Selected area diffraction (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Selected area diffraction" in English language version.

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De Graef, Marc (2003-03-27). Introduction to Conventional Transmission Electron Microscopy. Cambridge University Press. doi:10.1017/cbo9780511615092. ISBN 978-0-521-62006-2.
Klinger, Miloslav (2017-07-07). "More features, more tools, more CrysTBox". Journal of Applied Crystallography. 50 (4). International Union of Crystallography (IUCr): 1226–1234. Bibcode:2017JApCr..50.1226K. doi:10.1107/s1600576717006793. ISSN 1600-5767.
Gemmi, Mauro; Mugnaioli, Enrico; Gorelik, Tatiana E.; Kolb, Ute; Palatinus, Lukas; Boullay, Philippe; Hovmöller, Sven; Abrahams, Jan Pieter (2019-07-19). "3D Electron Diffraction: The Nanocrystallography Revolution". ACS Central Science. 5 (8). American Chemical Society (ACS): 1315–1329. doi:10.1021/acscentsci.9b00394. ISSN 2374-7943. PMC 6716134. PMID 31482114.
Morniroli, Jean Paul (2004). Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects. Taylor & Francis. doi:10.1201/9781420034073. ISBN 978-2-901483-05-2.
Klinger, Miloslav; Polívka, Leoš; Jäger, Aleš; Tyunina, Marina (2016-04-12). "Quantitative analysis of structural inhomogeneity in nanomaterials using transmission electron microscopy". Journal of Applied Crystallography. 49 (3). International Union of Crystallography (IUCr): 762–770. Bibcode:2016JApCr..49..762K. doi:10.1107/s1600576716003800. ISSN 1600-5767.

Klinger, Miloslav (2017-07-07). "More features, more tools, more CrysTBox". Journal of Applied Crystallography. 50 (4). International Union of Crystallography (IUCr): 1226–1234. Bibcode:2017JApCr..50.1226K. doi:10.1107/s1600576717006793. ISSN 1600-5767.
Klinger, Miloslav; Polívka, Leoš; Jäger, Aleš; Tyunina, Marina (2016-04-12). "Quantitative analysis of structural inhomogeneity in nanomaterials using transmission electron microscopy". Journal of Applied Crystallography. 49 (3). International Union of Crystallography (IUCr): 762–770. Bibcode:2016JApCr..49..762K. doi:10.1107/s1600576716003800. ISSN 1600-5767.

Gemmi, Mauro; Mugnaioli, Enrico; Gorelik, Tatiana E.; Kolb, Ute; Palatinus, Lukas; Boullay, Philippe; Hovmöller, Sven; Abrahams, Jan Pieter (2019-07-19). "3D Electron Diffraction: The Nanocrystallography Revolution". ACS Central Science. 5 (8). American Chemical Society (ACS): 1315–1329. doi:10.1021/acscentsci.9b00394. ISSN 2374-7943. PMC 6716134. PMID 31482114.

Gemmi, Mauro; Mugnaioli, Enrico; Gorelik, Tatiana E.; Kolb, Ute; Palatinus, Lukas; Boullay, Philippe; Hovmöller, Sven; Abrahams, Jan Pieter (2019-07-19). "3D Electron Diffraction: The Nanocrystallography Revolution". ACS Central Science. 5 (8). American Chemical Society (ACS): 1315–1329. doi:10.1021/acscentsci.9b00394. ISSN 2374-7943. PMC 6716134. PMID 31482114.

Kirkland, Earl (2010). Advanced computing in electron microscopy. New York: Springer. ISBN 978-1-4419-6533-2. OCLC 668095602.
Fultz, B (2013). Transmission electron microscopy and diffractometry of materials. Heidelberg New York: Springer. ISBN 978-3-642-43315-3. OCLC 796932144.
Klinger, Miloslav (2017-07-07). "More features, more tools, more CrysTBox". Journal of Applied Crystallography. 50 (4). International Union of Crystallography (IUCr): 1226–1234. Bibcode:2017JApCr..50.1226K. doi:10.1107/s1600576717006793. ISSN 1600-5767.
Gemmi, Mauro; Mugnaioli, Enrico; Gorelik, Tatiana E.; Kolb, Ute; Palatinus, Lukas; Boullay, Philippe; Hovmöller, Sven; Abrahams, Jan Pieter (2019-07-19). "3D Electron Diffraction: The Nanocrystallography Revolution". ACS Central Science. 5 (8). American Chemical Society (ACS): 1315–1329. doi:10.1021/acscentsci.9b00394. ISSN 2374-7943. PMC 6716134. PMID 31482114.
Klinger, Miloslav; Polívka, Leoš; Jäger, Aleš; Tyunina, Marina (2016-04-12). "Quantitative analysis of structural inhomogeneity in nanomaterials using transmission electron microscopy". Journal of Applied Crystallography. 49 (3). International Union of Crystallography (IUCr): 762–770. Bibcode:2016JApCr..49..762K. doi:10.1107/s1600576716003800. ISSN 1600-5767.