Electron beam-induced deposition (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Electron beam-induced deposition" in English language version.

refsWebsite

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10doi.org

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9harvard.edu

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8nih.gov

4^th place

2worldcat.org

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1semanticscholar.org

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1zenodo.org

621^st place

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doi.org

Carden, Will G.; Lu, Hang; Spencer, Julie A.; Fairbrother, D. Howard; McElwee-White, Lisa (2018-06-01). "Mechanism-based design of precursors for focused electron beam-induced deposition". MRS Communications. 8 (2): 343–357. doi:10.1557/mrc.2018.77. ISSN 2159-6867.
Mura, Francesco; Cognigni, Flavio; Ferroni, Matteo; Morandi, Vittorio; Rossi, Marco (2023-08-24). "Advances in Focused Ion Beam Tomography for Three-Dimensional Characterization in Materials Science". Materials. 16 (17): 5808. Bibcode:2023Mate...16.5808M. doi:10.3390/ma16175808. ISSN 1996-1944. PMC 10488958. PMID 37687502.
Kiyohara, Shuji; Takamatsu, Hideaki; Mori, Katsumi (2002). "Microfabrication of diamond films by localized electron beam chemical vapour deposition". Semiconductor Science and Technology. 17 (10): 1096. Bibcode:2002SeScT..17.1096K. doi:10.1088/0268-1242/17/10/311.
Nayak, A.; Banerjee, H. D. (1995). "Electron beam activated plasma chemical vapour deposition of polycrystalline diamond films". Physica Status Solidi A. 151 (1): 107–112. Bibcode:1995PSSAR.151..107N. doi:10.1002/pssa.2211510112.
Randolph, S.; Fowlkes, J.; Rack, P. (2006). "Focused, Nanoscale Electron-Beam-Induced Deposition and Etching". Critical Reviews of Solid State and Materials Sciences. 31 (3): 55. Bibcode:2006CRSSM..31...55R. doi:10.1080/10408430600930438. S2CID 93769658.
K. Furuya (2008). "Nanofabrication by advanced electron microscopy using intense and focused beam". Sci. Technol. Adv. Mater. 9 (1): 014110. Bibcode:2008STAdM...9a4110F. doi:10.1088/1468-6996/9/1/014110. PMC 5099805. PMID 27877936.
M. Song and K. Furuya (2008). "Fabrication and characterization of nanostructures on insulator substrates by electron-beam-induced deposition". Sci. Technol. Adv. Mater. 9 (2): 023002. Bibcode:2008STAdM...9b3002S. doi:10.1088/1468-6996/9/2/023002. PMC 5099707. PMID 27877950.
Erni, Rolf; Rossell, MD; Kisielowski, C; Dahmen, U (2009). "Atomic-Resolution Imaging with a Sub-50-pm Electron Probe". Physical Review Letters. 102 (9): 096101. Bibcode:2009PhRvL.102i6101E. doi:10.1103/PhysRevLett.102.096101. PMID 19392535.
Van Dorp, Willem F. (2005). "Approaching the Resolution Limit of Nanometer-Scale Electron Beam-Induced Deposition". Nano Letters. 5 (7): 1303–7. Bibcode:2005NanoL...5.1303V. doi:10.1021/nl050522i. PMID 16178228.
Luxmoore, I; Ross, I; Cullis, A; Fry, P; Orr, J; Buckle, P; Jefferson, J (2007). "Low temperature electrical characterisation of tungsten nano-wires fabricated by electron and ion beam induced chemical vapour deposition". Thin Solid Films. 515 (17): 6791. Bibcode:2007TSF...515.6791L. doi:10.1016/j.tsf.2007.02.029.

harvard.edu

ui.adsabs.harvard.edu

Mura, Francesco; Cognigni, Flavio; Ferroni, Matteo; Morandi, Vittorio; Rossi, Marco (2023-08-24). "Advances in Focused Ion Beam Tomography for Three-Dimensional Characterization in Materials Science". Materials. 16 (17): 5808. Bibcode:2023Mate...16.5808M. doi:10.3390/ma16175808. ISSN 1996-1944. PMC 10488958. PMID 37687502.
Kiyohara, Shuji; Takamatsu, Hideaki; Mori, Katsumi (2002). "Microfabrication of diamond films by localized electron beam chemical vapour deposition". Semiconductor Science and Technology. 17 (10): 1096. Bibcode:2002SeScT..17.1096K. doi:10.1088/0268-1242/17/10/311.
Nayak, A.; Banerjee, H. D. (1995). "Electron beam activated plasma chemical vapour deposition of polycrystalline diamond films". Physica Status Solidi A. 151 (1): 107–112. Bibcode:1995PSSAR.151..107N. doi:10.1002/pssa.2211510112.
Randolph, S.; Fowlkes, J.; Rack, P. (2006). "Focused, Nanoscale Electron-Beam-Induced Deposition and Etching". Critical Reviews of Solid State and Materials Sciences. 31 (3): 55. Bibcode:2006CRSSM..31...55R. doi:10.1080/10408430600930438. S2CID 93769658.
K. Furuya (2008). "Nanofabrication by advanced electron microscopy using intense and focused beam". Sci. Technol. Adv. Mater. 9 (1): 014110. Bibcode:2008STAdM...9a4110F. doi:10.1088/1468-6996/9/1/014110. PMC 5099805. PMID 27877936.
M. Song and K. Furuya (2008). "Fabrication and characterization of nanostructures on insulator substrates by electron-beam-induced deposition". Sci. Technol. Adv. Mater. 9 (2): 023002. Bibcode:2008STAdM...9b3002S. doi:10.1088/1468-6996/9/2/023002. PMC 5099707. PMID 27877950.
Erni, Rolf; Rossell, MD; Kisielowski, C; Dahmen, U (2009). "Atomic-Resolution Imaging with a Sub-50-pm Electron Probe". Physical Review Letters. 102 (9): 096101. Bibcode:2009PhRvL.102i6101E. doi:10.1103/PhysRevLett.102.096101. PMID 19392535.
Van Dorp, Willem F. (2005). "Approaching the Resolution Limit of Nanometer-Scale Electron Beam-Induced Deposition". Nano Letters. 5 (7): 1303–7. Bibcode:2005NanoL...5.1303V. doi:10.1021/nl050522i. PMID 16178228.
Luxmoore, I; Ross, I; Cullis, A; Fry, P; Orr, J; Buckle, P; Jefferson, J (2007). "Low temperature electrical characterisation of tungsten nano-wires fabricated by electron and ion beam induced chemical vapour deposition". Thin Solid Films. 515 (17): 6791. Bibcode:2007TSF...515.6791L. doi:10.1016/j.tsf.2007.02.029.

nih.gov

pubmed.ncbi.nlm.nih.gov

Mura, Francesco; Cognigni, Flavio; Ferroni, Matteo; Morandi, Vittorio; Rossi, Marco (2023-08-24). "Advances in Focused Ion Beam Tomography for Three-Dimensional Characterization in Materials Science". Materials. 16 (17): 5808. Bibcode:2023Mate...16.5808M. doi:10.3390/ma16175808. ISSN 1996-1944. PMC 10488958. PMID 37687502.
K. Furuya (2008). "Nanofabrication by advanced electron microscopy using intense and focused beam". Sci. Technol. Adv. Mater. 9 (1): 014110. Bibcode:2008STAdM...9a4110F. doi:10.1088/1468-6996/9/1/014110. PMC 5099805. PMID 27877936.
M. Song and K. Furuya (2008). "Fabrication and characterization of nanostructures on insulator substrates by electron-beam-induced deposition". Sci. Technol. Adv. Mater. 9 (2): 023002. Bibcode:2008STAdM...9b3002S. doi:10.1088/1468-6996/9/2/023002. PMC 5099707. PMID 27877950.
Erni, Rolf; Rossell, MD; Kisielowski, C; Dahmen, U (2009). "Atomic-Resolution Imaging with a Sub-50-pm Electron Probe". Physical Review Letters. 102 (9): 096101. Bibcode:2009PhRvL.102i6101E. doi:10.1103/PhysRevLett.102.096101. PMID 19392535.
Van Dorp, Willem F. (2005). "Approaching the Resolution Limit of Nanometer-Scale Electron Beam-Induced Deposition". Nano Letters. 5 (7): 1303–7. Bibcode:2005NanoL...5.1303V. doi:10.1021/nl050522i. PMID 16178228.

ncbi.nlm.nih.gov

Mura, Francesco; Cognigni, Flavio; Ferroni, Matteo; Morandi, Vittorio; Rossi, Marco (2023-08-24). "Advances in Focused Ion Beam Tomography for Three-Dimensional Characterization in Materials Science". Materials. 16 (17): 5808. Bibcode:2023Mate...16.5808M. doi:10.3390/ma16175808. ISSN 1996-1944. PMC 10488958. PMID 37687502.
K. Furuya (2008). "Nanofabrication by advanced electron microscopy using intense and focused beam". Sci. Technol. Adv. Mater. 9 (1): 014110. Bibcode:2008STAdM...9a4110F. doi:10.1088/1468-6996/9/1/014110. PMC 5099805. PMID 27877936.
M. Song and K. Furuya (2008). "Fabrication and characterization of nanostructures on insulator substrates by electron-beam-induced deposition". Sci. Technol. Adv. Mater. 9 (2): 023002. Bibcode:2008STAdM...9b3002S. doi:10.1088/1468-6996/9/2/023002. PMC 5099707. PMID 27877950.

semanticscholar.org

api.semanticscholar.org

Randolph, S.; Fowlkes, J.; Rack, P. (2006). "Focused, Nanoscale Electron-Beam-Induced Deposition and Etching". Critical Reviews of Solid State and Materials Sciences. 31 (3): 55. Bibcode:2006CRSSM..31...55R. doi:10.1080/10408430600930438. S2CID 93769658.

worldcat.org

search.worldcat.org

Carden, Will G.; Lu, Hang; Spencer, Julie A.; Fairbrother, D. Howard; McElwee-White, Lisa (2018-06-01). "Mechanism-based design of precursors for focused electron beam-induced deposition". MRS Communications. 8 (2): 343–357. doi:10.1557/mrc.2018.77. ISSN 2159-6867.
Mura, Francesco; Cognigni, Flavio; Ferroni, Matteo; Morandi, Vittorio; Rossi, Marco (2023-08-24). "Advances in Focused Ion Beam Tomography for Three-Dimensional Characterization in Materials Science". Materials. 16 (17): 5808. Bibcode:2023Mate...16.5808M. doi:10.3390/ma16175808. ISSN 1996-1944. PMC 10488958. PMID 37687502.

zenodo.org

Erni, Rolf; Rossell, MD; Kisielowski, C; Dahmen, U (2009). "Atomic-Resolution Imaging with a Sub-50-pm Electron Probe". Physical Review Letters. 102 (9): 096101. Bibcode:2009PhRvL.102i6101E. doi:10.1103/PhysRevLett.102.096101. PMID 19392535.