Magnetic force microscope (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Magnetic force microscope" in English language version.

refsWebsite

Global rank English rank

9doi.org

2^nd place

7harvard.edu

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5web.archive.org

1^st place

3semanticscholar.org

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1books.google.com

3^rd place

1zenodo.org

621^st place

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1nanoscan.ch

low place

1caltech.edu

887^th place

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1azom.com

low place

1unl.edu

1,708^th place

1,051^st place

1northwestern.edu

2,302^nd place

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1193.121

low place

1ntmdt-si.com

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1handle.net

102^nd place

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1hitachi-hitec-science.com

low place

1scitation.org

4,352^nd place

3,229^th place

193.121

164.67.193.121

I. Alvarado, "Procedure to Perform Magnetic Force Microscopy (MFM) with VEECO Dimension 3100 AFM", NRF, 2006 Archived May 29, 2011, at the Wayback Machine

azom.com

History of Probing Methods

books.google.com

D. Jiles (1998). "15". Introduction to Magnetism and Magnetic Materials (2 ed.). Springer. ISBN 3-540-40186-5.

caltech.edu

mechmat.caltech.edu

Magnetic Force Microscopy Archived July 19, 2011, at the Wayback Machine

doi.org

L. Abelmann; S. Porthun; et al. (1998). "Comparing the resolution of magnetic force microscopes using the CAMST reference samples". J. Magn. Magn. Mater. 190 (1–2): 135–147. Bibcode:1998JMMM..190..135A. doi:10.1016/S0304-8853(98)00281-9.
Y. Martin & K. Wickramasinghe (1987). "Magnetic Imaging by Force Microscopy with 1000A Resolution". Appl. Phys. Lett. 50 (20): 1455–1457. Bibcode:1987ApPhL..50.1455M. doi:10.1063/1.97800.
U. Hartmann (1999). "Magnetic Force Microscopy". Annu. Rev. Mater. Sci. 29: 53–87. Bibcode:1999AnRMS..29...53H. doi:10.1146/annurev.matsci.29.1.53. S2CID 99174136.
L. Gao; L.P. Yue; T. Yokota; et al. (2004). "Focused Ion Beam Milled CoPt Magnetic Force Microscopy Tips for High Resolution Domain Images". IEEE Transactions on Magnetics. 40 (4): 2194–2196. Bibcode:2004ITM....40.2194G. doi:10.1109/TMAG.2004.829173. S2CID 28850293.
A. Winkler; T. Mühl; S. Menzel; et al. (2006). "Magnetic Force Microscopy Sensors using Iron-filled Carbon Nanotubes". J. Appl. Phys. 99 (10): 104905–104905–5. Bibcode:2006JAP....99j4905W. doi:10.1063/1.2195879.
K. Tanaka; M. Yoshimura & K. Ueda (2009). "High-Resolution Magnetic Force Microscopy Using Carbon Nanotube Probes Fabricated Directly by Microwave Plasma-Enhanced Chemical Vapor Deposition". Journal of Nanomaterials. 2009: 147204. doi:10.1155/2009/147204.
R. Gomez; E.R. Burke & I.D. Mayergoyz (1996). "Magnetic Imaging in the Presence of External Fields: Technique and Applications". J. Appl. Phys. 79 (8): 6441–6446. Bibcode:1996JAP....79.6441G. doi:10.1063/1.361966. hdl:1903/8391.
Gama, Sergio; Ferreira, Lucas D. R.; Bessa, Carlos V. X.; Horikawa, Oswaldo; Coelho, Adelino A.; Gandra, Flavio C.; Araujo, Raul; Egolf, Peter W. (2016). "Analytic and Experimental Analysis of Magnetic Force Equations". IEEE Transactions on Magnetics. 52 (7): 1–4. doi:10.1109/tmag.2016.2517127. S2CID 21094593.
D. Rugar; H.J. Mamin; P. Guenther; et al. (1990). "Magnetic Force Microscopy: General Principles and Application to Longitudinal Recording Media". J. Appl. Phys. 68 (3): 1169–1183. Bibcode:1990JAP....68.1169R. doi:10.1063/1.346713.

handle.net

hdl.handle.net

R. Gomez; E.R. Burke & I.D. Mayergoyz (1996). "Magnetic Imaging in the Presence of External Fields: Technique and Applications". J. Appl. Phys. 79 (8): 6441–6446. Bibcode:1996JAP....79.6441G. doi:10.1063/1.361966. hdl:1903/8391.

harvard.edu

ui.adsabs.harvard.edu

L. Abelmann; S. Porthun; et al. (1998). "Comparing the resolution of magnetic force microscopes using the CAMST reference samples". J. Magn. Magn. Mater. 190 (1–2): 135–147. Bibcode:1998JMMM..190..135A. doi:10.1016/S0304-8853(98)00281-9.
Y. Martin & K. Wickramasinghe (1987). "Magnetic Imaging by Force Microscopy with 1000A Resolution". Appl. Phys. Lett. 50 (20): 1455–1457. Bibcode:1987ApPhL..50.1455M. doi:10.1063/1.97800.
U. Hartmann (1999). "Magnetic Force Microscopy". Annu. Rev. Mater. Sci. 29: 53–87. Bibcode:1999AnRMS..29...53H. doi:10.1146/annurev.matsci.29.1.53. S2CID 99174136.
L. Gao; L.P. Yue; T. Yokota; et al. (2004). "Focused Ion Beam Milled CoPt Magnetic Force Microscopy Tips for High Resolution Domain Images". IEEE Transactions on Magnetics. 40 (4): 2194–2196. Bibcode:2004ITM....40.2194G. doi:10.1109/TMAG.2004.829173. S2CID 28850293.
A. Winkler; T. Mühl; S. Menzel; et al. (2006). "Magnetic Force Microscopy Sensors using Iron-filled Carbon Nanotubes". J. Appl. Phys. 99 (10): 104905–104905–5. Bibcode:2006JAP....99j4905W. doi:10.1063/1.2195879.
R. Gomez; E.R. Burke & I.D. Mayergoyz (1996). "Magnetic Imaging in the Presence of External Fields: Technique and Applications". J. Appl. Phys. 79 (8): 6441–6446. Bibcode:1996JAP....79.6441G. doi:10.1063/1.361966. hdl:1903/8391.
D. Rugar; H.J. Mamin; P. Guenther; et al. (1990). "Magnetic Force Microscopy: General Principles and Application to Longitudinal Recording Media". J. Appl. Phys. 68 (3): 1169–1183. Bibcode:1990JAP....68.1169R. doi:10.1063/1.346713.

hitachi-hitec-science.com

[1] Archived July 21, 2013, at the Wayback Machine

nanoscan.ch

Nanoscan AG, Quantum Leap in Hard Disk Technology

northwestern.edu

nuance-dev.tech.northwestern.edu

"Magnetic Force Microscopy (MFM) manual" (PDF). Archived from the original (PDF) on 2016-01-12. Retrieved 2014-04-29.

ntmdt-si.com

"Cantilever Analysis". Archived from the original on 2018-02-22. Retrieved 2018-11-15.

scitation.org

aip.scitation.org

Point-dipole response from a magnetic force microscopy tip with a synthetic antiferromagnetic coating

semanticscholar.org

api.semanticscholar.org

U. Hartmann (1999). "Magnetic Force Microscopy". Annu. Rev. Mater. Sci. 29: 53–87. Bibcode:1999AnRMS..29...53H. doi:10.1146/annurev.matsci.29.1.53. S2CID 99174136.
L. Gao; L.P. Yue; T. Yokota; et al. (2004). "Focused Ion Beam Milled CoPt Magnetic Force Microscopy Tips for High Resolution Domain Images". IEEE Transactions on Magnetics. 40 (4): 2194–2196. Bibcode:2004ITM....40.2194G. doi:10.1109/TMAG.2004.829173. S2CID 28850293.
Gama, Sergio; Ferreira, Lucas D. R.; Bessa, Carlos V. X.; Horikawa, Oswaldo; Coelho, Adelino A.; Gandra, Flavio C.; Araujo, Raul; Egolf, Peter W. (2016). "Analytic and Experimental Analysis of Magnetic Force Equations". IEEE Transactions on Magnetics. 52 (7): 1–4. doi:10.1109/tmag.2016.2517127. S2CID 21094593.

unl.edu

digitalcommons.unl.edu

L. Gao; L.P. Yue; T. Yokota; et al. (2004). "Focused Ion Beam Milled CoPt Magnetic Force Microscopy Tips for High Resolution Domain Images". IEEE Transactions on Magnetics. 40 (4): 2194–2196. Bibcode:2004ITM....40.2194G. doi:10.1109/TMAG.2004.829173. S2CID 28850293.

web.archive.org

Magnetic Force Microscopy Archived July 19, 2011, at the Wayback Machine
"Magnetic Force Microscopy (MFM) manual" (PDF). Archived from the original (PDF) on 2016-01-12. Retrieved 2014-04-29.
I. Alvarado, "Procedure to Perform Magnetic Force Microscopy (MFM) with VEECO Dimension 3100 AFM", NRF, 2006 Archived May 29, 2011, at the Wayback Machine
"Cantilever Analysis". Archived from the original on 2018-02-22. Retrieved 2018-11-15.
[1] Archived July 21, 2013, at the Wayback Machine

zenodo.org

L. Abelmann; S. Porthun; et al. (1998). "Comparing the resolution of magnetic force microscopes using the CAMST reference samples". J. Magn. Magn. Mater. 190 (1–2): 135–147. Bibcode:1998JMMM..190..135A. doi:10.1016/S0304-8853(98)00281-9.