Rietveld refinement (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Rietveld refinement" in English language version.

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10doi.org

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9worldcat.org

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4harvard.edu

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2iucr.org

low place

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2nih.gov

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1springer.com

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1semanticscholar.org

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1degruyterbrill.com

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1nature.com

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1uoguelph.ca

low place

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degruyterbrill.com

Gozzo, Fabia; Cervellino, A.; Leoni, Matteo; Scardi, Paolo; Bergamaschi, A.; Schmitt, B. (December 2010). "Instrumental profile of MYTHEN detector in Debye-Scherrer geometry". Zeitschrift für Kristallographie. 225 (12): 616–624. doi:10.1524/zkri.2010.1345. ISSN 0044-2968.

doi.org

Hewat, A.; David, W. I. F.; Eijck, L. van (1 August 2016). "Hugo Rietveld (1932–2016)". Journal of Applied Crystallography. 49 (4): 1394–1395. doi:10.1107/S1600576716012061. ISSN 1600-5767.
Rietveld, H. M. (2 June 1969). "A profile refinement method for nuclear and magnetic structures". Journal of Applied Crystallography. 2 (2): 65–71. Bibcode:1969JApCr...2...65R. doi:10.1107/S0021889869006558. ISSN 0021-8898.
Longo, Elson; La Porta, Felipe de Almeida, eds. (2017). Recent Advances in Complex Functional Materials. doi:10.1007/978-3-319-53898-3. ISBN 978-3-319-53897-6. S2CID 136368632.
Caglioti, G.; Paoletti, A.; Ricci, F. P. (1 July 1958). "Choice of collimators for a crystal spectrometer for neutron diffraction". Nuclear Instruments. 3 (4): 223–228. Bibcode:1958NucIn...3..223C. doi:10.1016/0369-643X(58)90029-X. ISSN 0369-643X.
Finger, L. W.; Cox, D. E.; Jephcoat, A. P. (20 April 1994). "A correction for powder diffraction peak asymmetry due to axial divergence". Journal of Applied Crystallography. 27 (6): 892–900. Bibcode:1994JApCr..27..892F. doi:10.1107/S0021889894004218. ISSN 0021-8898.
Gozzo, Fabia; Cervellino, A.; Leoni, Matteo; Scardi, Paolo; Bergamaschi, A.; Schmitt, B. (December 2010). "Instrumental profile of MYTHEN detector in Debye-Scherrer geometry". Zeitschrift für Kristallographie. 225 (12): 616–624. doi:10.1524/zkri.2010.1345. ISSN 0044-2968.
McCusker, L. B.; Von Dreele, R. B.; Cox, D. E.; Louër, D.; Scardi, P. (1 February 1999). "Rietveld refinement guidelines". Journal of Applied Crystallography. 32 (1): 36–50. doi:10.1107/S0021889898009856. ISSN 0021-8898.
Hulbert, B. S.; Kriven, W. M. (1 February 2023). "Specimen-displacement correction for powder X-ray diffraction in Debye–Scherrer geometry with a flat area detector". Journal of Applied Crystallography. 56 (1): 160–166. doi:10.1107/S1600576722011360. ISSN 1600-5767. PMC 9901925. PMID 36777137.
Amano, Tatsuya; Babich, Danylo; Mandal, Ritwika; Guzman-Brambila, Julio; Volte, Alix; Trzop, Elzbieta; Servol, Marina; Pastor, Ernest; Alashoor, Maryam; Larsson, Jörgen; Jurgilaitis, Andrius; Pham, Van-Thai; Kroon, David; Ekström, John Carl; Ahn, Byungnam (November 2024). "Propagation of insulator-to-metal transition driven by photoinduced strain waves in a Mott material". Nature Physics. 20 (11): 1778–1785. doi:10.1038/s41567-024-02628-4. ISSN 1745-2481.
Toby, Brian H. (March 2006). "R factors in Rietveld analysis: How good is good enough?". Powder Diffraction. 21 (1): 67. Bibcode:2006PDiff..21...67T. doi:10.1154/1.2179804.

harvard.edu

ui.adsabs.harvard.edu

Rietveld, H. M. (2 June 1969). "A profile refinement method for nuclear and magnetic structures". Journal of Applied Crystallography. 2 (2): 65–71. Bibcode:1969JApCr...2...65R. doi:10.1107/S0021889869006558. ISSN 0021-8898.
Caglioti, G.; Paoletti, A.; Ricci, F. P. (1 July 1958). "Choice of collimators for a crystal spectrometer for neutron diffraction". Nuclear Instruments. 3 (4): 223–228. Bibcode:1958NucIn...3..223C. doi:10.1016/0369-643X(58)90029-X. ISSN 0369-643X.
Finger, L. W.; Cox, D. E.; Jephcoat, A. P. (20 April 1994). "A correction for powder diffraction peak asymmetry due to axial divergence". Journal of Applied Crystallography. 27 (6): 892–900. Bibcode:1994JApCr..27..892F. doi:10.1107/S0021889894004218. ISSN 0021-8898.
Toby, Brian H. (March 2006). "R factors in Rietveld analysis: How good is good enough?". Powder Diffraction. 21 (1): 67. Bibcode:2006PDiff..21...67T. doi:10.1154/1.2179804.

iucr.org

journals.iucr.org

McCusker, L. B.; Von Dreele, R. B.; Cox, D. E.; Louër, D.; Scardi, P. (1 February 1999). "Rietveld refinement guidelines". Journal of Applied Crystallography. 32 (1): 36–50. doi:10.1107/S0021889898009856. ISSN 0021-8898.
Hulbert, B. S.; Kriven, W. M. (1 February 2023). "Specimen-displacement correction for powder X-ray diffraction in Debye–Scherrer geometry with a flat area detector". Journal of Applied Crystallography. 56 (1): 160–166. doi:10.1107/S1600576722011360. ISSN 1600-5767. PMC 9901925. PMID 36777137.

nature.com

Amano, Tatsuya; Babich, Danylo; Mandal, Ritwika; Guzman-Brambila, Julio; Volte, Alix; Trzop, Elzbieta; Servol, Marina; Pastor, Ernest; Alashoor, Maryam; Larsson, Jörgen; Jurgilaitis, Andrius; Pham, Van-Thai; Kroon, David; Ekström, John Carl; Ahn, Byungnam (November 2024). "Propagation of insulator-to-metal transition driven by photoinduced strain waves in a Mott material". Nature Physics. 20 (11): 1778–1785. doi:10.1038/s41567-024-02628-4. ISSN 1745-2481.

nih.gov

ncbi.nlm.nih.gov

Hulbert, B. S.; Kriven, W. M. (1 February 2023). "Specimen-displacement correction for powder X-ray diffraction in Debye–Scherrer geometry with a flat area detector". Journal of Applied Crystallography. 56 (1): 160–166. doi:10.1107/S1600576722011360. ISSN 1600-5767. PMC 9901925. PMID 36777137.

pubmed.ncbi.nlm.nih.gov

Hulbert, B. S.; Kriven, W. M. (1 February 2023). "Specimen-displacement correction for powder X-ray diffraction in Debye–Scherrer geometry with a flat area detector". Journal of Applied Crystallography. 56 (1): 160–166. doi:10.1107/S1600576722011360. ISSN 1600-5767. PMC 9901925. PMID 36777137.

semanticscholar.org

api.semanticscholar.org

Longo, Elson; La Porta, Felipe de Almeida, eds. (2017). Recent Advances in Complex Functional Materials. doi:10.1007/978-3-319-53898-3. ISBN 978-3-319-53897-6. S2CID 136368632.

springer.com

link.springer.com

Longo, Elson; La Porta, Felipe de Almeida, eds. (2017). Recent Advances in Complex Functional Materials. doi:10.1007/978-3-319-53898-3. ISBN 978-3-319-53897-6. S2CID 136368632.

uoguelph.ca

atrium.lib.uoguelph.ca

Burns, Nicholas (May 2022). Two-Dimensional X-ray Diffraction Correction Factors and Analysis: A Starting Point for Quantitative Investigation of High-Density Crosslinked Polyethylene (Thesis). University of Guelph.

worldcat.org

search.worldcat.org

Hewat, A.; David, W. I. F.; Eijck, L. van (1 August 2016). "Hugo Rietveld (1932–2016)". Journal of Applied Crystallography. 49 (4): 1394–1395. doi:10.1107/S1600576716012061. ISSN 1600-5767.
Rietveld, H. M. (2 June 1969). "A profile refinement method for nuclear and magnetic structures". Journal of Applied Crystallography. 2 (2): 65–71. Bibcode:1969JApCr...2...65R. doi:10.1107/S0021889869006558. ISSN 0021-8898.
Pecharsky, Vitalij K.. (24 November 2008). Fundamentals of Powder Diffraction and Structural Characterization of Materials. Springer. ISBN 9780387095790. OCLC 690510145.
Caglioti, G.; Paoletti, A.; Ricci, F. P. (1 July 1958). "Choice of collimators for a crystal spectrometer for neutron diffraction". Nuclear Instruments. 3 (4): 223–228. Bibcode:1958NucIn...3..223C. doi:10.1016/0369-643X(58)90029-X. ISSN 0369-643X.
Finger, L. W.; Cox, D. E.; Jephcoat, A. P. (20 April 1994). "A correction for powder diffraction peak asymmetry due to axial divergence". Journal of Applied Crystallography. 27 (6): 892–900. Bibcode:1994JApCr..27..892F. doi:10.1107/S0021889894004218. ISSN 0021-8898.
Gozzo, Fabia; Cervellino, A.; Leoni, Matteo; Scardi, Paolo; Bergamaschi, A.; Schmitt, B. (December 2010). "Instrumental profile of MYTHEN detector in Debye-Scherrer geometry". Zeitschrift für Kristallographie. 225 (12): 616–624. doi:10.1524/zkri.2010.1345. ISSN 0044-2968.
McCusker, L. B.; Von Dreele, R. B.; Cox, D. E.; Louër, D.; Scardi, P. (1 February 1999). "Rietveld refinement guidelines". Journal of Applied Crystallography. 32 (1): 36–50. doi:10.1107/S0021889898009856. ISSN 0021-8898.
Hulbert, B. S.; Kriven, W. M. (1 February 2023). "Specimen-displacement correction for powder X-ray diffraction in Debye–Scherrer geometry with a flat area detector". Journal of Applied Crystallography. 56 (1): 160–166. doi:10.1107/S1600576722011360. ISSN 1600-5767. PMC 9901925. PMID 36777137.
Amano, Tatsuya; Babich, Danylo; Mandal, Ritwika; Guzman-Brambila, Julio; Volte, Alix; Trzop, Elzbieta; Servol, Marina; Pastor, Ernest; Alashoor, Maryam; Larsson, Jörgen; Jurgilaitis, Andrius; Pham, Van-Thai; Kroon, David; Ekström, John Carl; Ahn, Byungnam (November 2024). "Propagation of insulator-to-metal transition driven by photoinduced strain waves in a Mott material". Nature Physics. 20 (11): 1778–1785. doi:10.1038/s41567-024-02628-4. ISSN 1745-2481.