Magnetoresistive RAM (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Magnetoresistive RAM" in English language version.

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  • Akerman, J. (2005). "APPLIED PHYSICS: Toward a Universal Memory". Science. 308 (5721): 508–510. doi:10.1126/science.1110549. PMID 15845842. S2CID 60577959.
  • Engel, B. N.; Akerman, J.; Butcher, B.; Dave, R. W.; Deherrera, M.; Durlam, M.; Grynkewich, G.; Janesky, J.; Pietambaram, S. V.; Rizzo, N. D.; Slaughter, J. M.; Smith, K.; Sun, J. J.; Tehrani, S. (2005). "A 4-Mb toggle MRAM based on a novel bit and switching method". IEEE Transactions on Magnetics. 41 (1): 132. Bibcode:2005ITM....41..132E. doi:10.1109/TMAG.2004.840847. S2CID 38616311.
  • Sbiaa, R.; Meng, H.; Piramanayagam, S. N. (2011). "Materials with perpendicular magnetic anisotropy for magnetic random access memory". Physica Status Solidi RRL. 5 (12): 413. Bibcode:2011PSSRR...5..413S. doi:10.1002/pssr.201105420. S2CID 98626346.
  • Khvalkovskiy, A.V.; Apalkov, D.; Watts, S.; Chepulskii, R.; Beach, R S.; Ong, A.; Tang, X.; Driskill-Smith, A.; Butler, W.H.; Visscher, P.B.; Lottis, D.; Chen, E.; Nikitin, V.; Krounbi, M. (2013). "Basic principles of STT-MRAM cell operation in memory arrays". Journal of Physics D: Applied Physics. 46 (7): 074001. Bibcode:2013JPhD...46g4001K. doi:10.1088/0022-3727/46/7/074001. S2CID 110519121.
  • Schäfers, M.; Drewello, V.; Reiss, G.; Thomas, A.; Thiel, K.; Eilers, G.; Münzenberg, M.; Schuhmann, H.; Seibt, M. (2009). "Electric breakdown in ultra-thin MgO tunnel barrier junctions for spin-transfer torque switching". Applied Physics Letters. 95 (23): 232119. arXiv:0907.3579. Bibcode:2009ApPhL..95w2119S. doi:10.1063/1.3272268. S2CID 119251634.
  • Bishnoi, R.; Ebrahimi, M.; Oboril, F.; Tahoori, M.B. (2014). "Read disturb fault detection in STT-MRAM". 2014 International Test Conference. pp. 1–7. doi:10.1109/TEST.2014.7035342. ISBN 978-1-4799-4722-5. S2CID 7957290.
  • Chang, M.; Shen, S.; Liu, C.; Wu, C.; Lin, Y.; King, Y.; Lin, C.; Liao, H.; Chih, Y.; Yamauchi, H. (March 2013). "An Offset-Tolerant Fast-Random-Read Current-Sampling-Based Sense Amplifier for Small-Cell-Current Nonvolatile Memory". IEEE Journal of Solid-State Circuits. 48 (3): 864–877. Bibcode:2013IJSSC..48..864C. doi:10.1109/JSSC.2012.2235013. S2CID 23020634.
  • L Berger (October 1996). "Emission of spin waves by a magnetic multilayer traversed by a current". Physical Review B. 54 (13): 9353–8. Bibcode:1996PhRvB..54.9353B. doi:10.1103/physrevb.54.9353. PMID 9984672.
  • Slonczewski, J.C. (October 1996). "Current-driven excitation of magnetic multilayers". Journal of Magnetism and Magnetic Materials. 159 (1–2): L1–L7. Bibcode:1996JMMM..159L...1S. doi:10.1016/0304-8853(96)00062-5.
  • N.P. Vasil'eva (October 2003), "Magnetic Random Access Memory Devices", Automation and Remote Control, 64 (9): 1369–85, doi:10.1023/a:1026039700433, S2CID 195291447

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electronicsweekly.com

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harvard.edu

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koreatimes.co.kr

  • Kim, Yoo-chul (20 April 2016). "Cheil Worldwide acquires Founded". Koreatimes.co.kr. Korea Times. Retrieved 27 June 2016. 'Yes, Samsung will commercialize MRAMs and ReRAMs according to our own schedule. We are on our way and will be ready soon,' Kim told reporters.

linkedin.com

mram-info.com

nec.co.jp

newscientist.com

nih.gov

pubmed.ncbi.nlm.nih.gov

  • Akerman, J. (2005). "APPLIED PHYSICS: Toward a Universal Memory". Science. 308 (5721): 508–510. doi:10.1126/science.1110549. PMID 15845842. S2CID 60577959.
  • L Berger (October 1996). "Emission of spin waves by a magnetic multilayer traversed by a current". Physical Review B. 54 (13): 9353–8. Bibcode:1996PhRvB..54.9353B. doi:10.1103/physrevb.54.9353. PMID 9984672.

nikkeibp.co.jp

techon.nikkeibp.co.jp

nsf.gov

nve-spintronics.com

nve.com

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patents.google.com

  • United States 4731757A, "Magnetoresistive memory including thin film storage cells having tapered ends" 
  • Maiken, Eric. "Nonvolatile random access memory device". patents.google.com. Japan Patent Office. Retrieved 20 May 2023.

physorg.com

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scientificamerican.com

semanticscholar.org

api.semanticscholar.org

  • Akerman, J. (2005). "APPLIED PHYSICS: Toward a Universal Memory". Science. 308 (5721): 508–510. doi:10.1126/science.1110549. PMID 15845842. S2CID 60577959.
  • Engel, B. N.; Akerman, J.; Butcher, B.; Dave, R. W.; Deherrera, M.; Durlam, M.; Grynkewich, G.; Janesky, J.; Pietambaram, S. V.; Rizzo, N. D.; Slaughter, J. M.; Smith, K.; Sun, J. J.; Tehrani, S. (2005). "A 4-Mb toggle MRAM based on a novel bit and switching method". IEEE Transactions on Magnetics. 41 (1): 132. Bibcode:2005ITM....41..132E. doi:10.1109/TMAG.2004.840847. S2CID 38616311.
  • Sbiaa, R.; Meng, H.; Piramanayagam, S. N. (2011). "Materials with perpendicular magnetic anisotropy for magnetic random access memory". Physica Status Solidi RRL. 5 (12): 413. Bibcode:2011PSSRR...5..413S. doi:10.1002/pssr.201105420. S2CID 98626346.
  • Khvalkovskiy, A.V.; Apalkov, D.; Watts, S.; Chepulskii, R.; Beach, R S.; Ong, A.; Tang, X.; Driskill-Smith, A.; Butler, W.H.; Visscher, P.B.; Lottis, D.; Chen, E.; Nikitin, V.; Krounbi, M. (2013). "Basic principles of STT-MRAM cell operation in memory arrays". Journal of Physics D: Applied Physics. 46 (7): 074001. Bibcode:2013JPhD...46g4001K. doi:10.1088/0022-3727/46/7/074001. S2CID 110519121.
  • Schäfers, M.; Drewello, V.; Reiss, G.; Thomas, A.; Thiel, K.; Eilers, G.; Münzenberg, M.; Schuhmann, H.; Seibt, M. (2009). "Electric breakdown in ultra-thin MgO tunnel barrier junctions for spin-transfer torque switching". Applied Physics Letters. 95 (23): 232119. arXiv:0907.3579. Bibcode:2009ApPhL..95w2119S. doi:10.1063/1.3272268. S2CID 119251634.
  • Bishnoi, R.; Ebrahimi, M.; Oboril, F.; Tahoori, M.B. (2014). "Read disturb fault detection in STT-MRAM". 2014 International Test Conference. pp. 1–7. doi:10.1109/TEST.2014.7035342. ISBN 978-1-4799-4722-5. S2CID 7957290.
  • Chang, M.; Shen, S.; Liu, C.; Wu, C.; Lin, Y.; King, Y.; Lin, C.; Liao, H.; Chih, Y.; Yamauchi, H. (March 2013). "An Offset-Tolerant Fast-Random-Read Current-Sampling-Based Sense Amplifier for Small-Cell-Current Nonvolatile Memory". IEEE Journal of Solid-State Circuits. 48 (3): 864–877. Bibcode:2013IJSSC..48..864C. doi:10.1109/JSSC.2012.2235013. S2CID 23020634.
  • N.P. Vasil'eva (October 2003), "Magnetic Random Access Memory Devices", Automation and Remote Control, 64 (9): 1369–85, doi:10.1023/a:1026039700433, S2CID 195291447

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