Dufour, Marc L.; Gauthier, Bruno (2003). "Precise surface profilometry based on low-coherence interferometry". In Lessard, Roger A; Lampropoulos, George A (eds.). Applications of Photonic Technology 6. Vol. 5260. p. 173. Bibcode:2003SPIE.5260..173D. doi:10.1117/12.543395. S2CID135946276.
Dufour, Marc L.; Gauthier, Bruno (2003). "Precise surface profilometry based on low-coherence interferometry". In Lessard, Roger A; Lampropoulos, George A (eds.). Applications of Photonic Technology 6. Vol. 5260. p. 173. Bibcode:2003SPIE.5260..173D. doi:10.1117/12.543395. S2CID135946276.
Dufour, M. L.; Lamouche, G.; Vergnole, S.; Gauthier, B.; Padioleau, C.; Hewko, M.; Levesque, S.; Bartulovic, V. (June 2006). "Precise surface profilometry based on low-coherence interferometry". Proceedings of SPIE. Vol. 6343. Quebec City, Quebec, Canada: SPIE. pp. 63431Z.1–7. Retrieved December 14, 2010.
Dufour, Marc L.; Gauthier, Bruno (2003). "Precise surface profilometry based on low-coherence interferometry". In Lessard, Roger A; Lampropoulos, George A (eds.). Applications of Photonic Technology 6. Vol. 5260. p. 173. Bibcode:2003SPIE.5260..173D. doi:10.1117/12.543395. S2CID135946276.