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Recurrence tracking microscope (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Recurrence tracking microscope" in English language version.

refsWebsite
Global rank English rank
10doi.org
2nd place
2nd place
10worldcat.org
5th place
5th place
2arxiv.org
69th place
59th place

arxiv.org

  • Saif, Farhan (22 March 2006). "Recurrence tracking microscope". Physical Review A. 73 (3). American Physical Society (APS): 033618. arXiv:quant-ph/0604019. doi:10.1103/physreva.73.033618. ISSN 1050-2947.
  • Saif, Farhan (2005). "Classical and quantum chaos in atom optics". Physics Reports. 419 (6). Elsevier BV: 207–258. arXiv:quant-ph/0604066. doi:10.1016/j.physrep.2005.07.002. ISSN 0370-1573.

doi.org

  • Saif, Farhan (22 March 2006). "Recurrence tracking microscope". Physical Review A. 73 (3). American Physical Society (APS): 033618. arXiv:quant-ph/0604019. doi:10.1103/physreva.73.033618. ISSN 1050-2947.
  • Saif, Farhan (2005). "Classical and quantum chaos in atom optics". Physics Reports. 419 (6). Elsevier BV: 207–258. arXiv:quant-ph/0604066. doi:10.1016/j.physrep.2005.07.002. ISSN 0370-1573.
  • Binnig, G.; Rohrer, H.; Gerber, Ch.; Weibel, E. (10 January 1983). "7 × 7 Reconstruction on Si(111) Resolved in Real Space". Physical Review Letters. 50 (2). American Physical Society (APS): 120–123. doi:10.1103/physrevlett.50.120. ISSN 0031-9007.
  • Binnig, G.; Rohrer, H.; Gerber, Ch.; Weibel, E. (5 July 1982). "Surface Studies by Scanning Tunneling Microscopy". Physical Review Letters. 49 (1). American Physical Society (APS): 57–61. doi:10.1103/physrevlett.49.57. ISSN 0031-9007.
  • Binnig, G.; Rohrer, H.; Gerber, Ch.; Weibel, E. (15 January 1982). "Tunneling through a controllable vacuum gap". Applied Physics Letters. 40 (2). AIP Publishing: 178–180. doi:10.1063/1.92999. ISSN 0003-6951.
  • Tersoff, J.; Hamann, D. R. (15 January 1985). "Theory of the scanning tunneling microscope". Physical Review B. 31 (2). American Physical Society (APS): 805–813. doi:10.1103/physrevb.31.805. ISSN 0163-1829.
  • Bardeen, J. (15 January 1961). "Tunnelling from a Many-Particle Point of View". Physical Review Letters. 6 (2). American Physical Society (APS): 57–59. doi:10.1103/physrevlett.6.57. ISSN 0031-9007.
  • Chen, C. Julian (1990). "Origin of atomic resolution on metal surfaces in scanning tunneling microscopy". Physical Review Letters. 65 (4). American Physical Society (APS): 448–451. doi:10.1103/physrevlett.65.448. ISSN 0031-9007.
  • Lapshin, Rostislav V (2 July 2004). "Feature-oriented scanning methodology for probe microscopy and nanotechnology". Nanotechnology. 15 (9). IOP Publishing: 1135–1151. doi:10.1088/0957-4484/15/9/006. ISSN 0957-4484.
  • Humphris, A. D. L.; Miles, M. J.; Hobbs, J. K. (17 January 2005). "A mechanical microscope: High-speed atomic force microscopy". Applied Physics Letters. 86 (3). AIP Publishing: 034106. doi:10.1063/1.1855407. ISSN 0003-6951.

worldcat.org

search.worldcat.org

  • Saif, Farhan (22 March 2006). "Recurrence tracking microscope". Physical Review A. 73 (3). American Physical Society (APS): 033618. arXiv:quant-ph/0604019. doi:10.1103/physreva.73.033618. ISSN 1050-2947.
  • Saif, Farhan (2005). "Classical and quantum chaos in atom optics". Physics Reports. 419 (6). Elsevier BV: 207–258. arXiv:quant-ph/0604066. doi:10.1016/j.physrep.2005.07.002. ISSN 0370-1573.
  • Binnig, G.; Rohrer, H.; Gerber, Ch.; Weibel, E. (10 January 1983). "7 × 7 Reconstruction on Si(111) Resolved in Real Space". Physical Review Letters. 50 (2). American Physical Society (APS): 120–123. doi:10.1103/physrevlett.50.120. ISSN 0031-9007.
  • Binnig, G.; Rohrer, H.; Gerber, Ch.; Weibel, E. (5 July 1982). "Surface Studies by Scanning Tunneling Microscopy". Physical Review Letters. 49 (1). American Physical Society (APS): 57–61. doi:10.1103/physrevlett.49.57. ISSN 0031-9007.
  • Binnig, G.; Rohrer, H.; Gerber, Ch.; Weibel, E. (15 January 1982). "Tunneling through a controllable vacuum gap". Applied Physics Letters. 40 (2). AIP Publishing: 178–180. doi:10.1063/1.92999. ISSN 0003-6951.
  • Tersoff, J.; Hamann, D. R. (15 January 1985). "Theory of the scanning tunneling microscope". Physical Review B. 31 (2). American Physical Society (APS): 805–813. doi:10.1103/physrevb.31.805. ISSN 0163-1829.
  • Bardeen, J. (15 January 1961). "Tunnelling from a Many-Particle Point of View". Physical Review Letters. 6 (2). American Physical Society (APS): 57–59. doi:10.1103/physrevlett.6.57. ISSN 0031-9007.
  • Chen, C. Julian (1990). "Origin of atomic resolution on metal surfaces in scanning tunneling microscopy". Physical Review Letters. 65 (4). American Physical Society (APS): 448–451. doi:10.1103/physrevlett.65.448. ISSN 0031-9007.
  • Lapshin, Rostislav V (2 July 2004). "Feature-oriented scanning methodology for probe microscopy and nanotechnology". Nanotechnology. 15 (9). IOP Publishing: 1135–1151. doi:10.1088/0957-4484/15/9/006. ISSN 0957-4484.
  • Humphris, A. D. L.; Miles, M. J.; Hobbs, J. K. (17 January 2005). "A mechanical microscope: High-speed atomic force microscopy". Applied Physics Letters. 86 (3). AIP Publishing: 034106. doi:10.1063/1.1855407. ISSN 0003-6951.