Scanning probe microscopy (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Scanning probe microscopy" in English language version.

refsWebsite

Global rank English rank

39doi.org

2^nd place

31harvard.edu

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13nih.gov

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9semanticscholar.org

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7worldcat.org

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3arxiv.org

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3aip.org

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2nnin.org

low place

2web.archive.org

1^st place

1nature.com

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1osti.gov

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1uni-ulm.de

low place

1archive.org

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aip.org

link.aip.org

Fritz M, Radmacher M, Petersen N, Gaub HE (May 1994). "Visualization and identification of intracellular structures by force modulation microscopy and drug induced degradation". The 1993 international conference on scanning tunneling microscopy. The 1993 international conference on scanning tunneling microscopy. Vol. 12. Beijing, China: AVS. pp. 1526–1529. Bibcode:1994JVSTB..12.1526F. doi:10.1116/1.587278. Archived from the original on March 5, 2016. Retrieved October 5, 2009.
Higgins SR, Hamers RJ (March 1996). "Morphology and dissolution processes of metal sulfide minerals observed with the electrochemical scanning tunneling microscope". Journal of Vacuum Science and Technology B. 14 (2). AVS: 1360–1364. Bibcode:1996JVSTB..14.1360H. doi:10.1116/1.589098. Archived from the original on March 5, 2016. Retrieved October 5, 2009.

pubs.aip.org

Song J, Zhou Y, Huey BD (February 2021). "3D structure–property correlations of electronic and energy materials by tomographic atomic force microscopy". Applied Physics Letters. 118 (8). Bibcode:2021ApPhL.118h0501S. doi:10.1063/5.0040984. S2CID 233931111. Retrieved March 11, 2024.

archive.org

Volker R, Freeland JF, Streiffer SK (2011). "New Capabilities at the Interface of X-Rays and Scanning Tunneling Microscopy". In Kalinin, Sergei V., Gruverman, Alexei (eds.). Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy (1st ed.). New York: Springer. pp. 405–431. doi:10.1007/978-1-4419-7167-8_14. ISBN 978-1-4419-6567-7.

arxiv.org

Wagner C, Green MF, Leinen P, Deilmann T, Krüger P, Rohlfing M, et al. (July 2015). "Scanning Quantum Dot Microscopy". Physical Review Letters. 115 (2): 026101. arXiv:1503.07738. Bibcode:2015PhRvL.115b6101W. doi:10.1103/PhysRevLett.115.026101. PMID 26207484. S2CID 1720328.
Nasr Esfahani E, Eshghinejad A, Ou Y, Zhao J, Adler S, Li J (November 2017). "Scanning Thermo-Ionic Microscopy: Probing Nanoscale Electrochemistry via Thermal Stress-Induced Oscillation". Microscopy Today. 25 (6): 12–19. arXiv:1703.06184. doi:10.1017/s1551929517001043. ISSN 1551-9295. S2CID 119463679.
Esfahani EN, Liu X, Li J (2017). "Imaging ferroelectric domains via charge gradient microscopy enhanced by principal component analysis". Journal of Materiomics. 3 (4): 280–285. arXiv:1706.02345. doi:10.1016/j.jmat.2017.07.001. S2CID 118953680.

doi.org

Salapaka SM, Salapaka MV (2008). "Scanning Probe Microscopy". IEEE Control Systems Magazine. 28 (2): 65–83. doi:10.1109/MCS.2007.914688. ISSN 0272-1708. S2CID 20484280.
Binnig G, Quate CF, Gerber C (March 1986). "Atomic force microscope". Physical Review Letters. 56 (9): 930–933. Bibcode:1986PhRvL..56..930B. doi:10.1103/PhysRevLett.56.930. PMID 10033323.
Zhang L, Sakai T, Sakuma N, Ono T, Nakayama K (1999). "Nanostructural conductivity and surface-potential study of low-field-emission carbon films with conductive scanning probe microscopy". Applied Physics Letters. 75 (22): 3527–3529. Bibcode:1999ApPhL..75.3527Z. doi:10.1063/1.125377.
Weaver JM, Abraham DW (1991). "High resolution atomic force microscopy potentiometry". Journal of Vacuum Science and Technology B. 9 (3): 1559–1561. Bibcode:1991JVSTB...9.1559W. doi:10.1116/1.585423.
Nonnenmacher M, O'Boyle MP, Wickramasinghe HK (1991). "Kelvin probe force microscopy". Applied Physics Letters. 58 (25): 2921–2923. Bibcode:1991ApPhL..58.2921N. doi:10.1063/1.105227.
Hartmann U (1988). "Magnetic force microscopy: Some remarks from the micromagnetic point of view". Journal of Applied Physics. 64 (3): 1561–1564. Bibcode:1988JAP....64.1561H. doi:10.1063/1.341836.
Roelofs A, Böttger U, Waser R, Schlaphof F, Trogisch S, Eng LM (2000). "Differentiating 180° and 90° switching of ferroelectric domains with three-dimensional piezoresponse force microscopy". Applied Physics Letters. 77 (21): 3444–3446. Bibcode:2000ApPhL..77.3444R. doi:10.1063/1.1328049.
Matey JR, Blanc J (1985). "Scanning capacitance microscopy". Journal of Applied Physics. 57 (5): 1437–1444. Bibcode:1985JAP....57.1437M. doi:10.1063/1.334506.
Eriksson MA, Beck RG, Topinka M, Katine JA, Westervelt RM, Campman KL, et al. (July 29, 1996). "Cryogenic scanning probe characterization of semiconductor nanostructures". Applied Physics Letters. 69 (5): 671–673. Bibcode:1996ApPhL..69..671E. doi:10.1063/1.117801.
Wagner C, Green MF, Leinen P, Deilmann T, Krüger P, Rohlfing M, et al. (July 2015). "Scanning Quantum Dot Microscopy". Physical Review Letters. 115 (2): 026101. arXiv:1503.07738. Bibcode:2015PhRvL.115b6101W. doi:10.1103/PhysRevLett.115.026101. PMID 26207484. S2CID 1720328.
Trenkler T, De Wolf P, Vandervorst W, Hellemans L (1998). "Nanopotentiometry: Local potential measurements in complementary metal--oxide--semiconductor transistors using atomic force microscopy". Journal of Vacuum Science and Technology B. 16 (1): 367–372. Bibcode:1998JVSTB..16..367T. doi:10.1116/1.589812.
Fritz M, Radmacher M, Petersen N, Gaub HE (May 1994). "Visualization and identification of intracellular structures by force modulation microscopy and drug induced degradation". The 1993 international conference on scanning tunneling microscopy. The 1993 international conference on scanning tunneling microscopy. Vol. 12. Beijing, China: AVS. pp. 1526–1529. Bibcode:1994JVSTB..12.1526F. doi:10.1116/1.587278. Archived from the original on March 5, 2016. Retrieved October 5, 2009.
Luria J, Kutes Y, Moore A, Zhang L, Stach EA, Huey BD (September 26, 2016). "Charge transport in CdTe solar cells revealed by conductive tomographic atomic force microscopy". Nature Energy. 1 (11): 16150. Bibcode:2016NatEn...116150L. doi:10.1038/nenergy.2016.150. ISSN 2058-7546. OSTI 1361263. S2CID 138664678.
Steffes JJ, Ristau RA, Ramesh R, Huey BD (February 2019). "Thickness scaling of ferroelectricity in BiFeO₃ by tomographic atomic force microscopy". Proceedings of the National Academy of Sciences of the United States of America. 116 (7): 2413–2418. Bibcode:2019PNAS..116.2413S. doi:10.1073/pnas.1806074116. PMC 6377454. PMID 30683718.
Song J, Zhou Y, Huey BD (February 2021). "3D structure–property correlations of electronic and energy materials by tomographic atomic force microscopy". Applied Physics Letters. 118 (8). Bibcode:2021ApPhL.118h0501S. doi:10.1063/5.0040984. S2CID 233931111. Retrieved March 11, 2024.
Binnig G, Rohrer H, Gerber C, Weibel E (1982). "Tunneling through a controllable vacuum gap". Applied Physics Letters. 40 (2): 178–180. Bibcode:1982ApPhL..40..178B. doi:10.1063/1.92999.
Kaiser WJ, Bell LD (April 1988). "Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy". Physical Review Letters. 60 (14): 1406–1409. Bibcode:1988PhRvL..60.1406K. doi:10.1103/PhysRevLett.60.1406. PMID 10038030.
Higgins SR, Hamers RJ (March 1996). "Morphology and dissolution processes of metal sulfide minerals observed with the electrochemical scanning tunneling microscope". Journal of Vacuum Science and Technology B. 14 (2). AVS: 1360–1364. Bibcode:1996JVSTB..14.1360H. doi:10.1116/1.589098. Archived from the original on March 5, 2016. Retrieved October 5, 2009.
Chang AM, Hallen HD, Harriott L, Hess HF, Kao HL, Kwo J, et al. (1992). "Scanning Hall probe microscopy". Applied Physics Letters. 61 (16): 1974–1976. Bibcode:1992ApPhL..61.1974C. doi:10.1063/1.108334. S2CID 121741603.
Wiesendanger R, Bode M (July 25, 2001). "Nano- and atomic-scale magnetism studied by spin-polarized scanning tunneling microscopy and spectroscopy". Solid State Communications. 119 (4–5): 341–355. Bibcode:2001SSCom.119..341W. doi:10.1016/S0038-1098(01)00103-X. ISSN 0038-1098.
Reddick RC, Warmack RJ, Ferrell TL (January 1989). "New form of scanning optical microscopy". Physical Review B. 39 (1): 767–770. Bibcode:1989PhRvB..39..767R. doi:10.1103/PhysRevB.39.767. PMID 9947227.
Volker R, Freeland JF, Streiffer SK (2011). "New Capabilities at the Interface of X-Rays and Scanning Tunneling Microscopy". In Kalinin, Sergei V., Gruverman, Alexei (eds.). Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy (1st ed.). New York: Springer. pp. 405–431. doi:10.1007/978-1-4419-7167-8_14. ISBN 978-1-4419-6567-7.
Hansma PK, Drake B, Marti O, Gould SA, Prater CB (February 1989). "The scanning ion-conductance microscope". Science. 243 (4891): 641–643. Bibcode:1989Sci...243..641H. doi:10.1126/science.2464851. PMID 2464851.
Meister A, Gabi M, Behr P, Studer P, Vörös J, Niedermann P, et al. (June 2009). "FluidFM: combining atomic force microscopy and nanofluidics in a universal liquid delivery system for single cell applications and beyond". Nano Letters. 9 (6): 2501–2507. Bibcode:2009NanoL...9.2501M. doi:10.1021/nl901384x. PMID 19453133.
Sidles JA, Garbini JL, Bruland KJ, Rugar D, Züger O, Hoen S, et al. (1995). "Magnetic resonance force microscopy". Reviews of Modern Physics. 67 (1): 249–265. Bibcode:1995RvMP...67..249S. doi:10.1103/RevModPhys.67.249.
Betzig E, Trautman JK, Harris TD, Weiner JS, Kostelak RL (March 1991). "Breaking the diffraction barrier: optical microscopy on a nanometric scale". Science. 251 (5000): 1468–1470. Bibcode:1991Sci...251.1468B. doi:10.1126/science.251.5000.1468. PMID 17779440. S2CID 6906302.
Huth F, Govyadinov A, Amarie S, Nuansing W, Keilmann F, Hillenbrand R (August 2012). "Nano-FTIR absorption spectroscopy of molecular fingerprints at 20 nm spatial resolution". Nano Letters. 12 (8): 3973–3978. Bibcode:2012NanoL..12.3973H. doi:10.1021/nl301159v. PMID 22703339.
De Wolf P, Snauwaert J, Clarysse T, Vandervorst W, Hellemans L (1995). "Characterization of a point-contact on silicon using force microscopy-supported resistance measurements". Applied Physics Letters. 66 (12): 1530–1532. Bibcode:1995ApPhL..66.1530D. doi:10.1063/1.113636.
Xu JB, Lauger L, Dransfeld K, Wilson IH (1994). "Thermal sensors for investigation of heat transfer in scanning probe microscopy". Review of Scientific Instruments. 65 (7): 2262–2266. Bibcode:1994RScI...65.2262X. doi:10.1063/1.1145225.
Yoo MJ, Fulton TA, Hess HF, Willett RL, Dunkleberger LN, Chichester RJ, et al. (April 1997). "Scanning Single-Electron Transistor Microscopy: Imaging Individual Charges". Science. 276 (5312): 579–582. doi:10.1126/science.276.5312.579. PMID 9110974.
Nasr Esfahani E, Eshghinejad A, Ou Y, Zhao J, Adler S, Li J (November 2017). "Scanning Thermo-Ionic Microscopy: Probing Nanoscale Electrochemistry via Thermal Stress-Induced Oscillation". Microscopy Today. 25 (6): 12–19. arXiv:1703.06184. doi:10.1017/s1551929517001043. ISSN 1551-9295. S2CID 119463679.
Eshghinejad A, Nasr Esfahani E, Wang P, Xie S, Geary TC, Adler SB, et al. (May 28, 2016). "Scanning thermo-ionic microscopy for probing local electrochemistry at the nanoscale". Journal of Applied Physics. 119 (20): 205110. Bibcode:2016JAP...119t5110E. doi:10.1063/1.4949473. ISSN 0021-8979. S2CID 7415218.
Hong S, Tong S, Park WI, Hiranaga Y, Cho Y, Roelofs A (May 2014). "Charge gradient microscopy". Proceedings of the National Academy of Sciences of the United States of America. 111 (18): 6566–6569. Bibcode:2014PNAS..111.6566H. doi:10.1073/pnas.1324178111. PMC 4020115. PMID 24760831.
Esfahani EN, Liu X, Li J (2017). "Imaging ferroelectric domains via charge gradient microscopy enhanced by principal component analysis". Journal of Materiomics. 3 (4): 280–285. arXiv:1706.02345. doi:10.1016/j.jmat.2017.07.001. S2CID 118953680.
Park H, Jung J, Min DK, Kim S, Hong S, Shin H (March 2, 2004). "Scanning resistive probe microscopy: Imaging ferroelectric domains". Applied Physics Letters. 84 (10): 1734–1736. Bibcode:2004ApPhL..84.1734P. doi:10.1063/1.1667266. ISSN 0003-6951.
Bottomley LA (May 19, 1998). "Scanning Probe Microscopy". Analytical Chemistry. 70 (12): 425–476. doi:10.1021/a1980011o.
Akamine S, Barrett RC, Quate CF (1990). "Improved atomic force microscope images using microcantilevers with sharp tips". Applied Physics Letters. 57 (3): 316–318. Bibcode:1990ApPhL..57..316A. doi:10.1063/1.103677.
GRAHAM R, YU D (September 23, 2013). "SCANNING PHOTOCURRENT MICROSCOPY IN SEMICONDUCTOR NANOSTRUCTURES". Modern Physics Letters B. 27 (25): 1330018. doi:10.1142/s0217984913300184. ISSN 0217-9849.

dx.doi.org

GRAHAM R, YU D (September 23, 2013). "SCANNING PHOTOCURRENT MICROSCOPY IN SEMICONDUCTOR NANOSTRUCTURES". Modern Physics Letters B. 27 (25): 1330018. doi:10.1142/s0217984913300184. ISSN 0217-9849.

harvard.edu

ui.adsabs.harvard.edu

Binnig G, Quate CF, Gerber C (March 1986). "Atomic force microscope". Physical Review Letters. 56 (9): 930–933. Bibcode:1986PhRvL..56..930B. doi:10.1103/PhysRevLett.56.930. PMID 10033323.
Zhang L, Sakai T, Sakuma N, Ono T, Nakayama K (1999). "Nanostructural conductivity and surface-potential study of low-field-emission carbon films with conductive scanning probe microscopy". Applied Physics Letters. 75 (22): 3527–3529. Bibcode:1999ApPhL..75.3527Z. doi:10.1063/1.125377.
Weaver JM, Abraham DW (1991). "High resolution atomic force microscopy potentiometry". Journal of Vacuum Science and Technology B. 9 (3): 1559–1561. Bibcode:1991JVSTB...9.1559W. doi:10.1116/1.585423.
Nonnenmacher M, O'Boyle MP, Wickramasinghe HK (1991). "Kelvin probe force microscopy". Applied Physics Letters. 58 (25): 2921–2923. Bibcode:1991ApPhL..58.2921N. doi:10.1063/1.105227.
Hartmann U (1988). "Magnetic force microscopy: Some remarks from the micromagnetic point of view". Journal of Applied Physics. 64 (3): 1561–1564. Bibcode:1988JAP....64.1561H. doi:10.1063/1.341836.
Roelofs A, Böttger U, Waser R, Schlaphof F, Trogisch S, Eng LM (2000). "Differentiating 180° and 90° switching of ferroelectric domains with three-dimensional piezoresponse force microscopy". Applied Physics Letters. 77 (21): 3444–3446. Bibcode:2000ApPhL..77.3444R. doi:10.1063/1.1328049.
Matey JR, Blanc J (1985). "Scanning capacitance microscopy". Journal of Applied Physics. 57 (5): 1437–1444. Bibcode:1985JAP....57.1437M. doi:10.1063/1.334506.
Eriksson MA, Beck RG, Topinka M, Katine JA, Westervelt RM, Campman KL, et al. (July 29, 1996). "Cryogenic scanning probe characterization of semiconductor nanostructures". Applied Physics Letters. 69 (5): 671–673. Bibcode:1996ApPhL..69..671E. doi:10.1063/1.117801.
Wagner C, Green MF, Leinen P, Deilmann T, Krüger P, Rohlfing M, et al. (July 2015). "Scanning Quantum Dot Microscopy". Physical Review Letters. 115 (2): 026101. arXiv:1503.07738. Bibcode:2015PhRvL.115b6101W. doi:10.1103/PhysRevLett.115.026101. PMID 26207484. S2CID 1720328.
Trenkler T, De Wolf P, Vandervorst W, Hellemans L (1998). "Nanopotentiometry: Local potential measurements in complementary metal--oxide--semiconductor transistors using atomic force microscopy". Journal of Vacuum Science and Technology B. 16 (1): 367–372. Bibcode:1998JVSTB..16..367T. doi:10.1116/1.589812.
Fritz M, Radmacher M, Petersen N, Gaub HE (May 1994). "Visualization and identification of intracellular structures by force modulation microscopy and drug induced degradation". The 1993 international conference on scanning tunneling microscopy. The 1993 international conference on scanning tunneling microscopy. Vol. 12. Beijing, China: AVS. pp. 1526–1529. Bibcode:1994JVSTB..12.1526F. doi:10.1116/1.587278. Archived from the original on March 5, 2016. Retrieved October 5, 2009.
Luria J, Kutes Y, Moore A, Zhang L, Stach EA, Huey BD (September 26, 2016). "Charge transport in CdTe solar cells revealed by conductive tomographic atomic force microscopy". Nature Energy. 1 (11): 16150. Bibcode:2016NatEn...116150L. doi:10.1038/nenergy.2016.150. ISSN 2058-7546. OSTI 1361263. S2CID 138664678.
Steffes JJ, Ristau RA, Ramesh R, Huey BD (February 2019). "Thickness scaling of ferroelectricity in BiFeO₃ by tomographic atomic force microscopy". Proceedings of the National Academy of Sciences of the United States of America. 116 (7): 2413–2418. Bibcode:2019PNAS..116.2413S. doi:10.1073/pnas.1806074116. PMC 6377454. PMID 30683718.
Song J, Zhou Y, Huey BD (February 2021). "3D structure–property correlations of electronic and energy materials by tomographic atomic force microscopy". Applied Physics Letters. 118 (8). Bibcode:2021ApPhL.118h0501S. doi:10.1063/5.0040984. S2CID 233931111. Retrieved March 11, 2024.
Binnig G, Rohrer H, Gerber C, Weibel E (1982). "Tunneling through a controllable vacuum gap". Applied Physics Letters. 40 (2): 178–180. Bibcode:1982ApPhL..40..178B. doi:10.1063/1.92999.
Kaiser WJ, Bell LD (April 1988). "Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy". Physical Review Letters. 60 (14): 1406–1409. Bibcode:1988PhRvL..60.1406K. doi:10.1103/PhysRevLett.60.1406. PMID 10038030.
Higgins SR, Hamers RJ (March 1996). "Morphology and dissolution processes of metal sulfide minerals observed with the electrochemical scanning tunneling microscope". Journal of Vacuum Science and Technology B. 14 (2). AVS: 1360–1364. Bibcode:1996JVSTB..14.1360H. doi:10.1116/1.589098. Archived from the original on March 5, 2016. Retrieved October 5, 2009.
Chang AM, Hallen HD, Harriott L, Hess HF, Kao HL, Kwo J, et al. (1992). "Scanning Hall probe microscopy". Applied Physics Letters. 61 (16): 1974–1976. Bibcode:1992ApPhL..61.1974C. doi:10.1063/1.108334. S2CID 121741603.
Wiesendanger R, Bode M (July 25, 2001). "Nano- and atomic-scale magnetism studied by spin-polarized scanning tunneling microscopy and spectroscopy". Solid State Communications. 119 (4–5): 341–355. Bibcode:2001SSCom.119..341W. doi:10.1016/S0038-1098(01)00103-X. ISSN 0038-1098.
Reddick RC, Warmack RJ, Ferrell TL (January 1989). "New form of scanning optical microscopy". Physical Review B. 39 (1): 767–770. Bibcode:1989PhRvB..39..767R. doi:10.1103/PhysRevB.39.767. PMID 9947227.
Hansma PK, Drake B, Marti O, Gould SA, Prater CB (February 1989). "The scanning ion-conductance microscope". Science. 243 (4891): 641–643. Bibcode:1989Sci...243..641H. doi:10.1126/science.2464851. PMID 2464851.
Meister A, Gabi M, Behr P, Studer P, Vörös J, Niedermann P, et al. (June 2009). "FluidFM: combining atomic force microscopy and nanofluidics in a universal liquid delivery system for single cell applications and beyond". Nano Letters. 9 (6): 2501–2507. Bibcode:2009NanoL...9.2501M. doi:10.1021/nl901384x. PMID 19453133.
Sidles JA, Garbini JL, Bruland KJ, Rugar D, Züger O, Hoen S, et al. (1995). "Magnetic resonance force microscopy". Reviews of Modern Physics. 67 (1): 249–265. Bibcode:1995RvMP...67..249S. doi:10.1103/RevModPhys.67.249.
Betzig E, Trautman JK, Harris TD, Weiner JS, Kostelak RL (March 1991). "Breaking the diffraction barrier: optical microscopy on a nanometric scale". Science. 251 (5000): 1468–1470. Bibcode:1991Sci...251.1468B. doi:10.1126/science.251.5000.1468. PMID 17779440. S2CID 6906302.
Huth F, Govyadinov A, Amarie S, Nuansing W, Keilmann F, Hillenbrand R (August 2012). "Nano-FTIR absorption spectroscopy of molecular fingerprints at 20 nm spatial resolution". Nano Letters. 12 (8): 3973–3978. Bibcode:2012NanoL..12.3973H. doi:10.1021/nl301159v. PMID 22703339.
De Wolf P, Snauwaert J, Clarysse T, Vandervorst W, Hellemans L (1995). "Characterization of a point-contact on silicon using force microscopy-supported resistance measurements". Applied Physics Letters. 66 (12): 1530–1532. Bibcode:1995ApPhL..66.1530D. doi:10.1063/1.113636.
Xu JB, Lauger L, Dransfeld K, Wilson IH (1994). "Thermal sensors for investigation of heat transfer in scanning probe microscopy". Review of Scientific Instruments. 65 (7): 2262–2266. Bibcode:1994RScI...65.2262X. doi:10.1063/1.1145225.
Eshghinejad A, Nasr Esfahani E, Wang P, Xie S, Geary TC, Adler SB, et al. (May 28, 2016). "Scanning thermo-ionic microscopy for probing local electrochemistry at the nanoscale". Journal of Applied Physics. 119 (20): 205110. Bibcode:2016JAP...119t5110E. doi:10.1063/1.4949473. ISSN 0021-8979. S2CID 7415218.
Hong S, Tong S, Park WI, Hiranaga Y, Cho Y, Roelofs A (May 2014). "Charge gradient microscopy". Proceedings of the National Academy of Sciences of the United States of America. 111 (18): 6566–6569. Bibcode:2014PNAS..111.6566H. doi:10.1073/pnas.1324178111. PMC 4020115. PMID 24760831.
Park H, Jung J, Min DK, Kim S, Hong S, Shin H (March 2, 2004). "Scanning resistive probe microscopy: Imaging ferroelectric domains". Applied Physics Letters. 84 (10): 1734–1736. Bibcode:2004ApPhL..84.1734P. doi:10.1063/1.1667266. ISSN 0003-6951.
Akamine S, Barrett RC, Quate CF (1990). "Improved atomic force microscope images using microcantilevers with sharp tips". Applied Physics Letters. 57 (3): 316–318. Bibcode:1990ApPhL..57..316A. doi:10.1063/1.103677.

nature.com

Luria J, Kutes Y, Moore A, Zhang L, Stach EA, Huey BD (September 26, 2016). "Charge transport in CdTe solar cells revealed by conductive tomographic atomic force microscopy". Nature Energy. 1 (11): 16150. Bibcode:2016NatEn...116150L. doi:10.1038/nenergy.2016.150. ISSN 2058-7546. OSTI 1361263. S2CID 138664678.

nih.gov

pubmed.ncbi.nlm.nih.gov

Binnig G, Quate CF, Gerber C (March 1986). "Atomic force microscope". Physical Review Letters. 56 (9): 930–933. Bibcode:1986PhRvL..56..930B. doi:10.1103/PhysRevLett.56.930. PMID 10033323.
Wagner C, Green MF, Leinen P, Deilmann T, Krüger P, Rohlfing M, et al. (July 2015). "Scanning Quantum Dot Microscopy". Physical Review Letters. 115 (2): 026101. arXiv:1503.07738. Bibcode:2015PhRvL.115b6101W. doi:10.1103/PhysRevLett.115.026101. PMID 26207484. S2CID 1720328.
Steffes JJ, Ristau RA, Ramesh R, Huey BD (February 2019). "Thickness scaling of ferroelectricity in BiFeO₃ by tomographic atomic force microscopy". Proceedings of the National Academy of Sciences of the United States of America. 116 (7): 2413–2418. Bibcode:2019PNAS..116.2413S. doi:10.1073/pnas.1806074116. PMC 6377454. PMID 30683718.
Kaiser WJ, Bell LD (April 1988). "Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy". Physical Review Letters. 60 (14): 1406–1409. Bibcode:1988PhRvL..60.1406K. doi:10.1103/PhysRevLett.60.1406. PMID 10038030.
Reddick RC, Warmack RJ, Ferrell TL (January 1989). "New form of scanning optical microscopy". Physical Review B. 39 (1): 767–770. Bibcode:1989PhRvB..39..767R. doi:10.1103/PhysRevB.39.767. PMID 9947227.
Hansma PK, Drake B, Marti O, Gould SA, Prater CB (February 1989). "The scanning ion-conductance microscope". Science. 243 (4891): 641–643. Bibcode:1989Sci...243..641H. doi:10.1126/science.2464851. PMID 2464851.
Meister A, Gabi M, Behr P, Studer P, Vörös J, Niedermann P, et al. (June 2009). "FluidFM: combining atomic force microscopy and nanofluidics in a universal liquid delivery system for single cell applications and beyond". Nano Letters. 9 (6): 2501–2507. Bibcode:2009NanoL...9.2501M. doi:10.1021/nl901384x. PMID 19453133.
Betzig E, Trautman JK, Harris TD, Weiner JS, Kostelak RL (March 1991). "Breaking the diffraction barrier: optical microscopy on a nanometric scale". Science. 251 (5000): 1468–1470. Bibcode:1991Sci...251.1468B. doi:10.1126/science.251.5000.1468. PMID 17779440. S2CID 6906302.
Huth F, Govyadinov A, Amarie S, Nuansing W, Keilmann F, Hillenbrand R (August 2012). "Nano-FTIR absorption spectroscopy of molecular fingerprints at 20 nm spatial resolution". Nano Letters. 12 (8): 3973–3978. Bibcode:2012NanoL..12.3973H. doi:10.1021/nl301159v. PMID 22703339.
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