Scanning tunneling spectroscopy (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Scanning tunneling spectroscopy" in English language version.

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  • Klein, J.; Léger, A.; Belin, M.; Défourneau, D.; Sangster, M. J. L. (1973-03-15). "Inelastic-Electron-Tunneling Spectroscopy of Metal-Insulator-Metal Junctions". Physical Review B. 7 (6): 2336–2348. Bibcode:1973PhRvB...7.2336K. doi:10.1103/PhysRevB.7.2336.
  • Hamers, R. J.; Tromp, R. M.; Demuth, J. E. (5 May 1986). "Surface Electronic Structure of Si (111)-(7×7) Resolved in Real Space". Physical Review Letters. 56 (18). American Physical Society (APS): 1972–1975. Bibcode:1986PhRvL..56.1972H. doi:10.1103/physrevlett.56.1972. ISSN 0031-9007. PMID 10032824.
  • Mårtensson, P.; Feenstra, R. M. (15 April 1989). "Geometric and electronic structure of antimony on the GaAs(110) surface studied by scanning tunneling microscopy". Physical Review B. 39 (11). American Physical Society (APS): 7744–7753. Bibcode:1989PhRvB..39.7744M. doi:10.1103/physrevb.39.7744. ISSN 0163-1829. PMID 9947455.
  • Hamers, R J (1989). "Atomic-Resolution Surface Spectroscopy with the Scanning Tunneling Microscope". Annual Review of Physical Chemistry. 40 (1). Annual Reviews: 531–559. Bibcode:1989ARPC...40..531H. doi:10.1146/annurev.pc.40.100189.002531. ISSN 0066-426X.
  • R. V. Lapshin (2004). "Feature-oriented scanning methodology for probe microscopy and nanotechnology" (PDF). Nanotechnology. 15 (9). UK: IOP: 1135–1151. Bibcode:2004Nanot..15.1135L. doi:10.1088/0957-4484/15/9/006. ISSN 0957-4484. S2CID 250913438. (Russian translation is available).
  • Feenstra, R.M.; Stroscio, Joseph A.; Fein, A.P. (1987). "Tunneling spectroscopy of the Si(111)2 × 1 surface". Surface Science. 181 (1–2). Elsevier BV: 295–306. Bibcode:1987SurSc.181..295F. doi:10.1016/0039-6028(87)90170-1. ISSN 0039-6028.

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  • Klein, J.; Léger, A.; Belin, M.; Défourneau, D.; Sangster, M. J. L. (1973-03-15). "Inelastic-Electron-Tunneling Spectroscopy of Metal-Insulator-Metal Junctions". Physical Review B. 7 (6): 2336–2348. Bibcode:1973PhRvB...7.2336K. doi:10.1103/PhysRevB.7.2336.
  • Hamers, R. J.; Tromp, R. M.; Demuth, J. E. (5 May 1986). "Surface Electronic Structure of Si (111)-(7×7) Resolved in Real Space". Physical Review Letters. 56 (18). American Physical Society (APS): 1972–1975. Bibcode:1986PhRvL..56.1972H. doi:10.1103/physrevlett.56.1972. ISSN 0031-9007. PMID 10032824.
  • Mårtensson, P.; Feenstra, R. M. (15 April 1989). "Geometric and electronic structure of antimony on the GaAs(110) surface studied by scanning tunneling microscopy". Physical Review B. 39 (11). American Physical Society (APS): 7744–7753. Bibcode:1989PhRvB..39.7744M. doi:10.1103/physrevb.39.7744. ISSN 0163-1829. PMID 9947455.
  • Hamers, R J (1989). "Atomic-Resolution Surface Spectroscopy with the Scanning Tunneling Microscope". Annual Review of Physical Chemistry. 40 (1). Annual Reviews: 531–559. Bibcode:1989ARPC...40..531H. doi:10.1146/annurev.pc.40.100189.002531. ISSN 0066-426X.
  • R. V. Lapshin (2004). "Feature-oriented scanning methodology for probe microscopy and nanotechnology" (PDF). Nanotechnology. 15 (9). UK: IOP: 1135–1151. Bibcode:2004Nanot..15.1135L. doi:10.1088/0957-4484/15/9/006. ISSN 0957-4484. S2CID 250913438. (Russian translation is available).
  • Feenstra, R.M.; Stroscio, Joseph A.; Fein, A.P. (1987). "Tunneling spectroscopy of the Si(111)2 × 1 surface". Surface Science. 181 (1–2). Elsevier BV: 295–306. Bibcode:1987SurSc.181..295F. doi:10.1016/0039-6028(87)90170-1. ISSN 0039-6028.

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