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Nanoprobing (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Nanoprobing" in English language version.

refsWebsite
Global rank English rank
10doi.org
2nd place
2nd place
8semanticscholar.org
11th place
8th place
2asminternational.org
low place
low place

asminternational.org

dl.asminternational.org

  • Kane, Terence; Tenney, Michael P. "Nanoprobe Capacitance-Voltage Spectroscopy (NCVS) Localization of 32nm SOI SRAM Array Failure". dl.asminternational.org. doi:10.31399/asm.cp.istfa2009p0073. Retrieved 2023-04-23.
  • Moldovan, Grigore; Courbat, William. "Strategies to Identify Physical Origin of Contrast in EBIRCH". dl.asminternational.org. doi:10.31399/asm.cp.istfa2022p0277. Retrieved 2023-04-23.

doi.org

  • Kane, Terence; Tenney, Michael P. "Nanoprobe Capacitance-Voltage Spectroscopy (NCVS) Localization of 32nm SOI SRAM Array Failure". dl.asminternational.org. doi:10.31399/asm.cp.istfa2009p0073. Retrieved 2023-04-23.
  • Toh, S. L.; Tan, P. K.; Goh, Y. W.; Hendarto, E.; Cai, J. L.; Tan, H.; Wang, Q. F.; Deng, Q.; Lam, J.; Hsia, L. C.; Mai, Z. H. (2008). "In-Depth Electrical Analysis to Reveal the Failure Mechanisms with Nanoprobing". IEEE Transactions on Device and Materials Reliability. 8 (2): 387. doi:10.1109/TDMR.2008.920300. S2CID 24235354.
  • Fukui, M.; Nara, Y.; Fuse, J. (2012). "Characteristics Variability Evaluation of Actual LSI Transistors with Nanoprobing". 2012 IEEE 21st Asian Test Symposium. p. 4. doi:10.1109/ATS.2012.80. ISBN 978-1-4673-4555-2. S2CID 23388036.
  • Toh, S. L.; Mai, Z. H.; Tan, P. K.; Hendarto, E.; Tan, H.; Wang, Q. F.; Cai, J. L.; Deng, Q.; Ng, T. H.; Goh, Y. W.; Lam, J.; Hsia, L. C. (2007). "Use of Nanoprobing as the Diagnostic Tool for Nanoscaled Devices". 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits. p. 53. doi:10.1109/IPFA.2007.4378057. ISBN 978-1-4244-1014-9. S2CID 15046150.
  • Hendarto, E.; Lin, H. B.; Toh, S. L.; Tan, P. K.; Goh, Y. W.; Mai, Z. H.; Lam, J. (2008). "Investigation of soft fail issue in sub-nanometer devices using nanoprobing technique". 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits. p. 1. doi:10.1109/IPFA.2008.4588174. ISBN 978-1-4244-2039-1. S2CID 15534732.
  • Lin, H. S.; Chang, W. T.; Chen, C. L.; Huang, T. H.; Chiang, V.; Chen, C. M. (2006). "A Study of Asymmetrical Behaviour in Advanced Nano SRAM Devices". 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits. p. 63. doi:10.1109/IPFA.2006.250998. ISBN 1-4244-0205-0. S2CID 15417689.
  • Dickson, K.; Lange, G.; Erington, K.; Ybarra, J. (2011). "Electron Beam Absorbed Current as a means of locating metal defectivity on 45nm SOI technology". 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). p. 1. doi:10.1109/IPFA.2011.5992793. ISBN 978-1-4577-0159-7. S2CID 18455519.
  • Wen Pin Lin; Hsiu Ju Chang (2010). "Physical failure analysis cases by Electron Beam Absorbed Current & Electron Beam Induced Current detection on nano-probing SEM system". 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits. p. 1. doi:10.1109/IPFA.2010.5532245. ISBN 978-1-4244-5596-6. S2CID 14131647.
  • Moldovan, Grigore; Courbat, William. "Strategies to Identify Physical Origin of Contrast in EBIRCH". dl.asminternational.org. doi:10.31399/asm.cp.istfa2022p0277. Retrieved 2023-04-23.
  • Gong, Z.; Chen, B. K.; Liu, J.; Sun, Y. (2013). "Automated nanoprobing under scanning electron microscopy". 2013 IEEE International Conference on Robotics and Automation. p. 1433. doi:10.1109/ICRA.2013.6630759. ISBN 978-1-4673-5643-5. S2CID 17213432.

semanticscholar.org

api.semanticscholar.org

  • Toh, S. L.; Tan, P. K.; Goh, Y. W.; Hendarto, E.; Cai, J. L.; Tan, H.; Wang, Q. F.; Deng, Q.; Lam, J.; Hsia, L. C.; Mai, Z. H. (2008). "In-Depth Electrical Analysis to Reveal the Failure Mechanisms with Nanoprobing". IEEE Transactions on Device and Materials Reliability. 8 (2): 387. doi:10.1109/TDMR.2008.920300. S2CID 24235354.
  • Fukui, M.; Nara, Y.; Fuse, J. (2012). "Characteristics Variability Evaluation of Actual LSI Transistors with Nanoprobing". 2012 IEEE 21st Asian Test Symposium. p. 4. doi:10.1109/ATS.2012.80. ISBN 978-1-4673-4555-2. S2CID 23388036.
  • Toh, S. L.; Mai, Z. H.; Tan, P. K.; Hendarto, E.; Tan, H.; Wang, Q. F.; Cai, J. L.; Deng, Q.; Ng, T. H.; Goh, Y. W.; Lam, J.; Hsia, L. C. (2007). "Use of Nanoprobing as the Diagnostic Tool for Nanoscaled Devices". 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits. p. 53. doi:10.1109/IPFA.2007.4378057. ISBN 978-1-4244-1014-9. S2CID 15046150.
  • Hendarto, E.; Lin, H. B.; Toh, S. L.; Tan, P. K.; Goh, Y. W.; Mai, Z. H.; Lam, J. (2008). "Investigation of soft fail issue in sub-nanometer devices using nanoprobing technique". 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits. p. 1. doi:10.1109/IPFA.2008.4588174. ISBN 978-1-4244-2039-1. S2CID 15534732.
  • Lin, H. S.; Chang, W. T.; Chen, C. L.; Huang, T. H.; Chiang, V.; Chen, C. M. (2006). "A Study of Asymmetrical Behaviour in Advanced Nano SRAM Devices". 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits. p. 63. doi:10.1109/IPFA.2006.250998. ISBN 1-4244-0205-0. S2CID 15417689.
  • Dickson, K.; Lange, G.; Erington, K.; Ybarra, J. (2011). "Electron Beam Absorbed Current as a means of locating metal defectivity on 45nm SOI technology". 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). p. 1. doi:10.1109/IPFA.2011.5992793. ISBN 978-1-4577-0159-7. S2CID 18455519.
  • Wen Pin Lin; Hsiu Ju Chang (2010). "Physical failure analysis cases by Electron Beam Absorbed Current & Electron Beam Induced Current detection on nano-probing SEM system". 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits. p. 1. doi:10.1109/IPFA.2010.5532245. ISBN 978-1-4244-5596-6. S2CID 14131647.
  • Gong, Z.; Chen, B. K.; Liu, J.; Sun, Y. (2013). "Automated nanoprobing under scanning electron microscopy". 2013 IEEE International Conference on Robotics and Automation. p. 1433. doi:10.1109/ICRA.2013.6630759. ISBN 978-1-4673-5643-5. S2CID 17213432.