Reeh, Devin; Francisco Cruz, Tapia; Chung, Yu-Wei; Khaki, Behnam; Chu, Chicheng; Gadh, Rajit (2019). "Vulnerability Analysis and Risk Assessment of EV Charging System under Cyber-Physical Threats". 2019 IEEE Transportation Electrification Conference and Expo (ITEC). pp. 1–6. doi:10.1109/ITEC.2019.8790593. ISBN978-1-5386-9310-0. ISSN2377-5483. S2CID199509846.
Reeh, Devin; Francisco Cruz, Tapia; Chung, Yu-Wei; Khaki, Behnam; Chu, Chicheng; Gadh, Rajit (2019). "Vulnerability Analysis and Risk Assessment of EV Charging System under Cyber-Physical Threats". 2019 IEEE Transportation Electrification Conference and Expo (ITEC). pp. 1–6. doi:10.1109/ITEC.2019.8790593. ISBN978-1-5386-9310-0. ISSN2377-5483. S2CID199509846.
Reeh, Devin; Francisco Cruz, Tapia; Chung, Yu-Wei; Khaki, Behnam; Chu, Chicheng; Gadh, Rajit (2019). "Vulnerability Analysis and Risk Assessment of EV Charging System under Cyber-Physical Threats". 2019 IEEE Transportation Electrification Conference and Expo (ITEC). pp. 1–6. doi:10.1109/ITEC.2019.8790593. ISBN978-1-5386-9310-0. ISSN2377-5483. S2CID199509846.