Profilometer (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Profilometer" in English language version.

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  • W J Walecki, F Szondy, and M M Hilali, "Fast in-line surface topography metrology enabling stress calculation for solar cell manufacturing for throughput in excess of 2000 wafers per hour" 2008 Meas. Sci. Technol. 19 025302 (6pp) doi:10.1088/0957-0233/19/2/025302
  • Binnig, Gerd; Quate, Calvin F; Gerber, Ch (1986). "Atomic force microscope". Physical Review Letters. 56 (9): 930–933. doi:10.1103/PhysRevLett.56.930. PMID 10033323.
  • Dufour, Marc; Lamouche, G.; Gauthier, B.; Padioleau, C.; Monchalin, J.P. (2006). "Inspectionofhard-to-reachindustrialpartsusingsmalldiameterprobes" (PDF). SPIE Newsroom. SPIE. doi:10.1117/2.1200610.0467. S2CID 120476700. Retrieved December 15, 2010.
  • Dufour, M. L.; Lamouche, G.; Detalle, V.; Gauthier, B.; Sammut, P. (April 2005). "Low-Coherence Interferometry, an Advanced Technique for Optical Metrology in Industry". Insight: Non-Destructive Testing and Condition Monitoring. 47 (4): 216–219. CiteSeerX 10.1.1.159.5249. doi:10.1784/insi.47.4.216.63149. ISSN 1354-2575.
  • Cahoon, Joel E. (January 1995). "Defining Furrow Cross Section". Journal of Irrigation and Drainage Engineering. 121 (1): 114–119. doi:10.1061/(ASCE)0733-9437(1995)121:1(114). ISSN 0733-9437.

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