Derickson, D., & Jin, X., & Bland, C. C. (2021, April), The NanoVNA Vector Network Analyzer: This New Open-Source Electronic Test and Measurement Device Will Change Both Remote and In-Person Educational Delivery of Circuits, Electronics, Radio Frequency and Communication Laboratory Course Delivery Paper presented at 2021 ASEE Pacific Southwest Conference - "Pushing Past Pandemic Pedagogy: Learning from Disruption", Virtual. peer.asee.org/38253
Engen, Glenn F.; Hoer, Cletus A. (1979). "Through-reflect-line: An improved technique for calibrating the dual six-port automatic network analyzer". IEEE Transactions on Microwave Theory and Techniques. 27 (12): 987–993. Bibcode:1979ITMTT..27..987E. doi:10.1109/TMTT.1979.1129778. S2CID13838973.
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Engen, Glenn F.; Hoer, Cletus A. (1979). "Through-reflect-line: An improved technique for calibrating the dual six-port automatic network analyzer". IEEE Transactions on Microwave Theory and Techniques. 27 (12): 987–993. Bibcode:1979ITMTT..27..987E. doi:10.1109/TMTT.1979.1129778. S2CID13838973.
Engen, Glenn F.; Hoer, Cletus A. (1979). "Through-reflect-line: An improved technique for calibrating the dual six-port automatic network analyzer". IEEE Transactions on Microwave Theory and Techniques. 27 (12): 987–993. Bibcode:1979ITMTT..27..987E. doi:10.1109/TMTT.1979.1129778. S2CID13838973.
