Probe card (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Probe card" in English language version.

refsWebsite

Global rank English rank

2formfactor.com

low place

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1web.archive.org

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doi.org (Global: 2^nd place; English: 2^nd place)

Sayil, Selahattin (2018). Contactless VLSI Measurement and Testing Techniques. Springer International Publishing. pp. 1–3. doi:10.1007/978-3-319-69673-7. ISBN 978-3-319-69672-0.

eesemi.com (Global: low place; English: low place)

"ATE Load Boards/DUT Boards/Interface Boards". www.eesemi.com. Retrieved 2022-01-24.

formfactor.com (Global: low place; English: low place)

Michael Huebner (FormFactor) (2013). "Use of Resource Sharing Techniques to Increase Parallel Test and Test Coverage in Wafer Test" (PDF). IEEE SWTW.
"Vertical MEMS Probe Technology For Advanced Packaging" (PDF). formfactor.com. Retrieved 9 June 2020.

heraeus.com (Global: low place; English: low place)

"Materials for Probe Needles". heraeus.com. Retrieved 9 June 2020.

odva.org (Global: low place; English: low place)

"Performance Test Terminology for EtherNet/IP Devices" (PDF). Archived from the original (PDF) on 2016-09-14. Retrieved 2022-01-24.

swtest.org (Global: low place; English: low place)

William Mann. ""Leading Edge" of Wafer Level Testing" (PDF).

web.archive.org (Global: 1^st place; English: 1^st place)

"Performance Test Terminology for EtherNet/IP Devices" (PDF). Archived from the original (PDF) on 2016-09-14. Retrieved 2022-01-24.