Probe card (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Probe card" in English language version.

refsWebsite

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2formfactor.com

low place

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1web.archive.org

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doi.org

Sayil, Selahattin (2018). Contactless VLSI Measurement and Testing Techniques. Springer International Publishing. pp. 1–3. doi:10.1007/978-3-319-69673-7. ISBN 978-3-319-69672-0.

eesemi.com

"ATE Load Boards/DUT Boards/Interface Boards". www.eesemi.com. Retrieved 2022-01-24.

formfactor.com

Michael Huebner (FormFactor) (2013). "Use of Resource Sharing Techniques to Increase Parallel Test and Test Coverage in Wafer Test" (PDF). IEEE SWTW.
"Vertical MEMS Probe Technology For Advanced Packaging" (PDF). formfactor.com. Retrieved 9 June 2020.

heraeus.com

"Materials for Probe Needles". heraeus.com. Retrieved 9 June 2020.

odva.org

"Performance Test Terminology for EtherNet/IP Devices" (PDF). Archived from the original (PDF) on 2016-09-14. Retrieved 2022-01-24.

swtest.org

William Mann. ""Leading Edge" of Wafer Level Testing" (PDF).

web.archive.org

"Performance Test Terminology for EtherNet/IP Devices" (PDF). Archived from the original (PDF) on 2016-09-14. Retrieved 2022-01-24.