Secondary electrons (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Secondary electrons" in English language version.

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Zangwill, Andrew (1988). Physics at surfaces. Cambridge Cambridgeshire New York: Cambridge University Press. p. 21. ISBN 978-0-521-34752-5. OCLC 15855885.

Seiler, H (1983). "Secondary electron emission in the scanning electron microscope". Journal of Applied Physics. 54 (11). AIP Publishing: R1–R18. Bibcode:1983JAP....54R...1S. doi:10.1063/1.332840. ISSN 0021-8979.
Cazaux, Jacques (15 January 1999). "Some considerations on the secondary electron emission, δ, from e− irradiated insulators". Journal of Applied Physics. 85 (2). AIP Publishing: 1137–1147. doi:10.1063/1.369239. ISSN 0021-8979.
Schreiber, E.; Fitting, H.-J. (2002). "Monte Carlo simulation of secondary electron emission from the insulator SiO2". Journal of Electron Spectroscopy and Related Phenomena. 124 (1). Elsevier BV: 25–37. doi:10.1016/s0368-2048(01)00368-1. ISSN 0368-2048.
Fitting, H.-J.; Boyde, J.; Reinhardt, J. (16 January 1984). "Monte-Carlo Approach of Electron Emission from SiO2". Physica Status Solidi A. 81 (1). Wiley: 323–332. Bibcode:1984PSSAR..81..323F. doi:10.1002/pssa.2210810136. ISSN 0031-8965.

Seiler, H (1983). "Secondary electron emission in the scanning electron microscope". Journal of Applied Physics. 54 (11). AIP Publishing: R1–R18. Bibcode:1983JAP....54R...1S. doi:10.1063/1.332840. ISSN 0021-8979.
Fitting, H.-J.; Boyde, J.; Reinhardt, J. (16 January 1984). "Monte-Carlo Approach of Electron Emission from SiO2". Physica Status Solidi A. 81 (1). Wiley: 323–332. Bibcode:1984PSSAR..81..323F. doi:10.1002/pssa.2210810136. ISSN 0031-8965.

Zangwill, Andrew (1988). Physics at surfaces. Cambridge Cambridgeshire New York: Cambridge University Press. p. 21. ISBN 978-0-521-34752-5. OCLC 15855885.
Seiler, H (1983). "Secondary electron emission in the scanning electron microscope". Journal of Applied Physics. 54 (11). AIP Publishing: R1–R18. Bibcode:1983JAP....54R...1S. doi:10.1063/1.332840. ISSN 0021-8979.
Cazaux, Jacques (15 January 1999). "Some considerations on the secondary electron emission, δ, from e− irradiated insulators". Journal of Applied Physics. 85 (2). AIP Publishing: 1137–1147. doi:10.1063/1.369239. ISSN 0021-8979.
Schreiber, E.; Fitting, H.-J. (2002). "Monte Carlo simulation of secondary electron emission from the insulator SiO2". Journal of Electron Spectroscopy and Related Phenomena. 124 (1). Elsevier BV: 25–37. doi:10.1016/s0368-2048(01)00368-1. ISSN 0368-2048.
Fitting, H.-J.; Boyde, J.; Reinhardt, J. (16 January 1984). "Monte-Carlo Approach of Electron Emission from SiO2". Physica Status Solidi A. 81 (1). Wiley: 323–332. Bibcode:1984PSSAR..81..323F. doi:10.1002/pssa.2210810136. ISSN 0031-8965.