Malter effect (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Malter effect" in English language version.

refsWebsite

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3^rd place

69^th place

59^th place

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arxiv.org (Global: 69^th place; English: 59^th place)

Dong, M.Y.; Xiu, Q.L.; Wu, L.H.; Wu, Z.; Qin, Z.H.; Shen, P.; An, F.F.; Ju, X.D.; Liu, Y.; Zhu, K.; Ouyang, Q.; Chen, Y.B. (17 Aug 2015). "Aging effect in the BESIII drift chamber". Chinese Physics C. 40 016001. arXiv:1504.04681. doi:10.1088/1674-1137/40/1/016001. S2CID 118327562.

Peter W. Hawkes (1992). Advances in electronics and electron physics. Academic Press. pp. 34–. ISBN 978-0-12-014725-0. Retrieved 10 March 2012.
American Institute of Electrical Engineers; Institute of Electrical and Electronics Engineers (July 1980). Radio engineering and electronic physics. American Institute of Electrical Engineers. Retrieved 10 March 2012.
Kolanoski, Hermann; Wermes, Norbert (30 June 2020). Particle Detectors: Fundamentals and Applications. Oxford University Press. p. 251. ISBN 978-0-19-189923-2.
Ballentyne, D. W. G.; Lovett, D. R. (6 December 2012). "Malter Effect". A Dictionary of Named Effects and Laws in Chemistry, Physics and Mathematics (4th ed.). Springer. ISBN 978-94-011-6028-5.
Nappi, Eugenio; Sequinot, Jacques, eds. (10 August 2004). "Radiation Damage and Long Term Ageing in Gas Detectors by M. Titov". Innovative Detectors for Supercolliders, Proceedings of the 42nd Workshop of the Infn Eloisatron Project. World Scientific. pp. 199–226. ISBN 978-981-4483-32-2. (See p. 202.)

Dong, M.Y.; Xiu, Q.L.; Wu, L.H.; Wu, Z.; Qin, Z.H.; Shen, P.; An, F.F.; Ju, X.D.; Liu, Y.; Zhu, K.; Ouyang, Q.; Chen, Y.B. (17 Aug 2015). "Aging effect in the BESIII drift chamber". Chinese Physics C. 40 016001. arXiv:1504.04681. doi:10.1088/1674-1137/40/1/016001. S2CID 118327562.

Dong, M.Y.; Xiu, Q.L.; Wu, L.H.; Wu, Z.; Qin, Z.H.; Shen, P.; An, F.F.; Ju, X.D.; Liu, Y.; Zhu, K.; Ouyang, Q.; Chen, Y.B. (17 Aug 2015). "Aging effect in the BESIII drift chamber". Chinese Physics C. 40 016001. arXiv:1504.04681. doi:10.1088/1674-1137/40/1/016001. S2CID 118327562.