Sign In

Login

Password

Forgot Password ? Sign Up

Low-energy electron microscopy (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Low-energy electron microscopy" in English language version.

refsWebsite
Global rank English rank
8doi.org
2nd place
2nd place
4nih.gov
4th place
4th place
3worldcat.org
5th place
5th place
3semanticscholar.org
11th place
8th place
2arxiv.org
69th place
59th place
1harvard.edu
18th place
17th place
1handle.net
102nd place
76th place
1creativecommons.org
1,010th place
612th place

arxiv.org

creativecommons.org

doi.org

  • Bauer, E (1994). "Low energy electron microscopy". Reports on Progress in Physics. 57 (9): 895–938. Bibcode:1994RPPh...57..895B. doi:10.1088/0034-4885/57/9/002. ISSN 0034-4885. S2CID 250913078.
  • Franz, Torsten; von Boehn, Bernhard; Marchetto, Helder; Borkenhagen, Benjamin; Lilienkamp, Gerhard; Daum, Winfried; Imbihl, Ronald (2019). "Catalytic CO oxidation on Pt under near ambient pressure: A NAP-LEEM study". Ultramicroscopy. 200. Elsevier BV: 73–78. doi:10.1016/j.ultramic.2019.02.024. ISSN 0304-3991. PMID 30836286. S2CID 73480940.
  • de Jong, T. A.; Krasovskii, E. E.; Ott, C.; Tromp, R. M.; van der Molen, S. J.; Jobst, J. (2018-10-31). "Intrinsic stacking domains in graphene on silicon carbide: A pathway for intercalation". Physical Review Materials. 2 (10). American Physical Society (APS): 104005. arXiv:1807.04185. doi:10.1103/physrevmaterials.2.104005. ISSN 2475-9953.
  • Tromp, Rudolf (2019). "Spectroscopy with the Low Energy Electron Microscope". In Hawkes, Peter W.; Spence, John C. H. (eds.). Springer Handbook of Microscopy. Springer Handbooks. Springer International Publishing. pp. 576–581. doi:10.1007/978-3-030-00069-1_11. ISBN 978-3-030-00069-1. S2CID 210235774.
  • de la Barrera, Sergio C.; Lin, Yu-Chuan; Eichfeld, Sarah M.; Robinson, Joshua A.; Gao, Qin; Widom, Michael; Feenstra, Randall M. (July 2016). "Thickness characterization of atomically thin WSe2 on epitaxial graphene by low-energy electron reflectivity oscillations". Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 34 (4). American Vacuum Society: 04J106. arXiv:1606.04167. doi:10.1116/1.4954642.
  • de Jong, Tobias A.; Jobst, Johannes; Yoo, Hyobin; Krasovskii, Eugene E.; Kim, Philip; van der Molen, Sense Jan (2018). "Measuring the Local Twist Angle and Layer Arrangement in Van der Waals Heterostructures". Physica Status Solidi B. 255 (12). Wiley: 1800191. doi:10.1002/pssb.201800191. hdl:1887/62920.
  • Latychevskaia, T.; Escher, C.; Andregg, W.; Andregg, M.; Fink, H.-W. (20 June 2019). "Direct visualization of charge transport in suspended (or free-standing) DNA strands by low-energy electron microscopy". Scientific Reports. 9 (1). Nature: 8889. doi:10.1038/s41598-019-45351-4. PMC 6586886. PMID 31222124. Text was copied from this source, which is available under a Creative Commons Attribution 4.0 International License.
  • Fink, H.-W; Stocker, W.; Schmid, H. (30 May 1990). "Holography with low-energy electrons". Phys. Rev. Lett. 65 (10). American Physical Society: 1204–1206. doi:10.1103/PhysRevLett.65.1204. PMID 10042201.

handle.net

hdl.handle.net

harvard.edu

ui.adsabs.harvard.edu

  • Bauer, E (1994). "Low energy electron microscopy". Reports on Progress in Physics. 57 (9): 895–938. Bibcode:1994RPPh...57..895B. doi:10.1088/0034-4885/57/9/002. ISSN 0034-4885. S2CID 250913078.

nih.gov

pubmed.ncbi.nlm.nih.gov

ncbi.nlm.nih.gov

semanticscholar.org

api.semanticscholar.org

  • Bauer, E (1994). "Low energy electron microscopy". Reports on Progress in Physics. 57 (9): 895–938. Bibcode:1994RPPh...57..895B. doi:10.1088/0034-4885/57/9/002. ISSN 0034-4885. S2CID 250913078.
  • Franz, Torsten; von Boehn, Bernhard; Marchetto, Helder; Borkenhagen, Benjamin; Lilienkamp, Gerhard; Daum, Winfried; Imbihl, Ronald (2019). "Catalytic CO oxidation on Pt under near ambient pressure: A NAP-LEEM study". Ultramicroscopy. 200. Elsevier BV: 73–78. doi:10.1016/j.ultramic.2019.02.024. ISSN 0304-3991. PMID 30836286. S2CID 73480940.
  • Tromp, Rudolf (2019). "Spectroscopy with the Low Energy Electron Microscope". In Hawkes, Peter W.; Spence, John C. H. (eds.). Springer Handbook of Microscopy. Springer Handbooks. Springer International Publishing. pp. 576–581. doi:10.1007/978-3-030-00069-1_11. ISBN 978-3-030-00069-1. S2CID 210235774.

worldcat.org

search.worldcat.org

  • Bauer, E (1994). "Low energy electron microscopy". Reports on Progress in Physics. 57 (9): 895–938. Bibcode:1994RPPh...57..895B. doi:10.1088/0034-4885/57/9/002. ISSN 0034-4885. S2CID 250913078.
  • Franz, Torsten; von Boehn, Bernhard; Marchetto, Helder; Borkenhagen, Benjamin; Lilienkamp, Gerhard; Daum, Winfried; Imbihl, Ronald (2019). "Catalytic CO oxidation on Pt under near ambient pressure: A NAP-LEEM study". Ultramicroscopy. 200. Elsevier BV: 73–78. doi:10.1016/j.ultramic.2019.02.024. ISSN 0304-3991. PMID 30836286. S2CID 73480940.
  • de Jong, T. A.; Krasovskii, E. E.; Ott, C.; Tromp, R. M.; van der Molen, S. J.; Jobst, J. (2018-10-31). "Intrinsic stacking domains in graphene on silicon carbide: A pathway for intercalation". Physical Review Materials. 2 (10). American Physical Society (APS): 104005. arXiv:1807.04185. doi:10.1103/physrevmaterials.2.104005. ISSN 2475-9953.