Surface metrology (English Wikipedia)

Analysis of information sources in references of the Wikipedia article "Surface metrology" in English language version.

refsWebsite

Global rank English rank

3web.archive.org

1^st place

3doi.org

2^nd place

2harvard.edu

18^th place

17^th place

1nasa.gov

75^th place

83^rd place

1lboro.ac.uk

4,065^th place

3,349^th place

1zenodo.org

621^st place

380^th place

1nih.gov

4^th place

1archive.today

14^th place

1asme.org

6,461^st place

4,142^nd place

1iso.org

629^th place

610^th place

1wpi.edu

low place

9,904^th place

archive.today

"B46.1 - Surface Texture (Surface Roughness, Waviness, and Lay)". ASME. 2009. Archived from the original on 14 Apr 2013. Retrieved 2016-03-26.

asme.org

"B46.1 - Surface Texture (Surface Roughness, Waviness, and Lay)". ASME. 2009. Archived from the original on 14 Apr 2013. Retrieved 2016-03-26.

doi.org

Gao, F; Leach, R K; Petzing, J; Coupland, J M (2008). "Surface Measurement errors using commercial scanning white light interferometers". Measurement Science and Technology. 19 (1): 015303. Bibcode:2008MeScT..19a5303G. doi:10.1088/0957-0233/19/1/015303.
Rhee, H. G.; Vorburger, T. V.; Lee, J. W.; Fu, J (2005). "Discrepancies between roughness measurements obtained with phase-shifting and white-light interferometry". Applied Optics. 44 (28): 5919–27. Bibcode:2005ApOpt..44.5919R. doi:10.1364/AO.44.005919. PMID 16231799.
Gadelmawla E.S.; Koura M.M.; Maksoud T.M.A.; Elewa I.M.; Soliman H.H. (2002). "Roughness parameters". Journal of Materials Processing Technology. 123: 133–145. doi:10.1016/S0924-0136(02)00060-2.

harvard.edu

ui.adsabs.harvard.edu

Gao, F; Leach, R K; Petzing, J; Coupland, J M (2008). "Surface Measurement errors using commercial scanning white light interferometers". Measurement Science and Technology. 19 (1): 015303. Bibcode:2008MeScT..19a5303G. doi:10.1088/0957-0233/19/1/015303.
Rhee, H. G.; Vorburger, T. V.; Lee, J. W.; Fu, J (2005). "Discrepancies between roughness measurements obtained with phase-shifting and white-light interferometry". Applied Optics. 44 (28): 5919–27. Bibcode:2005ApOpt..44.5919R. doi:10.1364/AO.44.005919. PMID 16231799.

iso.org

"ISO 4287:1997 - Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters". ISO. Archived from the original on Jan 19, 2004.

lboro.ac.uk

dspace.lboro.ac.uk

Gao, F; Leach, R K; Petzing, J; Coupland, J M (2008). "Surface Measurement errors using commercial scanning white light interferometers". Measurement Science and Technology. 19 (1): 015303. Bibcode:2008MeScT..19a5303G. doi:10.1088/0957-0233/19/1/015303.

nasa.gov

science-edu.larc.nasa.gov

"What Wavelength Goes With a Color?". Archived from the original on 2011-07-20. Retrieved 2008-05-14.

nih.gov

pubmed.ncbi.nlm.nih.gov

Rhee, H. G.; Vorburger, T. V.; Lee, J. W.; Fu, J (2005). "Discrepancies between roughness measurements obtained with phase-shifting and white-light interferometry". Applied Optics. 44 (28): 5919–27. Bibcode:2005ApOpt..44.5919R. doi:10.1364/AO.44.005919. PMID 16231799.

web.archive.org

"What Wavelength Goes With a Color?". Archived from the original on 2011-07-20. Retrieved 2008-05-14.
"ISO 4287:1997 - Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters". ISO. Archived from the original on Jan 19, 2004.
"Surface Metrology Laboratory – Washburn Shops 243 – Scale-sensitive Fractal Analysis". Worcester Polytechnic Institute Mechanical Engineering Department. September 28, 2007. Archived from the original on Apr 21, 2012. Retrieved 2016-03-26.

wpi.edu

me.wpi.edu

"Surface Metrology Laboratory – Washburn Shops 243 – Scale-sensitive Fractal Analysis". Worcester Polytechnic Institute Mechanical Engineering Department. September 28, 2007. Archived from the original on Apr 21, 2012. Retrieved 2016-03-26.

zenodo.org

Rhee, H. G.; Vorburger, T. V.; Lee, J. W.; Fu, J (2005). "Discrepancies between roughness measurements obtained with phase-shifting and white-light interferometry". Applied Optics. 44 (28): 5919–27. Bibcode:2005ApOpt..44.5919R. doi:10.1364/AO.44.005919. PMID 16231799.