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Unger, Ann-Katrin; Neujahr, Ralph; Hawes, Chris; Hummel, Eric (2020), Wacker, Irene; Hummel, Eric; Burgold, Steffen; Schröder, Rasmus (eds.), "Improving Serial Block Face SEM by Focal Charge Compensation", Volume Microscopy : Multiscale Imaging with Photons, Electrons, and Ions, Neuromethods, vol. 155, New York, NY: Springer US, pp. 165–178, doi:10.1007/978-1-0716-0691-9_9, ISBN978-1-0716-0691-9, S2CID226563386
Di Scipio, F.; Raimondo, S.; Tos, P.; Geuna, S. (2008). "A simple protocol for paraffin-embedded myelin sheath staining with osmium(VIII) oxide for light microscope observation". Microscopy Research and Technique. 71 (7): 497–502. doi:10.1002/jemt.20577. PMID18320578. S2CID9404999.
Di Scipio, F.; Raimondo, S.; Tos, P.; Geuna, S. (2008). "A simple protocol for paraffin-embedded myelin sheath staining with osmium(VIII) oxide for light microscope observation". Microscopy Research and Technique. 71 (7): 497–502. doi:10.1002/jemt.20577. PMID18320578. S2CID9404999.
Unger, Ann-Katrin; Neujahr, Ralph; Hawes, Chris; Hummel, Eric (2020), Wacker, Irene; Hummel, Eric; Burgold, Steffen; Schröder, Rasmus (eds.), "Improving Serial Block Face SEM by Focal Charge Compensation", Volume Microscopy : Multiscale Imaging with Photons, Electrons, and Ions, Neuromethods, vol. 155, New York, NY: Springer US, pp. 165–178, doi:10.1007/978-1-0716-0691-9_9, ISBN978-1-0716-0691-9, S2CID226563386
Di Scipio, F.; Raimondo, S.; Tos, P.; Geuna, S. (2008). "A simple protocol for paraffin-embedded myelin sheath staining with osmium(VIII) oxide for light microscope observation". Microscopy Research and Technique. 71 (7): 497–502. doi:10.1002/jemt.20577. PMID18320578. S2CID9404999.
