Focused ion beam (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Focused ion beam" in English language version.

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14doi.org

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9harvard.edu

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8nih.gov

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3semanticscholar.org

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2fibics.com

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2web.archive.org

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2zeiss.com

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1tudelft.nl

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1handle.net

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1books.google.com

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1researchgate.net

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1sciencedirect.com

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1ucla.edu

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books.google.com

J. Orloff; M. Utlaut; L. Swanson (2003). High Resolution Focused Ion Beams: FIB and Its Applications. Springer Press. ISBN 978-0-306-47350-0.

doi.org

Orloff, Jon (1996). "Fundamental limits to imaging resolution for focused ion beams". Journal of Vacuum Science and Technology B. 14 (6): 3759–3763. Bibcode:1996JVSTB..14.3759O. doi:10.1116/1.588663.
Castaldo, V.; Hagen, C. W.; Rieger, B.; Kruit, P. (2008). "Sputtering limits versus signal-to-noise limits in the observation of Sn balls in a Ga[sup +] microscope". Journal of Vacuum Science and Technology B. 26 (6): 2107–2115. Bibcode:2008JVSTB..26.2107C. doi:10.1116/1.3013306.
Smith, C (2012). "Microscopy: Two microscopes are better than one". Nature. 492 (7428): 293–297. Bibcode:2012Natur.492..293S. doi:10.1038/492293a. PMID 23235883. S2CID 205075538.
Bertazzo, S.; et al. (2012). "Correlative Light-Ion Microscopy for Biological Applications". Nanoscale. 4 (9): 2851–2854. Bibcode:2012Nanos...4.2851B. doi:10.1039/c2nr30431g. hdl:10044/1/21898. PMID 22466253.
Koch, J.; Grun, K.; Ruff, M.; Wernhardt, R.; Wieck, A.D. (1999). "Creation of nanoelectronic devices by focused ion beam implantation". IECON '99 Proceedings. The 25th Annual Conference of the IEEE. Vol. 1. pp. 35–39. doi:10.1109/IECON.1999.822165. ISBN 0-7803-5735-3.
Bertazzo, Sergio; Maidment, Susannah C. R.; Kallepitis, Charalambos; Fearn, Sarah; Stevens, Molly M.; Xie, Hai-nan (9 June 2015). "Fibres and cellular structures preserved in 75-million–year-old dinosaur specimens". Nature Communications. 6: 7352. Bibcode:2015NatCo...6.7352B. doi:10.1038/ncomms8352. PMC 4468865. PMID 26056764.
Principe, E L; Gnauck, P; Hoffrogge, P (2005). "A Three Beam Approach to TEM Preparation Using In-situ Low Voltage Argon Ion Final Milling in a FIB-SEM Instrument". Microscopy and Microanalysis. 11. doi:10.1017/S1431927605502460.
Gorji, Saleh; Kashiwar, Ankush; Mantha, Lakshmi S; Kruk, Robert; Witte, Ralf; Marek, Peter; Hahn, Horst; Kübel, Christian; Scherer, Torsten (December 2020). "Nanowire facilitated transfer of sensitive TEM samples in a FIB". Ultramicroscopy. 219: 113075. doi:10.1016/j.ultramic.2020.113075. PMID 33035837. S2CID 222255773.
Miller, M. K.; Russell, K. F. (September 2007). "Atom probe specimen preparation with a dual beam SEM/FIB miller". Ultramicroscopy. 107 (9): 761–6. doi:10.1016/j.ultramic.2007.02.023. PMID 17403581.
W. H. Escovitz; T. R. Fox; R. Levi-Setti (1975). "Scanning Transmission Ion Microscope with a Field Ion Source". Proceedings of the National Academy of Sciences of the United States of America. 72 (5): 1826–1828. Bibcode:1975PNAS...72.1826E. doi:10.1073/pnas.72.5.1826. PMC 432639. PMID 1057173.
Orloff, J.; Swanson, L. (1975). "Study of a field-ionization source for microprobe applications". Journal of Vacuum Science and Technology. 12 (6): 1209. Bibcode:1975JVST...12.1209O. doi:10.1116/1.568497.
Seliger, R.; Ward, J.W.; Wang, V.; Kubena, R.L. (1979). "A high-intensity scanning ion probe with submicrometer spot size". Appl. Phys. Lett. 34 (5): 310. Bibcode:1979ApPhL..34..310S. doi:10.1063/1.90786.
C.A. Volkert; A.M. Minor (2007). "Focused Ion Beam: Microscopy and Micromachining" (PDF). MRS Bulletin. 32 (5): 389–399. doi:10.1557/mrs2007.62.
Khizroev S.; Litvinov D. (2004). "Focused-ion-beam-based rapid prototyping of nanoscale magnetic devices". Nanotechnology. 15 (3): R7. Bibcode:2004Nanot..15R...7K. doi:10.1088/0957-4484/15/3/R01. S2CID 250902092.

fei.com

"Unique Imaging of Soft Materials Using Cryo-SDB" (PDF). Retrieved 2009-06-06.

fibics.com

"Introduction: Focused Ion Beam Systems". Retrieved 2009-08-06.
"FIB: Chemical Contrast". Retrieved 2007-02-28.

handle.net

hdl.handle.net

Bertazzo, S.; et al. (2012). "Correlative Light-Ion Microscopy for Biological Applications". Nanoscale. 4 (9): 2851–2854. Bibcode:2012Nanos...4.2851B. doi:10.1039/c2nr30431g. hdl:10044/1/21898. PMID 22466253.

harvard.edu

ui.adsabs.harvard.edu

Orloff, Jon (1996). "Fundamental limits to imaging resolution for focused ion beams". Journal of Vacuum Science and Technology B. 14 (6): 3759–3763. Bibcode:1996JVSTB..14.3759O. doi:10.1116/1.588663.
Castaldo, V.; Hagen, C. W.; Rieger, B.; Kruit, P. (2008). "Sputtering limits versus signal-to-noise limits in the observation of Sn balls in a Ga[sup +] microscope". Journal of Vacuum Science and Technology B. 26 (6): 2107–2115. Bibcode:2008JVSTB..26.2107C. doi:10.1116/1.3013306.
Smith, C (2012). "Microscopy: Two microscopes are better than one". Nature. 492 (7428): 293–297. Bibcode:2012Natur.492..293S. doi:10.1038/492293a. PMID 23235883. S2CID 205075538.
Bertazzo, S.; et al. (2012). "Correlative Light-Ion Microscopy for Biological Applications". Nanoscale. 4 (9): 2851–2854. Bibcode:2012Nanos...4.2851B. doi:10.1039/c2nr30431g. hdl:10044/1/21898. PMID 22466253.
Bertazzo, Sergio; Maidment, Susannah C. R.; Kallepitis, Charalambos; Fearn, Sarah; Stevens, Molly M.; Xie, Hai-nan (9 June 2015). "Fibres and cellular structures preserved in 75-million–year-old dinosaur specimens". Nature Communications. 6: 7352. Bibcode:2015NatCo...6.7352B. doi:10.1038/ncomms8352. PMC 4468865. PMID 26056764.
W. H. Escovitz; T. R. Fox; R. Levi-Setti (1975). "Scanning Transmission Ion Microscope with a Field Ion Source". Proceedings of the National Academy of Sciences of the United States of America. 72 (5): 1826–1828. Bibcode:1975PNAS...72.1826E. doi:10.1073/pnas.72.5.1826. PMC 432639. PMID 1057173.
Orloff, J.; Swanson, L. (1975). "Study of a field-ionization source for microprobe applications". Journal of Vacuum Science and Technology. 12 (6): 1209. Bibcode:1975JVST...12.1209O. doi:10.1116/1.568497.
Seliger, R.; Ward, J.W.; Wang, V.; Kubena, R.L. (1979). "A high-intensity scanning ion probe with submicrometer spot size". Appl. Phys. Lett. 34 (5): 310. Bibcode:1979ApPhL..34..310S. doi:10.1063/1.90786.
Khizroev S.; Litvinov D. (2004). "Focused-ion-beam-based rapid prototyping of nanoscale magnetic devices". Nanotechnology. 15 (3): R7. Bibcode:2004Nanot..15R...7K. doi:10.1088/0957-4484/15/3/R01. S2CID 250902092.

nih.gov

pubmed.ncbi.nlm.nih.gov

Smith, C (2012). "Microscopy: Two microscopes are better than one". Nature. 492 (7428): 293–297. Bibcode:2012Natur.492..293S. doi:10.1038/492293a. PMID 23235883. S2CID 205075538.
Bertazzo, S.; et al. (2012). "Correlative Light-Ion Microscopy for Biological Applications". Nanoscale. 4 (9): 2851–2854. Bibcode:2012Nanos...4.2851B. doi:10.1039/c2nr30431g. hdl:10044/1/21898. PMID 22466253.
Bertazzo, Sergio; Maidment, Susannah C. R.; Kallepitis, Charalambos; Fearn, Sarah; Stevens, Molly M.; Xie, Hai-nan (9 June 2015). "Fibres and cellular structures preserved in 75-million–year-old dinosaur specimens". Nature Communications. 6: 7352. Bibcode:2015NatCo...6.7352B. doi:10.1038/ncomms8352. PMC 4468865. PMID 26056764.
Gorji, Saleh; Kashiwar, Ankush; Mantha, Lakshmi S; Kruk, Robert; Witte, Ralf; Marek, Peter; Hahn, Horst; Kübel, Christian; Scherer, Torsten (December 2020). "Nanowire facilitated transfer of sensitive TEM samples in a FIB". Ultramicroscopy. 219: 113075. doi:10.1016/j.ultramic.2020.113075. PMID 33035837. S2CID 222255773.
Miller, M. K.; Russell, K. F. (September 2007). "Atom probe specimen preparation with a dual beam SEM/FIB miller". Ultramicroscopy. 107 (9): 761–6. doi:10.1016/j.ultramic.2007.02.023. PMID 17403581.
W. H. Escovitz; T. R. Fox; R. Levi-Setti (1975). "Scanning Transmission Ion Microscope with a Field Ion Source". Proceedings of the National Academy of Sciences of the United States of America. 72 (5): 1826–1828. Bibcode:1975PNAS...72.1826E. doi:10.1073/pnas.72.5.1826. PMC 432639. PMID 1057173.

ncbi.nlm.nih.gov

Bertazzo, Sergio; Maidment, Susannah C. R.; Kallepitis, Charalambos; Fearn, Sarah; Stevens, Molly M.; Xie, Hai-nan (9 June 2015). "Fibres and cellular structures preserved in 75-million–year-old dinosaur specimens". Nature Communications. 6: 7352. Bibcode:2015NatCo...6.7352B. doi:10.1038/ncomms8352. PMC 4468865. PMID 26056764.
W. H. Escovitz; T. R. Fox; R. Levi-Setti (1975). "Scanning Transmission Ion Microscope with a Field Ion Source". Proceedings of the National Academy of Sciences of the United States of America. 72 (5): 1826–1828. Bibcode:1975PNAS...72.1826E. doi:10.1073/pnas.72.5.1826. PMC 432639. PMID 1057173.

researchgate.net

Gorji, Saleh; Kashiwar, Ankush; Mantha, Lakshmi S; Kruk, Robert; Witte, Ralf; Marek, Peter; Hahn, Horst; Kübel, Christian; Scherer, Torsten (December 2020). "Nanowire facilitated transfer of sensitive TEM samples in a FIB". Ultramicroscopy. 219: 113075. doi:10.1016/j.ultramic.2020.113075. PMID 33035837. S2CID 222255773.

sciencedirect.com

Miller, M. K.; Russell, K. F. (September 2007). "Atom probe specimen preparation with a dual beam SEM/FIB miller". Ultramicroscopy. 107 (9): 761–6. doi:10.1016/j.ultramic.2007.02.023. PMID 17403581.

semanticscholar.org

api.semanticscholar.org

Smith, C (2012). "Microscopy: Two microscopes are better than one". Nature. 492 (7428): 293–297. Bibcode:2012Natur.492..293S. doi:10.1038/492293a. PMID 23235883. S2CID 205075538.
Gorji, Saleh; Kashiwar, Ankush; Mantha, Lakshmi S; Kruk, Robert; Witte, Ralf; Marek, Peter; Hahn, Horst; Kübel, Christian; Scherer, Torsten (December 2020). "Nanowire facilitated transfer of sensitive TEM samples in a FIB". Ultramicroscopy. 219: 113075. doi:10.1016/j.ultramic.2020.113075. PMID 33035837. S2CID 222255773.
Khizroev S.; Litvinov D. (2004). "Focused-ion-beam-based rapid prototyping of nanoscale magnetic devices". Nanotechnology. 15 (3): R7. Bibcode:2004Nanot..15R...7K. doi:10.1088/0957-4484/15/3/R01. S2CID 250902092.

tudelft.nl

repository.tudelft.nl

Castaldo, V.; Hagen, C. W.; Rieger, B.; Kruit, P. (2008). "Sputtering limits versus signal-to-noise limits in the observation of Sn balls in a Ga[sup +] microscope". Journal of Vacuum Science and Technology B. 26 (6): 2107–2115. Bibcode:2008JVSTB..26.2107C. doi:10.1116/1.3013306.

ucla.edu

nanolab.ucla.edu

C.A. Volkert; A.M. Minor (2007). "Focused Ion Beam: Microscopy and Micromachining" (PDF). MRS Bulletin. 32 (5): 389–399. doi:10.1557/mrs2007.62.

web.archive.org

"Carl Zeiss press release". 2008-11-21. Archived from the original on 2009-05-01. Retrieved 2009-06-06.
"Zeiss Orion Helium Ion Microscope Technical Data" (PDF). Archived from the original (PDF) on 2012-03-24. Retrieved 2011-06-02.

zeiss.com

smt.zeiss.com

"Carl Zeiss press release". 2008-11-21. Archived from the original on 2009-05-01. Retrieved 2009-06-06.
"Zeiss Orion Helium Ion Microscope Technical Data" (PDF). Archived from the original (PDF) on 2012-03-24. Retrieved 2011-06-02.