Electron-beam technology (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Electron-beam technology" in English language version.

refsWebsite

Global rank English rank

5^th place

5^th place

low place

low place

1web.archive.org

1^st place

1^st place

7,696^th place

9,995^th place

485^th place

440^th place

2^nd place

2^nd place

doi.org

Haguenau, F.; Hawkes, P.W.; Hutchison, J.L.; Satiat–Jeunemaître, B.; Simon, G.T.; Williams, D.B. (April 2003). "Key Events in the History of Electron Microscopy". Microscopy and Microanalysis. 9 (2): 96–138. doi:10.1017/S1431927603030113. ISSN 1431-9276.

ebeam.com

Electron Beam Applications Archived 2016-10-22 at the Wayback Machine.

fraunhofer.de

fep.fraunhofer.de

"Development of Electron Beam Systems and Technologies".

oup.com

academic.oup.com

Haguenau, F.; Hawkes, P.W.; Hutchison, J.L.; Satiat–Jeunemaître, B.; Simon, G.T.; Williams, D.B. (April 2003). "Key Events in the History of Electron Microscopy". Microscopy and Microanalysis. 9 (2): 96–138. doi:10.1017/S1431927603030113. ISSN 1431-9276.

web.archive.org

Electron Beam Applications Archived 2016-10-22 at the Wayback Machine.

worldcat.org

search.worldcat.org

Reimer, Ludwig (2013). Transmission Electron Microscopy : Physics of Image Formation and Microanalysis. Springer Berlin / Heidelberg. ISBN 978-3-662-13553-2. OCLC 1066178493.
Haguenau, F.; Hawkes, P.W.; Hutchison, J.L.; Satiat–Jeunemaître, B.; Simon, G.T.; Williams, D.B. (April 2003). "Key Events in the History of Electron Microscopy". Microscopy and Microanalysis. 9 (2): 96–138. doi:10.1017/S1431927603030113. ISSN 1431-9276.

worldcat.org

Reimer, Ludwig (2013). Transmission Electron Microscopy : Physics of Image Formation and Microanalysis. Springer Berlin / Heidelberg. ISBN 978-3-662-13553-2. OCLC 1066178493.