Highly oriented pyrolytic graphite (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Highly oriented pyrolytic graphite" in English language version.

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2semanticscholar.org

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arxiv.org

R. V. Lapshin (2019). "Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode" (PDF). Applied Surface Science. 470: 1122–1129. arXiv:1501.06679. Bibcode:2019ApSS..470.1122L. doi:10.1016/j.apsusc.2018.10.149. ISSN 0169-4332. S2CID 119275633.

doi.org

IUPAC, Compendium of Chemical Terminology, 2nd ed. (the "Gold Book") (1997). Online corrected version: (2006–) "Highly oriented pyrolytic graphite". doi:10.1351/goldbook.H02823.
L. C. F. Blackman; A. R. Ubbelohde (1962). "Stress Recrystallization of Graphite". Proceedings of the Royal Society of London. A266 (1324): 20–32. Bibcode:1962RSPSA.266...20B. doi:10.1098/rspa.1962.0044. S2CID 136690560.
R. V. Lapshin (1998). "Automatic lateral calibration of tunneling microscope scanners" (PDF). Review of Scientific Instruments. 69 (9): 3268–3276. Bibcode:1998RScI...69.3268L. doi:10.1063/1.1149091. ISSN 0034-6748.
R. V. Lapshin (2019). "Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode" (PDF). Applied Surface Science. 470: 1122–1129. arXiv:1501.06679. Bibcode:2019ApSS..470.1122L. doi:10.1016/j.apsusc.2018.10.149. ISSN 0169-4332. S2CID 119275633.

elsevier.com

authors.elsevier.com

R. V. Lapshin (2019). "Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode" (PDF). Applied Surface Science. 470: 1122–1129. arXiv:1501.06679. Bibcode:2019ApSS..470.1122L. doi:10.1016/j.apsusc.2018.10.149. ISSN 0169-4332. S2CID 119275633.

fast-page.org

lapshin.fast-page.org

R. V. Lapshin (1998). "Automatic lateral calibration of tunneling microscope scanners" (PDF). Review of Scientific Instruments. 69 (9): 3268–3276. Bibcode:1998RScI...69.3268L. doi:10.1063/1.1149091. ISSN 0034-6748.

harvard.edu

ui.adsabs.harvard.edu

L. C. F. Blackman; A. R. Ubbelohde (1962). "Stress Recrystallization of Graphite". Proceedings of the Royal Society of London. A266 (1324): 20–32. Bibcode:1962RSPSA.266...20B. doi:10.1098/rspa.1962.0044. S2CID 136690560.
R. V. Lapshin (1998). "Automatic lateral calibration of tunneling microscope scanners" (PDF). Review of Scientific Instruments. 69 (9): 3268–3276. Bibcode:1998RScI...69.3268L. doi:10.1063/1.1149091. ISSN 0034-6748.
R. V. Lapshin (2019). "Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode" (PDF). Applied Surface Science. 470: 1122–1129. arXiv:1501.06679. Bibcode:2019ApSS..470.1122L. doi:10.1016/j.apsusc.2018.10.149. ISSN 0169-4332. S2CID 119275633.

iupac.org

goldbook.iupac.org

IUPAC, Compendium of Chemical Terminology, 2nd ed. (the "Gold Book") (1997). Online corrected version: (2006–) "Highly oriented pyrolytic graphite". doi:10.1351/goldbook.H02823.

semanticscholar.org

api.semanticscholar.org

L. C. F. Blackman; A. R. Ubbelohde (1962). "Stress Recrystallization of Graphite". Proceedings of the Royal Society of London. A266 (1324): 20–32. Bibcode:1962RSPSA.266...20B. doi:10.1098/rspa.1962.0044. S2CID 136690560.
R. V. Lapshin (2019). "Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode" (PDF). Applied Surface Science. 470: 1122–1129. arXiv:1501.06679. Bibcode:2019ApSS..470.1122L. doi:10.1016/j.apsusc.2018.10.149. ISSN 0169-4332. S2CID 119275633.

ulb.ac.be

dipot.ulb.ac.be

L. C. F. Blackman; A. R. Ubbelohde (1962). "Stress Recrystallization of Graphite". Proceedings of the Royal Society of London. A266 (1324): 20–32. Bibcode:1962RSPSA.266...20B. doi:10.1098/rspa.1962.0044. S2CID 136690560.

worldcat.org

search.worldcat.org

R. V. Lapshin (1998). "Automatic lateral calibration of tunneling microscope scanners" (PDF). Review of Scientific Instruments. 69 (9): 3268–3276. Bibcode:1998RScI...69.3268L. doi:10.1063/1.1149091. ISSN 0034-6748.
R. V. Lapshin (2019). "Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode" (PDF). Applied Surface Science. 470: 1122–1129. arXiv:1501.06679. Bibcode:2019ApSS..470.1122L. doi:10.1016/j.apsusc.2018.10.149. ISSN 0169-4332. S2CID 119275633.