuroSys '11). pp 343-356" (PDF). 2011. Archived (PDF) from the original on 2012-11-14.
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Ian Poole. "SDRAM Memory Basics & Tutorial". Archived from the original on 2018-02-27. Retrieved 26 Feb 2018.
Understanding DRAM Operation (PDF) (Application Note). IBM. December 1996. Archived from the original (PDF) on 29 August 2017.
Various Methods of DRAM Refresh (PDF) (Technical Note). Micron Technology. 1994. TN-04-30. Archived from the original (PDF) on 2011-10-03.
EDO (Hyper Page Mode) (PDF) (Applications Note). IBM. 6 June 1996. Archived from the original (PDF) on 2021-12-02. a new address can be provided for the next access cycle before completing the current cycle. Consequently, the CAS pulse width can be shorter and the cycle time decreased dramatically.
Lin, Albert (20 December 1999). "Memory Grades, the Most Confusing Subject". Simmtester.com. CST, Inc. Archived from the original on 2020-08-12. Retrieved 1 November 2017. So for the same –60 part, EDO DRAM is about 30% faster than FPM DRAM in peak data rate.
Huang, Andrew (14 September 1996). "Bunnie's RAM FAQ". Archived from the original on 12 June 2017.
Cuppu, Vinodh; Jacob, Bruce; Davis, Brian; Mudge, Trevor (November 2001). "High-Performance DRAMs in Workstation Environments" (PDF). IEEE Transactions on Computers. 50 (11): 1133–1153. Bibcode:2001ITCmp..50.1133C. doi:10.1109/12.966491. hdl:1903/7456. Archived (PDF) from the original on 8 August 2017. Retrieved 2 November 2017.
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Scheick, Leif Z.; Guertin, Steven M.; Swift, Gary M. (December 2000). "Analysis of radiation effects on individual DRAM cells". IEEE Transactions on Nuclear Science. 47 (6): 2534–2538. Bibcode:2000ITNS...47.2534S. doi:10.1109/23.903804. ISSN 0018-9499.

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"How to "open" microchip and what's inside? : ZeptoBars". 2012-11-15. Archived from the original on 2016-03-14. Retrieved 2016-04-02. Micron MT4C1024 — 1 mebibit (220 bit) dynamic ram. Widely used in 286 and 386-era computers, early 90s. Die size - 8662x3969μm.

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Dynamic random-access memory (English Wikipedia)

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epfl.ch (Global: 3,783^rd place; English: 3,769^th place)

hdl.handle.net (Global: 66^th place; English: 34^th place)

ibm.com (Global: 1,369^th place; English: 968^th place)

ieee.org (Global: 912^th place; English: 722^nd place)

latimes.com (Global: 32^nd place; English: 21^st place)

microsoft.com (Global: 263^rd place; English: 259^th place)

nytimes.com (Global: 7^th place; English: 7^th place)

patents.google.com (Global: 1,154^th place; English: 606^th place)

phys.org (Global: 1,595^th place; English: 1,363^rd place)

princeton.edu (Global: 802^nd place; English: 528^th place)

rochester.edu (Global: 2,816^th place; English: 1,888^th place)

samsung.com (Global: 2,692^nd place; English: 2,465^th place)

sciencemuseum.org.uk (Global: low place; English: 8,101^st place)

semanticscholar.org (Global: 15^th place; English: 8^th place)

stackexchange.com (Global: 4,114^th place; English: 3,027^th place)

theregister.co.uk (Global: 1,877^th place; English: 1,233^rd place)

tomshardware.com (Global: 3,042^nd place; English: 1,982^nd place)

usenix.org (Global: 7,359^th place; English: 4,657^th place)

utah.edu (Global: 2,766^th place; English: 1,555^th place)

utexas.edu (Global: 868^th place; English: 634^th place)

web.archive.org (Global: 1^st place; English: 1^st place)

worldcat.org (Global: 4^th place; English: 4^th place)