Rowlette, J; Eiles, T (2003), "Critical timing analysis in microprocessors using near-ir laser assisted device alteration (Lada)", International Test Conference, 2003. Proceedings. ITC 2003, vol. 1, Washington, D.C.: International Test Conference, pp. 264–73, doi:10.1109/TEST.2003.1270848, ISBN0-7803-8106-8.
