Single-event upset (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Single-event upset" in English language version.

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Binder, Smith, Holman (1975). "Satellite Anomalies from Galactic Cosmic Rays". IEEE Transactions on Nuclear Science. NS-22, No. 6 (6): 2675–2680. Bibcode:1975ITNS...22.2675B. doi:10.1109/TNS.1975.4328188. S2CID 3032512 – via IEEE Explore.{{cite journal}}: CS1 maint: multiple names: authors list (link)
Torrens, G.; Alheyasat, A.; Alorda, B.; Barcelo, S.; Segura, J.; Bota, S. A. (2020). "Transistor Width Effect on the Power Supply Voltage Dependence of α-SER in CMOS 6T SRAM". IEEE Transactions on Nuclear Science. 67 (5): 811–817. Bibcode:2020ITNS...67..811T. doi:10.1109/TNS.2020.2983586. ISSN 0018-9499. S2CID 216198845.

Binder, Smith, Holman (1975). "Satellite Anomalies from Galactic Cosmic Rays". IEEE Transactions on Nuclear Science. NS-22, No. 6 (6): 2675–2680. Bibcode:1975ITNS...22.2675B. doi:10.1109/TNS.1975.4328188. S2CID 3032512 – via IEEE Explore.{{cite journal}}: CS1 maint: multiple names: authors list (link)
Torrens, G.; Alheyasat, A.; Alorda, B.; Barcelo, S.; Segura, J.; Bota, S. A. (2020). "Transistor Width Effect on the Power Supply Voltage Dependence of α-SER in CMOS 6T SRAM". IEEE Transactions on Nuclear Science. 67 (5): 811–817. Bibcode:2020ITNS...67..811T. doi:10.1109/TNS.2020.2983586. ISSN 0018-9499. S2CID 216198845.

Neutron-Induced Single Event Upset (SEU) FAQ, Microsemi Corporation, retrieved October 7, 2018, The cause has been traced to errors in an onboard computer suspected to have been induced by cosmic rays.

Binder, Smith, Holman (1975). "Satellite Anomalies from Galactic Cosmic Rays". IEEE Transactions on Nuclear Science. NS-22, No. 6 (6): 2675–2680. Bibcode:1975ITNS...22.2675B. doi:10.1109/TNS.1975.4328188. S2CID 3032512 – via IEEE Explore.{{cite journal}}: CS1 maint: multiple names: authors list (link)
Torrens, G.; Alheyasat, A.; Alorda, B.; Barcelo, S.; Segura, J.; Bota, S. A. (2020). "Transistor Width Effect on the Power Supply Voltage Dependence of α-SER in CMOS 6T SRAM". IEEE Transactions on Nuclear Science. 67 (5): 811–817. Bibcode:2020ITNS...67..811T. doi:10.1109/TNS.2020.2983586. ISSN 0018-9499. S2CID 216198845.