Point diffraction interferometer (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Point diffraction interferometer" in English language version.

refsWebsite

Global rank English rank

10doi.org

2^nd place

9harvard.edu

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5semanticscholar.org

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5nih.gov

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2worldcat.org

5^th place

2spiedigitallibrary.org

low place

2difrotec.com

low place

1handle.net

102^nd place

76^th place

1llnl.gov

6,750^th place

5,140^th place

difrotec.com

"Product — Difrotec". difrotec.com. Retrieved 2017-03-20.
"Difrotec D7 is a high accuracy industrial point diffraction interferometer". www.difrotec.com. Retrieved 2017-04-28.

doi.org

Smartt, R. N.; W. H. Steel (1975). "Theory and application of Point-Diffraction interferometers". Japanese Journal of Applied Physics. 14 (S1): 351–356. Bibcode:1975JJAPS..14..351S. doi:10.7567/jjaps.14s1.351. S2CID 121804757.
Neal, Robert M.; Wyant, James C. (2006-05-20). "Polarization phase-shifting point-diffraction interferometer". Applied Optics. 45 (15): 3463–3476. Bibcode:2006ApOpt..45.3463N. doi:10.1364/AO.45.003463. hdl:10150/280372. ISSN 1539-4522. PMID 16708090.
Voznesenskiy, Nikolay; Voznesenskaia, Mariia; Petrova, Natalia; Abels, Artur (2012-12-18). Mazuray, Laurent; Wartmann, Rolf; Wood, Andrew P; de la Fuente, Marta C; Tissot, Jean-Luc M; Raynor, Jeffrey M; Kidger, Tina E; David, Stuart; Benítez, Pablo; Smith, Daniel G; Wyrowski, Frank; Erdmann, Andreas (eds.). "Alignment of phase-shifting interferograms in the two-beam point diffraction interferometer". Optical Systems Design 2012. 8550. International Society for Optics and Photonics: 85500R–85500R–8. doi:10.1117/12.980910. S2CID 123535031. {{cite journal}}: Cite journal requires |journal= (help)
Kwon, Osuk (February 1984). "Multichannel phase-shifted interferometer". Optics Letters. 9 (2): 59–61. Bibcode:1984OptL....9...59K. doi:10.1364/ol.9.000059. PMID 19718235.
Medecki, Hector (1996). "A Phase-Shifting Point Diffraction Interferometer". Optics Letters. 21 (19): 1526–1528. Bibcode:1996OptL...21.1526M. doi:10.1364/OL.21.001526. PMID 19881713.
Naulleau, Patrick (1999). "Extreme-ultraviolet phase-shifting point-diffraction interferometer: a wave-front metrology tool with subangstrom reference-wave accuracy". Applied Optics. 38 (35): 7252–7263. Bibcode:1999ApOpt..38.7252N. doi:10.1364/ao.38.007252. PMID 18324274.
Otaki, Katsura; Bonneau, Florian; Ichihara, Yutaka (1999-01-01). "Absolute measurement of a spherical surface using a point diffraction interferometer". Optical Engineering for Sensing and Nanotechnology (ICOSN '99). 3740: 602–605. Bibcode:1999SPIE.3740..602O. doi:10.1117/12.347755. S2CID 119631152. {{cite journal}}: Cite journal requires |journal= (help)
Rhee, Hyug-Gyo; Kim, Seung-Woo (2002-10-01). "Absolute distance measurement by two-point-diffraction interferometry". Applied Optics. 41 (28): 5921–5928. Bibcode:2002ApOpt..41.5921R. doi:10.1364/AO.41.005921. ISSN 1539-4522. PMID 12371550.
Voznesenskiy, Nikolay; Voznesenskaia, Mariia; Petrova, Natalia; Abels, Artur (2013-05-13). "Concept, realization and performance of a two-beam phase-shifting point diffraction interferometer". In Lehmann, Peter H; Osten, Wolfgang; Albertazzi, Armando (eds.). Optical Measurement Systems for Industrial Inspection VIII. Vol. 8788. International Society for Optics and Photonics. pp. 878805–878805–13. doi:10.1117/12.2020618. S2CID 109782639.
Chkhalo, Nikolay I.; Kluenkov, Evgeniy B.; Pestov, Aleksey E.; Raskin, Denis G.; Salashchenko, Nikolay N.; Toropov, Mikhail N. (2008-01-01). "Manufacturing and investigation of objective lens for ultrahigh resolution lithography facilities". Micro- and Nanoelectronics 2007. SPIE Proceedings. 7025: 702505–702505–6. Bibcode:2008SPIE.7025E..05C. doi:10.1117/12.802351. S2CID 55343344.

handle.net

hdl.handle.net

Neal, Robert M.; Wyant, James C. (2006-05-20). "Polarization phase-shifting point-diffraction interferometer". Applied Optics. 45 (15): 3463–3476. Bibcode:2006ApOpt..45.3463N. doi:10.1364/AO.45.003463. hdl:10150/280372. ISSN 1539-4522. PMID 16708090.

harvard.edu

ui.adsabs.harvard.edu

Smartt, R. N.; W. H. Steel (1975). "Theory and application of Point-Diffraction interferometers". Japanese Journal of Applied Physics. 14 (S1): 351–356. Bibcode:1975JJAPS..14..351S. doi:10.7567/jjaps.14s1.351. S2CID 121804757.
Smartt, R. N.; Strong, J. (1972). "Point-Diffraction Interferometer". Journal of the Optical Society of America. 62: 737. Bibcode:1974JOSA...62..737S.
Neal, Robert M.; Wyant, James C. (2006-05-20). "Polarization phase-shifting point-diffraction interferometer". Applied Optics. 45 (15): 3463–3476. Bibcode:2006ApOpt..45.3463N. doi:10.1364/AO.45.003463. hdl:10150/280372. ISSN 1539-4522. PMID 16708090.
Kwon, Osuk (February 1984). "Multichannel phase-shifted interferometer". Optics Letters. 9 (2): 59–61. Bibcode:1984OptL....9...59K. doi:10.1364/ol.9.000059. PMID 19718235.
Medecki, Hector (1996). "A Phase-Shifting Point Diffraction Interferometer". Optics Letters. 21 (19): 1526–1528. Bibcode:1996OptL...21.1526M. doi:10.1364/OL.21.001526. PMID 19881713.
Naulleau, Patrick (1999). "Extreme-ultraviolet phase-shifting point-diffraction interferometer: a wave-front metrology tool with subangstrom reference-wave accuracy". Applied Optics. 38 (35): 7252–7263. Bibcode:1999ApOpt..38.7252N. doi:10.1364/ao.38.007252. PMID 18324274.
Otaki, Katsura; Bonneau, Florian; Ichihara, Yutaka (1999-01-01). "Absolute measurement of a spherical surface using a point diffraction interferometer". Optical Engineering for Sensing and Nanotechnology (ICOSN '99). 3740: 602–605. Bibcode:1999SPIE.3740..602O. doi:10.1117/12.347755. S2CID 119631152. {{cite journal}}: Cite journal requires |journal= (help)
Rhee, Hyug-Gyo; Kim, Seung-Woo (2002-10-01). "Absolute distance measurement by two-point-diffraction interferometry". Applied Optics. 41 (28): 5921–5928. Bibcode:2002ApOpt..41.5921R. doi:10.1364/AO.41.005921. ISSN 1539-4522. PMID 12371550.
Chkhalo, Nikolay I.; Kluenkov, Evgeniy B.; Pestov, Aleksey E.; Raskin, Denis G.; Salashchenko, Nikolay N.; Toropov, Mikhail N. (2008-01-01). "Manufacturing and investigation of objective lens for ultrahigh resolution lithography facilities". Micro- and Nanoelectronics 2007. SPIE Proceedings. 7025: 702505–702505–6. Bibcode:2008SPIE.7025E..05C. doi:10.1117/12.802351. S2CID 55343344.

llnl.gov

str.llnl.gov

"Interferometer". str.llnl.gov. Retrieved 2017-03-20.

nih.gov

pubmed.ncbi.nlm.nih.gov

Neal, Robert M.; Wyant, James C. (2006-05-20). "Polarization phase-shifting point-diffraction interferometer". Applied Optics. 45 (15): 3463–3476. Bibcode:2006ApOpt..45.3463N. doi:10.1364/AO.45.003463. hdl:10150/280372. ISSN 1539-4522. PMID 16708090.
Kwon, Osuk (February 1984). "Multichannel phase-shifted interferometer". Optics Letters. 9 (2): 59–61. Bibcode:1984OptL....9...59K. doi:10.1364/ol.9.000059. PMID 19718235.
Medecki, Hector (1996). "A Phase-Shifting Point Diffraction Interferometer". Optics Letters. 21 (19): 1526–1528. Bibcode:1996OptL...21.1526M. doi:10.1364/OL.21.001526. PMID 19881713.
Naulleau, Patrick (1999). "Extreme-ultraviolet phase-shifting point-diffraction interferometer: a wave-front metrology tool with subangstrom reference-wave accuracy". Applied Optics. 38 (35): 7252–7263. Bibcode:1999ApOpt..38.7252N. doi:10.1364/ao.38.007252. PMID 18324274.
Rhee, Hyug-Gyo; Kim, Seung-Woo (2002-10-01). "Absolute distance measurement by two-point-diffraction interferometry". Applied Optics. 41 (28): 5921–5928. Bibcode:2002ApOpt..41.5921R. doi:10.1364/AO.41.005921. ISSN 1539-4522. PMID 12371550.

semanticscholar.org

api.semanticscholar.org

Smartt, R. N.; W. H. Steel (1975). "Theory and application of Point-Diffraction interferometers". Japanese Journal of Applied Physics. 14 (S1): 351–356. Bibcode:1975JJAPS..14..351S. doi:10.7567/jjaps.14s1.351. S2CID 121804757.
Voznesenskiy, Nikolay; Voznesenskaia, Mariia; Petrova, Natalia; Abels, Artur (2012-12-18). Mazuray, Laurent; Wartmann, Rolf; Wood, Andrew P; de la Fuente, Marta C; Tissot, Jean-Luc M; Raynor, Jeffrey M; Kidger, Tina E; David, Stuart; Benítez, Pablo; Smith, Daniel G; Wyrowski, Frank; Erdmann, Andreas (eds.). "Alignment of phase-shifting interferograms in the two-beam point diffraction interferometer". Optical Systems Design 2012. 8550. International Society for Optics and Photonics: 85500R–85500R–8. doi:10.1117/12.980910. S2CID 123535031. {{cite journal}}: Cite journal requires |journal= (help)
Otaki, Katsura; Bonneau, Florian; Ichihara, Yutaka (1999-01-01). "Absolute measurement of a spherical surface using a point diffraction interferometer". Optical Engineering for Sensing and Nanotechnology (ICOSN '99). 3740: 602–605. Bibcode:1999SPIE.3740..602O. doi:10.1117/12.347755. S2CID 119631152. {{cite journal}}: Cite journal requires |journal= (help)
Voznesenskiy, Nikolay; Voznesenskaia, Mariia; Petrova, Natalia; Abels, Artur (2013-05-13). "Concept, realization and performance of a two-beam phase-shifting point diffraction interferometer". In Lehmann, Peter H; Osten, Wolfgang; Albertazzi, Armando (eds.). Optical Measurement Systems for Industrial Inspection VIII. Vol. 8788. International Society for Optics and Photonics. pp. 878805–878805–13. doi:10.1117/12.2020618. S2CID 109782639.
Chkhalo, Nikolay I.; Kluenkov, Evgeniy B.; Pestov, Aleksey E.; Raskin, Denis G.; Salashchenko, Nikolay N.; Toropov, Mikhail N. (2008-01-01). "Manufacturing and investigation of objective lens for ultrahigh resolution lithography facilities". Micro- and Nanoelectronics 2007. SPIE Proceedings. 7025: 702505–702505–6. Bibcode:2008SPIE.7025E..05C. doi:10.1117/12.802351. S2CID 55343344.

spiedigitallibrary.org

proceedings.spiedigitallibrary.org

Voznesenskiy, Nikolay; Voznesenskaia, Mariia; Petrova, Natalia; Abels, Artur (2012-12-18). Mazuray, Laurent; Wartmann, Rolf; Wood, Andrew P; de la Fuente, Marta C; Tissot, Jean-Luc M; Raynor, Jeffrey M; Kidger, Tina E; David, Stuart; Benítez, Pablo; Smith, Daniel G; Wyrowski, Frank; Erdmann, Andreas (eds.). "Alignment of phase-shifting interferograms in the two-beam point diffraction interferometer". Optical Systems Design 2012. 8550. International Society for Optics and Photonics: 85500R–85500R–8. doi:10.1117/12.980910. S2CID 123535031. {{cite journal}}: Cite journal requires |journal= (help)
Voznesenskiy, Nikolay; Voznesenskaia, Mariia; Petrova, Natalia; Abels, Artur (2013-05-13). "Concept, realization and performance of a two-beam phase-shifting point diffraction interferometer". In Lehmann, Peter H; Osten, Wolfgang; Albertazzi, Armando (eds.). Optical Measurement Systems for Industrial Inspection VIII. Vol. 8788. International Society for Optics and Photonics. pp. 878805–878805–13. doi:10.1117/12.2020618. S2CID 109782639.

worldcat.org

search.worldcat.org

Neal, Robert M.; Wyant, James C. (2006-05-20). "Polarization phase-shifting point-diffraction interferometer". Applied Optics. 45 (15): 3463–3476. Bibcode:2006ApOpt..45.3463N. doi:10.1364/AO.45.003463. hdl:10150/280372. ISSN 1539-4522. PMID 16708090.
Rhee, Hyug-Gyo; Kim, Seung-Woo (2002-10-01). "Absolute distance measurement by two-point-diffraction interferometry". Applied Optics. 41 (28): 5921–5928. Bibcode:2002ApOpt..41.5921R. doi:10.1364/AO.41.005921. ISSN 1539-4522. PMID 12371550.