Leakage (electronics) (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Leakage (electronics)" in English language version.

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3web.archive.org

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1marcspages.co.uk

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1electricfence-online.co.uk

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1emcfastpass.com

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1incompliancemag.com

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1semanticscholar.org

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asresearch.com

Associated Research Tech Info Archived 2006-10-16 at the Wayback Machine

doi.org

Rahbardar Mojaver, Hassan; Valizadeh, Pouya (April 2016). "Reverse Gate-Current of AlGaN/GaN HFETs: Evidence of Leakage at Mesa Sidewalls". IEEE Transactions on Electron Devices. 63 (4): 1444–1449. doi:10.1109/TED.2016.2529301. ISSN 0018-9383. S2CID 43162250.

electricfence-online.co.uk

Glossary from Electric Fence Archived 2011-10-08 at the Wayback Machine

emcfastpass.com

Schaffner - Leakage currents in power line filters

ieee.org

ieeexplore.ieee.org

Rahbardar Mojaver, Hassan; Valizadeh, Pouya (April 2016). "Reverse Gate-Current of AlGaN/GaN HFETs: Evidence of Leakage at Mesa Sidewalls". IEEE Transactions on Electron Devices. 63 (4): 1444–1449. doi:10.1109/TED.2016.2529301. ISSN 0018-9383. S2CID 43162250.

incompliancemag.com

Leakage Current Measuring Circuits

keysight.com

literature.cdn.keysight.com

Keysight Technologies Application Note: Increase DC-input Battery Adapter Test Throughput By Several-fold

marcspages.co.uk

Issues with Leakage

semanticscholar.org

api.semanticscholar.org

Rahbardar Mojaver, Hassan; Valizadeh, Pouya (April 2016). "Reverse Gate-Current of AlGaN/GaN HFETs: Evidence of Leakage at Mesa Sidewalls". IEEE Transactions on Electron Devices. 63 (4): 1444–1449. doi:10.1109/TED.2016.2529301. ISSN 0018-9383. S2CID 43162250.

web.archive.org

Associated Research Tech Info Archived 2006-10-16 at the Wayback Machine
"Glossary from System Connection". Archived from the original on 2008-12-01. Retrieved 2009-09-09.{{cite web}}: CS1 maint: bot: original URL status unknown (link)
Glossary from Electric Fence Archived 2011-10-08 at the Wayback Machine

worldcat.org

search.worldcat.org

Rahbardar Mojaver, Hassan; Valizadeh, Pouya (April 2016). "Reverse Gate-Current of AlGaN/GaN HFETs: Evidence of Leakage at Mesa Sidewalls". IEEE Transactions on Electron Devices. 63 (4): 1444–1449. doi:10.1109/TED.2016.2529301. ISSN 0018-9383. S2CID 43162250.