Sign In

Login

Password

Forgot Password ? Sign Up

Elastic recoil detection (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Elastic recoil detection" in English language version.

refsWebsite
Global rank English rank
35doi.org
2nd place
2nd place
30harvard.edu
18th place
17th place
4semanticscholar.org
11th place
8th place
2nih.gov
4th place
4th place
2web.archive.org
1st place
1st place
1psu.edu
207th place
136th place
1osti.gov
2,036th place
1,254th place
1msu.edu
1,844th place
1,231st place
1mpg.de
1,624th place
1,592nd place
1spirit-ion.eu
low place
low place
1photonis.com
low place
low place
1books.google.com
3rd place
3rd place
1archive.org
6th place
6th place

archive.org

books.google.com

doi.org

  • Assmann, W.; Huber, H.; Steinhausen, Ch.; Dobler, M.; Glückler, H.; Weidinger, A. (1 May 1994). "Elastic recoil detection analysis with heavy ions". Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 89 (1–4): 131–139. Bibcode:1994NIMPB..89..131A. doi:10.1016/0168-583X(94)95159-4.
  • Brijs, B.; Deleu, J.; Conard, T.; De Witte, H.; Vandervorst, W.; Nakajima, K.; Kimura, K.; Genchev, I.; Bergmaier, A.; Goergens, L.; Neumaier, P.; Dollinger, G.; Döbeli, M. (2000). "Characterization of ultra thin oxynitrides: A general approach". Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 161–163: 429–434. Bibcode:2000NIMPB.161..429B. CiteSeerX 10.1.1.521.6748. doi:10.1016/S0168-583X(99)00674-6.
  • Dollinger, G.; Bergmaier, A.; Faestermann, T.; Frey, C. M. (1995). "High resolution depth profile analysis by elastic recoil detection with heavy ions". Fresenius' Journal of Analytical Chemistry. 353 (3–4): 311–315. doi:10.1007/BF00322058. PMID 15048488. S2CID 197595083.
  • L’Ecuyer, J.; Brassard, C.; Cardinal, C.; Chabbal, J.; Deschênes, L.; Labrie, J.P.; Terreault, B.; Martel, J.G.; St. Jacques, R. (1976). "An accurate and sensitive method for the determination of the depth distribution of light elements in heavy materials". Journal of Applied Physics. 47 (1): 381. Bibcode:1976JAP....47..381L. doi:10.1063/1.322288.
  • Tomita, Mitsuhiro; Akutsu, Haruko; Oshima, Yasunori; Sato, Nobutaka; Mure, Shoichi; Fukuyama, Hirofumi; Ichihara, Chikara (2010). "Depth profile analysis of helium in silicon with high-resolution elastic recoil detection analysis". Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 28 (3): 554. Bibcode:2010JVSTB..28..554T. doi:10.1116/1.3425636.
  • Elliman, R.G.; Timmers, H.; Palmer, G.R.; Ophel, T.R. (1998). "Limitations to depth resolution in high-energy, heavy-ion elastic recoil detection analysis". Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 136–138 (1–4): 649–653. Bibcode:1998NIMPB.136..649E. doi:10.1016/S0168-583X(97)00879-3.
  • Avasthi, DK (1997). "Role of swift heavy ions in materials characterization and modification". Vacuum. 48 (12): 1011–1015. Bibcode:1997Vacuu..48.1011A. doi:10.1016/S0042-207X(97)00114-0.
  • Dollinger, G.; Bergmaier, A.; Faestermann, T.; Frey, C. M. (1 October 1995). "High resolution depth profile analysis by elastic recoil detection with heavy ions". Analytical and Bioanalytical Chemistry. 353 (3–4): 311–315. doi:10.1007/s0021653530311. PMID 15048488. S2CID 43574325.
  • Yu, R.; Gustafsson, T. (December 1986). "Determination of the abundance of adsorbed light atoms on a surface using recoil scattering". Surface Science. 177 (2): L987 – L993. Bibcode:1986SurSc.177L.987Y. doi:10.1016/0039-6028(86)90133-0.
  • Seiberling, L.E.; Cooper, B.H.; Griffith, J.E.; Mendenhall, M.H.; Tombrello, T.A. (1982). "The sputtering of insulating materials by fast heavy ions". Nuclear Instruments and Methods in Physics Research. 198 (1): 17–25. Bibcode:1982NIMPR.198...17S. doi:10.1016/0167-5087(82)90045-X.
  • Stoquert, J.P.; Guillaume, G.; Hage-Ah, M.; Grob, J.J.; Gamer, C.; Siffert, P. (1989). "Determination of concentration profiles by elastic recoil detection with a ΔE−E gas telescope and high energy incident heavy ions". Nuclear Instruments and Methods in Physics Research Section B. 44 (2): 184–194. Bibcode:1989NIMPB..44..184S. doi:10.1016/0168-583X(89)90426-6.
  • Jeynes, Chris; Webb, Roger P.; Lohstroh, Annika (January 2011). "Ion Beam Analysis: A Century of Exploiting the Electronic and Nuclear Structure of the Atom for Materials Characterisation". Reviews of Accelerator Science and Technology. 4 (1): 41–82. Bibcode:2011rast.book...41J. doi:10.1142/S1793626811000483.
  • Doyle, B.L.; Peercy, P.S.; Gray, T.J.; Cocke, C.L.; Justiniano, E. (1983). "Surface Spectroscopy Using High Energy Heavy Ions". IEEE Transactions on Nuclear Science. 30 (NS-30): 1252. Bibcode:1983ITNS...30.1252D. doi:10.1109/TNS.1983.4332502. S2CID 26944869.
  • Terreault, B.; Martel, J.G.; St-Jacques, R.G.; L'Ecuyer, J. (January 1977). "Depth profiling of light elements in materials with high-energy ion beams". Journal of Vacuum Science and Technology. 14 (1): 492–500. Bibcode:1977JVST...14..492T. doi:10.1116/1.569240.
  • Szilágyi, E.; Pászti, F.; Quillet, V.; Abel, F. (1994). "Optimization of the depth resolution in ERDA of H using 12C ions". Nuclear Instruments and Methods in Physics Research Section B. 85 (1–4): 63–67. Bibcode:1994NIMPB..85...63S. doi:10.1016/0168-583X(94)95787-8.
  • Mallepell, M.; Döbeli, M.; Suter, M. (2009). "Annular gas ionization detector for low energy heavy ion backscattering spectrometry". Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 267 (7): 1193–1198. Bibcode:2009NIMPB.267.1193M. doi:10.1016/j.nimb.2009.01.031.
  • For a more detailed description of ionization detector design, see Assmann, W.; Hartung, P.; Huber, H.; Staat, P.; Steinhausen, C.; Steffens, H. (1994). "Elastic recoil detection analysis with heavy ions". Nuclear Instruments and Methods in Physics Research Section B. 85 (1–4): 726–731. Bibcode:1994NIMPB..85..726A. doi:10.1016/0168-583X(94)95911-0.
  • Szilágyi, E.; Pászti, F.; Amsel, G. (1995). "Theoretical approximations for depth resolution calculations in IBA methods". Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 100 (1): 103–121. Bibcode:1995NIMPB.100..103S. doi:10.1016/0168-583X(95)00186-7.
  • Szilagyi, E.; Paszti, F.; Amsel, G. (1995). "Theoretical approach of depth resolution in IBA geometry". Journal of the American Chemical Society. 100 (1): 103–121. Bibcode:1995NIMPB.100..103S. doi:10.1016/0168-583X(95)00186-7.
  • Tschalär, C.; Maccabee, H. (1970). "Energy-Straggling Measurements of Heavy Charged Particles in Thick Absorbers". Physical Review B. 1 (7): 2863–2869. Bibcode:1970PhRvB...1.2863T. doi:10.1103/PhysRevB.1.2863.
  • Bohr, N. (1913). "II". Philosophical Magazine. Series 6. 25 (145): 10–31. doi:10.1080/14786440108634305.
  • Schmaus, D.; L'hoir, A. (1984). "Experimental study of the multiple scattering lateral spread of MeV protons transmitted through polyester films". Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 2 (1–3): 156–158. Bibcode:1984NIMPB...2..156S. doi:10.1016/0168-583X(84)90178-2.
  • Payne, M. (1969). "Energy Straggling of Heavy Charged Particles in Thick Absorbers". Physical Review. 185 (2): 611–623. Bibcode:1969PhRv..185..611P. doi:10.1103/PhysRev.185.611.
  • Tschalär, C. (1968). "Straggling distributions of large energy losses". Nuclear Instruments and Methods. 61 (2): 141–156. Bibcode:1968NucIM..61..141T. doi:10.1016/0029-554X(68)90535-1.
  • Scott, William (1963). "The Theory of Small-Angle Multiple Scattering of Fast Charged Particles". Reviews of Modern Physics. 35 (2): 231–313. Bibcode:1963RvMP...35..231S. doi:10.1103/RevModPhys.35.231.
  • Sigmund, P.; Heinemeier, J.; Besenbacher, F.; Hvelplund, P.; Knudsen, H. (1978). "Small-angle multiple scattering of ions in the screened-coulomb region. III. Combined angular and lateral spread". Nuclear Instruments and Methods. 150 (2): 221–231. Bibcode:1978NucIM.150..221S. doi:10.1016/0029-554X(78)90370-1.
  • Williams, E. J. (1 October 1929). "The Straggling of Formula-Particles". Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences. 125 (798): 420–445. Bibcode:1929RSPSA.125..420W. doi:10.1098/rspa.1929.0177.
  • Williams, E. (1940). "Multiple Scattering of Fast Electrons and Alpha-Particles, and "Curvature" of Cloud Tracks Due to Scattering". Physical Review. 58 (4): 292–306. Bibcode:1940PhRv...58..292W. doi:10.1103/PhysRev.58.292.
  • Williams, E. (1945). "Application of Ordinary Space-Time Concepts in Collision Problems and Relation of Classical Theory to Born's Approximation". Reviews of Modern Physics. 17 (2–3): 217–226. Bibcode:1945RvMP...17..217W. doi:10.1103/RevModPhys.17.217.
  • Goudsmit, S.; Saunderson, J. (1940). "Multiple Scattering of Electrons. II". Physical Review. 58 (1): 36–42. Bibcode:1940PhRv...58...36G. doi:10.1103/PhysRev.58.36.
  • Meyer, L. (1971). "Plural and multiple scattering of low-energy heavy particles in solids". Physica Status Solidi B. 44 (1): 253–268. Bibcode:1971PSSBR..44..253M. doi:10.1002/pssb.2220440127.
  • "Small-angle multiple scattering of ions in the screened coulomb region". Journal of the ICRU. 12 (1): 239–253. 2005. doi:10.1093/jicru/ndi014.
  • Composto, Russell J.; Walters, Russel M.; Genzer, Jan (2002). "Application of ion scattering techniques to characterize polymer surfaces and interfaces". Materials Science and Engineering: R: Reports. 38 (3–4): 107–180. doi:10.1016/S0927-796X(02)00009-8.
  • Green, Peter F.; Russell, Thomas P. (1991). "Segregation of low molecular weight symmetric diblock copolymers at the interface of high molecular weight homopolymers". Macromolecules. 24 (10): 2931–2935. Bibcode:1991MaMol..24.2931G. doi:10.1021/ma00010a045.
  • Gusinskii, G M; Kudryavtsev, I V; Kudoyarova, V K; Naidenov, V O; Rassadin, L A (1 July 1992). "A method for investigation of light-element distribution in the surface layers of semiconductors and dielectrics". Semiconductor Science and Technology. 7 (7): 881–887. Bibcode:1992SeScT...7..881G. doi:10.1088/0268-1242/7/7/002. S2CID 250777983.

harvard.edu

ui.adsabs.harvard.edu

  • Assmann, W.; Huber, H.; Steinhausen, Ch.; Dobler, M.; Glückler, H.; Weidinger, A. (1 May 1994). "Elastic recoil detection analysis with heavy ions". Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 89 (1–4): 131–139. Bibcode:1994NIMPB..89..131A. doi:10.1016/0168-583X(94)95159-4.
  • Brijs, B.; Deleu, J.; Conard, T.; De Witte, H.; Vandervorst, W.; Nakajima, K.; Kimura, K.; Genchev, I.; Bergmaier, A.; Goergens, L.; Neumaier, P.; Dollinger, G.; Döbeli, M. (2000). "Characterization of ultra thin oxynitrides: A general approach". Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 161–163: 429–434. Bibcode:2000NIMPB.161..429B. CiteSeerX 10.1.1.521.6748. doi:10.1016/S0168-583X(99)00674-6.
  • L’Ecuyer, J.; Brassard, C.; Cardinal, C.; Chabbal, J.; Deschênes, L.; Labrie, J.P.; Terreault, B.; Martel, J.G.; St. Jacques, R. (1976). "An accurate and sensitive method for the determination of the depth distribution of light elements in heavy materials". Journal of Applied Physics. 47 (1): 381. Bibcode:1976JAP....47..381L. doi:10.1063/1.322288.
  • Tomita, Mitsuhiro; Akutsu, Haruko; Oshima, Yasunori; Sato, Nobutaka; Mure, Shoichi; Fukuyama, Hirofumi; Ichihara, Chikara (2010). "Depth profile analysis of helium in silicon with high-resolution elastic recoil detection analysis". Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 28 (3): 554. Bibcode:2010JVSTB..28..554T. doi:10.1116/1.3425636.
  • Elliman, R.G.; Timmers, H.; Palmer, G.R.; Ophel, T.R. (1998). "Limitations to depth resolution in high-energy, heavy-ion elastic recoil detection analysis". Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 136–138 (1–4): 649–653. Bibcode:1998NIMPB.136..649E. doi:10.1016/S0168-583X(97)00879-3.
  • Avasthi, DK (1997). "Role of swift heavy ions in materials characterization and modification". Vacuum. 48 (12): 1011–1015. Bibcode:1997Vacuu..48.1011A. doi:10.1016/S0042-207X(97)00114-0.
  • Yu, R.; Gustafsson, T. (December 1986). "Determination of the abundance of adsorbed light atoms on a surface using recoil scattering". Surface Science. 177 (2): L987 – L993. Bibcode:1986SurSc.177L.987Y. doi:10.1016/0039-6028(86)90133-0.
  • Seiberling, L.E.; Cooper, B.H.; Griffith, J.E.; Mendenhall, M.H.; Tombrello, T.A. (1982). "The sputtering of insulating materials by fast heavy ions". Nuclear Instruments and Methods in Physics Research. 198 (1): 17–25. Bibcode:1982NIMPR.198...17S. doi:10.1016/0167-5087(82)90045-X.
  • Stoquert, J.P.; Guillaume, G.; Hage-Ah, M.; Grob, J.J.; Gamer, C.; Siffert, P. (1989). "Determination of concentration profiles by elastic recoil detection with a ΔE−E gas telescope and high energy incident heavy ions". Nuclear Instruments and Methods in Physics Research Section B. 44 (2): 184–194. Bibcode:1989NIMPB..44..184S. doi:10.1016/0168-583X(89)90426-6.
  • Jeynes, Chris; Webb, Roger P.; Lohstroh, Annika (January 2011). "Ion Beam Analysis: A Century of Exploiting the Electronic and Nuclear Structure of the Atom for Materials Characterisation". Reviews of Accelerator Science and Technology. 4 (1): 41–82. Bibcode:2011rast.book...41J. doi:10.1142/S1793626811000483.
  • Doyle, B.L.; Peercy, P.S.; Gray, T.J.; Cocke, C.L.; Justiniano, E. (1983). "Surface Spectroscopy Using High Energy Heavy Ions". IEEE Transactions on Nuclear Science. 30 (NS-30): 1252. Bibcode:1983ITNS...30.1252D. doi:10.1109/TNS.1983.4332502. S2CID 26944869.
  • Terreault, B.; Martel, J.G.; St-Jacques, R.G.; L'Ecuyer, J. (January 1977). "Depth profiling of light elements in materials with high-energy ion beams". Journal of Vacuum Science and Technology. 14 (1): 492–500. Bibcode:1977JVST...14..492T. doi:10.1116/1.569240.
  • Szilágyi, E.; Pászti, F.; Quillet, V.; Abel, F. (1994). "Optimization of the depth resolution in ERDA of H using 12C ions". Nuclear Instruments and Methods in Physics Research Section B. 85 (1–4): 63–67. Bibcode:1994NIMPB..85...63S. doi:10.1016/0168-583X(94)95787-8.
  • Mallepell, M.; Döbeli, M.; Suter, M. (2009). "Annular gas ionization detector for low energy heavy ion backscattering spectrometry". Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 267 (7): 1193–1198. Bibcode:2009NIMPB.267.1193M. doi:10.1016/j.nimb.2009.01.031.
  • For a more detailed description of ionization detector design, see Assmann, W.; Hartung, P.; Huber, H.; Staat, P.; Steinhausen, C.; Steffens, H. (1994). "Elastic recoil detection analysis with heavy ions". Nuclear Instruments and Methods in Physics Research Section B. 85 (1–4): 726–731. Bibcode:1994NIMPB..85..726A. doi:10.1016/0168-583X(94)95911-0.
  • Szilágyi, E.; Pászti, F.; Amsel, G. (1995). "Theoretical approximations for depth resolution calculations in IBA methods". Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 100 (1): 103–121. Bibcode:1995NIMPB.100..103S. doi:10.1016/0168-583X(95)00186-7.
  • Szilagyi, E.; Paszti, F.; Amsel, G. (1995). "Theoretical approach of depth resolution in IBA geometry". Journal of the American Chemical Society. 100 (1): 103–121. Bibcode:1995NIMPB.100..103S. doi:10.1016/0168-583X(95)00186-7.
  • Tschalär, C.; Maccabee, H. (1970). "Energy-Straggling Measurements of Heavy Charged Particles in Thick Absorbers". Physical Review B. 1 (7): 2863–2869. Bibcode:1970PhRvB...1.2863T. doi:10.1103/PhysRevB.1.2863.
  • Schmaus, D.; L'hoir, A. (1984). "Experimental study of the multiple scattering lateral spread of MeV protons transmitted through polyester films". Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 2 (1–3): 156–158. Bibcode:1984NIMPB...2..156S. doi:10.1016/0168-583X(84)90178-2.
  • Payne, M. (1969). "Energy Straggling of Heavy Charged Particles in Thick Absorbers". Physical Review. 185 (2): 611–623. Bibcode:1969PhRv..185..611P. doi:10.1103/PhysRev.185.611.
  • Tschalär, C. (1968). "Straggling distributions of large energy losses". Nuclear Instruments and Methods. 61 (2): 141–156. Bibcode:1968NucIM..61..141T. doi:10.1016/0029-554X(68)90535-1.
  • Scott, William (1963). "The Theory of Small-Angle Multiple Scattering of Fast Charged Particles". Reviews of Modern Physics. 35 (2): 231–313. Bibcode:1963RvMP...35..231S. doi:10.1103/RevModPhys.35.231.
  • Sigmund, P.; Heinemeier, J.; Besenbacher, F.; Hvelplund, P.; Knudsen, H. (1978). "Small-angle multiple scattering of ions in the screened-coulomb region. III. Combined angular and lateral spread". Nuclear Instruments and Methods. 150 (2): 221–231. Bibcode:1978NucIM.150..221S. doi:10.1016/0029-554X(78)90370-1.
  • Williams, E. J. (1 October 1929). "The Straggling of Formula-Particles". Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences. 125 (798): 420–445. Bibcode:1929RSPSA.125..420W. doi:10.1098/rspa.1929.0177.
  • Williams, E. (1940). "Multiple Scattering of Fast Electrons and Alpha-Particles, and "Curvature" of Cloud Tracks Due to Scattering". Physical Review. 58 (4): 292–306. Bibcode:1940PhRv...58..292W. doi:10.1103/PhysRev.58.292.
  • Williams, E. (1945). "Application of Ordinary Space-Time Concepts in Collision Problems and Relation of Classical Theory to Born's Approximation". Reviews of Modern Physics. 17 (2–3): 217–226. Bibcode:1945RvMP...17..217W. doi:10.1103/RevModPhys.17.217.
  • Goudsmit, S.; Saunderson, J. (1940). "Multiple Scattering of Electrons. II". Physical Review. 58 (1): 36–42. Bibcode:1940PhRv...58...36G. doi:10.1103/PhysRev.58.36.
  • Meyer, L. (1971). "Plural and multiple scattering of low-energy heavy particles in solids". Physica Status Solidi B. 44 (1): 253–268. Bibcode:1971PSSBR..44..253M. doi:10.1002/pssb.2220440127.
  • Green, Peter F.; Russell, Thomas P. (1991). "Segregation of low molecular weight symmetric diblock copolymers at the interface of high molecular weight homopolymers". Macromolecules. 24 (10): 2931–2935. Bibcode:1991MaMol..24.2931G. doi:10.1021/ma00010a045.
  • Gusinskii, G M; Kudryavtsev, I V; Kudoyarova, V K; Naidenov, V O; Rassadin, L A (1 July 1992). "A method for investigation of light-element distribution in the surface layers of semiconductors and dielectrics". Semiconductor Science and Technology. 7 (7): 881–887. Bibcode:1992SeScT...7..881G. doi:10.1088/0268-1242/7/7/002. S2CID 250777983.

mpg.de

www2.ipp.mpg.de

msu.edu

nscl.msu.edu

nih.gov

pubmed.ncbi.nlm.nih.gov

  • Dollinger, G.; Bergmaier, A.; Faestermann, T.; Frey, C. M. (1995). "High resolution depth profile analysis by elastic recoil detection with heavy ions". Fresenius' Journal of Analytical Chemistry. 353 (3–4): 311–315. doi:10.1007/BF00322058. PMID 15048488. S2CID 197595083.
  • Dollinger, G.; Bergmaier, A.; Faestermann, T.; Frey, C. M. (1 October 1995). "High resolution depth profile analysis by elastic recoil detection with heavy ions". Analytical and Bioanalytical Chemistry. 353 (3–4): 311–315. doi:10.1007/s0021653530311. PMID 15048488. S2CID 43574325.

osti.gov

photonis.com

psu.edu

citeseerx.ist.psu.edu

  • Brijs, B.; Deleu, J.; Conard, T.; De Witte, H.; Vandervorst, W.; Nakajima, K.; Kimura, K.; Genchev, I.; Bergmaier, A.; Goergens, L.; Neumaier, P.; Dollinger, G.; Döbeli, M. (2000). "Characterization of ultra thin oxynitrides: A general approach". Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 161–163: 429–434. Bibcode:2000NIMPB.161..429B. CiteSeerX 10.1.1.521.6748. doi:10.1016/S0168-583X(99)00674-6.

semanticscholar.org

api.semanticscholar.org

  • Dollinger, G.; Bergmaier, A.; Faestermann, T.; Frey, C. M. (1995). "High resolution depth profile analysis by elastic recoil detection with heavy ions". Fresenius' Journal of Analytical Chemistry. 353 (3–4): 311–315. doi:10.1007/BF00322058. PMID 15048488. S2CID 197595083.
  • Dollinger, G.; Bergmaier, A.; Faestermann, T.; Frey, C. M. (1 October 1995). "High resolution depth profile analysis by elastic recoil detection with heavy ions". Analytical and Bioanalytical Chemistry. 353 (3–4): 311–315. doi:10.1007/s0021653530311. PMID 15048488. S2CID 43574325.
  • Doyle, B.L.; Peercy, P.S.; Gray, T.J.; Cocke, C.L.; Justiniano, E. (1983). "Surface Spectroscopy Using High Energy Heavy Ions". IEEE Transactions on Nuclear Science. 30 (NS-30): 1252. Bibcode:1983ITNS...30.1252D. doi:10.1109/TNS.1983.4332502. S2CID 26944869.
  • Gusinskii, G M; Kudryavtsev, I V; Kudoyarova, V K; Naidenov, V O; Rassadin, L A (1 July 1992). "A method for investigation of light-element distribution in the surface layers of semiconductors and dielectrics". Semiconductor Science and Technology. 7 (7): 881–887. Bibcode:1992SeScT...7..881G. doi:10.1088/0268-1242/7/7/002. S2CID 250777983.

spirit-ion.eu

web.archive.org