Rottländer, P.; Hehn, M.; Schuhl, A. (11 January 2002). "Determining the interfacial barrier height and its relation to tunnel magnetoresistance". Physical Review B. 65 (5). American Physical Society (APS): 054422. Bibcode:2002PhRvB..65e4422R. doi:10.1103/physrevb.65.054422. ISSN0163-1829.
Takahashi, Y.; Ohnishi, K. (1993). "Estimation of insulation layer conductance in MNOS structure". IEEE Transactions on Electron Devices. 40 (11): 2006–2010. Bibcode:1993ITED...40.2006T. doi:10.1109/16.239741.
Ieda, Masayuki; Sawa, Goro; Kato, Sousuke (1 September 1971). "A Consideration of Poole‐Frenkel Effect on Electric Conduction in Insulators". Journal of Applied Physics. 42 (10): 3737–3740. Bibcode:1971JAP....42.3737I. doi:10.1063/1.1659678. ISSN0021-8979.
Rottländer, P.; Hehn, M.; Schuhl, A. (11 January 2002). "Determining the interfacial barrier height and its relation to tunnel magnetoresistance". Physical Review B. 65 (5). American Physical Society (APS): 054422. Bibcode:2002PhRvB..65e4422R. doi:10.1103/physrevb.65.054422. ISSN0163-1829.
Takahashi, Y.; Ohnishi, K. (1993). "Estimation of insulation layer conductance in MNOS structure". IEEE Transactions on Electron Devices. 40 (11): 2006–2010. Bibcode:1993ITED...40.2006T. doi:10.1109/16.239741.
Ieda, Masayuki; Sawa, Goro; Kato, Sousuke (1 September 1971). "A Consideration of Poole‐Frenkel Effect on Electric Conduction in Insulators". Journal of Applied Physics. 42 (10): 3737–3740. Bibcode:1971JAP....42.3737I. doi:10.1063/1.1659678. ISSN0021-8979.
Rottländer, P.; Hehn, M.; Schuhl, A. (11 January 2002). "Determining the interfacial barrier height and its relation to tunnel magnetoresistance". Physical Review B. 65 (5). American Physical Society (APS): 054422. Bibcode:2002PhRvB..65e4422R. doi:10.1103/physrevb.65.054422. ISSN0163-1829.
Ieda, Masayuki; Sawa, Goro; Kato, Sousuke (1 September 1971). "A Consideration of Poole‐Frenkel Effect on Electric Conduction in Insulators". Journal of Applied Physics. 42 (10): 3737–3740. Bibcode:1971JAP....42.3737I. doi:10.1063/1.1659678. ISSN0021-8979.