Random-access memory (English Wikipedia)

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Havemann, Robert H.; Eklund, R. E.; Tran, Hiep V.; Haken, R. A.; Scott, D. B.; Fung, P. K.; Ham, T. E.; Favreau, D. P.; Virkus, R. L. (December 1987). "An 0.8 μm 256K BiCMOS SRAM technology". 1987 International Electron Devices Meeting. pp. 841–843. doi:10.1109/IEDM.1987.191564. S2CID 40375699.
Shahidi, Ghavam G.; Davari, Bijan; Dennard, Robert H.; Anderson, C. A.; Chappell, B. A.; et al. (December 1994). "A room temperature 0.1 μm CMOS on SOI". IEEE Transactions on Electron Devices. 41 (12): 2405–2412. Bibcode:1994ITED...41.2405S. doi:10.1109/16.337456. S2CID 108832941.
Robinson, Arthur L. (11 May 1984). "Experimental Memory Chips Reach 1 Megabit: As they become larger, memories become an increasingly important part of the integrated circuit business, technologically and economically". Science. 224 (4649): 590–592. doi:10.1126/science.224.4649.590. ISSN 0036-8075. PMID 17838349.
Hanafi, Hussein I.; Lu, Nicky C. C.; Chao, H. H.; Hwang, Wei; Henkels, W. H.; Rajeevakumar, T. V.; Terman, L. M.; Franch, Robert L. (October 1988). "A 20-ns 128-kbit*4 high speed DRAM with 330-Mbit/s data rate". IEEE Journal of Solid-State Circuits. 23 (5): 1140–1149. Bibcode:1988IJSSC..23.1140L. doi:10.1109/4.5936.

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Sah, Chih-Tang (October 1988). "Evolution of the MOS transistor-from conception to VLSI" (PDF). Proceedings of the IEEE. 76 (10): 1280–1326 (1303). Bibcode:1988IEEEP..76.1280S. doi:10.1109/5.16328. ISSN 0018-9219.
Isobe, Mitsuo; Uchida, Yukimasa; Maeguchi, Kenji; Mochizuki, T.; Kimura, M.; Hatano, H.; Mizutani, Y.; Tango, H. (October 1981). "An 18 ns CMOS/SOS 4K static RAM". IEEE Journal of Solid-State Circuits. 16 (5): 460–465. Bibcode:1981IJSSC..16..460I. doi:10.1109/JSSC.1981.1051623. S2CID 12992820.
Shahidi, Ghavam G.; Davari, Bijan; Dennard, Robert H.; Anderson, C. A.; Chappell, B. A.; et al. (December 1994). "A room temperature 0.1 μm CMOS on SOI". IEEE Transactions on Electron Devices. 41 (12): 2405–2412. Bibcode:1994ITED...41.2405S. doi:10.1109/16.337456. S2CID 108832941.
Hanafi, Hussein I.; Lu, Nicky C. C.; Chao, H. H.; Hwang, Wei; Henkels, W. H.; Rajeevakumar, T. V.; Terman, L. M.; Franch, Robert L. (October 1988). "A 20-ns 128-kbit*4 high speed DRAM with 330-Mbit/s data rate". IEEE Journal of Solid-State Circuits. 23 (5): 1140–1149. Bibcode:1988IJSSC..23.1140L. doi:10.1109/4.5936.

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Williams, F. C.; Kilburn, T. (September 1948), "Electronic Digital Computers", Nature, 162 (4117): 487, Bibcode:1948Natur.162..487W, doi:10.1038/162487a0, S2CID 4110351. Reprinted in The Origins of Digital Computers.
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Yoshimoto, M.; Anami, K.; Shinohara, H.; Yoshihara, T.; Takagi, H.; Nagao, S.; Kayano, S.; Nakano, T. (1983). "A 64Kb full CMOS RAM with divided word line structure". 1983 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. Vol. XXVI. pp. 58–59. doi:10.1109/ISSCC.1983.1156503. S2CID 34837669.
Havemann, Robert H.; Eklund, R. E.; Tran, Hiep V.; Haken, R. A.; Scott, D. B.; Fung, P. K.; Ham, T. E.; Favreau, D. P.; Virkus, R. L. (December 1987). "An 0.8 μm 256K BiCMOS SRAM technology". 1987 International Electron Devices Meeting. pp. 841–843. doi:10.1109/IEDM.1987.191564. S2CID 40375699.
Shahidi, Ghavam G.; Davari, Bijan; Dennard, Robert H.; Anderson, C. A.; Chappell, B. A.; et al. (December 1994). "A room temperature 0.1 μm CMOS on SOI". IEEE Transactions on Electron Devices. 41 (12): 2405–2412. Bibcode:1994ITED...41.2405S. doi:10.1109/16.337456. S2CID 108832941.

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