MOSFET (English Wikipedia)

For example, see Cheng, Yuhua; Hu, Chenming (1999). MOSFET modeling & BSIM3 user's guide. Springer. ISBN 978-0-7923-8575-2. The most recent version of the BSIM model is described in V., Sriramkumar; Paydavosi, Navid; Lu, Darsen; Lin, Chung-Hsun; Dunga, Mohan; Yao, Shijing; Morshed, Tanvir; Niknejad, Ali & Hu, Chenming (2012). "BSIM-CMG 106.1.0beta Multi-Gate MOSFET Compact Model" (PDF). Department of Electronic Engineering and Computer Science, University of California Berkeley. Archived from the original (PDF) on 2014-07-27. Retrieved 2012-04-01.

books.google.com

Moskowitz, Sanford L. (2016). Advanced Materials Innovation: Managing Global Technology in the 21st century. John Wiley & Sons. p. 168. ISBN 978-0-470-50892-3.
Christophe Lécuyer; David C. Brook; Jay Last (2010). Makers of the Microchip: A Documentary History of Fairchild Semiconductor. MIT Press. pp. 62–63. ISBN 978-0-262-01424-3.
Claeys, Cor L. (2003). ULSI Process Integration III: Proceedings of the International Symposium. The Electrochemical Society. pp. 27–30. ISBN 978-1-56677-376-8.
Deal, Bruce E. (1998). "Highlights Of Silicon Thermal Oxidation Technology". Silicon materials science and technology. The Electrochemical Society. p. 183. ISBN 978-1566771931.
Bassett, Ross Knox (2007). To the Digital Age: Research Labs, Start-up Companies, and the Rise of MOS Technology. Johns Hopkins University Press. pp. 22–23. ISBN 978-0-8018-8639-3.
For example, see Cheng, Yuhua; Hu, Chenming (1999). MOSFET modeling & BSIM3 user's guide. Springer. ISBN 978-0-7923-8575-2. The most recent version of the BSIM model is described in V., Sriramkumar; Paydavosi, Navid; Lu, Darsen; Lin, Chung-Hsun; Dunga, Mohan; Yao, Shijing; Morshed, Tanvir; Niknejad, Ali & Hu, Chenming (2012). "BSIM-CMG 106.1.0beta Multi-Gate MOSFET Compact Model" (PDF). Department of Electronic Engineering and Computer Science, University of California Berkeley. Archived from the original (PDF) on 2014-07-27. Retrieved 2012-04-01.
van der Meer, P. R.; van Staveren, A.; van Roermund, A. H. M. (2004). Low-Power Deep Sub-Micron CMOS Logic: Subthreshold Current Reduction. Dordrecht: Springer. p. 78. ISBN 978-1-4020-2848-9.
Smith, Leslie S.; Hamilton, Alister (1998). Neuromorphic Systems: Engineering Silicon from Neurobiology. World Scientific. pp. 52–56. ISBN 978-981-02-3377-8.
Kumar, Satish (2004). Neural Networks: A Classroom Approach. Tata McGraw-Hill. p. 688. ISBN 978-0-07-048292-0.
Glesner, Manfred; Zipf, Peter; Renovell, Michel (2002). Field-programmable Logic and Applications: 12th International Conference. Dordrecht: Springer. p. 425. ISBN 978-3-540-44108-3.
Vittoz, Eric A. (1996). "The Fundamentals of Analog Micropower Design". In Toumazou, Chris; Battersby, Nicholas C.; Porta, Sonia (eds.). Circuits and systems tutorials. John Wiley and Sons. pp. 365–372. ISBN 978-0-7803-1170-1.
Shukla, Sandeep K.; Bahar, R. Iris (2004). Nano, Quantum and Molecular Computing. Springer. p. 10 and Fig. 1.4, p. 11. ISBN 978-1-4020-8067-8.
Srivastava, Ashish; Sylvester, Dennis; Blaauw, David (2005). Statistical Analysis and Optimization For VLSI: Timing and Power. Springer. p. 135. ISBN 978-0-387-25738-9.
For a uniformly doped p-type substrate with bulk acceptor doping of N_A per unit volume,
$\varphi _{B}={\frac {k_{B}T}{q}}\ln \left({\frac {N_{A}}{n_{i}}}\right)\ ,$
with n_i the intrinsic mobile carrier density per unit volume in the bulk. See, for example, Arora, Narain (2007). "Equation 5.12". Mosfet modeling for VLSI simulation: theory and practice. World Scientific. p. 173. ISBN 9789812707581.
Colinge, Jean-Pierre; Colinge, Cynthia A. (2002). Physics of Semiconductor Devices. Dordrecht: Springer. p. 233, Figure 7.46. ISBN 978-1-4020-7018-1.
Weber, Eicke R.; Dabrowski, Jarek, eds. (2004). Predictive Simulation of Semiconductor Processing: Status and Challenges. Dordrecht: Springer. p. 5, Figure 1.2. ISBN 978-3-540-20481-7.
Roy, Kaushik; Yeo, Kiat Seng (2004). Low Voltage, Low Power VLSI Subsystems. McGraw-Hill Professional. Fig. 2.1, p. 44, Fig. 1.1, p. 4. ISBN 978-0-07-143786-8.
Vasileska, Dragica; Goodnick, Stephen (2006). Computational Electronics. Morgan & Claypool. p. 103. ISBN 978-1-59829-056-1.
Chen, Wai-Kai (2006). The VLSI Handbook. CRC Press. Fig. 2.28, p. 2–22. ISBN 978-0-8493-4199-1.
Soudris, D.; Pirsch, P.; Barke, E., eds. (2000). Integrated Circuit Design: Power and Timing Modeling, Optimization, and Simulation (10th Int. Workshop). Springer. p. 38. ISBN 978-3-540-41068-3.
Zeitzoff, P. M.; Hutchby, J. A.; Huff, H. R. (2002). "Figure 12: Simplified cross section of FinFET double-gate MOSFET". In Park, Yoon-Soo; Shur, Michael; Tang, William (eds.). Frontiers in electronics: future chips : proceedings of the 2002 Workshop on Frontiers in Electronics (WOFE-02), St Croix, Virgin Islands, USA, 6–11 January 2002. World Scientific. p. 82. ISBN 978-981-238-222-1.
Lee, J.-H.; Lee, J.-W.; Jung, H.-A.-R.; Choi, B.-K. (2009). "Comparison of SOI FinFETs and bulk FinFETs: Figure 2". Silicon-on-Insulator Technology and Devices. The Electrochemical Society. p. 102. ISBN 978-1-56677-712-4.
Hadziioannou, Georges; Malliaras, George G. (2007). Semiconducting polymers: chemistry, physics and engineering. Wiley-VCH. ISBN 978-3-527-31271-9.
Jones, William (1997). Organic Molecular Solids: Properties and Applications. CRC Press. ISBN 978-0-8493-9428-7.

brunningsoftware.co.uk

"Using a MOSFET as a Switch". Archived from the original on 2018-04-11. 090507 brunningsoftware.co.uk

circuitstoday.com

"Electronic Circuit Symbols". circuitstoday.com. 9 November 2011. Archived from the original on 13 October 2014.

computerhistory.org

"1960 – Metal Oxide Semiconductor (MOS) Transistor Demonstrated". The Silicon Engine. Computer History Museum. Retrieved 2023-01-16.
"1955 – Photolithography Techniques Are Used to Make Silicon Devices". Computer History Museum. Retrieved 2012-06-02.
"1964 – First Commercial MOS IC Introduced".^{[permanent dead link‍]}
"Computer History Museum – The Silicon Engine | 1963 – Complementary MOS Circuit Configuration is Invented". Computerhistory.org. Retrieved 2012-06-02.
"Computer History Museum – Exhibits – Microprocessors". Computerhistory.org. Retrieved 2012-06-02.
"1965 – "Moore's Law" Predicts the Future of Integrated Circuits". Computer History Museum.

doi.org

Huff, Howard; Riordan, Michael (2007-09-01). "Frosch and Derick: Fifty Years Later (Foreword)". The Electrochemical Society Interface. 16 (3): 29. doi:10.1149/2.F02073IF. ISSN 1064-8208.
Frosch, C. J.; Derick, L (1957). "Surface Protection and Selective Masking during Diffusion in Silicon". Journal of the Electrochemical Society. 104 (9): 547. doi:10.1149/1.2428650.
Frosch, C. J.; Derick, L (1957). "Surface Protection and Selective Masking during Diffusion in Silicon". Journal of the Electrochemical Society. 104 (9): 547. doi:10.1149/1.2428650.
Frosch, C. J.; Derick, L (1957). "Surface Protection and Selective Masking during Diffusion in Silicon". Journal of the Electrochemical Society. 104 (9): 547. doi:10.1149/1.2428650.
Ligenza, J. R.; Spitzer, W. G. (1960-07-01). "The mechanisms for silicon oxidation in steam and oxygen". Journal of Physics and Chemistry of Solids. 14: 131–136. Bibcode:1960JPCS...14..131L. doi:10.1016/0022-3697(60)90219-5. ISSN 0022-3697.
KAHNG, D. (1961). "Silicon-Silicon Dioxide Surface Device". Technical Memorandum of Bell Laboratories: 583–596. doi:10.1142/9789814503464_0076. ISBN 978-981-02-0209-5.
Shichman, H. & Hodges, D. A. (1968). "Modeling and simulation of insulated-gate field-effect transistor switching circuits". IEEE Journal of Solid-State Circuits. SC-3 (3): 285–289. Bibcode:1968IJSSC...3..285S. doi:10.1109/JSSC.1968.1049902. Archived from the original on June 10, 2013.
Lindsay, R.; Pawlak; Kittl; Henson; Torregiani; Giangrandi; Surdeanu; Vandervorst; Mayur; Ross; McCoy; Gelpey; Elliott; Pages; Satta; Lauwers; Stolk; Maex (2011). "A Comparison of Spike, Flash, SPER and Laser Annealing for 45nm CMOS". MRS Proceedings. 765. doi:10.1557/PROC-765-D7.4.
Xu, Wentao; Guo, Chang; Rhee, Shi-Woo (2013). "High performance organic field-effect transistors using cyanoethyl pullulan (CEP) high-k polymer cross-linked with trimethylolpropane triglycidyl ether (TTE) at low temperatures". Journal of Materials Chemistry C. 1 (25): 3955. doi:10.1039/C3TC30134F.

element-14.com

"Power MOSFET Basics: Understanding MOSFET Characteristics Associated With The Figure of Merit". element14. Archived from the original on 5 April 2015. Retrieved 27 November 2010.
"Power MOSFET Basics: Understanding Gate Charge and Using It To Assess Switching Performance". element14. Archived from the original on 30 June 2014. Retrieved 27 November 2010.

elsevier.com

linkinghub.elsevier.com

Ligenza, J. R.; Spitzer, W. G. (1960-07-01). "The mechanisms for silicon oxidation in steam and oxygen". Journal of Physics and Chemistry of Solids. 14: 131–136. Bibcode:1960JPCS...14..131L. doi:10.1016/0022-3697(60)90219-5. ISSN 0022-3697.

equars.com

"Body effect". Equars.com. Archived from the original on 2014-11-10. Retrieved 2012-06-02.

espacenet.com

worldwide.espacenet.com

US 3025589 Hoerni, J. A.: "Method of Manufacturing Semiconductor Devices” filed May 1, 1959
US 3064167 Hoerni, J. A.: "Semiconductor device" filed May 15, 1960

v3.espacenet.com

Heil, Oskar, "Improvements in or relating to electrical amplifiers and other control arrangements and devices", Patent No. GB439457, European Patent Office, filed in Great Britain 1934-03-02, published December 6, 1935 (originally filed in Germany March 2, 1934).

frontiersemi.com

"Frontier Semiconductor Paper" (PDF). Archived from the original (PDF) on February 27, 2012. Retrieved 2012-06-02.

ghostarchive.org

Jaeger, Richard C.; Blalock, Travis N. "Figure 4.15 IEEE Standard MOS transistor circuit symbols". Microelectronic Circuit Design (PDF). Archived (PDF) from the original on 2022-10-09.
"VLSI wiring capacitance" (PDF). IBM Journal of Research and Development. 9 February 2021. Archived (PDF) from the original on 2022-10-09.^{[dead link‍]}

harvard.edu

ui.adsabs.harvard.edu

Ligenza, J. R.; Spitzer, W. G. (1960-07-01). "The mechanisms for silicon oxidation in steam and oxygen". Journal of Physics and Chemistry of Solids. 14: 131–136. Bibcode:1960JPCS...14..131L. doi:10.1016/0022-3697(60)90219-5. ISSN 0022-3697.
Shichman, H. & Hodges, D. A. (1968). "Modeling and simulation of insulated-gate field-effect transistor switching circuits". IEEE Journal of Solid-State Circuits. SC-3 (3): 285–289. Bibcode:1968IJSSC...3..285S. doi:10.1109/JSSC.1968.1049902. Archived from the original on June 10, 2013.

ibm.com

research.ibm.com

"VLSI wiring capacitance" (PDF). IBM Journal of Research and Development. 9 February 2021. Archived (PDF) from the original on 2022-10-09.^{[dead link‍]}

ieee.org

ieeexplore.ieee.org

Shichman, H. & Hodges, D. A. (1968). "Modeling and simulation of insulated-gate field-effect transistor switching circuits". IEEE Journal of Solid-State Circuits. SC-3 (3): 285–289. Bibcode:1968IJSSC...3..285S. doi:10.1109/JSSC.1968.1049902. Archived from the original on June 10, 2013.

intel.com

"Intel 45nm Hi-k Silicon Technology". Intel. Archived from the original on July 5, 2007.

iop.org

iopscience.iop.org

Huff, Howard; Riordan, Michael (2007-09-01). "Frosch and Derick: Fifty Years Later (Foreword)". The Electrochemical Society Interface. 16 (3): 29. doi:10.1149/2.F02073IF. ISSN 1064-8208.
Frosch, C. J.; Derick, L (1957). "Surface Protection and Selective Masking during Diffusion in Silicon". Journal of the Electrochemical Society. 104 (9): 547. doi:10.1149/1.2428650.
Frosch, C. J.; Derick, L (1957). "Surface Protection and Selective Masking during Diffusion in Silicon". Journal of the Electrochemical Society. 104 (9): 547. doi:10.1149/1.2428650.
Frosch, C. J.; Derick, L (1957). "Surface Protection and Selective Masking during Diffusion in Silicon". Journal of the Electrochemical Society. 104 (9): 547. doi:10.1149/1.2428650.

itrs.net

"International Technology Roadmap for Semiconductors". Archived from the original on 2015-12-28.

massless.info

"D-MOSFET OPERATION AND BIASING" (PDF). Archived (PDF) from the original on 2022-10-22.

mcgraw-hill.com

highered.mcgraw-hill.com

Jaeger, Richard C.; Blalock, Travis N. "Figure 4.15 IEEE Standard MOS transistor circuit symbols". Microelectronic Circuit Design (PDF). Archived (PDF) from the original on 2022-10-09.

patents.google.com

Lilienfeld, Julius Edgar (1926-10-08) "Method and apparatus for controlling electric currents" U.S. patent 1745175A
US2802760A, Lincoln, Derick & Frosch, Carl J., "Oxidation of semiconductive surfaces for controlled diffusion", issued 1957-08-13

revera.com

"ReVera's FinFET Control". revera.com. Archived from the original on 19 September 2010.

rsc.org

pubs.rsc.org

Xu, Wentao; Guo, Chang; Rhee, Shi-Woo (2013). "High performance organic field-effect transistors using cyanoethyl pullulan (CEP) high-k polymer cross-linked with trimethylolpropane triglycidyl ether (TTE) at low temperatures". Journal of Materials Chemistry C. 1 (25): 3955. doi:10.1039/C3TC30134F.

semi1source.com

"MIS". Semiconductor Glossary. Archived from the original on 2017-01-22. Retrieved 2017-05-14.

sites.google.com

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swtpc.com

Cushman, Robert H. (20 September 1975). "2-1/2-generation μP's-$10 parts that perform like low-end mini's" (PDF). EDN. Archived from the original (PDF) on 24 April 2016. Retrieved 8 August 2013.

techweb.com

"Depletion Mode". Techweb. 29 January 2010. Archived from the original on 31 October 2010. Retrieved 27 November 2010.

trailing-edge.com

bitsavers.trailing-edge.com

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web.archive.org

"D-MOSFET OPERATION AND BIASING" (PDF). Archived (PDF) from the original on 2022-10-22.
"Intel 45nm Hi-k Silicon Technology". Intel. Archived from the original on July 5, 2007.
"memory components data book" (PDF). memory components data book. Intel. pp. 2–1. Archived from the original (PDF) on 4 March 2016. Retrieved 30 August 2015.
"Using a MOSFET as a Switch". Archived from the original on 2018-04-11. 090507 brunningsoftware.co.uk
Shichman, H. & Hodges, D. A. (1968). "Modeling and simulation of insulated-gate field-effect transistor switching circuits". IEEE Journal of Solid-State Circuits. SC-3 (3): 285–289. Bibcode:1968IJSSC...3..285S. doi:10.1109/JSSC.1968.1049902. Archived from the original on June 10, 2013.
For example, see Cheng, Yuhua; Hu, Chenming (1999). MOSFET modeling & BSIM3 user's guide. Springer. ISBN 978-0-7923-8575-2. The most recent version of the BSIM model is described in V., Sriramkumar; Paydavosi, Navid; Lu, Darsen; Lin, Chung-Hsun; Dunga, Mohan; Yao, Shijing; Morshed, Tanvir; Niknejad, Ali & Hu, Chenming (2012). "BSIM-CMG 106.1.0beta Multi-Gate MOSFET Compact Model" (PDF). Department of Electronic Engineering and Computer Science, University of California Berkeley. Archived from the original (PDF) on 2014-07-27. Retrieved 2012-04-01.
"Body effect". Equars.com. Archived from the original on 2014-11-10. Retrieved 2012-06-02.
"Electronic Circuit Symbols". circuitstoday.com. 9 November 2011. Archived from the original on 13 October 2014.
Cushman, Robert H. (20 September 1975). "2-1/2-generation μP's-$10 parts that perform like low-end mini's" (PDF). EDN. Archived from the original (PDF) on 24 April 2016. Retrieved 8 August 2013.
"ReVera's FinFET Control". revera.com. Archived from the original on 19 September 2010.
"International Technology Roadmap for Semiconductors". Archived from the original on 2015-12-28.
"Frontier Semiconductor Paper" (PDF). Archived from the original (PDF) on February 27, 2012. Retrieved 2012-06-02.
"Depletion Mode". Techweb. 29 January 2010. Archived from the original on 31 October 2010. Retrieved 27 November 2010.
"MIS". Semiconductor Glossary. Archived from the original on 2017-01-22. Retrieved 2017-05-14.
"Power MOSFET Basics: Understanding MOSFET Characteristics Associated With The Figure of Merit". element14. Archived from the original on 5 April 2015. Retrieved 27 November 2010.
"Power MOSFET Basics: Understanding Gate Charge and Using It To Assess Switching Performance". element14. Archived from the original on 30 June 2014. Retrieved 27 November 2010.

worldcat.org

Gray, P. R.; Hurst, P. J.; Lewis, S. H. & Meyer, R. G. (2001). Analysis and Design of Analog Integrated Circuits (4th ed.). New York: Wiley. pp. 66–67. ISBN 978-0-471-32168-2.
Galup-Montoro, C. & Schneider, M. C. (2007). MOSFET modeling for circuit analysis and design. London/Singapore: World Scientific. p. 83. ISBN 978-981-256-810-6.
Malik, Norbert R. (1995). Electronic circuits: analysis, simulation, and design. Englewood Cliffs, New Jersey: Prentice Hall. pp. 315–316. ISBN 978-0-02-374910-0.
Sedra, A. S. & Smith, K. C. (2004). Microelectronic Circuits (5th ed.). Oxford University Press. p. 250, Eq. 4.14. ISBN 978-0-19-514251-8.
Gray, P. R.; Hurst, P. J.; Lewis, S. H.; Meyer, R. G. (2001). Analysis and design of analog integrated circuits (4th ed.). New York: Wiley. §1.5.2 p. 45. ISBN 978-0-471-32168-2.
Sedra, A. S. & Smith, K. C. (2004). Microelectronic circuits (5th ed.). New York: Oxford University Press. p. 552. ISBN 978-0-19-514251-8.

search.worldcat.org

Huff, Howard; Riordan, Michael (2007-09-01). "Frosch and Derick: Fifty Years Later (Foreword)". The Electrochemical Society Interface. 16 (3): 29. doi:10.1149/2.F02073IF. ISSN 1064-8208.
Ligenza, J. R.; Spitzer, W. G. (1960-07-01). "The mechanisms for silicon oxidation in steam and oxygen". Journal of Physics and Chemistry of Solids. 14: 131–136. Bibcode:1960JPCS...14..131L. doi:10.1016/0022-3697(60)90219-5. ISSN 0022-3697.