Scanning electron microscope (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Scanning electron microscope" in English language version.

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adsabs.harvard.edu (Global: 14th place; English: 9th place)

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  • GB 511204, von Ardenne, Manfred, "Improvements in electron microscopes", published 15 August 1939
  • US patent 4823006, Danilatos, Gerasimos D. and Lewis, George C., "Integrated electron optical/differential pumping/imaging signal detection system for an environmental scanning electron microscope", issued 18 April 1989
  • US patent 4785182, Mancuso, James F.; Maxwell, William B. and Danilatos, Gerasimos D., "Secondary Electron Detector for Use in a Gaseous Atmosphere", issued 15 November 1988

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  • "SEM Basics". MyScope training, Microscopy Australia. 1 December 2025. Retrieved 1 December 2025.
  • "SEM, The Specimen Chamber". MyScope training, Microscopy Australia. 1 December 2025. Retrieved 1 December 2025.

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